Texas Instruments CY74FCT157CTSOCT, CY74FCT157CTSOC, CY74FCT157CTQCT, CY74FCT157CTQC, CY74FCT157ATSOCT Datasheet

Data sheet acquired from Cypress Semiconductor Corporation.

Data sheet modified to remove devices not offered.

CY54/74FCT157T

SCCS014 - May 1994 - Revised February 2000

Features

•Function, pinout, and drive compatible with FCT and F logic

•FCT-C speed at 4.3 ns max. (Com’l), FCT-A speed at 5.0 ns max. (Com’l)

•Reduced VOH (typically = 3.3V) versions of equivalent FCT functions

•Edge-rate control circuitry for significantly improved noise characteristics

•Power-off disable feature

•Matched rise and fall times

•Fully compatible with TTL input and output logic levels

•ESD > 2000V

•Extended commercial range of −40˚C to +85˚C

• Sink current	64 mA (Com’l),
	32 mA (Mil)
Source current	32 mA (Com’l),
	12 mA (Mil)

Quad 2-Input Multiplexer

Functional Description

The FCT157T is a quad two-input multiplexer that selects four bits of data from two sources under the control of a common data Select input (S). The Enable input (E) is Active LOW. When (E) is HIGH, all of the outputs (Y) are forced LOW regardless of all other input conditions.

Moving data from two groups of registers to four common output buses is a common use of the FCT157T. The state of the Select input determines the particular register from which the data comes. It can also be used as a function generator. The device is useful for implementing highly irregular logic by generating any four of the sixteen different functions of two variables with one variable common.

The FCT157T is a logic implementation of a four-pole, two-position switch where the position of the switch is determined by the logic levels supplied to the Select input.

The outputs are designed with a power-off disable feature to allow for live insertion of boards.

Logic Block Diagram, FCT157T						Pin Configurations
I0a	I1a	I0b I1b I0c	I1c	I0d I1d		S
					E

Ya

Yb

Yc

Yd

LCC

Top View

1b

0b

NC

a

1a

I

I

Y

I

Yb

8

7

6

5

4

I0a

9

3

GND

10

FCT157T

2

S

NC

11

1

NC

Yc

12

20

VCC

I1c

13

19

E

14

1516

17 18

0c

d

NC

1d

0d

I

Y

I

I

SOIC/QSOP

Top View

S	1		16		VCC
I0a	2
		15				E
I	3	14			I0d
1a
Ya	4	FCT157T 13			I1d
I0b	5	12			Yd
I1b	6	11			I0c
Yb	7				I1c
		10
GND	8	9			Yc

Logic Symbol

	E I0a		I1a I0b	I1b I0c I1c	I0d I1d
	S		FCT157T
		Ya	Yb	Yc	Yd

FCT157T–1

Copyright © 2000, Texas Instruments Incorporated

CY54/74FCT157T

Pin Description

		Name	Description
	S		Common Select Input
			Enable Inputs (Active LOW)
	E
	I0		Data Inputs from Source 0
	I1		Data Inputs from Source 1
	Y		Non-Inverted Output

Function Table[1]

		Inputs			Outputs
E	S		I0	I1	Y
H	X		X	X	L
L	H		X	L	L
L	H		X	H	H
L	L		L	X	L
L	L		H	X	H

Electrical Characteristics Over the Operating Range

Maximum Ratings[2,3]

(Above which the useful life may be impaired. For user guidelines, not tested.)

Storage Temperature .....................................	−65°C to +150°C
Ambient Temperature with	−65°C to +135°C
Power Applied ..................................................
Supply Voltage to Ground Potential..................	−0.5V to +7.0V
DC Input Voltage .................................................	−0.5V to +7.0V
DC Output Voltage ..............................................	−0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ......		120 mA
Power Dissipation ..........................................................		0.5W
Static Discharge Voltage............................................		>2001V

(per MIL-STD-883, Method 3015)

Operating Range

		Ambient
Range	Range	Temperature	VCC
Commercial	All	−40°C to +85°C	5V ± 5%
Military[4]	All	−55°C to +125°C	5V ± 10%

Parameter		Description			Test Conditions		Min.	Typ.[5]	Max.	Unit
VOH		Output HIGH Voltage	VCC=Min., IOH=−32 mA			Com’l	2.0			V
			VCC=Min., IOH=−15 mA			Com’l	2.4	3.3		V
			VCC=Min., IOH=−12 mA			Mil	2.4	3.3		V
VOL		Output LOW Voltage	VCC=Min., IOL=64 mA			Com’l		0.3	0.55	V
			VCC=Min., IOL=32 mA			Mil		0.3	0.55	V
VIH		Input HIGH Voltage					2.0			V
VIL		Input LOW Voltage							0.8	V
VH		Hysteresis[6]	All inputs					0.2		V
VIK		Input Clamp Diode Voltage	VCC=Min., IIN=−18 mA					−0.7	−1.2	V
II		Input HIGH Current	VCC=Max., VIN=VCC						5	µA
IIH		Input HIGH Current	VCC=Max., VIN=2.7V						±1	µA
IIL		Input LOW Current	VCC=Max., VIN=0.5V						±1	µA
IOZH		Off State HIGH-Level Output	VCC = Max., VOUT = 2.7V						10	µA
		Current
IOZL		Off State LOW-Level	VCC = Max., VOUT = 0.5V						−10	µA
		Output Current
I	OS	Output Short Circuit Current[7]	V	CC	=Max., V =0.0V		−60	−120	−225	mA
					OUT
IOFF		Power-Off Disable	VCC=0V, VOUT=4.5V						±1	µA

Note:

1.H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care

2.Unless otherwise noted, these limits are over the operating free-air temperature range.

3.Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.

4.TA is the “instant on” case temperature.

5.Typical values are at VCC=5.0V, TA=+25˚C ambient.

6.This parameter is specified but not tested.

7.Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last.

2