Data sheet acquired from Cypress Semiconductor Corporation. Data sheet modified to remove devices not offered.
SCCS037 - July 1994 - Revised March 2000
CY74FCT2245T
8-Bit Transceiver
Features
•Function and pinout compatible with FCT and F logic
•25Ω output series resistors to reduce transmission line reflection noise
•FCT-C speed at 4.1 ns max. FCT-A speed at 4.6 ns max.
•Edge-rate control circuitry for significantly improved noise characteristics
•Power-off disable feature
•Fully compatible with TTL input and output logic levels
•ESD > 2000V
• Sink current |
12 mA |
Source current |
15 mA |
•Extended commercial temp. range of –40˚C to +85˚C
•Three-state outputs
Functional Description
The FCT2245T contains eight non-inverting, bidirectional buffers with three-state outputs intended for bus oriented applications. On-chip termination resistors have been added to the outputs to reduce system noise caused by reflections. For this reason, the FCT2245T can be used in an existing design to replace the FCT245T. The FCT2245T current sinking capability is 12 mA at the A and B ports.
The Transmit/Receive (T/R) input determines the direction of data flow through the bidirectional transceiver. Transmit (Active HIGH) enables data from A ports to B ports; receive (Active LOW) enables data from B ports to A ports. The output enable (OE) input, when HIGH, disables both the A and B ports by putting them in a High Z condition.
The outputs are designed with a power-off disable feature to allow for live insertion of boards.
Logic Block Diagram |
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Pin Configurations |
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T/R |
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OE |
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DIP/SOIC/QSOP |
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A0 |
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Top View |
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B0 |
T/R |
1 |
20 |
VCC |
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A1 |
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A0 |
2 |
19 |
OE |
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18 |
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B1 |
A1 |
3 |
B0 |
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A2 |
4 |
17 |
B1 |
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A2 |
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A3 |
5 |
16 |
B2 |
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B2 |
A4 |
6 |
15 |
B3 |
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14 |
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A3 |
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A5 |
7 |
B4 |
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A6 |
8 |
13 |
B5 |
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B3 |
A7 |
9 |
12 |
B6 |
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A4 |
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GND |
10 |
11 |
B7 |
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B4 |
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FCT2245T–3 |
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A5 |
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B5 |
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A6 |
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B6 |
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A7 |
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B7 |
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FCT2245T–1 |
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Function Table[1] |
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Inputs |
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OE |
T/R |
Output |
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L |
L |
Bus B Data to Bus A |
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L |
H |
Bus A Data to Bus B |
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H |
X |
High Z State |
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Note: |
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1.H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.
Copyright © 2000, Texas Instruments Incorporated
CY74FCT2245T
Maximum Ratings[2,3]
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature ................................. |
–65°C to +150°C |
Ambient Temperature with |
–65°C to +135°C |
Power Applied ............................................. |
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Supply Voltage to Ground Potential ............... |
–0.5V to +7.0V |
DC Input Voltage............................................ |
–0.5V to +7.0V |
DC Output Voltage ......................................... |
–0.5V to +7.0V |
Electrical Characteristics Over the Operating Range
DC Output Current (Maximum Sink Current/Pin) ...... |
120 mA |
Power Dissipation .......................................................... |
0.5W |
Static Discharge Voltage............................................ |
>2001V |
(per MIL-STD-883, Method 3015)
Operating Range
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Ambient |
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Range |
Range |
Temperature |
VCC |
Commercial |
T, AT, CT |
–40°C to +85°C |
5V ± 5% |
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Parameter |
Description |
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Test Conditions |
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Min. |
Typ.[5] |
Max. |
Unit |
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VOH |
Output HIGH Voltage |
VCC=Min., IOH=–15 mA |
Com’l |
2.4 |
3.3 |
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V |
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VOL |
Output LOW Voltage |
VCC=Min., IOL=12 mA |
Com’l |
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0.3 |
0.55 |
V |
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ROUT |
Output Resistance |
VCC=Min., IOL=12 mA |
Com’l |
20 |
25 |
40 |
Ω |
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VIH |
Input HIGH Voltage |
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2.0 |
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V |
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VIL |
Input LOW Voltage |
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0.8 |
V |
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VH |
Hysteresis[6] |
All inputs |
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0.2 |
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V |
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VIK |
Input Clamp Diode Voltage |
VCC=Min., IIN=–18 mA |
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–0.7 |
–1.2 |
V |
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II |
Input HIGH Current |
VCC=Max., VIN=VCC |
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5 |
µA |
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IIH |
Input HIGH Current |
VCC=Max., VIN=2.7V |
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±1 |
µA |
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IIL |
Input LOW Current |
VCC=Max., VIN=0.5V |
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±1 |
µA |
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I |
OS |
Output Short Circuit Current[7] |
V |
=Max., V =0.0V |
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–60 |
–120 |
–225 |
mA |
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CC |
OUT |
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IOFF |
Power-Off Disable |
VCC=0V, VOUT=4.5V |
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±1 |
µA |
Capacitance[6]
Parameter |
Description |
Test Conditions |
Typ.[5] |
Max. |
Unit |
CIN |
Input Capacitance |
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5 |
10 |
pF |
COUT |
Output Capacitance |
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9 |
12 |
pF |
Notes: |
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2.Unless otherwise noted, these limits are over the operating free-air temperature range.
3.Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
4.TA is the “instant on” case temperature.
5.Typical values are at VCC=5.0V, TA=+25˚C ambient.
6.This parameter is specified but not tested.
7.Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last.
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CY74FCT2245T
Power Supply Characteristics
Parameter |
Description |
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Test Conditions |
Typ.[5] |
Max. |
Unit |
ICC |
Quiescent Power Supply Current |
VCC=Max., VIN < 0.2V, |
0.1 |
0.2 |
mA |
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VIN > VCC–0.2V |
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ICC |
Quiescent Power Supply Current |
VCC=Max., VIN=3.4V,[8] |
0.5 |
2.0 |
mA |
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(TTL inputs) |
f1=0, Outputs Open |
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ICCD |
Dynamic Power Supply |
VCC=Max., One Input Toggling, |
0.06 |
0.12 |
mA/MHz |
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Current[9] |
50% Duty Cycle, Outputs Open, |
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T/R=OE=GND, |
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VIN < 0.2V or VIN > VCC–0.2V |
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IC |
Total Power Supply Current[10] |
VCC=Max., 50% Duty Cycle, |
0.7 |
1.4 |
mA |
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Outputs Open, |
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One Bit Toggling at f1=10 MHz, |
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T/R=OE=GND, |
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VIN < 0.2V or VIN > VCC–0.2V |
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VCC=Max., |
1.0 |
2.4 |
mA |
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50% Duty Cycle, Outputs Open, |
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One Bit Toggling at f1=10 MHz, |
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T/R=OE=GND, |
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VIN=3.4V or VIN=GND |
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VCC=Max., |
1.3 |
2.6[11] |
mA |
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50% Duty Cycle, Outputs Open, |
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Eight |
Bits Toggling at f1=2.5 MHz, |
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T/R=OE=GND, |
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VIN < 0.2V or VIN > VCC–0.2V |
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VCC=Max., |
3.3 |
10.6[11] |
mA |
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50% Duty Cycle, Outputs Open, |
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Eight |
Bits Toggling at f1=2.5 MHz, |
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T/R=OE=GND, |
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VIN=3.4V or VIN=GND |
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Notes: |
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8.Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.
9.This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
10. IC |
= IQUIESCENT + IINPUTS + IDYNAMIC |
IC |
= ICC+ ICCDHNT+ICCD(f0/2 + f1N1) |
ICC |
= Quiescent Current with CMOS input levels |
ICC |
= Power Supply Current for a TTL HIGH input (VIN=3.4V) |
DH |
= Duty Cycle for TTL inputs HIGH |
NT |
= Number of TTL inputs at DH |
ICCD |
= Dynamic Current caused by an input transition pair (HLH or LHL) |
f0 |
= Clock frequency for registered devices, otherwise zero |
f1 |
= Input signal frequency |
N1 |
= Number of inputs changing at f1 |
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
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