Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
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CY54/74FCT377T |
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8-Bit Register |
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SCCS023 - May1994 - Revised March 2000 |
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Features |
• Clock Enable for address and data synchronization |
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application |
•Function, pinout and drive compatible with FCT and F logic
•FCT-C speed at 5.2 ns max. (Com’l) FCT-A speed at 7.2 ns max. (Com’l)
•Reduced VOH (typically = 3.3V) versions of equivalent FCT functions
•Edge-rate control circuitry for significantly improved noise characteristics
•Power-off disable feature
•Matched rise and fall times
•ESD > 2000V
•Fully compatible with TTL input and output logic levels
• Sink Current |
64 mA (Com’l), |
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32 mA (Mil) |
Source Current |
32 mA (Com’l), |
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12 mA (Mil) |
•Eight edge-triggered D flip-flops
•Extended commercial range of −40˚C to +85˚C
Functional Description
The FCT377T has eight triggered D-type flip-flops with individual D inputs. The common buffered clock inputs (CP) loads all flip-flops simultaneously when the Clock Enable (CE) is LOW. The register is fully edge-triggered. The state of each D input, one set-up time before the LOW-to-HIGH clock transition, is transferred to the corresponding flip-flop’s O output. The CE input must be stable only one set-up time prior to the LOW-to-HIGH clock transition for predictable operation.
The outputs are designed with a power-off disable feature to allow for live insertion of boards.
Logic Block Diagram |
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D0 |
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D1 |
D2 |
D3 |
D4 |
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D5 |
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D6 |
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D7 |
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CE |
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D Q |
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D Q |
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D Q |
D Q |
D Q |
D Q |
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D Q |
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D Q |
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CP |
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CP |
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CP |
CP |
CP |
CP |
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CP |
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CP |
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CP |
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O0 |
O1 |
O2 |
O3 |
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O4 |
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O5 |
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O6 |
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O7 |
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Pin Configurations |
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Logic Symbol |
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SOIC/QSOP |
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LCC |
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Top View |
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Top View |
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CE |
1 |
20 |
VCC |
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3 |
2 |
2 1 |
1 |
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O0 |
2 |
19 |
O7 |
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D |
D |
O O |
D |
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8 7 6 5 4 |
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D0 |
3 |
18 |
D7 |
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D0 |
D1 |
D2 |
D3 |
D4 |
D5 |
D6 |
D7 |
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O3 |
D0 |
D1 |
4 |
17 |
D6 |
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9 |
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3 |
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CP |
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GND |
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O |
O1 |
5 |
16 |
O6 |
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10 |
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2 |
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0 |
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CP |
11 |
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1 |
CE |
O2 |
6 |
15 |
O5 |
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CE |
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O4 12 |
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20 |
VCC |
D2 |
7 |
14 |
D5 |
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O0 |
O1 |
O2 |
O3 |
O4 |
O5 |
O6 |
O7 |
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D4 |
13 |
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19 |
O7 |
D3 |
8 |
13 |
D4 |
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14 |
1516 |
17 18 |
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O3 |
9 |
12 |
O4 |
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5 |
5 |
6 |
6 |
7 |
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GND |
10 |
11 |
CP |
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D |
O |
O |
D |
D |
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Copyright © 2000, Texas Instruments Incorporated
CY54/74FCT377T
Function Table[1]
Operating |
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Inputs |
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Outputs |
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Mode |
CP |
CE |
D |
O |
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Load “1” |
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l |
h |
H |
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Load “0“ |
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l |
l |
L |
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Hold |
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h |
X |
No Change |
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X |
H |
X |
No Change |
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Supply Voltage to Ground Potential............... |
–0.5V to +7.0V |
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DC Input Voltage ........................................... |
–0.5V to +7.0V |
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DC Output Voltage......................................... |
–0.5V to +7.0V |
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DC Output Current (Maximum Sink Current/Pin) ...... |
120 mA |
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Power Dissipation .......................................................... |
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0.5W |
Static Discharge Voltage............................................ |
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>2001V |
(per MIL-STD-883, Method 3015) |
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Maximum Ratings[2, 3]
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature ................................. |
–65°C to +150°C |
Ambient Temperature |
–65°C to +135°C |
with Power Applied...................................... |
Operating Range
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Ambient |
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Range |
Range |
Temperature |
VCC |
Commercial |
All |
–40°C to +85°C |
5V ± 5% |
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Military[4] |
All |
–55°C to +125°C |
5V ± 10% |
Electrical Characteristics Over the Operating Range
Parameter |
Description |
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Test Conditions |
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Min. |
Typ.[5] |
Max. |
Unit |
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VOH |
Output HIGH Voltage |
VCC=Min., IOH=–32 mA |
Com’l |
2.0 |
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V |
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VCC=Min., IOH=–15 mA |
Com’l |
2.4 |
3.3 |
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V |
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VCC=Min., IOH=–12 mA |
Mil |
2.4 |
3.3 |
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V |
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VOL |
Output LOW Voltage |
VCC=Min., IOL=64 mA |
Com’l |
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0.3 |
0.55 |
V |
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VCC=Min., IOL=32 mA |
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0.3 |
0.55 |
V |
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VIH |
Input HIGH Voltage |
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2.0 |
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V |
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VIL |
Input LOW Voltage |
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0.8 |
V |
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VH |
Hysteresis[6] |
All inputs |
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0.2 |
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V |
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VIK |
Input Clamp Diode Voltage |
VCC=Min., IIN=–18 mA |
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–0.7 |
–1.2 |
V |
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II |
Input HIGH Current |
VCC=Max., VIN=VCC |
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5 |
A |
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IIH |
Input HIGH Current |
VCC=Max., VIN=2.7V |
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±1 |
A |
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IIL |
Input LOW Current |
VCC=Max., VIN=0.5V |
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±1 |
A |
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I |
OS |
Output Short Circuit Current[7] |
V |
=Max., V =0.0V |
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–60 |
–120 |
–225 |
mA |
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CC |
OUT |
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IOFF |
Power-Off Disable |
VCC=0V., VOUT=4.5V |
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±1 |
A |
Notes:
1.H = HIGH Voltage Level
h = HIGH Voltage Level one set-up time prior to the LOW-to-HIGH Clock Transition L = LOW Voltage Level
l = LOW Voltage Level one set-up time prior to the LOW-to-HIGH Clock Transition X = Don’t Care
Z = HIGH Impedance
= LOW-to-HIGH clock transition
2.Unless otherwise noted, these limits are over the operating free-air temperature range.
3.Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
4.TA is the “instant on” case temperature.
5.Typical values are at VCC=5.0V, TA=+25˚C ambient.
6.This parameter is specified but not tested.
7.Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last.
2
CY54/74FCT377T
Capacitance[2]
Parameter |
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Description |
Typ.[5] |
Max. |
Unit |
CIN |
Input Capacitance |
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5 |
10 |
pF |
COUT |
Output Capacitance |
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9 |
12 |
pF |
Power Supply Characteristics
Parameter |
Description |
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Test Conditions |
Typ.[5] |
Max. |
Unit |
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ICC |
Quiescent Power Supply Current |
VCC=Max., VIN≤0.2V, VIN ≥ VCC–0.2V |
0.1 |
0.2 |
mA |
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CC |
Quiescent Power Supply Current |
V |
=Max., V |
=3.4V, f |
=0, Outputs Open[8] |
0.5 |
2.0 |
mA |
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(TTL inputs HIGH) |
CC |
IN |
1 |
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I |
CCD |
Dynamic Power Supply Current[9] |
V |
=Max., One Bit Toggling, |
0.06 |
0.12 |
mA/MHz |
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CC |
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50% Duty Cycle, Outputs Open, |
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CE=GND, VIN ≤ 0.2V or VIN ≥ VCC–0.2V |
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I |
C |
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Total Power Supply Current[10] |
V |
=Max., f |
=10 MHz, |
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0.7 |
1.4 |
mA |
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CC |
0 |
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50% Duty Cycle, Outputs Open, |
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One Bit Toggling at f1=5 MHz, |
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CE=GND, VIN≤0.2V or VIN ≥ VCC–0.2V |
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VCC=Max., f0=10 MHz, |
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1.2 |
3.4 |
mA |
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50% Duty Cycle, Outputs Open, |
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One Bit Toggling at f1=5 MHz, |
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CE=GND, |
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VIN=3.4V or VIN=GND |
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VCC=Max., f0=10 MHz, |
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1.6 |
3.2[11] |
mA |
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50% Duty Cycle, Outputs Open, |
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Eight Bits Toggling at f1=2.5 MHz, |
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CE=GND, VIN≤0.2V or VIN≥VCC–0.2V |
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V |
=Max., f |
=10 MHz, |
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3.9 |
12.2[11] |
mA |
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CC |
0 |
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50% Duty Cycle, Outputs Open, |
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Eight Bits Toggling at f1=2.5 MHz, |
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CE=GND, VIN=3.4V or VIN=GND |
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Notes: |
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8.Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.
9.This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
10. IC |
= IQUIESCENT + IINPUTS + IDYNAMIC |
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IC |
= |
ICC+ ICCDHNT+ICCD(f0/2 + f1N1) |
ICC |
= Quiescent Current with CMOS input levels |
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ICC |
= Power Supply Current for a TTL HIGH input (VIN=3.4V) |
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DH |
= Duty Cycle for TTL inputs HIGH |
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NT |
= Number of TTL inputs at DH |
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ICCD |
= Dynamic Current caused by an input transition pair (HLH or LHL) |
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f0 |
= Clock frequency for registered devices, otherwise zero |
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f1 |
= |
Input signal frequency |
N1 |
= Number of inputs changing at f1 |
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
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