Texas Instruments CY74FCT480ATPC, CY74FCT480BTSOCT, CY74FCT480BTSOC, CY74FCT480BTQCT, CY74FCT480BTQC Datasheet

Data sheet acquired from Cypress Semiconductor Corporation.

Data sheet modified to remove devices not offered.

CY54/74FCT480T

SCCS025 - May 1993 - Revised March 2000

Dual 8-Bit Parity Generator/Checker

Features

•Function, pinout and drive compatible with FCT and F logic

•FCT-A speed at 7.5 ns max. (Com’l) FCT-B speed at 5.6 ns max. (Com’l)

•Reduced VOH (typically = 3.3V) versions of equivalent FCT functions

•Edge-rate control circuitry for significantly improved noise characteristics

•Power-off disable feature

•Matched rise and fall times

•ESD > 2000V

•Fully compatible with TTL input and output logic levels

• Sink Current	64 mA (Com’l),
	32 mA (Mil)
Source Current	32 mA (Com’l),
	12 mA (Mil)

•Two 8-bit parity generator/checkers

•Open drain Active LOW parity error output

•Expandable for larger word widths

Functional Description

The FCT480T is a high-speed dual 8-bit parity generator/checker. Each parity generator/checker accepts eight data bits and one parity bit as inputs, and generates a sum and parity error output. The FCT480T can be used in ODD parity systems. The parity error output is open-drain, designed for easy expansion of the word width by a wired-OR connection of several FCT480T type devices. Since additional logic is not needed, the parity generation or checking times remain the same as for an individual FCT480T device.

The outputs are designed with a power-off disable feature to allow for live insertion of boards.

Logic Block Diagram

A1

B1

C1

D1

E1

F1

G1

H1

PAR1

CHK/GEN

A2

B2

C2

D2

E2

F2

G2

H2

PAR2

Pin Configurations

LCC

Top View

							1	H G		NC F		E	D
							PAR
								1 1			1	1		1
							1110 9			8	7	6	5
	CHK/GEN														C1
							12							4
		ODD1													B1
							13							3
			GND												A1
							14							2
				NC											NC
							15							1
		ODD2													VCC
							16							28
		ERROR					17							27	A2
			PAR2				18							26	B2
							19 20 21 22 23 24 25
							2	2	2		2 2			2
							H	G	F	NC E D				C

FCT480T–2

ODD1

ERR

ODD2

FCT480T–1

DIP/SOIC/QSOP

Top View

		A1			1	24			VCC
					2	23
		B1							A2
					3
		C1				22			B2
					4	21
		D1							C2
					5	20
		E1							D2
					6
		F1				19			E2
		G1			7	18			F2
		H1			8
						17			G2
	PAR1				9	16			H2
CHK/GEN					10	15			PAR2
	ODD		1		11	14			ERROR
GND					12	13				2
									ODD

FCT480T–3

Copyright © 2000, Texas Instruments Incorporated

CY54/74FCT480T

Function Table

Inputs

Outputs

A1 to H1

A2 to H2

CHK/GEN

PAR1

PAR2

ODD1

ODD2

ERROR

Number of A1 to H1 Inputs

Number of A2 to H2 Inputs

H

H

H

L

L

H

HIGH is EVEN

HIGH is EVEN

L

H

H

L

L

H

L

L

H

L

L

L

H

H

L

L

X

X

H

H

L

Number of Inputs HIGH A2

H

H

H

L

H

L

to H2 is ODD

L

H

H

H

L

H

L

L

L

H

L

L

H

L

L

L

X

X

H

L

L

Number of A1 to H1 Inputs

Number of A2 to H2 Inputs

H

H

H

H

L

L

HIGH is ODD

HIGH is EVEN

L

H

L

L

H

H

L

H

H

L

L

L

L

H

L

L

X

X

L

H

L

Number of A2 to H2 Inputs

H

H

H

H

H

L

HIGH is ODD

L

H

L

H

L

H

L

H

L

L

L

L

L

L

H

L

X

X

L

L

H

Maximum Ratings[1, 2]

(Above which the useful life may be impaired. For user guidelines, not tested.)

Storage Temperature .................................	–65°C to +150°C
Ambient Temperature with	–65°C to +135°C
Power Applied .............................................
Supply Voltage to Ground Potential ...............	–0.5V to +7.0V
DC Input Voltage............................................	–0.5V to +7.0V
DC Output Voltage .........................................	–0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin).......		120 mA
Power Dissipation ..........................................................		0.5W

Static Discharge Voltage............................................	>2001V
(per MIL-STD-883, Method 3015)

Operating Range

		Ambient
Range	Range	Temperature	VCC
Commercial	All	–40°C to +85°C	5V ± 5%
Military[3]	All	–55°C to +125°C	5V ± 10%

Notes:

1.Unless otherwise noted, these limits are over the operating free-air temperature range.

2.Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.

3.TA is the “instant on” case temperature.

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CY54/74FCT480T

Electrical Characteristics Over the Operating Range

Parameter		Description		Test Conditions			Min.	Typ.[4]	Max.	Unit
VOH		Output HIGH Voltage	VCC = Min., IOH = –32 mA			Com’l	2.0			V
			VCC = Min., IOH = –15 mA			Com’l	2.4	3.3		V
			VCC = Min., IOH = –12 mA			Mil	2.4	3.3		V
VOL		Output LOW Voltage	VCC = Min., IOL = 64 mA			Com’l		0.3	0.55	V
			VCC = Min., IOL = 32 mA			Mil		0.3	0.55	V
VIH		Input HIGH Voltage					2.0			V
VIL		Input LOW Voltage							0.8	V
VH		Hysteresis[5]	All inputs					0.2		V
VIK		Input Clamp Diode Voltage	VCC = Min., IIN = –18 mA					–0.7	–1.2	V
II		Input HIGH Current	VCC = Max., VIN = VCC						5	A
IIH		Input HIGH Current	VCC = Max., VIN = 2.7V						±1	A
IIL		Input LOW Current	VCC = Max., VIN = 0.5V						±1	A
IOZH		Off State HIGH-Level Output	VCC = Max., VOUT = 2.7V						10	A
		Current
IOZL		Off State LOW-Level	VCC = Max., VOUT = 0.5V						–10	A
		Output Current
I	OS	Output Short Circuit Current[6]	V	= Max., V	= 0.0V		–60	–120	–225	mA
			CC	OUT
IOFF		Power-Off Disable	VCC = 0V, VOUT = 4.5V						±1	A

Capacitance[5]

Parameter	Description	Typ.[4]	Max.	Unit
CIN	Input Capacitance	5	10	pF
COUT	Output Capacitance	9	12	pF
Notes:

4.Typical values are at VCC=5.0V, TA=+25˚C ambient.

5.This parameter is specified but not tested.

6.Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last.

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