Texas Instruments CY74FCT573CTQC, CY74FCT573ATSOCT, CY74FCT573ATSOC, CY74FCT573ATQC, CY74FCT573ATPC Datasheet

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Texas Instruments CY74FCT573CTQC, CY74FCT573ATSOCT, CY74FCT573ATSOC, CY74FCT573ATQC, CY74FCT573ATPC Datasheet

Data sheet acquired from Cypress Semiconductor Corporation. Data sheet modified to remove devices not offered.

CY54/74FCT373T

CY54/74FCT573T

SCCS021 - May 1994 - Revised February 2000

8-Bit Latches

Features

Function and pinout compatible with FCT, and F logic

FCT-C speed at 4.2 ns max. (Com’l),

FCT-A speed at 5.2 ns max. (Com’l)

• Reduced V (typically = 3.3V) versions of equivalent

OH

FCT functions

Edge-rate control circuitry for significantly improved noise characteristics

Power-off disable feature

ESD > 2000V

Matched rise and fall times

Extended commercial range of40˚C to +85˚C

Fully compatible with TTL input and output logic levels

• Sink current

64 mA (Com’l), 32 mA (Mil)

Source current

32 mA (Com’l), 12 mA (Mil)

Functional Description

The FCT373T and FCT573T consist of eight latches with three-state outputs for bus organized applications. When latch enable (LE) is HIGH, the flip-flops appear transparent to the data. Data that meets the required set-up times are latched when LE transitions from HIGH to LOW. Data appears on the bus when the (OE) is LOW. When output enable is HIGH, the bus output is in the impedance state. In this mode, data may be entered into the latches. The FCT573T is identical to the FCT373T except for the flow-through pinout, which simplifies board design.

The outputs are designed with a power-off disable feature to allow for live insertion of boards.

Logic Block Diagram

D0

D1

D2

D3

D4

D5

D6

D7

LE

CP

D

CP

D

CP

D

CP

D

CP

D

CP

D

CP

D

CP

D

 

Q

 

Q

 

Q

 

Q

 

Q

 

Q

 

Q

 

Q

OE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

O0

 

O1

 

O2

 

O3

 

O4

 

O5

 

O6

 

O7

Pin Configurations

 

 

 

DIP/SOIC/QSOP

 

 

 

DIP/SOIC/QSOP

 

 

 

 

 

Top View

 

 

 

 

 

 

 

Top View

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

OE

1

 

20

 

VCC

OE

1

 

20

 

VCC

D0

 

 

 

 

 

 

 

 

 

 

 

 

 

 

O

2

 

19

 

O7

2

 

19

 

O0

0

 

 

 

D1

3

 

18

 

O1

D0

3

 

18

 

D7

 

 

 

 

 

 

D1

4

 

17

 

D6

D2

4

 

17

 

O2

 

 

 

 

 

FCT373T

 

 

D3

5

FCT573T

 

O3

O

5

 

O

 

16

 

1

 

 

16

 

6

D4

6

 

15

 

O4

O2

6

 

15

 

O5

 

 

D2

7

 

14

 

D5

D5

7

 

14

 

O5

D3

8

 

13

 

D4

D6

8

 

13

 

O6

O3

9

 

12

 

O4

D7

9

 

12

 

O7

 

 

GND

10

11

 

LE

GND

10

11

 

LE

 

 

 

 

 

 

 

 

 

 

 

Logic Symbol

D0 D1 D2 D3 D4 D5 D6 D7

LE

OE

O0 O1 O2 O3 O4 O5 O6 O7

Copyright © 2000, Texas Instruments Incorporated

CY54/74FCT373T

CY54/74FCT573T

Function Table[1]

 

 

 

Inputs

 

Outputs

 

 

 

 

 

 

 

 

 

LE

D

O

 

OE

 

 

 

 

 

 

L

H

H

H

 

 

 

 

 

 

L

H

L

L

 

 

 

 

 

 

L

L

X

Q0

 

H

X

X

Z

 

 

 

 

 

 

Maximum Ratings[2, 3]

(Above which the useful life may be impaired. For user guidelines, not tested.)

Storage Temperature .................................

–65°C to +150°C

Ambient Temperature with

–65°C to +135°C

Power Applied .............................................

Electrical Characteristics Over the Operating Range

Supply Voltage to Ground Potential...............

–0.5V to +7.0V

DC Input Voltage ...........................................

–0.5V to +7.0V

DC Output Voltage.........................................

–0.5V to +7.0V

DC Output Current (Maximum Sink Current/Pin) ......

120 mA

Power Dissipation ..........................................................

 

0.5W

Static Discharge Voltage............................................

 

>2001V

(per MIL-STD-883, Method 3015)

Operating Range

 

 

Ambient

 

Range

Range

Temperature

VCC

Commercial

T, AT, CT

–40°C to +85°C

5V ± 5%

 

 

 

 

Military[4]

All

–55°C to +125°C

5V ± 10%

Parameter

Description

 

 

Test Conditions

 

Min.

Typ.[5]

Max.

Unit

VOH

Output HIGH Voltage

VCC=Min., IOH=–32 mA

Com’l

2.0

 

 

V

 

 

 

VCC=Min., IOH=–15 mA

Com’l

2.4

3.3

 

V

 

 

 

VCC=Min., IOH=–12 mA

Mil

2.4

3.3

 

V

VOL

Output LOW Voltage

VCC=Min., IOL=64 mA

Com’l

 

0.3

0.55

V

 

 

 

VCC=Min., IOL=32 mA

Mil

 

0.3

0.55

V

VIH

Input HIGH Voltage

 

 

 

 

 

2.0

 

 

V

VIL

Input LOW Voltage

 

 

 

 

 

 

 

0.8

V

VH

Hysteresis[6]

All inputs

 

 

 

0.2

 

V

VIK

Input Clamp Diode Voltage

VCC=Min., IIN=–18 mA

 

 

–0.7

–1.2

V

II

Input HIGH Current

VCC=Max., VIN=VCC

 

 

 

5

A

IIH

Input HIGH Current

VCC=Max., VIN=2.7V

 

 

 

±1

A

IIL

Input LOW Current

VCC=Max., VIN=0.5V

 

 

 

±1

A

IOZH

Off State HIGH-Level Output

VCC=Max., VOUT=2.7V

 

 

 

10

A

 

 

Current

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IOZL

Off State LOW-Level

VCC=Max., VOUT=0.5V

 

 

 

–10

A

 

 

Output Current

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

I

OS

Output Short Circuit Current[7]

V

CC

=Max., V

0.0V

 

–60

–120

–225

mA

 

 

 

OUT=

 

 

 

 

 

 

IOFF

Power-Off Disable

VCC=0V, VOUT=4.5V

 

 

 

±1

A

Notes:

1.H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care

Z = HIGH Impedance

Qn = Previous state of flip flops (Qn-1)

2.Unless otherwise noted, these limits are over the operating free-air temperature range.

3.Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.

4.TA is the “instant on” case temperature.

5.Typical values are at VCC=5.0V, TA=+25˚C ambient.

6.This parameter is specified but not tested.

7.Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last.

2

CY54/74FCT373T

CY54/74FCT573T

Capacitance[6]

Parameter

 

Description

Typ.[5]

Max.

Unit

CIN

Input Capacitance

 

6

10

pF

COUT

Output Capacitance

 

8

12

pF

Power Supply Characteristics

Parameter

Description

Test Conditions

Typ.[5]

Max.

Unit

ICC

Quiescent Power Supply Current

VCC=Max., VIN ≤ 0.2V, VIN ≥ VCC – 0.2V

0.1

0.2

mA

ICC

Quiescent Power Supply Current

VCC=Max., VIN=3.4V, f1=0, Outputs Open[8]

0.5

2.0

mA

 

(TTL inputs HIGH)

 

 

 

 

 

 

 

 

 

 

ICCD

Dynamic Power Supply Current[9]

VCC=Max., One Input Toggling,

0.6

0.12

mA/MHz

 

 

50% Duty Cycle, Outputs Open,

 

 

 

 

 

OE=GND, VIN ≤ 0.2V or VIN ≥ VCC – 0.2V

 

 

 

IC

Total Power Supply Current[10]

VCC=Max., 50% Duty Cycle, Outputs Open,

0.7

1.4

mA

 

 

One Bit Toggling at f1=10 MHz,

 

 

 

 

 

OE=GND, LE=VCC

 

 

 

 

 

VIN ≤ 0.2V or VIN ≥ VCC – 0.2V

 

 

 

 

 

VCC=Max., 50% Duty Cycle, Outputs Open,

1.0

2.4

mA

 

 

One Bit Toggling at f1=10 MHz,

 

 

 

 

 

OE=GND, LE=VCC, VIN=3.4V or VIN=GND

 

 

 

 

 

VCC=Max., 50% Duty Cycle, Outputs Open,

1.3

2.6[11]

mA

 

 

Eight Bits Toggling at f1=2.5 MHz,

 

 

 

 

 

OE=GND, LE=VCC,

 

 

 

 

 

VIN ≤ 0.2V or VIN ≥ VCC – 0.2V

 

 

 

 

 

VCC=Max., 50% Duty Cycle, Outputs Open,

3.3

10.6[11]

mA

 

 

Eight Bits Toggling at f1=2.5 MHz,

 

 

 

 

 

OE=GND, LE=VCCVIN=3.4V or VIN=GND

 

 

 

Notes:

 

 

 

 

 

8.Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.

9.This parameter is not directly testable, but is derived for use in Total Power Supply calculations.

10. IC

= IQUIESCENT + IINPUTS + IDYNAMIC

IC

=

ICC+ ICCDHNT+ICCD(f0/2 + f1N1)

ICC

= Quiescent Current with CMOS input levels

ICC

= Power Supply Current for a TTL HIGH input (VIN=3.4V)

DH

= Duty Cycle for TTL inputs HIGH

NT

= Number of TTL inputs at DH

ICCD

= Dynamic Current caused by an input transition pair (HLH or LHL)

f0

= Clock frequency for registered devices, otherwise zero

f1

=

Input signal frequency

N1

=

Number of inputs changing at f1

All currents are in milliamps and all frequencies are in megahertz.

11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.

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