Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
CY74FCT2541T
SCCS041 - September 1994 - Revised March 2000
Features
•Function and pinout compatible with FCT and F logic
•FCT-C speed at 4.1 ns max. FCT-A speed at 4.8 ns max.
•25Ω output series to reduce transmission line reflection noise
•Reduced VOH (typically = 3.3V) versions of equivalent FCT functions
•Edge-rate control circuitry for significantly improved noise characteristics
•Power-off disable feature
•ESD > 2000V
•Matched rise and fall times
•Fully compatible with TTL input and output logic levels
• Sink current |
12 mA |
Source current |
15 mA |
8-Bit Buffer/Line Driver
•Extended commercial temp. range of –40˚C to +85˚C
•Three-state outputs
Functional Description
The FCT2541T is an octal buffer and line driver designed to be employed as a memory address driver, clock driver, and bus-oriented transmitter/receiver. On-chip termination resistors have been added to the outputs to reduce system noise caused by reflections. The FCT2541T can be used to replace the FCT541T to reduce noise in an existing design. The speed of the FCT2541T is comparable to bipolar logic counterparts while reducing power dissipation. The input and output voltage levels allow direct interface with TTL and CMOS devices without external components.
The outputs are designed with a power-off disable feature to allow for live insertion of boards.
Logic Block Diagram |
|
Pin Configurations |
||||
OEA |
OEB |
|
SOIC/QSOP |
|
||
|
|
|
|
|||
|
|
|
Top View |
|
||
D0 |
O0 |
OEA |
1 |
20 |
VCC |
|
D1 |
O1 |
D0 |
2 |
19 |
OE B |
|
D1 |
3 |
18 |
O0 |
|||
|
|
|||||
D2 |
O2 |
D2 |
4 |
17 |
O1 |
|
D3 |
O3 |
D3 |
5 |
16 |
O2 |
|
D4 |
6 |
15 |
O3 |
|||
|
|
|||||
D4 |
O4 |
D5 |
7 |
14 |
O4 |
|
D5 |
O5 |
D6 |
8 |
13 |
O5 |
|
D7 |
9 |
12 |
O6 |
|||
|
|
|||||
D6 |
O6 |
GND |
10 |
11 |
O7 |
|
|
|
|||||
D7 |
O7 |
|
|
FCT2541T–2 |
||
|
FCT2541T–3 |
|
|
|
|
]
Function Table[1]
|
|
|
Inputs |
|
|
||
|
|
|
|
|
|
|
|
|
|
A |
|
|
B |
D |
Output |
|
OE |
OE |
|||||
|
L |
|
L |
L |
L |
||
|
L |
|
L |
H |
H |
||
|
H |
|
H |
X |
Z |
||
|
|
|
|
|
|
|
|
Note:
1.H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care
Z = High Impedance
Copyright © 2000, Texas Instruments Incorporated
CY74FCT2541T
Maximum Ratings[2,3]
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature ..................................... |
−65°C to +150°C |
Ambient Temperature with |
−65°C to +135°C |
Power Applied .................................................. |
|
Supply Voltage to Ground Potential.................. |
−0.5V to +7.0V |
DC Input Voltage ................................................. |
−0.5V to +7.0V |
DC Output Voltage .............................................. |
−0.5V to +7.0V |
Electrical Characteristics Over the Operating Range
DC Output Current (Maximum Sink Current/Pin) ...... |
120 mA |
Power Dissipation .......................................................... |
0.5W |
Static Discharge Voltage............................................ |
>2001V |
(per MIL-STD-883, Method 3015)
Operating Range
|
Ambient |
|
Range |
Temperature |
VCC |
Commercial |
−40°C to +85°C |
5V ± 5% |
|
|
|
Parameter |
Description |
|
Test Conditions |
Min. |
Typ.[5] |
Max. |
Unit |
||
VOH |
Output HIGH Voltage |
VCC = Min., IOH = −15 mA |
2.4 |
3.3 |
|
V |
|||
VOL |
Output LOW Voltage |
VCC = Min., IOL = 12 mA |
|
0.3 |
0.55 |
V |
|||
ROUT |
Output Resistance |
VCC = Min., IOL = 12 mA |
20 |
25 |
40 |
Ω |
|||
VIH |
Input HIGH Voltage |
|
|
|
2.0 |
|
|
V |
|
VIL |
Input LOW Voltage |
|
|
|
|
|
0.8 |
V |
|
VH |
Hysteresis[6] |
All inputs |
|
|
0.2 |
|
V |
||
VIK |
Input Clamp Diode Voltage |
VCC = Min., IIN = −18 mA |
|
−0.7 |
−1.2 |
V |
|||
II |
Input HIGH Current |
VCC = Max., VIN = VCC |
|
|
5 |
µA |
|||
IIH |
Input HIGH Current |
VCC = Max., VIN = 2.7V |
|
|
±1 |
µA |
|||
IIL |
Input LOW Current |
VCC = Max., VIN = 0.5V |
|
|
±1 |
µA |
|||
IOZH |
Off State HIGH-Level |
VCC = Max., VOUT = 2.7V |
|
|
15 |
µA |
|||
|
|
Output Current |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|||
IOZL |
Off State LOW-Level |
VCC = Max., VOUT = 0.5V |
|
|
−15 |
µA |
|||
|
|
Output Current |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
I |
OS |
Output Short Circuit Current[7] |
V |
= Max., V |
= 0.0V |
−60 |
−120 |
−225 |
mA |
|
|
CC |
OUT |
|
|
|
|
|
|
IOFF |
Power-Off Disable |
VCC = 0V, VOUT = 4.5V |
|
|
±1 |
µA |
Capacitance[6]
Parameter |
Description |
Typ.[5] |
Max. |
Unit |
CIN |
Input Capacitance |
5 |
10 |
pF |
COUT |
Output Capacitance |
9 |
12 |
pF |
Notes: |
|
|
|
|
2.Unless otherwise noted, these limits are over the operating free-air temperature range.
3.Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
4.TA is the “instant on” case temperature.
5.Typical values are at VCC=5.0V, TA=+25˚C ambient.
6.This parameter is specified but not tested.
7.Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last.
2