Data sheet acquired from Cypress Semiconductor Corporation. |
CY74FCT16501T |
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Data sheet modified to remove devices not offered. |
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CY74FCT162501T |
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CY74FCT162H501T |
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18-Bit Registered Transceivers |
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SCCS057 - August 1994 - Revised March 2000 |
Features
•FCT-E speed at 3.8 ns
•Power-off disable outputs permits live insertion
•Edge-rate control circuitry for significantly improved noise characteristics
•Typical output skew < 250 ps
•ESD > 2000V
•TSSOP (19.6 mil pitch) and SSOP (25-mil pitch) packages
•Industrial temperature range of−40˚C to +85˚C
•VCC = 5V ± 10%
CY74FCT16501T Features: |
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• 64 mA sink current, 32 mA source current |
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• Typical V |
(ground bounce) <1.0V at V |
CC |
= 5V, |
OLP |
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TA = 25˚C
CY74FCT162501T Features:
•Balanced 24 mA output drivers
•Reduced system switching noise
• Typical V |
(ground bounce) <0.6V at V |
CC |
= 5V, |
OLP |
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TA= 25˚C |
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CY74FCT162H501T Features:
•Bus hold retains last active state
•Eliminates the need for external pull-up or pull-down resistors
Functional Description
These 18-bit universal bus transceivers can be operated in transparent, latched or clock modes by combining D-type latches and D-type flip-flops. Data flow in each direction is controlled by output enable (OEAB and OEBA), latch enable (LEAB and LEBA), and clock inputs (CLKAB and CLKBA). For A-to-B data flow, the device operates in transparent mode when LEAB is HIGH. When LEAB is LOW, the A data is latched if CLKAB is held at a HIGH or LOW logic level. If LEAB is LOW, the A bus data is stored in the latch/flip-flop on the LOW-to-HIGH transition of CLKAB. OEAB performs the output enable function on the B port. Data flow from B-to-A is similar to that of A-to-B and is controlled by OEBA, LEBA, and CLKBA. The output buffers are designed with a power-off disable feature to allow live insertion of boards.
The CY74FCT16501T is ideally suited for driving high-capacitance loads and low-impedance backplanes.
THE CY74FCT162501T has 24-mA balanced output drivers with current limiting resistors in the outputs. This reduces the need for external terminating resistors and provides for minimal undershoot and reduced ground bounce. The CY74FCT162501T is ideal for driving transmission lines.
The CY74FCT162H501T is a 24-mA balanced output part, that has “bus hold” on the data inputs. The device retains the input’s last state whenever the input goes to high impedance. This eliminates the need for pull-up/down resistors and prevents floating inputs.
Functional Block Diagram |
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Pin Configuration |
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SSOP/TSSOP |
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Top View |
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OEAB |
1 |
56 |
GND |
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LEAB |
2 |
55 |
CLKAB |
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A1 |
3 |
54 |
B1 |
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GND |
4 |
53 |
GND |
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OEAB |
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A2 |
5 |
52 |
B2 |
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A3 |
6 |
51 |
B3 |
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CLKBA |
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VCC |
7 |
50 |
VCC |
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LEBA |
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A4 |
8 |
49 |
B4 |
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A5 |
9 |
48 |
B5 |
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OEBA |
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A6 |
10 |
47 |
B6 |
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GND |
11 |
46 |
GND |
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CLKAB |
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A7 |
12 |
45 |
B7 |
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LEAB |
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A8 |
13 |
44 |
B8 |
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A9 |
14 |
43 |
B9 |
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C |
C |
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A10 |
15 |
42 |
B10 |
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B1 |
A11 |
16 |
41 |
B11 |
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A 1 |
D |
D |
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A12 |
17 |
40 |
B12 |
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GND |
18 |
39 |
GND |
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C |
C |
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A13 |
19 |
38 |
B13 |
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A14 |
20 |
37 |
B14 |
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D |
D |
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A15 |
21 |
36 |
B15 |
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VCC |
22 |
35 |
VCC |
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A 16 |
23 |
34 |
B16 |
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A 17 |
24 |
33 |
B17 |
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TO 17 OTHER CHANNELS |
FCT16501-1 |
GND |
25 |
32 |
GND |
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A 18 |
26 |
31 |
B18 |
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OEBA |
27 |
30 |
CLKBA |
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LEBA |
28 |
29 |
GND |
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FCT16501-2 |
Copyright © 2000, Texas Instruments Incorporated
CY74FCT16501T
CY74FCT162501T
CY74FCT162H501T
Pin Description
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Name |
Description |
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OEAB |
A-to-B Output Enable Input |
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B-to-A Output Enable Input (Active LOW) |
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OEBA |
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LEAB |
A-to-B Latch Enable Input |
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LEBA |
B-to-A Latch Enable Input |
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CLKAB |
A-to-B Clock Input |
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CLKBA |
B-to-A Clock Input |
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A |
A-to-B Data Inputs or B-to-A Three-State |
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Outputs[1] |
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B |
B-to-A Data Inputs or A-to-B Three-State |
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Outputs[1] |
Maximum Ratings[6, 7]
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature .................................... |
−55°C to +125°C |
Ambient Temperature with |
−55°C to +125°C |
Power Applied.................................................. |
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DC Input Voltage................................................. |
−0.5V to +7.0V |
DC Output Voltage.............................................. |
−0.5V to +7.0V |
DC Output Current |
−60 to +120 mA |
(Maximum Sink Current/Pin)........................... |
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Power Dissipation.......................................................... |
1.0W |
Static Discharge Voltage ........................................... |
>2001V |
(per MIL-STD-883, Method 3015) |
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Function Table[2, 3]
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Inputs |
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Outputs |
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OEAB |
LEAB |
CLKAB |
A |
B |
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L |
X |
X |
X |
Z |
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H |
H |
X |
L |
L |
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H |
H |
X |
H |
H |
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H |
L |
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L |
L |
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H |
L |
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H |
H |
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H |
L |
L |
X |
B[4] |
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H |
L |
H |
X |
B[5] |
Notes:
Operating Range
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Ambient |
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Temperature |
VCC |
Industrial |
−40°C to +85°C |
5V ± 10% |
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1.On the 74FCT162H501T these pins have bus hold.
2.A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA, LEBA, and CLKBA.
3.H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care
Z = High-impedance
= LOW-to-HIGH Transition
4.Output level before the indicated steady-state input conditions were established.
5.Output level before the indicated steady-state input conditions were established, provided that CLKAB was HIGH before LEAB went LOW.
6.Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature range.
7.Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
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CY74FCT16501T
CY74FCT162501T
CY74FCT162H501T
Electrical Characteristics Over the Operating Range
Parameter |
Description |
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Test Conditions |
Min. |
Typ.[8] |
Max. |
Unit |
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VIH |
Input HIGH Voltage |
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2.0 |
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V |
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VIL |
Input LOW Voltage |
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0.8 |
V |
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VH |
Input Hysteresis[9] |
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100 |
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mV |
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VIK |
Input Clamp Diode Voltage |
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VCC=Min., IIN=−18 mA |
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−0.7 |
−1.2 |
V |
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IIH |
Input HIGH Current |
Standard |
VCC=Max., VI=VCC |
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±1 |
µA |
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Bus Hold |
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±100 |
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IIL |
Input LOW Current |
Standard |
VCC=Max., VI=GND |
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±1 |
µA |
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Bus Hold |
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±100 |
µA |
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I |
BBH |
Bus Hold Sustain Current on Bus Hold Input[10] |
V |
CC |
=Min., |
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V |
=2.0V |
−50 |
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µA |
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I |
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IBBL |
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VI=0.8V |
+50 |
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µA |
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IBHHO |
Bus Hold Overdrive Current on Bus Hold In- |
VCC=Max., VI=1.5V |
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TBD |
mA |
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IBHLO |
put[10] |
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IOZH |
High Impedance Output Current |
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VCC=Max., VOUT=2.7V |
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±1 |
µA |
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(Three-State Output pins) |
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IOZL |
High Impedance Output Current |
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VCC=Max., VOUT=0.5V |
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±1 |
µA |
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(Three-State Output pins) |
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I |
OS |
Short Circuit Current[11] |
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V |
CC |
=Max., V |
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=GND |
−80 |
−140 |
−200 |
mA |
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OUT |
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O |
Output Drive Current[11] |
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V |
CC |
=Max., V |
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=2.5V |
−50 |
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−180 |
mA |
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OUT |
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I |
OFF |
Power-Off Disable |
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V |
CC |
=0V, V |
≤4.5V[12] |
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±1 |
µA |
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OUT |
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Output Drive Characteristics for CY74FCT16501T
Parameter |
Description |
Test Conditions |
Min. |
Typ.[8] |
Max. |
Unit |
VOH |
Output HIGH Voltage |
VCC=Min., IOH=−3 mA |
2.5 |
3.5 |
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V |
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VCC=Min., IOH=−15 mA |
2.4 |
3.5 |
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VCC=Min., IOH=−32 mA |
2.0 |
3.0 |
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VOL |
Output LOW Voltage |
VCC=Min., IOL=64 mA |
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0.2 |
0.55 |
V |
Output Drive Characteristics for CY74FCT162501T, CY74FCT162H501T
Parameter |
Description |
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Test Conditions |
Min. |
Typ.[8] |
Max. |
Unit |
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IODL |
Output LOW Current[11] |
VCC=5V, VIN=VIH or VIL, VOUT=1.5V |
60 |
115 |
150 |
mA |
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ODH |
Output HIGH Current[11] |
V |
CC |
=5V, V |
=V |
IH |
or V |
IL |
, V =1.5V |
−60 |
−115 |
−150 |
mA |
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IN |
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OUT |
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VOH |
Output HIGH Voltage |
VCC=Min., IOH=−24 mA |
2.4 |
3.3 |
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VOL |
Output LOW Voltage |
VCC=Min., IOL=24 mA |
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0.3 |
0.55 |
V |
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Notes: |
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8.Typical values are at VCC= 5.0V, TA= +25˚C ambient.
9.This parameter is specified but not tested.
10.Pins with bus hold are described in Pin Description.
11.Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last.
12.Tested at +25˚C.
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