Texas Instruments CY74FCT574TSOCT, CY74FCT574TSOC, CY74FCT574TQCT, CY74FCT574TQC, CY74FCT574CTSOCT Datasheet

Data sheet acquired from Cypress Semiconductor Corporation. Data sheet modified to remove devices not offered.

CY54/74FCT374T

CY54/74FCT574T

SCCS022 - May 1994 - Revised February 2000

8-Bit Registers

Features

•Function, pinout, and drive compatible with FCT and F logic

•FCT-C speed at 5.2 ns max. (Com’l)

FCT-A speed at 6.5 ns max. (Com’l)

• Reduced V (typically = 3.3V) versions of equivalent

OH

FCT functions

•Edge-rate control circuitry for significantly improved noise characteristics

•Power-off disable feature

•Matched rise and fall times

•Fully compatible with TTL input and output logic levels

•ESD > 2000V

•Extended commercial range of−40˚C to +85˚C

• Sink Current	64 mA (Com’l), 32 mA (Mil)
Source Current	32 mA (Com’l), 12 mA (Mil)

•Edge-triggered D-type inputs

•250 MHz typical toggle rate

Logic Block Diagram

D0

D1

D2

D3

D4

D5

D6

D7

CP

CP

D

CP

D

CP

D

CP

D

CP

D

CP

D

CP

D

CP

D

Q

Q

Q

Q

Q

Q

Q

Q

OE

O0

O1

O2

O3

O4

O5

O6

O7

FCT374T–6

Pin Configurations

DIP/SOIC/QSOP

DIP/SOIC/QSOP

LCC

Top View

LCC

Top View

Top View

Top View

OE

1

20

VCC

OE

1

20

VCC

3

2

2

1

1

O0

2

19

O7

6

5

4

3

2

D0

2

19

O0

D

D

O

O

D

D0

3

18

D7

D

D

D

D

D

D1

3

18

O1

8

7

6

5

4

8

7

6

5

4

D1

4

17

D6

D7

D1

D2

4

17

O2

O3

D0

9

3

9

3

O1

5

16

O6

GND

D0

D3

5

FCT574T16

O3

GND

O0

10

2

10

FCT374T

2

O2

6

FCT374T15

O5

CP

FCT574T

OE

D4

6

O4

CP

11

OE

11

1

15

O4

1

VCC

D2

7

14

D5

O7

12

20

VCC

D5

7

14

O5

12

20

D4 13

19

O7

D3

8

13

D4

O6 13

14

1516

19

O0

D6

8

13

O6

14

1516

17 18

O3

9

12

O4

17 18

D7

9

12

O7

5

5

6

6

7

GND

10

11

CP

5

4

3

2

1

GND

10

11

CP

D

O

O

D

D

O

O

O

O

O

FCT374T–1

FCT374T–2

FCT374T–3

FCT374T–4

Logic Symbol

D0

D1

D2

D3

D4

D5

D6

D7

CP

OE

O0

O1

O2

O3

O4

O5

O6

O7

FCT374T–5

Copyright © 2000, Texas Instruments Incorporated

CY54/74FCT374T

CY54/74FCT574T

Functional Description

The FCT374T and FCT574T are high-speed low-power octal D-type flip-flops featuring separate D-type inputs for each flip-flop. Both devices have three-state outputs for bus oriented applications. A buffered clock (CP) and output enable (OE) are common to all flip-flops. The FCT574T is identical to FCT374T except for flow-through pinout to simplify board design. The eight flip-flops contained in the FCT374T and FCT574T will store the state of their individual D inputs that meet the set-up and hold time requirements on the LOW-to-HIGH clock (CP) transition. When OE is LOW, the contents of the eight flip-flops are available at the outputs. When OE is HIGH, the outputs will be in the high-impedance state. The state of output enable does not affect the state of the flip-flops.

The outputs are designed with a power-off disable feature to allow for live insertion of boards.

Maximum Ratings[2, 3]

(Above which the useful life may be impaired. For user guidelines, not tested.)

Storage Temperature ..................................	-65°C to +150°C
Ambient Temperature with	–65°C to +135°C
Power Applied.............................................
Supply Voltage to Ground Potential...............	–0.5V to +7.0V
DC Input Voltage ...........................................	–0.5V to +7.0V
DC Output Voltage.........................................	–0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ......		120 mA
Power Dissipation ..........................................................		0.5W
Static Discharge Voltage............................................		>2001V
(per MIL-STD-883, Method 3015)

Function Table[1]

		Inputs		Outputs
D	CP		OE	O
H			L	H
L			L	L
X	X		H	Z

Electrical Characteristics Over the Operating Range

Operating Range

		Ambient
Range	Range	Temperature	VCC
Commercial	T, AT, CT	–40°C to +85°C	5V ± 5%
Military[4]	All	–55°C to +125°C	5V ± 10%

Parameter		Description			Test Conditions		Min.	Typ.[5]	Max.	Unit
VOH		Output HIGH Voltage	VCC=Min., IOH=–32 mA			Com’l	2.0			V
			VCC=Min., IOH=–15 mA			Com’l	2.4	3.3		V
			VCC=Min., IOH=–12 mA			Mil	2.4	3.3		V
VOL		Output LOW Voltage	VCC=Min., IOL=64 mA			Com’l		0.3	0.55	V
			VCC=Min., IOL=32 mA			Mil		0.3	0.55	V
VIH		Input HIGH Voltage					2.0			V
VIL		Input LOW Voltage							0.8	V
VH		Hysteresis[6]	All inputs					0.2		V
VIK		Input Clamp Diode Voltage	VCC=Min., IIN=–18 mA					–0.7	–1.2	V
II		Input HIGH Current	VCC=Max., VIN=VCC						5	A
IIH		Input HIGH Current	VCC=Max., VIN=2.7V						±1	A
IIL		Input LOW Current	VCC=Max., VIN=0.5V						±1	A
IOZH		Off State HIGH-Level Output	VCC = Max., VOUT = 2.7V						10	A
		Current
IOZL		Off State LOW-Level	VCC = Max., VOUT = 0.5V						–10	A
		Output Current
I	OS	Output Short Circuit Current[7]	V	CC	=Max., V =0.0V		–60	–120	–225	mA
					OUT
IOFF		Power-Off Disable	VCC=0V, VOUT=4.5V						±1	A

Notes:

1.H = HIGH Voltage Level. L = LOW Voltage Level X = Don’t Care Z = HIGH Impedance = LOW-to-HIGH clock transition

2.Unless otherwise noted, these limits are over the operating free-air temperature range.

3.Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.

4.TA is the “instant on” case temperature.

5.Typical values are at VCC=5.0V, TA=+25˚C ambient.

6.This parameter is specified but not tested.

7.Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameters tests. In any sequence of parameter tests, IOS tests should be performed last.

2

CY54/74FCT374T

CY54/74FCT574T

Capacitance[2]

Parameter		Description	Typ.[5]	Max.	Unit
CIN	Input Capacitance		5	10	pF
COUT	Output Capacitance		9	12	pF

Power Supply Characteristics

Parameter		Description			Test Conditions	Typ.[5]	Max.	Unit
ICC		Quiescent Power Supply Current	VCC=Max., VIN≤0.2V, VIN≥VCC–0.2V			0.1	0.2	mA
I	CC	Quiescent Power Supply Current	V	CC	=Max., V =3.4V,[8]	0.5	2.0	mA
		(TTL inputs HIGH)			IN
			f1=0, Outputs Open
ICCD		Dynamic Power Supply Current[9]	VCC=Max., One Bit Toggling,			0.06	0.12	mA/MHz
			50% Duty Cycle, Outputs Open,
			OE=GND, VIN≤0.2V or VIN≥VCC–0.2V
IC		Total Power Supply Current[10]	VCC=Max., f0=10 MHz,			0.7	1.4	mA
			50% Duty Cycle, Outputs Open,
			One Bit Toggling at f1=5 MHz,
			OE=GND, VIN≤0.2V or VIN≥VCC–0.2V
			VCC=Max., f0=10 MHz,			1.2	3.4	mA
			50% Duty Cycle, Outputs Open,
			One Bit Toggling at f1=5 MHz,
			OE=GND, VIN=3.4V or VIN=GND
			VCC=Max., f0=10 MHz,			1.6	3.2[11]	mA
			50% Duty Cycle, Outputs Open,
			Eight Bits Toggling at f1=2.5 MHz,
			OE=GND, VIN≤0.2V or VIN≥VCC–0.2V
			VCC=Max., f0=10 MHz,			3.9	12.2[11]	mA
			50% Duty Cycle, Outputs Open,
			Eight Bits Toggling at f1=2.5 MHz,
			OE=GND, VIN=3.4V or VIN=GND
Notes:

8.Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.

9.This parameter is not directly testable, but is derived for use in Total Power Supply calculations.

10. IC	=	IQUIESCENT + IINPUTS + IDYNAMIC
IC	=	ICC+ ICCDHNT+ICCD(f0/2 + f1N1)
ICC	=	Quiescent Current with CMOS input levels
ICC =		Power Supply Current for a TTL HIGH input (VIN=3.4V)
DH	=	Duty Cycle for TTL inputs HIGH
NT	=	Number of TTL inputs at DH
ICCD =		Dynamic Current caused by an input transition pair (HLH or LHL)
f0	=	Clock frequency for registered devices, otherwise zero
f1	=	Input signal frequency
N1	=	Number of inputs changing at f1

All currents are in milliamps and all frequencies are in megahertz.

11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.

3