Texas Instruments SN74ABT823DW, SN74ABT823DWR, SN74ABT823NT, SN74ABT823DBLE, SN74ABT823DBR Datasheet

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SN54ABT823, SN74ABT823

 

9-BIT BUS-INTERFACE FLIP-FLOPS

 

 

 

 

 

WITH 3-STATE OUTPUTS

 

SCBS158E ± JANUARY 1991 ± REVISED MAY 1997

 

 

 

 

 

 

 

 

 

D State-of-the-Art EPIC-ΙΙB BiCMOS Design

SN54ABT823 . . . JT OR W PACKAGE

Significantly Reduces Power Dissipation

SN74ABT823 . . . DB, DW, OR NT PACKAGE

D ESD Protection Exceeds 2000 V Per

 

 

 

 

(TOP VIEW)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

MIL-STD-883, Method 3015; Exceeds 200 V

 

 

 

 

 

 

VCC

 

 

OE

 

1

24

Using Machine Model (C = 200 pF, R = 0)

 

 

1D

 

2

23

1Q

D Latch-Up Performance Exceeds 500 mA Per

 

 

2D

 

3

22

2Q

JEDEC Standard JESD-17

 

 

3D

 

4

21

3Q

D Typical VOLP (Output Ground Bounce) < 1 V

 

 

4D

 

5

20

4Q

at VCC = 5 V, TA = 25°C

 

 

5D

 

6

19

5Q

 

 

6D

 

 

 

6Q

 

 

 

7

18

D High-Impedance State During Power Up

 

 

 

 

 

7D

 

 

 

7Q

 

 

 

8

17

and Power Down

 

 

 

 

 

8D

 

 

 

8Q

 

 

 

9

16

D High-Drive Outputs (±32-mA IOH, 64-mA IOL)

 

 

 

 

 

9D

 

 

 

9Q

 

 

 

10

15

D Buffered Control Inputs to Reduce

 

 

 

 

 

 

 

 

 

CLR

 

11

14

 

CLKEN

 

 

dc Loading Effects

GND

 

 

 

CLK

 

12

13

DPackage Options Include Plastic Small-Outline (DW) and Shrink

Small-Outline (DB) Packages, Ceramic Chip

 

SN54ABT823 . . . FK PACKAGE

Carriers (FK) and Flatpacks (W), and

 

 

 

(TOP VIEW)

 

 

 

 

 

 

 

 

CC

 

 

Standard Plastic (NT) and Ceramic (JT)

 

 

 

OE

NC

 

 

 

2D

1D

V 1Q

2Q

 

DIPs

 

 

 

 

 

 

 

 

 

 

 

 

description

 

3D

4

3

2

1

28 27 26

3Q

 

5

 

 

 

 

25

These 9-bit flip-flops feature 3-state

outputs

4D

6

 

 

 

 

24

4Q

5D

7

 

 

 

 

23

5Q

designed specifically for driving highly capacitive

 

 

 

 

NC

8

 

 

 

 

22

NC

or relatively low-impedance loads. They are

 

 

 

 

6D

9

 

 

 

 

21

6Q

particularly suitable for implementing wider buffer

 

 

 

 

7D

10

 

 

 

 

20

7Q

registers, I/O ports, bidirectional bus drivers with

 

 

 

 

8D

11

 

 

 

 

19

8Q

parity, and working registers.

 

 

 

 

 

 

 

12 13 14 15 16 17 18

 

With the clock-enable (CLKEN) input low, the nine

 

9D

CLR

GND

NC

CLK CLKEN

9Q

 

low-to-high transitions of the clock. Taking CLKEN

 

 

D-type edge-triggered flip-flops enter data on the

 

 

 

 

 

 

 

 

high disables the clock buffer, thus latching the

NC ± No internal connection

 

 

outputs. Taking the clear (CLR) input low causes

 

 

 

 

 

 

 

 

 

 

the nine Q outputs to go low, independently of the

 

 

 

 

 

 

 

 

clock.

 

 

 

 

 

 

 

 

 

A buffered output-enable (OE) input can be used to place the nine outputs in either a normal logic state (high or low logic level) or a high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without need for interface or pullup components.

When VCC is between 0 and 2.1 V, the device is in the high-impedance state during power up or power down.

However, to ensure the high-impedance state above 2.1 V, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The SN54ABT823 is characterized for operation over the full military temperature range of ±55°C to 125°C. The SN74ABT823 is characterized for operation from ±40°C to 85°C.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

EPIC-ΙΙB is a trademark of Texas Instruments Incorporated.

PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.

Copyright 1997, Texas Instruments Incorporated

POST OFFICE BOX 655303 DALLAS, TEXAS 75265

1

SN54ABT823, SN74ABT823

9-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS

SCBS158E ± JANUARY 1991 ± REVISED MAY 1997

FUNCTION TABLE (each flip-flop)

 

 

 

 

INPUTS

 

 

OUTPUT

 

 

 

 

 

 

 

CLK

D

Q

 

OE

 

CLR

 

CLKEN

 

 

 

 

 

 

 

 

 

 

 

L

 

L

 

X

X

X

L

 

L

 

H

 

L

H

H

 

L

 

H

 

L

L

L

 

L

 

H

 

H

X

X

Q0

 

H

 

X

 

X

X

X

Z

 

 

 

 

 

 

 

 

 

 

logic symbol²

 

 

 

1

EN

 

 

 

 

 

OE

 

 

 

 

 

 

 

11

 

 

 

 

 

R

 

 

 

CLR

 

 

 

 

 

 

 

 

 

14

G1

 

 

 

CLKEN

 

 

 

 

 

 

 

 

13

 

 

 

 

 

 

CLK

 

 

1C2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

2

 

 

 

23

 

 

 

1D

 

2D

 

 

1Q

 

 

 

3

 

 

 

22

 

 

 

 

 

 

 

2D

 

 

 

 

 

2Q

 

 

 

 

 

4

 

 

 

21

 

 

 

 

 

 

 

3D

 

 

 

 

 

3Q

 

 

 

 

20

5

 

 

 

4Q

 

 

 

 

 

4D

 

 

 

 

 

 

 

 

 

 

6

 

 

 

19

 

 

 

 

 

 

 

5D

 

 

 

 

 

5Q

 

 

 

 

18

7

 

 

 

6Q

 

 

 

 

 

6D

 

 

 

 

 

 

 

17

8

 

 

 

7Q

 

 

 

 

 

7D

 

 

 

 

 

 

 

 

 

16

9

 

 

 

8Q

 

 

 

 

 

8D

 

 

 

 

 

 

 

 

 

 

10

 

 

 

15

 

 

 

 

 

 

 

9D

 

 

 

 

 

9Q

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

² This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers shown are for the DB, DW, JT, NT, and W packages.

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POST OFFICE BOX 655303 DALLAS, TEXAS 75265

Texas Instruments SN74ABT823DW, SN74ABT823DWR, SN74ABT823NT, SN74ABT823DBLE, SN74ABT823DBR Datasheet

SN54ABT823, SN74ABT823 9-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS

SCBS158E ± JANUARY 1991 ± REVISED MAY 1997

logic diagram (positive logic)

OE

1

 

 

 

 

 

 

 

CLR

11

 

 

 

 

 

 

 

CLKEN

14

 

 

 

 

 

 

 

CLK

13

R

 

 

 

 

 

 

C1

23

 

 

 

1Q

 

 

 

1D

2

1D

 

 

 

 

 

To Eight Other Channels

Pin numbers shown are for the DB, DW, JT, NT, and W packages.

absolute maximum ratings over operating free-air temperature range (unless otherwise noted)²

Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. ±0.5 V to 7

V

Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. ±0.5 V to 7

V

Voltage range applied to any output in the high or power-off state, VO . . . . . . . . . . . . . . . . . . .

±0.5 V to 5.5

V

Current into any output in the low state, IO: SN54ABT823 . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . . 96 mA

SN74ABT823 . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . 128 mA

Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . ±18 mA

Output clamp current, IOK (VO < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . ±50 mA

Package thermal impedance, θJA (see Note 2): DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . 104°C/W

DW package . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . 81°C/W

NT package . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . 67°C/W

Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

±65°C to 150°C

²Stresses beyond those listed under ªabsolute maximum ratingsº may cause permanent damage to the device. This is a stress ratingonly, and functional operation of the device at these or any other conditions beyond those indicated in the ªrecommended operating conditionsº section of

this specification is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.

2.The package thermal impedance is calculated in accordance with EIA/JEDEC Std JESD51, except for through-hole packages, which use a trace length of zero.

POST OFFICE BOX 655303 DALLAS, TEXAS 75265

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