Texas Instruments SN74ABT533ADBLE, SN74ABT533ADBR, SN74ABT533ADW, SN74ABT533ADWR, SN74ABT533AN Datasheet

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SN54ABT533, SN74ABT533A

 

OCTAL TRANSPARENT D-TYPE LATCHES

 

WITH 3-STATE OUTPUTS

 

SCBS186D ± JANUARY 1991 ± REVISED JANUARY 1997

 

 

 

D State-of-the-Art EPIC-ΙΙB BiCMOS Design

SN54ABT533 . . . J OR W PACKAGE

Significantly Reduces Power Dissipation

SN74ABT533A . . . DB, DW, N, OR PW PACKAGE

 

(TOP VIEW)

DLatch-Up Performance Exceeds 500 mA Per

JEDEC Standard JESD-17

 

 

 

 

 

 

 

 

 

OE

1

20

VCC

D Typical VOLP (Output Ground Bounce) < 1 V

 

 

 

 

 

 

 

 

 

 

1Q

 

2

19

8Q

at VCC = 5 V, TA = 25°C

 

1D

3

18

8D

D High-Drive Outputs (±32-mA IOH, 64-mA IOL)

 

2D

4

17

7D

 

 

 

 

 

 

 

 

 

 

D ESD Protection Exceeds 2000 V Per

 

2Q

 

5

16

7Q

 

 

 

 

 

 

 

 

 

 

MIL-STD-883, Method 3015; Exceeds 200 V

 

3Q

 

6

15

6Q

Using Machine Model (C = 200 pF, R = 0)

 

3D

7

14

6D

D Package Options Include Plastic

 

4D

8

13

5D

 

 

 

 

 

 

 

 

 

 

4Q

9

12

5Q

Small-Outline (DW), Shrink Small-Outline

 

GND

10

11

LE

(DB), and Thin Shrink Small-Outline (PW)

 

 

 

 

 

 

 

 

 

Packages, Ceramic Chip Carriers (FK),

SN54ABT533 . . . FK PACKAGE

Plastic (N) and Ceramic (J) DIPs, and

Ceramic Flat (W) Package

 

 

 

 

(TOP VIEW)

 

 

 

 

 

 

 

 

 

 

 

 

description

These octal transparent D-type latches with 3-state outputs are designed specifically for driving highly capacitive or relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

When the latch-enable (LE) input is high, the Q outputs follow the complements of the data

(D) inputs. When LE is taken low, the Q outputs are latched at the inverse of the levels at the D inputs.

 

1D

1Q

OE

CC

8Q

 

 

V

 

2D

3

2

1

20 19

8D

4

 

 

 

18

2Q

5

 

 

 

17

7D

3Q

6

 

 

 

16

7Q

3D

7

 

 

 

15

6Q

4D

8

10 11

 

14

6D

 

9

12 13

 

 

4Q

GND

LE

5Q

5D

 

A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or a high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without need for interface or pullup components.

OE does not affect the internal operations of the latches. Previously stored data can be retained or new data can be entered while the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The SN54ABT533 is characterized for operation over the full military temperature range of ±55°C to 125°C. The SN74ABT533A is characterized for operation from ±40°C to 85°C.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

EPIC-ΙΙB is a trademark of Texas Instruments Incorporated.

PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.

Copyright 1997, Texas Instruments Incorporated

POST OFFICE BOX 655303 DALLAS, TEXAS 75265

1

SN54ABT533, SN74ABT533A

OCTAL TRANSPARENT D-TYPE LATCHES

WITH 3-STATE OUTPUTS

SCBS186D ± JANUARY 1991 ± REVISED JANUARY 1997

 

 

 

FUNCTION TABLE

 

 

 

(each latch)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

INPUTS

 

OUTPUT

 

 

 

 

LE

D

 

Q

 

 

 

OE

 

 

 

 

 

 

 

 

 

 

 

 

L

H

H

 

L

 

 

 

L

H

L

 

H

 

 

 

L

L

X

 

 

 

 

 

 

Q

0

 

 

 

H

X

X

 

Z

 

 

 

 

 

 

 

 

 

 

logic symbol²

 

logic diagram (positive logic)

1

 

 

 

 

OE

1

 

EN

 

 

 

 

 

OE

 

 

 

 

 

 

11

 

 

 

 

LE

11

 

LE

C1

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

C1

2

3

 

 

2

 

 

1Q

 

 

 

 

3

 

1D

1D

1

 

1Q

1D

 

 

1D

 

4

 

 

5

 

 

 

 

2Q

 

 

 

2D

 

 

 

 

 

 

7

 

 

6

 

 

 

 

3D

 

 

9

3Q

 

 

 

8

 

 

 

 

 

 

4D

 

 

12

4Q

 

To Seven Other Channels

 

13

 

 

 

 

 

5D

 

 

15

5Q

 

 

 

14

 

 

6Q

 

 

 

6D

 

 

16

 

 

 

17

 

 

 

 

 

 

7D

 

 

19

7Q

 

 

 

18

 

 

 

 

 

 

8D

 

 

 

8Q

 

 

 

²This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.

absolute maximum ratings over operating free-air temperature range (unless otherwise noted)³

Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±0.5 V to 7 V Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±0.5 V to 7 V Voltage range applied to any output in the high or power-off state, VO . . . . . . . . . . . . . . . . . . . . ±0.5 V to 5.5 V

Current into any output in the low state, IO: SN54ABT533 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96 mA SN74ABT533A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128 mA

Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±18 mA Output clamp current, IOK (VO < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Package thermal impedance, θJA (see Note 2): DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115°C/W DW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97°C/W

N package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67°C/W PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128°C/W Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±65°C to 150°C

³Stresses beyond those listed under ªabsolute maximum ratingsº may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under ªrecommended operating conditionsº is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.

2.The package thermal impedance is calculated in accordance with EIA/JEDEC Std JESD51, except for through-hole packages, which use a trace length of zero.

2

POST OFFICE BOX 655303 DALLAS, TEXAS 75265

Texas Instruments SN74ABT533ADBLE, SN74ABT533ADBR, SN74ABT533ADW, SN74ABT533ADWR, SN74ABT533AN Datasheet

SN54ABT533, SN74ABT533A

OCTAL TRANSPARENT D-TYPE LATCHES

WITH 3-STATE OUTPUTS

SCBS186D ± JANUARY 1991 ± REVISED JANUARY 1997

recommended operating conditions (see Note 3)

 

 

SN54ABT533

SN74ABT533A

UNIT

 

 

 

 

 

 

 

 

MIN

MAX

MIN

MAX

 

 

 

 

 

 

 

 

 

 

VCC

Supply voltage

4.5

5.5

4.5

5.5

V

VIH

High-level input voltage

2

 

2

 

V

VIL

Low-level input voltage

 

0.8

 

0.8

V

VI

Input voltage

0

VCC

0

VCC

V

IOH

High-level output current

 

±24

 

±32

mA

IOL

Low-level output current

 

48

 

64

mA

t/ v

Input transition rise or fall rate

 

10

 

10

ns/V

 

 

 

 

 

 

 

TA

Operating free-air temperature

±55

125

±40

85

°C

NOTE 3: Unused inputs must be held high or low to prevent them from floating.

electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)

PARAMETER

TEST CONDITIONS

 

TA = 25°C

 

SN54ABT533

 

SN74ABT533A

UNIT

MIN

TYP²

MAX

MIN

MAX

 

MIN

MAX

 

 

 

 

 

 

VIK

VCC = 4.5 V,

II = ±18 mA

 

 

 

±1.2

 

±1.2

 

 

±1.2

V

 

VCC = 4.5 V,

IOH = ±3 mA

 

2.5

 

 

2.5

 

 

 

2.5

 

 

VOH

VCC = 5 V,

IOH = ±3 mA

 

3

 

 

3

 

 

 

3

 

V

VCC = 4.5 V

IOH = ±24 mA

 

2

 

 

2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IOH = ±32 mA

 

2*

 

 

 

 

 

 

2

 

 

 

 

 

 

 

 

 

 

 

 

 

VOL

VCC = 4.5 V

IOL = 48 mA

 

 

 

0.55

 

0.55

 

 

 

V

IOL = 64 mA

 

 

 

0.55*

 

 

 

 

 

0.55

 

 

 

 

 

 

 

 

 

 

 

Vhys

 

 

 

 

100

 

 

 

 

 

 

 

mV

II

VCC = 5.5 V,

VI = VCC or GND

 

 

±1

 

±1

 

 

±1

µA

IOZH

VCC = 5.5 V,

VO = 2.7 V

 

 

 

10

 

10

 

 

10

µA

IOZL

VCC = 5.5 V,

VO = 0.5 V

 

 

 

±10

 

±10

 

 

±10

µA

Ioff

VCC = 0,

VI or VO ≤ 4.5 V

 

 

 

±150

 

 

 

 

 

±150

µA

ICEX

VCC = 5.5 V,

VO = 5.5 V

Outputs high

 

 

50

 

50

 

 

50

µA

I ³

V = 5.5 V,

V = 2.5 V

 

±50

±140

±180

±50

±180

 

±50

±180

mA

O

CC

O

 

 

 

 

 

 

 

 

 

 

 

 

VCC = 5.5 V, IO

= 0,

Outputs high

 

1

250

 

250

 

 

250

µA

ICC

Outputs low

 

24

30

 

30

 

 

30

mA

VI = VCC or GND

 

 

 

 

 

Outputs disabled

 

0.5

250

 

250

 

 

250

µA

 

 

 

 

 

 

 

 

VCC = 5.5 V,

 

Outputs high

 

 

1.5

 

1.5

 

 

1.5

 

ICC§

 

 

 

 

 

 

 

 

 

 

 

mA

 

Outputs low

 

 

1.5

 

1.5

 

 

1.5

One input at 3.4 V,

 

 

 

 

 

 

Other inputs at VCC or GND

Outputs disabled

 

 

1.5

 

1.5

 

 

1.5

 

Ci

VI = 2.5 V or 0.5 V

 

 

3.5

 

 

 

 

 

 

 

pF

Co

VO = 2.5 V or 0.5 V

 

 

6.5

 

 

 

 

 

 

 

pF

* On products compliant to MIL-PRF-38535, this parameter does not apply.

 

 

 

 

 

 

 

 

 

² All typical values are at VCC = 5 V.

 

 

 

 

 

 

 

 

 

 

 

³ Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

 

 

 

§ This is the increase in supply current for each input that is at the specified TTL voltage level rather than V

CC

or GND.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

POST OFFICE BOX 655303 DALLAS, TEXAS 75265

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