Texas Instruments TLV5618AQDR, TLV5618AQD, TLV5618AMJG, TLV5618AMJGB, TLV5618AMFKB Datasheet

...
0 (0)
TLV5618A
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT
DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
features
Dual 12-Bit Voltage Output DAC
Programmable Settling Time – 2.5 µs in Fast Mode – 12 µs in Slow Mode
Compatible With TMS320 and SPI Serial Ports
Differential Nonlinearity <0.5 LSB Typ
Monotonic Over Temperature
Available in Q-Temp Automotive
HighRel Automotive Applications Configuration Control / Print Support Qualification to Automotive Standards
description
The TL V5618A is a dual 12-bit voltage output DAC with a flexible 3-wire serial interface. The serial interface is compatible with TMS320, SPI, QSPI, and Microwire serial ports. It is programmed with a 16-bit serial string containing 4 control and 12 data bits.
The resistor string output voltage is buffered by an x2 gain rail-to-rail output buffer. The buffer features a Class-AB output stage to improve stability and reduce settling time. The program­mable settling time of the DAC allows the designer to optimize speed versus power dissipation.
applications
Digital Servo Control Loops
Digital Offset and Gain Adjustment
Industrial Process Control
Machine and Motion Control Devices
Mass Storage Devices
D OR JG PACKAGE
(TOP VIEW)
DIN
NC
SCLK
NC CS NC
SCLK
CS
OUTA
4 5 6 7 8
1 2 3 4
FK PACKAGE
(TOP VIEW)
NC
NC
DINNCV
NC
OUTA
8 7 6 5
AGND
DD
1920132
1312119 10
V
DD
OUTB REF AGND
NC
18 17 16 15 14
NC
NC OUTB NC REF NC
Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in an 8-pin SOIC package in standard commercial and industrial temperature ranges.
The TL V5618AC is characterized for operation from 0°C to 70°C. The TL V5618AI is characterized for operation from –40°C to 85°C. The TLV5618AQ is characterized for operation from –40°C to 125°C. The TLV5618AM is characterized for operation from –55°C to 125°C.
AVAILABLE OPTIONS
PACKAGE
T
A
0°C to 70°C TLV5618ACD
–40°C to 85°C TLV5618AID –40°C to 125°C –55°C to 125°C TLV5618AMJG TLV5618AMFK
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SPI and QSPI are trademarks of Motorola, Inc. Microwire is a trademark of National Semiconductor Corporation.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
SOIC
(D)
TLV5618AQD
TLV5618AQDR
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
CERAMIC DIP
(JG)
20 PAD LCCC
(FK)
Copyright 2000, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters.
1
TLV5618A
I/O/P
DESCRIPTION
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
functional block diagram
DIN
SCLK
CS
Power-On
Reset
Speed Control
Serial
Interface
and
Control
Power and
2
12
Buffer
REF AGND V
12 12
12
12-Bit
DAC A
Latch
12-Bit
DAC B
Latch
12
DD
x2
x2
OUTA
OUTB
Terminal Functions
TERMINAL
NAME NO.
AGND 5 P Ground CS 3 I Chip select. Digital input active low, used to enable/disable inputs. DIN 1 I Digital serial data input OUTA 4 O DAC A analog voltage output OUTB 7 O DAC B analog voltage output REF 6 I Analog reference voltage input SCLK 2 I Digital serial clock input V
DD
8 P Positive power supply
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PACKAGE
A
A
A
A
Suppl
oltage, V
Operating free-air temperature, T
°C
TLV5618A
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT
DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage (VDD to AGND) 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Reference input voltage range – 0.3 V to VDD + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Digital input voltage range – 0.3 V to V
DD
+ 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: TLV5618AC 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TLV5618AI –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TLV5618AQ –40°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TLV5618AM –55°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
stg
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
DISSIPATION RATING TABLE
T
25°C DERATING FACTOR T
POWER RATING ABOVE TA = 25°C
D 635 mW 5.08 mW/°C 407 mW 330 mW 127 mW FK 1375 mW 11.00 mW/°C 880 mW 715 mW 275 mW JG 1050 mW 8.40 mW/°C 672 mW 546 mW 210 mW
This is the inverse of the traditional junction-to-ambient thermal resistance (RΘJA). Thermal resistances are not production tested and are for informational purposes only.
= 70°C T
POWER RATING
= 85°C T
POWER RATING
= 125°C
POWER RATING
recommended operating conditions
MIN NOM MAX UNIT
pp
y v
Power on reset, POR 0.55 2 V High-level digital input voltage, V Low-level digital input voltage, V Reference voltage, V Reference voltage, V Load resistance, R Load capacitance, C Clock frequency, f
p
NOTE 1: Due to the x2 output buffer, a reference input voltage (VDD–0.4 V)/2 causes clipping of the transfer function.
DD
IH
IL
to REF terminal VDD = 5 V (see Note 1) AGND 2.048 VDD–1.5 V
ref
to REF terminal VDD = 3 V (see Note 1) AGND 1.024 VDD–1.5 V
ref
L
L
CLK
p
A
VDD = 5 V 4.5 5 5.5 VDD = 3 V 2.7 3 3.3
VDD = 2.7 V to 5.5 V 2 V VDD = 2.7 V to 5.5 V 0.8 V
2 k
100 pF
TLV5618AC 0 70 TLV5618AI –40 85 TLV5618AQ –40 125 TLV5618AM –55 125
V
20 MHz
°
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
3
TLV5618A
I
P
t
All i
AGND
A
DD
y
DD
,
DAC latch = 0x800
Slow
0.8
1
PSRR
Power supply rejection ratio
dB
Reference input bandwidth
REF
V
024 V dc
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
electrical characteristics over recommended operating conditions (unless otherwise noted)
power supply
PARAMETER TEST CONDITIONS MIN TYP MAX
No load,
ower supply curren
Power down supply current 1 µA
pp
NOTES: 2. Power supply rejection ratio at zero scale is measured by varying VDD and is given by:
PSRR = 20 log [(EZS(VDDmax) – EZS(VDDmin)/VDDmax]
3. Power supply rejection ratio at full scale is measured by varying VDD and is given by: PSRR = 20 log [(EG(VDDmax) – EG(VDDmin)/VDDmax]
nputs =
Zero scale, See Note 2 –65 Full scale, See Note 3 –65
or V,
=
Fast 1.8 2.3 Slow 0.8 1
static DAC specifications
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Resolution 12 bits INL Integral nonlinearity See Note 4 ±2 ±4 LSB DNL Differential nonlinearity See Note 5 ±0.5 ±1 LSB E
ZS
EZS TC Zero-scale-error temperature coefficient See Note 7 3 ppm/°C E
G
EG T
NOTES: 4. The relative accuracy of integral nonlinearity (INL), sometimes referred to as linearity error , is the maximum deviation of the output
Zero-scale error (offset error at zero scale) See Note 6 ±12 mV
Gain error See Note 8 ±0.6
Gain-error temperature coefficient See Note 9 1 ppm/°C
C
from the line between zero and full scale, excluding the effects of zero-code and full-scale errors.
5. The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal 1-LSB amplitude change of any two adjacent codes.
6. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
7. Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (T
8. Gain error is the deviation from the ideal output (2V
9. Gain temperature coefficient is given by: EG TC = [EG (T
– 1 LSB) with an output load of 10 kΩ.
ref
max) – Eg
(T
max) – EZS
min
)]/2V
(T
× 106/(T
ref
min
)]/2V
max
× 106/(T
ref
– T
min
– T
max
).
output specifications
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
O
Output voltage range RL = 10 k VDD–0.4 V Output load regulation accuracy VO = 4.096 V, 2.048 V RL = 2 k ±0.29 % FS
min
UNIT
m
% full
scale V
).
reference input
VIInput voltage range 0 V RIInput resistance 10 M CIInput capacitance 5 pF
Reference feedthrough REF = 1 Vpp at 1 kHz + 1.024 V dc (see Note 10) –80 dB
NOTE 10: Reference feedthrough is measured at the DAC output with an input code = 0x000.
4
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
DD–1.5
p
= 0.2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
pp
+ 1.
Fast 1.3 MHz Slow 525 kHz
V
t
Output settling time, full scale
L
,
L
,
s
t
Output settling time, code to code
L
,
L
,
s
SR
Slew rate
L
,
L
,
V/µs
s
,
out
,
dB
TLV5618A
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT
DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
electrical characteristics over recommended operating conditions (unless otherwise noted) (Continued)
digital inputs
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
I
High-level digital input current VI = V
IH
I
Low-level digital input current VI = 0 V –1 µA
IL
C
Input capacitance 8 pF
i
DD
analog output dynamic performance
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
R
s(FS)
s(CC)
SNR Signal-to-noise ratio 76 SINAD Signal-to-noise + distortion THD Total harmonic distortion SFDR Spurious free dynamic range 72
NOTES: 11. Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change
p
p
Glitch energy
of 0x020 to 0xFDF and 0xFDF to 0x020 respectively. Not tested, assured by design.
12. Settling time is the time for the output signal to remain within ± 0.5 LSB of the final measured value for a digital input code change of one count. Not tested, assured by design.
13. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% of full-scale voltage.
= 10 kΩ,C
See Note 11 R
= 10 kΩ,C
See Note 12 R
= 10 kΩ,C
See Note 13 DIN = 0 to 1, FCLK = 100 kHz,
CS
= V
DD
f
= 102 kSPS, f
RL = 10 kΩ,CL = 100 pF
= 100 pF,
= 100 pF,
= 100 pF,
= 1 kHz,
Fast 2.5 Slow 12 Fast 1 Slow 2 Fast 3 Slow 0.5
68
–68
1 µA
µ
µ
5 nV–s
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
5
TLV5618A
t
Setup time, data ready before SCLK falling edge
ns
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
digital input timing requirements
t
su(CS–CK)
t
su(C16-CS)
t
wH
t
wL
su(D)
t
h(D)
timing requirements
Setup time, CS low before first negative SCLK edge 10 ns Setup time, 16th negative SCLK edge before CS rising edge 10 ns SCLK pulse width high 25 ns SCLK pulse width low 25 ns
p
Hold time, data held valid after SCLK falling edge 5 ns
t
t
wL
wH
C and I suffixes 10 Q and M suffixes 8
MIN NOM MAX UNIT
SCLK
DIN
CS
X
t
1
t
su(D)th(D)
su(CS-CK)
2 3 4 5 15 16
D15 D14 D13 D12 D1 D0 XX
t
X
su(C16-CS)
Figure 1. Timing Diagram
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Loading...
+ 12 hidden pages