Fairchild Semiconductor 74ABT125CSJX, 74ABT125CSJ, 74ABT125CSCX, 74ABT125CSC, 74ABT125CMTCX Datasheet

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Fairchild Semiconductor 74ABT125CSJX, 74ABT125CSJ, 74ABT125CSCX, 74ABT125CSC, 74ABT125CMTCX Datasheet

March 1994

Revised November 1999

74ABT125

Quad Buffer with 3-STATE Outputs

General Description

The ABT125 contains four independent non-inverting buffers with 3-STATE outputs.

Features

Non-inverting buffers

Output sink capability of 64 mA, source capability of 32 mA

Guaranteed latchup protection

High impedance glitch free bus loading during entire power up and power down cycle

Nondestructive hot insertion capability

Disable time less than enable time to avoid bus contention

Ordering Code:

Order Number

Package Number

Package Description

 

 

 

74ABT125CSC

M14A

14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150” Narrow Body

 

 

 

74ABT125CSJ

M14D

14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide

 

 

 

74ABT125CMTC

MTC14

14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153,4.4mm Wide

 

 

 

Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.

Connection Diagram

Pin Descriptions

 

 

 

 

 

 

 

 

 

 

 

 

 

Pin Names

 

Descriptions

 

 

 

 

 

 

 

 

 

 

 

n, Bn

 

 

Inputs

 

 

 

A

 

 

 

 

 

On

 

 

Outputs

 

Function Table

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Inputs

 

 

Output

 

 

 

 

 

 

 

 

 

 

 

 

An

Bn

 

On

 

 

 

 

L

L

 

L

 

 

 

 

L

H

 

H

 

 

 

 

H

X

 

Z

 

 

 

 

 

 

 

 

H =

HIGH Voltage Level

L =

LOW Voltage Level

Z =

HIGH Impedance

X =

Immaterial

Outputs STATE-3 with Buffer Quad 74ABT125

© 1999 Fairchild Semiconductor Corporation

DS011667

www.fairchildsemi.com

74ABT125

Absolute Maximum Ratings(Note 1)

Storage Temperature

− 65° C to + 150° C

Ambient Temperature under Bias

− 55° C to + 125° C

Junction Temperature under Bias

− 55° C to + 150° C

VCC Pin Potential to

 

Ground Pin

− 0.5V to + 7.0V

Input Voltage (Note 2)

− 0.5V to + 7.0V

Input Current (Note 2)

− 30 mA to + 5.0 mA

Voltage Applied to Any Output

 

in the Disabled or

 

Power-Off State

− 0.5V to 5.5V

in the HIGH State

− 0.5V to VCC

Current Applied to Output

 

in LOW State (Max)

twice the rated IOL (mA)

DC Latchup Source Current

 

(Across Comm Operating Range)

− 300 mA

Over Voltage Latchup (I/O)

10V

Recommended Operating

Conditions

Free Air Ambient Temperature

− 40° C to + 85° C

Supply Voltage

+ 4.5V to + 5.5V

Minimum Input Edge Rate (∆ V/∆ t)

 

Data Input

50 mV/ns

Enable Input

20 mV/ns

Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied.

Note 2: Either voltage limit or current limit is sufficient to protect inputs.

DC Electrical Characteristics

Symbol

Parameter

Min

Typ

Max

Units

VCC

 

 

 

 

Conditions

VIH

Input HIGH Voltage

 

 

 

 

V

 

 

Recognized HIGH Signal

VIL

Input LOW Voltage

 

 

 

0.8

V

 

 

Recognized LOW Signal

VCD

Input Clamp Diode Voltage

 

 

− 1.2

V

Min

 

IIN =

− 18 mA

 

VOH

Output HIGH Voltage

 

2.5

 

 

V

Min

 

IOH =

3 mA

 

 

 

 

2.0

 

 

V

Min

 

IOH =

32 mA

 

VOL

Output LOW Voltage

 

 

 

0.55

V

Min

 

IOL =

64 mA

 

IIH

Input HIGH Current

 

 

 

1

µ A

Max

 

VIN =

2.7V (Note 3)

 

 

 

 

 

 

1

 

VIN =

VCC

 

 

 

 

 

 

 

 

 

 

IBVI

Input HIGH Current Breakdown Test

 

 

7

µ A

Max

 

VIN =

7.0V

 

IIL

Input LOW Current

 

 

 

− 1

µ A

Max

 

VIN =

0.5V (Note 3)

 

 

 

 

 

 

− 1

 

VIN =

0.0V

 

 

 

 

 

 

 

 

 

 

VID

Input Leakage Test

 

 

 

 

V

0.0

IID =

1.9 µ A, All Other Pin Grounded

IOZH

Output Leakage Current

 

 

10

µ A

0− 5.5V

 

VOUT =

2.7V;

 

n =

 

 

 

 

OE

2.0V

IOZL

Output Leakage Current

 

 

− 10

µ A

0− 5.5V

 

VOUT =

0.5V;

 

n =

 

 

 

 

OE

2.0V

IOS

Output Short-Circuit Current

 

 

− 275

mA

Max

 

VOUT =

0.0V

 

ICEX

Output HIGH Leakage Current

 

 

50

µ A

Max

 

VOUT =

VCC

 

IZZ

Bus Drainage Test

 

 

 

100

µ A

0.0

 

VOUT =

5.5V; All Others GND

ICCH

Power Supply Current

 

 

 

50

µ A

Max

All Outputs HIGH

 

ICCL

Power Supply Current

 

 

 

15

mA

Max

All Outputs LOW

 

ICCZ

Power Supply Current

 

 

 

50

µ A

Max

 

 

n =

VCC;

 

 

 

 

 

OE

 

 

 

 

 

 

 

 

 

 

All Others at VCC or Ground

ICCT

Additional ICC /Input

Outputs Enabled

 

 

1.5

mA

 

 

VI =

V CC − 2.1V

 

 

 

Outputs 3-STATE

 

 

1.5

mA

Max

 

Enable Input VI = VCC − 2.1V

 

 

Outputs 3-STATE

 

 

50

µ A

 

Data Input V I = VCC − 2.1V

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

All Others at VCC or Ground

ICCD

Dynamic ICC

No Load

 

 

 

mA/

 

 

Outputs Open

 

 

(Note 3)

 

 

 

0.1

MHz

Max

 

 

n =

GND, (Note 4)

 

 

 

 

 

OE

 

 

 

 

 

 

 

 

 

One Bit Toggling, 50% Duty Cycle

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Note 3: Guaranteed, but not tested.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Note 4: For 8 bits toggling, ICCD < 0.8 mA/MHz.

 

 

 

 

 

 

 

 

 

 

 

 

 

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