Fairchild Semiconductor 100329QI, 100329QCX, 100329QC, 100329PC, 100329DC Datasheet

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August 1989

Revised August 2000

100329

Low Power Octal ECL/TTL Bidirectional Translator with Register

General Description

The 100329 is an octal registered bidirectional translator designed to convert TTL logic levels to 100K ECL logic levels and vice versa. The direction of the translation is determined by the DIR input. A LOW on the output enable input (OE) holds the ECL outputs in a cut-off state and the TTL outputs at a high impedance level. The outputs change synchronously with the rising edge of the clock input (CP) even though only one output is enabled at the time.

The cut-off state is designed to be more negative than a normal ECL LOW level. This allows the output emitter-fol- lowers to turn off when the termination supply is − 2.0V, presenting a high impedance to the data bus. This high impedance reduces the termination power and prevents loss of low state noise margin when several loads share the bus.

The 100329 is designed with FAST TTL output buffers, featuring optimal DC drive and capable of quickly charging and discharging highly capacitive loads. All inputs have 50 kΩ pull-down resistors.

Features

Bidirectional translation

ECL high impedance outputs

Registered outputs

FAST TTL outputs

3-STATE outputs

Voltage compensated operating range = − 4.2V to − 5.7V

High drive IOS

Ordering Code:

Order Number

Package Number

Package Description

 

 

 

100329PC

N24E

24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide

 

 

 

100329QC

V28A

28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square

 

 

 

100329QI

V28A

28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square

 

 

Industrial Temperature Range (− 40° C to + 85° C)

 

 

 

Devices also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.

Connection Diagrams

24-Pin DIP 28-Pin PLCC

FAST is a registered trademark of Fairchild Semiconductor Corporation.

Register with Translator Bidirectional ECL/TTL Octal Power Low 100329

© 2000 Fairchild Semiconductor Corporation

DS010583

www.fairchildsemi.com

Fairchild Semiconductor 100329QI, 100329QCX, 100329QC, 100329PC, 100329DC Datasheet

100329

Logic Symbol

Pin Descriptions

Pin Names

Description

 

 

E0–E7

ECL Data I/O

T0–T7

TTL Data I/O

OE

Output Enable Input

CP

Clock Pulse Input (Active Rising Edge)

DIR

Direction Control Input

 

 

All pins function at 100K ECL levels except for T0–T7.

Truth Table

OE

DIR

CP

ECL

TTL

Notes

Port

Port

 

 

 

 

 

 

 

 

 

 

L

L

X

Input

Z

(Note 1)(Note 3)

 

 

 

 

 

 

L

H

X

LOW

Input

(Note 2)(Note 3)

 

 

 

(Cut-Off)

 

 

 

 

 

 

 

 

H

L

 

L

L

(Note 1)

 

 

 

 

 

 

H

L

 

H

H

(Note 1)

 

 

 

 

 

 

H

L

L

X

NC

(Note 1)(Note 3)

 

 

 

 

 

 

H

H

 

L

L

(Note 2)

 

 

 

 

 

 

H

H

 

H

H

(Note 2)

 

 

 

 

 

 

H

H

L

NC

X

(Note 2)(Note 3)

H = HIGH Voltage Level

L = LOW Voltage Level

X = Don't Care

Z = High Impedance

= LOW-to-HIGH Clock Transition

NC = No Change

Note 1: ECL input to TTL output mode.

Note 2: TTL input to ECL output mode.

Note 3: Retains data present before CP.

Functional Diagram

Note: DIR and OE use ECL logic levels

Detail

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2

Absolute Maximum Ratings(Note 4)

Storage Temperature (TSTG)

− 65° C to + 150° C

Maximum Junction Temperature (Tj)

+ 150° C

VEE Pin Potential to Ground Pin

− 7.0V to + 0.5V

VTTL Pin Potential to Ground Pin

− 0.5V to + 6.0V

ECL Input Voltage (DC)

VEE to + 0.5V

ECL Output Current

 

(DC Output HIGH)

− 50 mA

TTL Input Voltage (Note 6)

− 0.5V to + 6.0V

TTL Input Current (Note 6)

− 30 mA to + 5.0 mA

Voltage Applied to Output

 

in HIGH State

 

3-STATE Output

− 0.5V to + 5.5V

Current Applied to TTL

 

Output in LOW State (Max)

twice the rated IOL (mA)

ESD (Note 5)

≥ 2000V

Recommended Operating

Conditions

Case Temperature (TC)

0° C to + 85° C

ECL Supply Voltage (VEE)

− 5.7V to − 4.2V

TTL Supply Voltage (VTTL)

+ 4.5V to + 5.5V

Note 4: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The “Recommended Operating Conditions” table will define the conditions for actual device operation.

Note 5: ESD testing conforms to MIL-STD-883, Method 3015.

Note 6: Either voltage limit or current limit is sufficient to protect inputs.

TTL-to-ECL DC Electrical Characteristics

VEE = − 4.2V to − 5.7V, VCC = VCCA = GND, TC =

0° C to + 85° C, VTTL =

+ 4.5V to + 5.5V (Note 7)

 

Symbol

Parameter

 

 

Min

Typ

 

Max

Units

 

Conditions

 

 

 

 

 

 

 

 

 

 

 

VOH

Output HIGH Voltage

 

1025

− 955

 

− 870

mV

VIN =

VIH (Max) or VIL (Min)

VOL

Output LOW Voltage

 

1830

− 1705

 

− 1620

mV

Loading with 50Ω to − 2V

 

Cutoff Voltage

 

 

 

 

 

 

 

OE or DIR LOW,

 

 

 

 

 

− 2000

 

− 1950

mV

VIN =

VIH (Max) or VIL (Min)

 

 

 

 

 

 

 

 

 

Loading with 50Ω to − 2V

 

 

 

 

 

 

 

 

 

 

 

VOHC

Output HIGH Voltage

 

1035

 

 

 

mV

 

 

 

Corner Point HIGH

 

 

 

 

 

VIN =

VIH (Min) or VIL (Max)

 

 

 

 

 

 

 

 

VOLC

Output LOW Voltage

 

 

 

 

 

− 1610

mV

Loading with 50Ω to − 2V

 

Corner Point LOW

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VIH

Input HIGH Voltage

 

 

2.0

 

 

5.0

V

Over VTTL, VEE, TC Range

VIL

Input LOW Voltage

 

 

0

 

 

0.8

V

Over VTTL, VEE, TC Range

IIH

Input HIGH Current

 

 

 

 

 

70

µ A

VIN =

+ 2.7V

 

Breakdown Test

 

 

 

 

 

1.0

mA

VIN =

+ 5.5V

IIL

Input LOW Current

 

− 700

 

 

 

µ A

VIN =

+ 0.5V

VFCD

Input Clamp

 

 

− 1.2

 

 

 

V

IIN = − 18 mA

 

Diode Voltage

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IEE

VEE Supply Current

 

 

 

 

 

 

 

LE LOW, OE and DIR HIGH

 

 

 

 

 

 

 

 

 

Inputs Open

 

 

 

− 189

 

 

− 94

mA

VEE =

− 4.2V to − 4.8V

 

 

 

− 199

 

 

− 94

 

VEE =

− 4.2V to − 5.7V

Note 7: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under “worst case” conditions.

100329

3

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100329

ECL-to-TTL DC Electrical Characteristics

VEE = − 4.2V to − 5.7V, VCC = VCCA =

GND, TC = 0° C to + 85° C, CL =

50 pF, VTTL =

+ 4.5V to + 5.5V (Note 8)

 

Symbol

Parameter

 

 

Min

Typ

 

Max

 

Units

 

 

Conditions

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VOH

Output HIGH Voltage

 

 

2.7

3.1

 

 

 

V

IOH =

3 mA, VTTL =

4.75V

 

 

 

 

2.4

2.9

 

 

 

V

IOH =

3 mA, VTTL =

4.50V

VOL

Output LOW Voltage

 

 

 

0.3

 

0.5

 

V

IOL =

24 mA, VTTL =

4.50V

VIH

Input HIGH Voltage

 

1165

 

 

− 870

 

mV

Guaranteed HIGH Signal

 

 

 

 

 

 

 

 

 

 

for All Inputs

 

 

 

 

 

 

 

 

 

 

 

 

VIL

Input LOW Voltage

 

1830

 

 

− 1475

 

mV

Guaranteed LOW Signal

 

 

 

 

 

 

 

 

 

 

for All Inputs

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IIH

Input HIGH Current

 

 

 

 

 

350

 

µ A

VIN =

VIH (Max)

 

IIL

Input LOW Current

 

 

0.50

 

 

 

 

µ A

VIN =

VIL (Min)

 

IOZHT

3-STATE Current

 

 

 

 

 

70

 

µ A

VOUT =

+ 2.7V

 

 

Output HIGH

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IOZLT

3-STATE Current

 

− 700

 

 

 

 

µ A

VOUT =

+ 0.5V

 

 

Output LOW

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IOS

Output Short-Circuit

 

− 225

 

 

− 100

 

mA

VOUT =

0.0V, VTTL =

+ 5.5V

 

Current

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ITTL

VTTL Supply Current

 

 

 

 

 

74

 

mA

TTL Outputs LOW

 

 

 

 

 

 

 

 

49

 

mA

TTL Outputs HIGH

 

 

 

 

 

 

 

 

67

 

mA

TTL Outputs in 3-STATE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Note 8: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under “worst case” conditions.

DIP TTL-to-ECL AC Electrical Characteristics

VEE = − 4.2V to − 5.7V, VTTL = +

4.5V to + 5.5V, VCC =

VCCA =

GND

 

 

 

 

 

Symbol

Parameter

TC = 0° C

 

TC = 25° C

TC = 85° C

Units

Conditions

 

 

 

Min

Max

 

Min

Max

Min

Max

 

 

 

 

 

 

 

 

 

 

 

 

 

 

fMAX

Max Toggle Frequency

 

350

 

 

350

 

350

 

MHz

 

tPLH

CP to En

 

1.7

3.6

 

1.7

3.7

1.9

3.9

ns

Figures 1, 2

tPHL

 

 

 

 

 

 

 

 

 

 

 

tPZH

OE to En

 

1.3

4.2

 

1.5

4.4

1.7

4.8

ns

Figures 1, 2

 

(Cutoff to HIGH)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tPHZ

OE to En

 

1.5

4.5

 

1.6

4.5

1.6

4.6

ns

Figures 1, 2

 

(HIGH to Cutoff)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tPHZ

DIR to En

 

1.6

4.3

 

1.6

4.3

1.7

4.5

ns

Figures 1, 2

 

(HIGH to Cutoff)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tSET

Tn to CP

 

1.1

 

 

1.1

 

1.1

 

ns

Figures 1, 2

tHOLD

Tn to CP

 

1.7

 

 

1.7

 

1.9

 

ns

Figures 1, 2

tPW(H)

Pulse Width CP

 

2.1

 

 

2.1

 

2.1

 

ns

Figures 1, 2

tTLH

Transition Time

 

0.6

1.6

 

0.6

1.6

0.6

1.6

ns

Figures 1, 2

tTHL

20% to 80%, 80% to 20%

 

 

 

 

 

 

 

 

 

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