Fairchild Semiconductor 100355QIX, 100355QI, 100355QCX, 100355QC, 100355PC Datasheet

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July 1989

Revised August 2000

100355

Low Power Quad Multiplexer/Latch

General Description

The 100355 contains four transparent latches, each of which can accept and store data from two sources. When both Enable (En) inputs are LOW, the data that appears at an output is controlled by the Select (Sn) inputs, as shown in the Operating Mode table. In addition to routing data from either D0 or D1, the Select inputs can force the outputs LOW for the case where the latch is transparent (both Enables are LOW) and can steer a HIGH signal from either D0 or D1 to an output. The Select inputs can be tied together for applications requiring only that data be steered from either D0 or D1. A positive-going signal on either Enable input latches the outputs. A HIGH signal on the Master Reset (MR) input overrides all the other inputs and forces the Q outputs LOW. All inputs have 50 kΩ pull-down resistors.

Features

Greater than 40% power reduction of the 100155

2000V ESD protection

Pin/function compatible with 100155

Voltage compensated operating range = − 4.2V to − 5.7V

Available to industrial grade temperature range

Ordering Code:

Order Number

Package Number

Package Description

 

 

 

100355PC

N24E

24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide

 

 

 

100355QC

V28A

28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square

 

 

 

100355QI

V28A

28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square

 

 

Industrial Temperature Range (− 40° C to + 85° C)

 

 

 

Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.

Logic Symbol

Connection Diagrams

 

24-Pin DIP

Pin Descriptions

 

Pin Names

Description

 

 

 

 

 

 

 

 

 

 

 

 

1,

 

 

2

Enable Inputs (Active LOW)

 

 

E

E

 

 

 

 

 

 

Select Inputs

 

 

S

0, S1

28-Pin PLCC

 

MR

Master Reset

 

 

 

Dna–Dnd

Data Inputs

 

 

Qa–Qd

Data Outputs

 

 

 

 

 

d

Complementary Data Outputs

 

 

Q

a–Q

 

Multiplexer/Latch Quad Power Low 100355

© 2000 Fairchild Semiconductor Corporation

DS010147

www.fairchildsemi.com

Fairchild Semiconductor 100355QIX, 100355QI, 100355QCX, 100355QC, 100355PC Datasheet

100355

Operating Mode Table

Truth Table

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Controls

 

 

 

Outputs

 

 

 

 

 

 

 

Inputs

 

 

 

 

 

Outputs

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

E1

E2

S1

 

S0

 

Qn

 

MR

E1

E2

 

S1

S0

D1x D0x

Qx

Qx

 

 

H

 

X

X

 

X

 

Latched (Note 1)

 

H

 

X

X

 

X

X

X

X

 

H

L

 

 

X

 

H

X

 

X

 

Latched (Note 1)

 

L

 

L

L

 

H

H

H

X

 

L

H

 

 

L

 

L

L

 

L

 

D0x

 

L

 

L

L

H H

L X

 

H

L

 

 

L

 

L

H

 

L

 

D0x + D1x

 

L

 

L

L

 

L

L

X H

 

L

H

 

 

L

 

L

L

 

H

 

L

 

L

 

L

L

 

L

L

X

L

 

H

L

 

 

L

 

L

H

 

H

 

D1x

 

L

L L

L H

X X

 

H

L

H =

HIGH

Voltage Level

 

 

 

 

 

L

 

L

L

 

H

L

H

X

 

L

H

L = LOW Voltage Level

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

X = Don’t Care

 

 

 

 

 

 

 

L

 

L

L

 

H

L

X

H

 

L

H

Note 1: Stores data present before

E

went HIGH

 

L

 

L

L

 

H

L

L

L

 

H

L

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

L

 

H

X

 

X

X

X

X

Latched (Note 1)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

L

 

X

H

 

X

X

X

X

Latched (Note 1)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Logic Diagram

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2

Absolute Maximum Ratings(Note 2)

Storage Temperature (TSTG)

− 65° C to + 150° C

Maximum Junction Temperature (TJ)

+ 150° C

VEE Pin Potential to Ground Pin

− 7.0V to + 0.5V

Input Voltage (DC)

VEE to + 0.5V

Output Current (DC Output HIGH)

− 50 mA

ESD (Note 3)

≥ 2000V

Recommended Operating

Conditions

Case Temperature (TC)

 

Commercial

0° C to + 85° C

Industrial

− 40° C to + 85° C

Supply Voltage (VEE)

− 5.7V to − 4.2V

Note 2: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The “Recommended Operating Conditions” table will define the conditions for actual device operation.

Note 3: ESD testing conforms to MIL-STD-883, Method 3015.

Commercial Version

DC Electrical Characteristics (Note 4)

VEE = − 4.2V to − 5.7V, VCC = VCCA =

GND, TC = 0° C to + 85° C

 

 

 

 

 

 

Symbol

 

 

 

 

 

Parameter

 

Min

Typ

Max

Units

 

Conditions

 

 

 

 

 

 

 

 

 

 

 

VOH

Output HIGH Voltage

 

− 1025

− 955

− 870

mV

VIN =

VIH (Max)

Loading with

VOL

Output LOW Voltage

 

− 1830

− 1705

− 1620

mV

or VIL (Min)

50Ω

to − 2.0V

VOHC

Output HIGH Voltage

 

− 1035

 

 

mV

VIN =

VIH (Min)

Loading with

VOLC

Output LOW Voltage

 

 

 

− 1610

mV

or VIL (Max)

50Ω

to − 2.0V

VIH

Input HIGH Voltage

 

− 1165

 

− 870

mV

Guaranteed HIGH Signal

 

 

 

 

 

 

 

 

 

 

 

 

 

 

for ALL Inputs

 

 

 

 

 

 

 

 

 

 

 

 

VIL

Input LOW Voltage

 

− 1830

 

− 1475

mV

Guaranteed LOW Signal

 

 

 

 

 

 

 

 

 

 

 

 

 

 

for ALL Inputs

 

 

 

 

 

 

 

 

 

 

 

 

 

IIL

Input LOW Current

 

0.50

 

 

µ A

VIN =

VIL (Min)

 

 

IIH

Input HIGH Current

 

 

 

 

 

 

 

 

 

 

 

S

0, S1

 

 

 

220

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

µ A

VIN =

 

 

 

 

 

E1, E2

 

 

 

350

VIH (Max)

 

 

 

 

Dna–Dnd

 

 

 

340

 

 

 

 

 

 

 

MR

 

 

 

430

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IEE

Power Supply Current

 

− 87

 

− 40

mA

Inputs Open

 

 

Note 4: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guard banding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under “worst case” conditions.

100355

3

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