July 1989
Revised August 2000
100355
Low Power Quad Multiplexer/Latch
General Description
The 100355 contains four transparent latches, each of which can accept and store data from two sources. When both Enable (En) inputs are LOW, the data that appears at an output is controlled by the Select (Sn) inputs, as shown in the Operating Mode table. In addition to routing data from either D0 or D1, the Select inputs can force the outputs LOW for the case where the latch is transparent (both Enables are LOW) and can steer a HIGH signal from either D0 or D1 to an output. The Select inputs can be tied together for applications requiring only that data be steered from either D0 or D1. A positive-going signal on either Enable input latches the outputs. A HIGH signal on the Master Reset (MR) input overrides all the other inputs and forces the Q outputs LOW. All inputs have 50 kΩ pull-down resistors.
Features
■Greater than 40% power reduction of the 100155
■2000V ESD protection
■Pin/function compatible with 100155
■Voltage compensated operating range = − 4.2V to − 5.7V
■Available to industrial grade temperature range
Ordering Code:
Order Number |
Package Number |
Package Description |
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100355PC |
N24E |
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide |
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100355QC |
V28A |
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square |
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100355QI |
V28A |
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square |
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Industrial Temperature Range (− 40° C to + 85° C) |
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Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbol |
Connection Diagrams |
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24-Pin DIP |
Pin Descriptions
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Pin Names |
Description |
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1, |
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2 |
Enable Inputs (Active LOW) |
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E |
E |
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Select Inputs |
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S |
0, S1 |
28-Pin PLCC |
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MR |
Master Reset |
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Dna–Dnd |
Data Inputs |
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Qa–Qd |
Data Outputs |
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d |
Complementary Data Outputs |
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Q |
a–Q |
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Multiplexer/Latch Quad Power Low 100355
© 2000 Fairchild Semiconductor Corporation |
DS010147 |
www.fairchildsemi.com |
100355
Operating Mode Table |
Truth Table |
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Controls |
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Outputs |
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Inputs |
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Outputs |
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E1 |
E2 |
S1 |
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S0 |
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Qn |
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MR |
E1 |
E2 |
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S1 |
S0 |
D1x D0x |
Qx |
Qx |
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H |
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X |
X |
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X |
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Latched (Note 1) |
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H |
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X |
X |
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X |
X |
X |
X |
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H |
L |
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X |
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H |
X |
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X |
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Latched (Note 1) |
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L |
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L |
L |
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H |
H |
H |
X |
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L |
H |
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L |
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L |
L |
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L |
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D0x |
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L |
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L |
L |
H H |
L X |
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L |
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L |
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H |
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L |
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D0x + D1x |
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L |
L |
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L |
L |
X H |
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L |
H |
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L |
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L |
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H |
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L |
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L |
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L |
L |
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L |
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X |
L |
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H |
L |
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L |
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L |
H |
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H |
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D1x |
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L |
L L |
L H |
X X |
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H |
L |
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H = |
HIGH |
Voltage Level |
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L |
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L |
L |
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H |
L |
H |
X |
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L |
H |
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L = LOW Voltage Level |
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X = Don’t Care |
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L |
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L |
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H |
L |
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H |
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L |
H |
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Note 1: Stores data present before |
E |
went HIGH |
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L |
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H |
L |
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H |
L |
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L |
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H |
X |
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X |
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X |
Latched (Note 1) |
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L |
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X |
H |
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X |
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X |
Latched (Note 1) |
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Logic Diagram
www.fairchildsemi.com |
2 |
Absolute Maximum Ratings(Note 2)
Storage Temperature (TSTG) |
− 65° C to + 150° C |
Maximum Junction Temperature (TJ) |
+ 150° C |
VEE Pin Potential to Ground Pin |
− 7.0V to + 0.5V |
Input Voltage (DC) |
VEE to + 0.5V |
Output Current (DC Output HIGH) |
− 50 mA |
ESD (Note 3) |
≥ 2000V |
Recommended Operating
Conditions
Case Temperature (TC) |
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Commercial |
0° C to + 85° C |
Industrial |
− 40° C to + 85° C |
Supply Voltage (VEE) |
− 5.7V to − 4.2V |
Note 2: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The “Recommended Operating Conditions” table will define the conditions for actual device operation.
Note 3: ESD testing conforms to MIL-STD-883, Method 3015.
Commercial Version
DC Electrical Characteristics (Note 4)
VEE = − 4.2V to − 5.7V, VCC = VCCA = |
GND, TC = 0° C to + 85° C |
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Symbol |
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Parameter |
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Min |
Typ |
Max |
Units |
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Conditions |
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VOH |
Output HIGH Voltage |
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− 1025 |
− 955 |
− 870 |
mV |
VIN = |
VIH (Max) |
Loading with |
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VOL |
Output LOW Voltage |
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− 1830 |
− 1705 |
− 1620 |
mV |
or VIL (Min) |
50Ω |
to − 2.0V |
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VOHC |
Output HIGH Voltage |
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− 1035 |
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mV |
VIN = |
VIH (Min) |
Loading with |
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VOLC |
Output LOW Voltage |
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− 1610 |
mV |
or VIL (Max) |
50Ω |
to − 2.0V |
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VIH |
Input HIGH Voltage |
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− 1165 |
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− 870 |
mV |
Guaranteed HIGH Signal |
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for ALL Inputs |
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VIL |
Input LOW Voltage |
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− 1830 |
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− 1475 |
mV |
Guaranteed LOW Signal |
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for ALL Inputs |
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IIL |
Input LOW Current |
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0.50 |
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µ A |
VIN = |
VIL (Min) |
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IIH |
Input HIGH Current |
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S |
0, S1 |
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220 |
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µ A |
VIN = |
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E1, E2 |
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350 |
VIH (Max) |
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Dna–Dnd |
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340 |
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MR |
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430 |
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IEE |
Power Supply Current |
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− 87 |
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− 40 |
mA |
Inputs Open |
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Note 4: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guard banding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under “worst case” conditions.
100355
3 |
www.fairchildsemi.com |