Fairchild Semiconductor 74ABT16245CSSC, 74ABT16245CMTDX, 74ABT16245CMTD, 74ABT16245CSSCX Datasheet

April 1992

Revised November 1999

74ABT16245

16-Bit Transceiver with 3-STATE Outputs

General Description

The ABT16245 contains sixteen non-inverting bidirectional buffers with 3-STATE outputs and is intended for bus oriented applications. The device is byte controlled. Each byte has separate control inputs which can be shorted together for full 16-bit operation. The T/R inputs determine the direction of data flow through the device. The OE inputs disable both the A and B ports by placing them in a high impedance state.

Features

■Bidirectional non-inverting buffers

■Separate control logic for each byte

■16-bit version of the ABT245

■A and B output sink capability of 64 mA, source capability of 32 mA

■Guaranteed output skew

■Guaranteed multiple output switching specifications

■Output switching specified for both 50 pF and 250 pF loads

■Guaranteed simultaneous switching noise level and dynamic threshold performance

■Guaranteed latchup protection

■High impedance glitch free bus loading during entire power up and power down cycle

■Non-destructive hot insertion capability

Ordering Code:

Order Number	Package Number	Package Description
74ABT16245CSSC	MS48A	48-Lead Small Shrink Outline Package (SSOP), JEDEC MO-118, 0.300” Wide
74ABT16245CMTD	MTD48	48-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide

Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.

Logic Symbol

Connection Diagram

Pin Descriptions

	Pin Names				Description
			n		Output Enable Input (Active LOW)
	OE
					Transmit/Receive Input
	T/R			n
	A0–A15				Side A Inputs/Outputs
	B0–B15				Side B Inputs/Outputs

Outputs STATE-3 with Transceiver Bit-16 74ABT16245

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74ABT16245

Truth Tables

Logic Diagrams

Inputs

Outputs

OE1

T/R1

L

L

Bus B0–B7 Data to Bus A0–A7

L

H

Bus A0–A7 Data to Bus B0–B7

H

X

HIGH-Z State on A0–A7, B0–B 7

Inputs

Outputs

OE2

T/R2

L

L

Bus B8–B15 Data to Bus A8–A 15

L

H

Bus A8–A15 Data to Bus B8–B 15

H

X

HIGH-Z State on A8–A15, B8–B 15

H =	HIGH Voltage Level
L =	LOW Voltage Level
X =	Immaterial
Z =	High Impedance

Functional Description

The ABT16245 contains sixteen non-inverting bidirectional buffers with 3-STATE outputs. The device is byte controlled with each byte functioning identically, but independent of the other. The control pins can be shorted together to obtain full 16-bit operation.

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Absolute Maximum Ratings(Note 1)

Storage Temperature	− 65° C to + 150° C
Ambient Temperature under Bias	− 55° C to + 125° C
Junction Temperature under Bias	− 55° C to + 150° C
VCC Pin Potential to Ground Pin	− 0.5V to + 7.0V
Input Voltage (Note 2)	− 0.5V to + 7.0V
Input Current (Note 2)	− 30 mA to + 5.0 mA
Voltage Applied to Any Output
in the Disabled or
Power-Off State	− 0.5V to 5.5V
in the HIGH State	− 0.5V to VCC
Current Applied to Output
in LOW State (Max)	twice the rated IOL (mA)
DC Latchup Source Current	− 500 mA
Over Voltage Latchup (I/O)	10V

Recommended Operating

Conditions

Free Air Ambient Temperature	− 40° C to + 85° C
Supply Voltage	+ 4.5V to + 5.5V
Minimum Input Edge Rate (∆ V/∆ t)
Data Input	50 mV/ns
Enable Input	20 mV/ns

Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied.

Note 2: Either voltage limit or current limit is sufficient to protect inputs.

DC Electrical Characteristics

Symbol

Parameter

Min

Typ

Max

Units

VCC

Conditions

VIH

Input HIGH Voltage

2.0

V

Recognized HIGH Signal

VIL

Input LOW Voltage

0.8

V

Recognized LOW Signal

VCD

Input Clamp Diode Voltage

− 1.2

V

Min

IIN =

− 18 mA

n)

(OE

n, T/R

VOH

Output HIGH Voltage

2.5

V

Min

IOH =

− 3 mA (An, Bn)

2.0

V

Min

IOH =

− 32 mA (An, Bn)

VOL

Output LOW Voltage

0.55

V

Min

IOL =

64 mA (An, Bn)

IIH

Input HIGH Current

1

VIN =

2.7V

n) (Note 3)

µ A

Max

(OE

n, T/R

1

VIN =

VCC

(OE

n, T/R

n)

IBVI

Input HIGH Current Breakdown Test

7

µ A

Max

VIN =

7.0V

n)

(OE

n, T/R

IBVIT

Input HIGH Current Breakdown Test (I/O)

100

µ A

Max

VIN =

5.5V (An, Bn)

IIL

Input LOW Current

− 1

VIN =

0.5V

n) (Note 3)

µ A

Max

(OE

n, T/R

− 1

VIN =

0.0V

(OE

n, T/R

n)

VID

Input Leakage Test

4.75

V

0.0

IID =

1.9 µ A

n)

(OE

n, T/R

All Other Pins Grounded

IIH +

I OZH

Output Leakage Current

10

µ A

0 −

5.5V

VOUT =

2.7V (An, Bn);

=

2.0V

OE

IIL +

I OZL

Output Leakage Current

− 10

µ A

0 −

5.5V

VOUT =

0.5V (An, Bn);

=

2.0V

OE

IOS

Output Short-Circuit Current

− 100

− 275

mA

Max

VOUT =

0.0V (An, Bn)

ICEX

Output HIGH Leakage Current

50

µ A

Max

VOUT =

VCC (An, Bn)

IZZ

Bus Drainage Test

100

µ A

0.0

VOUT =

5.50V (An, Bn);

All Others GND

ICCH

Power Supply Current

100

µ A

Max

All Outputs HIGH

ICCL

Power Supply Current

60

mA

Max

All Outputs LOW

ICCZ

Power Supply Current

100

µ A

Max

n =

n = GND or VCC

OE

VCC, T/R

All others at VCC or GND

ICCT

Additional ICC/Input

Outputs Enabled

2.5

mA

VI =

VCC − 2.1V

Outputs 3-STATE

2.5

mA

Max

n VI =

VCC −

OE

n, T/

R

2.1V

Outputs 3-STATE

50

µ A

Data Input VI =

VCC −

2.1V

All others at VCC or GND

ICCD

Dynamic ICC

No Load

mA/

Max

Outputs OPEN

(Note 3)

0.1

MHz

OEn =

GND, T/Rn = GND or VCC

One Bit Toggling, 50% Duty Cycle

Note 3: Guaranteed, but not tested.

74ABT16245

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