Fairchild Semiconductor 74ABT2240CMSA, 74ABT2240CSJX, 74ABT2240CSJ, 74ABT2240CSCX, 74ABT2240CSC Datasheet
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March 1994
Revised November 1999
74ABT2240
Octal Buffer/Line Driver with
25Ω Series Resistors in the Outputs
General Description
The ABT2240 is an inverting octal buffer and line driver designed to drive the capacitive inputs of MOS memory drivers, address drivers, clock drivers, and bus-oriented transmitters/receivers.
The 25Ω series resistors in the outputs reduce ringing and eliminate the need for external resistors.
Features
■Guaranteed latchup protection
■High impedance glitch-free bus loading during entire power up and power down cycle
■Nondestructive hot insertion capability
Ordering Code:
Order Number |
Package Number |
Package Description |
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74ABT2240CSC |
M20B |
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body |
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74ABT2240CSJ |
M20D |
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide |
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74ABT2240CMSA |
MSA20 |
20-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide |
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74ABT2240CMTC |
MTC20 |
20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide |
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Devices also available in Tape and Reel. Specify by appending letter suffix “X” to the ordering code.
Connection Diagram |
Pin Descriptions |
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Pin Names |
Descriptions |
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1, |
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2 |
Output Enable Input (Active LOW) |
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OE |
OE |
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D0–D7 |
Data Inputs |
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7 |
Outputs |
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O |
0–O |
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Schematic of Each Output |
Truth Table |
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OE1 |
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I0–3 |
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O0–3 |
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OE2 |
I4–7 |
O4–7 |
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H |
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X |
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Z |
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H |
X |
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Z |
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L |
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H |
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L |
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L |
H |
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L |
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L |
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L |
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H |
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L |
L |
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H |
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H = HIGH Voltage Level |
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L = LOW Voltage Level |
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X = Immaterial |
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Z = High Impedance |
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Outputs the in Resistors Series Ω25 with Driver Buffer/Line Octal 74ABT2240
© 1999 Fairchild Semiconductor Corporation |
DS011665 |
www.fairchildsemi.com |
74ABT2240
Absolute Maximum Ratings(Note 1)
Storage Temperature |
− 65° C to + 150° C |
Ambient Temperature under Bias |
− 55° C to + 125° C |
Junction Temperature under Bias |
− 55° C to + 150° C |
VCC Pin Potential to Ground Pin |
− 0.5V to + 7.0V |
Input Voltage (Note 2) |
− 0.5V to + 7.0V |
Input Current (Note 2) |
− 30 mA to + 5.0 mA |
Voltage Applied to Any Output |
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in the Disabled or |
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Power-off State |
− 0.5V to 5.5V |
in the HIGH State |
− 0.5V to VCC |
Current Applied to Output |
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in LOW State (Max) |
twice the rated IOL (mA) |
DC Latchup Source Current |
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(Across Comm Operating Range) |
− 300 mA |
Over Voltage Latchup (I/O) |
10V |
Recommended Operating
Conditions
Free Air Ambient Temperature |
− 40° C to + 85° C |
Supply Voltage |
+ 4.5V to + 5.5V |
Minimum Input Edge Rate (∆ V/∆ t) |
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Data Input |
50 mV/ns |
Enable Input |
20 mV/ns |
Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol |
Parameter |
Min |
Typ |
Max |
Units |
VCC |
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Conditions |
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VIH |
Input HIGH Voltage |
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2.0 |
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V |
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Recognized HIGH Signal |
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VIL |
Input LOW Voltage |
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0.8 |
V |
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Recognized LOW Signal |
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VCD |
Input Clamp Diode Voltage |
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− 1.2 |
V |
Min |
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IIN = |
− 18 mA |
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VOH |
Output HIGH |
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2.5 |
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V |
Min |
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IOH = |
− |
3 mA |
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Voltage |
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2.0 |
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V |
Min |
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IOH = |
− |
32 mA |
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VOL |
Output LOW Voltage |
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0.8 |
V |
Min |
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IOL = |
15 mA |
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IIH |
Input HIGH Current |
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1 |
µ A |
Max |
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VIN = |
2.7V (Note 3) |
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1 |
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VIN = |
V CC |
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IBVI |
Input HIGH Current Breakdown Test |
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7 |
µ A |
Max |
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VIN = |
7.0V |
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I IL |
Input LOW Current |
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− 1 |
µ A |
Max |
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VIN = |
0.5V (Note 3) |
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− 1 |
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VIN = |
0.0V |
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VID |
Input Leakage Test |
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V |
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0.0 |
IID = |
1.9 µ A |
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All Other Pins Grounded |
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IOZH |
Output Leakage Current |
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10 |
µ A |
0 − |
5.5V |
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VOUT = |
2.7V; |
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2.0V |
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OEn = |
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IOZL |
Output Leakage Current |
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− 10 |
µ A |
0 − |
5.5V |
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VOUT = |
0.5V; |
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2.0V |
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OEn = |
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IOS |
Output Short-Circuit Current |
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− 275 |
mA |
Max |
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VOUT = |
0.0V |
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ICEX |
Output HIGH Leakage Current |
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50 |
µ A |
Max |
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VOUT = |
V CC |
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IZZ |
Bus Drainage Test |
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100 |
µ A |
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0.0 |
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VOUT = |
5.5V; All Others GND |
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ICCH |
Power Supply Current |
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50 |
µ A |
Max |
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All Outputs HIGH |
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ICCL |
Power Supply Current |
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30 |
mA |
Max |
All Outputs LOW |
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ICCZ |
Power Supply Current |
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50 |
µ A |
Max |
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V CC |
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OEn = |
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All Others at VCCor GND |
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ICCT |
Additional |
Outputs Enabled |
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1.5 |
mA |
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VI = |
V CC − 2.1V |
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ICC/Input |
Outputs 3-STATE |
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1.5 |
mA |
Max |
Enable Input VI = VCC − 2.1V |
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Outputs 3-STATE |
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50 |
µ A |
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Data Input VI = VCC − 2.1V |
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All Others at VCCor GND |
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ICCD |
Dynamic ICC |
No Load |
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mA/ |
Max |
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Outputs OPEN |
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(Note 3) |
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0.1 |
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MHz |
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OEn = |
GND (Note 4) |
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One Bit Toggling, 50% Duty Cycle |
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Note 3: Guaranteed, but not tested. |
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Note 4: For 8 bits toggling, ICCD < |
0.8 mA/MHz. |
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www.fairchildsemi.com |
2 |
AC Electrical Characteristics
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TA = + 25° C |
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TA = − 40° C to + 85° C |
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Symbol |
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Parameter |
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VCC = + 5V |
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VCC = 4.5V–5.5V |
Units |
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CL = 50 pF |
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CL = |
50 pF |
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Min |
Typ |
Max |
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Min |
Max |
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tPLH |
Propagation |
1.0 |
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4.9 |
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1.0 |
4.9 |
ns |
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tPHL |
Delay Data to Outputs |
1.5 |
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5.3 |
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1.5 |
5.3 |
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tPZH |
Output Enable |
1.5 |
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6.6 |
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1.5 |
6.6 |
ns |
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tPZL |
Time |
2.7 |
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6.9 |
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2.7 |
6.9 |
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tPHZ |
Output Disable |
1.9 |
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6.4 |
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1.9 |
6.4 |
ns |
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tPLZ |
Time |
1.9 |
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6.4 |
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1.9 |
6.4 |
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Capacitance |
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Symbol |
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Parameter |
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Typ |
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Units |
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Conditions |
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TA = 25° C |
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CIN |
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Input Capacitance |
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5.0 |
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pF |
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VCC = |
0V |
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COUT (Note 5) |
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Output Capacitance |
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9.0 |
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pF |
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VCC = |
5.0V |
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Note 5: COUT is measured at frequency f = 1 MHz, per MIL-STD-883, Method 3012.
74ABT2240
3 |
www.fairchildsemi.com |
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