November 1992
Revised January 1999
74ABT899
9-Bit Latchable Transceiver with Parity Generator/Checker
General Description
The ABT899 is a 9-bit to 9-bit parity transceiver with transparent latches. The device can operate as a feed-through transceiver or it can generate/check parity from the 8-bit data busses in either direction.
The ABT899 features independent latch enables for the A- to-B direction and the B-to-A direction, a select pin for ODD/EVEN parity, and separate error signal output pins for checking parity.
Features
■Latchable transceiver with output sink of 64 mA
■Option to select generate parity and check or “feed-through” data/parity in directions A-to-B or B-to-A
■Independent latch enables for A-to-B and B-to-A directions
■Select pin for ODD/EVEN parity
■ERRA and ERRB output pins for parity checking
■Ability to simultaneously generate and check parity
■May be used in systems applications in place of the 543 and 280
■May be used in system applications in place of the 657 and 373 (no need to change T/R to check parity)
■Guaranteed output skew
■Guaranteed multiple output switching specifications
■Output switching specified for both 50 pF and 250 pF loads
■Guaranteed simultaneous switching noise level and dynamic threshold performance
■Guaranteed latchup protection
■High impedance glitch free bus loading during entire power up and power down cycle
■Nondestructive hot insertion capability
■Disable time less than enable time to avoid bus contention
Ordering Code:
Order Number |
Package Number |
Package Description |
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74ABT899CSC |
M28B |
28-Lead Small Outline Integrated Circuit (SOIC), MS-013, 0.300” Wide Body |
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74ABT899CMSA |
MSA28 |
28-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide |
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74ABT899CQC |
V28A |
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450” Square |
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Devices also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Connection Diagrams |
Pin Assignment for |
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SOIC and SSOP |
Pin Assignment |
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for PLCC |
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Generator/Checker Parity with Transceiver Latchable Bit-9 74ABT899
© 1999 Fairchild Semiconductor Corporation |
DS011509.prf |
www.fairchildsemi.com |
74ABT899
Pin Descriptions
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Pin Names |
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Descriptions |
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A0–A7 |
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A Bus Data Inputs/Data Outputs |
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B0–B7 |
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B Bus Data Inputs/Data Outputs |
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APAR, BPAR |
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A and B Bus Parity Inputs/Outputs |
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ODD/EVEN |
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ODD/EVEN Parity Select, |
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Active LOW for EVEN Parity |
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Output Enables for A or B Bus, |
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GBA, |
GAB |
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Active LOW |
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Select Pin for Feed-Through or |
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SEL |
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Generate Mode, LOW for Generate |
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Mode |
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LEA, LEB |
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Latch Enables for A and B Latches, |
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HIGH for Transparent Mode |
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Error Signals for Checking Generated |
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ERRA, |
ERRB |
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Parity with Parity In, LOW if Error |
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Occurs |
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Functional Description
The ABT899 has three principal modes of operation which are outlined below. These modes apply to both the A-to-B and B-to-A directions.
•Bus A (B) communicates to Bus B (A), parity is generated and passed on to the B (A) Bus as BPAR (APAR). If LEB (LEA) is HIGH and the Mode Select (SEL) is LOW, the parity generated from B[0:7] (A[0:7]) can be checked and monitored by ERRB (ERRA).
•Bus A (B) communicates to Bus B (A) in a feed-through mode if SEL is HIGH. Parity is still generated and checked as ERRA and ERRB in the feed-through mode (can be used as an interrupt to signal a data/parity bit error to the CPU).
•Independent Latch Enables (LEA and LEB) allow other permutations of generating/checking (see Function Table below).
Function Table
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Inputs |
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Operation |
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LEA |
LEB |
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GAB |
GBA |
SEL |
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H |
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H |
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X |
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X |
X |
Busses A and B are 3-STATE. |
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H |
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L |
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L |
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L |
H |
Generates parity from B[0:7] based on O/E |
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(Note 1). Generated parity → APAR. |
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Generated parity checked against BPAR and output as ERRB. |
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H |
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L |
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L |
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H |
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Generated parity → APAR. Gener- |
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Generates parity from B[0:7] based on O/E. |
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ated parity checked against BPAR and output as ERRB. Generated parity also |
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fed back through the A latch for generate/check as ERRA. |
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H |
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L |
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L |
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L |
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Generated parity → APAR. |
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Generates parity from B latch data based on O/E. |
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Generated parity checked against latched BPAR and output as ERRB. |
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H |
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L |
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H |
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X |
H |
BPAR/B[0:7] → APAR/A0:7] Feed-through mode. Generated parity checked |
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against BPAR and output as ERRB. |
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H |
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L |
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H |
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BPAR/B[0:7] → APAR/A[0:7] |
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Feed-through mode. Generated parity checked against BPAR and output as |
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ERRB. Generated parity also fed back through the A latch for generate/check as |
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ERRA. |
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L |
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H |
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L |
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Generated parity → BPAR. Gener- |
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Generates parity for A[0:7] based on O/E. |
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ated parity checked against APAR and output as ERRA. |
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L |
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H |
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L |
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H |
H |
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Generated parity → BPAR. Gener- |
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Generates parity from A[0:7] based on O/E. |
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ated parity checked against APAR and output as ERRA. Generated parity also |
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fed back through the B latch for generate/check as ERRB. |
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L |
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H |
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L |
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X |
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Generated parity → BPAR. |
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Generates parity from A latch data based on O/E. |
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Generated parity checked against latched APAR and output as ERRA. |
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L |
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H |
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H |
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H |
L |
APAR/A[0:7] → BPAR/B[0:7] |
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Feed-through mode. Generated parity checked against APAR and output as |
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ERRA. |
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L |
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H |
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H |
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H |
H |
APAR/A[0:7] → BPAR/B[0:7] |
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Feed-through mode. Generated parity checked against APAR and output as |
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ERRA. Generated parity also fed back through the B latch for generate/check as |
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ERRB. |
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H = HIGH Voltage Level |
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L = LOW Voltage Level |
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X = Immaterial |
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Note 1: O/E |
= ODD/EVEN |
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www.fairchildsemi.com |
2 |
Functional Block Diagram
74ABT899
3 |
www.fairchildsemi.com |
74ABT899
Absolute Maximum Ratings(Note 2)
Storage Temperature |
−65°C to +150°C |
Ambient Temperature under Bias |
−55°C to +125°C |
Junction Temperature under Bias |
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Plastic |
−55°C to +150°C |
VCC Pin Potential to |
−0.5V to +7.0V |
Ground Pin |
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Input Voltage (Note 3) |
−0.5V to +7.0V |
Input Current (Note 3) |
−30 mA to +5.0 mA |
Voltage Applied to Any Output |
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in the Disable or Power- |
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Off State |
−0.5V to +5.5V |
in the HIGH State |
−0.5V to VCC |
Current Applied to Output |
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in LOW State (Max) |
twice the rated IOL (mA) |
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DC Latchup Source Current |
−500 mA |
Over Voltage Latchup (I/O) |
10V |
Recommended Operating
Conditions
Free Air Ambient Temperature |
−40°C to +85°C |
Supply Voltage |
+4.5V to +5.5V |
Minimum Input Edge Rate ( V/ |
t) |
Data Input |
50 mV/ns |
Enable Input |
20 mV/ns |
Note 2: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied.
Note 3: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol |
Parameter |
Min |
Typ |
Max |
Units |
VCC |
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Conditions |
VIH |
Input HIGH Voltage |
2.0 |
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V |
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Recognized HIGH Signal |
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VIL |
Input LOW Voltage |
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0.8 |
V |
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Recognized LOW Signal |
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VCD |
Input Clamp Diode Voltage |
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−1.2 |
V |
Min |
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IIN = −18 mA (Non I/O Pins) |
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VOH |
Output HIGH |
2.5 |
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V |
Min |
IOH = −3 mA, (An, Bn, APAR, BPAR) |
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Voltage |
2.0 |
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IOH = −32 mA, (An, Bn, APAR, BPAR) |
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VOL |
Output LOW Voltage |
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0.55 |
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Min |
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IOL = 64 mA, (An, Bn, APAR, BPAR) |
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VID |
Input Leakage Test |
4.75 |
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V |
0.0 |
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IID = 1.9 μA, (Non-I/O Pins) |
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All Other Pins Grounded |
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IIH |
Input HIGH Current |
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5 |
μA |
Max |
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VIN = 2.7V (Non-I/O Pins) (Note 4) |
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VIN = VCC (Non-I/O Pins) |
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IBVI |
Input HIGH Current |
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7 |
μA |
Max |
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VIN = 7.0V (Non-I/O Pins) |
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Breakdown Test |
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IBVIT |
Input HIGH Current |
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100 |
μA |
Max |
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VIN = 5.5V (An, Bn, APAR, BPAR) |
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Breakdown Test (I/O) |
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IIL |
Input LOW Current |
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−5 |
μA |
Max |
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VIN = 0.5V (Non-I/O Pins) (Note 4) |
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VIN = 0.0V (Non-I/O Pins) |
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IIH + IOZH |
Output Leakage Current |
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50 |
μA |
0V–5.5V |
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VOUT = 2.7V (An, Bn); |
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and |
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= 2.0V |
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GAB |
GBA |
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IIL + IOZL |
Output Leakage Current |
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−50 |
μA |
0V–5.5V |
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VOUT = 0.5V (An, Bn); |
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and |
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= 2.0V |
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GAB |
GBA |
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IOS |
Output Short-Circuit Current |
−100 |
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−275 |
mA |
Max |
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VOUT = 0V (An, Bn, APAR, BPAR) |
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ICEX |
Output HIGH Leakage Current |
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50 |
μA |
Max |
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VOUT = VCC (An, Bn, APAR, BPAR) |
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IZZ |
Bus Drainage Test |
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100 |
μA |
0.0V |
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VOUT = 5.5V (An, Bn, APAR, BPAR); |
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All Others GND |
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ICCH |
Power Supply Current |
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250 |
μA |
Max |
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All Outputs HIGH |
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ICCL |
Power Supply Current |
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34 |
mA |
Max |
All Outputs LOW, ERRA/B = HIGH (Note 5) |
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ICCZ |
Power Supply Current |
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250 |
μA |
Max |
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Outputs 3-STATE All Others at VCC or GND |
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ICCT |
Additional ICC/Input |
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2.5 |
mA |
Max |
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VI = VCC − 2.1V All Others at VCC or GND |
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ICCD |
Dynamic ICC: No Load |
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0.4 |
mA/MHz |
Max |
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Outputs Open |
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(Note 4) |
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or |
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= GND, LE = HIGH |
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GAB |
GBA |
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Non-I/O = GND or VCC |
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One bit toggling, 50% duty cycle |
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Note 4: Guaranteed, but not tested.
Note 5: Add 3.75 mA for each ERR LOW.
www.fairchildsemi.com |
4 |
DC Electrical Characteristics
(PLCC package)
Symbol |
Parameter |
Min |
Typ |
Max |
Units |
VCC |
Conditions |
CL = 50 pF, RL = 500Ω |
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VOLP |
Quiet Output Maximum Dynamic VOL |
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0.8 |
1.1 |
V |
5.0 |
TA = 25°C (Note 6) |
VOLV |
Quiet Output Minimum Dynamic VOL |
−1.3 |
−0.8 |
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V |
5.0 |
TA = 25°C (Note 6) |
VOHV |
Minimum HIGH Level Dynamic Output Voltage |
2.5 |
3.0 |
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V |
5.0 |
TA = 25°C (Note 8) |
VIHD |
Minimum HIGH Level Dynamic Input Voltage |
2.2 |
1.8 |
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V |
5.0 |
TA = 25°C (Note 7) |
VILD |
Maximum LOW Level Dynamic Input Voltage |
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0.8 |
0.5 |
V |
5.0 |
TA = 25°C (Note 7) |
Note 6: Max number of outputs defined as (n). n − 1 data inputs are driven 0V to 3V. One output at LOW. Guaranteed, but not tested.
Note 7: Max number of data inputs (n) switching. n − 1 inputs switching 0V to 3V. Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD). Guaranteed, but not tested.
Note 8: Max number of outputs defined as (n). n − 1 data inputs are driven 0V to 3V. One output HIGH. Guaranteed, but not tested.
AC Electrical Characteristics
(SOIC and PLCC Package) |
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TA = +25°C |
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TA = −40°C to +85°C |
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Symbol |
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Parameter |
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VCC = +5.0V |
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VCC = 4.5V–5.5V |
Units |
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CL = 50 pF |
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CL = 50 pF |
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Min |
Typ |
Max |
Min |
Max |
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tPLH |
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Propagation Delay |
1.5 |
3.0 |
4.8 |
1.5 |
4.8 |
ns |
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tPHL |
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An, to Bn |
1.5 |
3.5 |
4.8 |
1.5 |
4.8 |
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tPLH |
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Propagation Delay |
2.5 |
5.9 |
9.2 |
2.5 |
9.2 |
ns |
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tPHL |
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An, Bn to BPAR, APAR |
2.5 |
5.8 |
9.2 |
2.5 |
9.2 |
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tPLH |
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Propagation Delay |
2.5 |
5.4 |
8.5 |
2.5 |
8.5 |
ns |
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tPHL |
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An, Bn to |
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2.5 |
5.4 |
8.5 |
2.5 |
8.5 |
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ERRA, |
ERRB |
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tPLH |
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Propagation Delay |
1.5 |
3.7 |
6.0 |
1.5 |
6.0 |
ns |
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tPHL |
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APAR, BPAR to |
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1.5 |
3.7 |
6.0 |
1.5 |
6.0 |
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ERRA, |
ERRB |
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tPLH |
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Propagation Delay |
2.0 |
4.4 |
6.9 |
2.0 |
6.9 |
ns |
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tPHL |
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ODD/EVEN to APAR, BPAR |
2.0 |
4.4 |
6.9 |
2.0 |
6.9 |
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tPLH |
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Propagation Delay |
1.8 |
4.0 |
6.0 |
1.8 |
6.0 |
ns |
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tPHL |
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to |
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1.8 |
4.0 |
6.0 |
1.8 |
6.0 |
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ODD/EVEN |
ERRA, |
ERRB |
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tPLH |
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Propagation Delay |
1.5 |
3.8 |
6.0 |
1.5 |
6.0 |
ns |
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tPHL |
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SEL to APAR, BPAR |
1.5 |
3.8 |
6.0 |
1.5 |
6.0 |
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tPLH |
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Propagation Delay |
1.5 |
3.2 |
4.6 |
1.5 |
4.6 |
ns |
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tPHL |
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LEA, LEB to Bn, An |
1.5 |
3.2 |
4.6 |
1.5 |
4.6 |
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tPLH |
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Propagation Delay |
2.5 |
5.9 |
8.8 |
2.5 |
8.8 |
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tPHL |
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LEA, LEB to BPAR, APAR |
2.5 |
5.7 |
8.8 |
2.5 |
8.8 |
ns |
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Generate Mode |
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tPLH |
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Propagation Delay |
1.5 |
3.6 |
5.1 |
1.5 |
5.1 |
ns |
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tPHL |
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LEA, LEB to BPAR, APAR, |
1.5 |
3.6 |
5.1 |
1.5 |
5.1 |
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Feed Thru Mode |
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tPLH |
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Propagation Delay |
1.6 |
5.4 |
8.4 |
1.6 |
8.4 |
ns |
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tPHL |
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LEA, LEB to |
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1.6 |
5.4 |
8.4 |
1.6 |
8.4 |
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ERRA, |
ERRB |
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tPZH |
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Output Enable Time |
1.5 |
3.6 |
6.0 |
1.5 |
6.0 |
ns |
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tPZL |
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or |
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to An, |
1.5 |
3.4 |
6.0 |
1.5 |
6.0 |
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GBA |
GAB |
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APAR or Bn, BPAR |
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tPHZ |
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Output Disable Time |
1.0 |
4.0 |
6.0 |
1.0 |
6.0 |
ns |
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tPLZ |
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or |
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to A , |
1.0 |
3.3 |
6.0 |
1.0 |
6.0 |
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GBA |
GAB |
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n |
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APAR or Bn, BPAR |
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tPLHtPHL |
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Propagation Delay |
1.5 |
3.3 |
5.4 |
1.5 |
5.4 |
ns |
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APAR to BPAR, BPAR to APAR |
1.5 |
3.8 |
5.4 |
1.5 |
5.4 |
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74ABT899
5 |
www.fairchildsemi.com |