Analog Devices AD7829BRU, AD7829BR, AD7829BN, AD7822BRU, AD7822BR Datasheet

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Analog Devices AD7829BRU, AD7829BR, AD7829BN, AD7822BRU, AD7822BR Datasheet

a

3 V/5 V, 2 MSPS, 8-Bit, 1-, 4-, 8-Channel

Sampling ADCs

 

 

AD7822/AD7825/AD7829

 

 

 

FEATURES

8-Bit Half-Flash ADC with 420 ns Conversion Time 1, 4 and 8 Single-Ended Analog Input Channels

Available with Input Offset Adjust On-Chip Track-and-Hold

SNR Performance Given for Input Frequencies Up to 10 MHz

On-Chip Reference (2.5 V)

Automatic Power-Down at the End of Conversion Wide Operating Supply Range

3 V 10% and 5 V 10%

Input Ranges

0 V to 2 V p-p, VDD = 3 V 10% 0 V to 2.5 V p-p, VDD = 5 V 10%

Flexible Parallel Interface with EOC Pulse to Allow Stand-Alone Operation

APPLICATIONS

Data Acquisition Systems, DSP Front Ends

Disk Drives

Mobile Communication Systems, Subsampling

Applications

FUNCTIONAL BLOCK DIAGRAM

 

 

CONVST EOC

A0* A1* A2* PD*

VDD

 

 

 

 

CONTROL

 

COMP

 

 

 

 

 

LOGIC

 

 

 

 

 

 

 

2.5V

 

 

 

 

 

 

 

 

REF

 

VIN1

 

 

 

 

 

BUF

VREFIN / OUT

V

*

 

 

 

 

 

IN2

 

 

 

 

 

 

 

VIN3*

INPUT

 

 

8-BIT

 

 

VIN4*

T/H

HALF

 

 

VIN5*

MUX

 

 

FLASH

 

 

 

 

 

ADC

PARALLEL

DB7

VIN6*

 

 

 

 

 

 

 

 

DB0

VIN7*

 

 

 

 

 

PORT

 

 

 

 

 

 

 

VIN8*

 

 

 

 

 

 

 

 

 

 

VMID

AGND

DGND

CS RD

 

 

 

*A0, A1

 

AD7825/AD7829

 

 

 

 

*A2

 

AD7829

 

 

 

 

 

*PD

 

AD7822/AD7825

 

 

 

 

*VIN2 TO VIN4

 

AD7825/AD7829

 

 

 

 

*VIN4 TO VIN8

 

AD7829

 

 

 

GENERAL DESCRIPTION

The AD7822, AD7825, and AD7829 are high speed, 1-, 4-, and 8-channel, microprocessor-compatible, 8-bit analog-to-digital converters with a maximum throughput of 2 MSPS. The AD7822, AD7825, and AD7829 contain an on-chip reference of 2.5 V (2% tolerance), a track/hold amplifier, a 420 ns 8-bit half-flash ADC and a high speed parallel interface. The converters can operate from a single 3 V ± 10% and 5 V ± 10% supply.

The AD7822, AD7825, and AD7829 combine the convert start and power-down functions at one pin, i.e., the CONVST pin.

This allows a unique automatic power-down at the end of a conversion to be implemented. The logic level on the CONVST

pin is sampled after the end of a conversion when an EOC (End of Conversion) signal goes high, and if it is logic low at that point, the ADC is powered down. The AD7822 and AD7825 also have a separate power-down pin. (See Operating Modes section of the data sheet.)

The parallel interface is designed to allow easy interfacing to microprocessors and DSPs. Using only address decoding logic, the parts are easily mapped into the microprocessor address space. The EOC pulse allows the ADCs to be used in a standalone manner. (See Parallel Interface section of the data sheet.)

REV. B

Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.

The AD7822 and AD7825 are available in a 20-/24-lead 0.3" wide, plastic dual-in-line package (DIP), a 20-/24-lead small outline IC (SOIC) and a 20-/24-lead thin shrink small outline package (TSSOP). The AD7829 is available in a 28-lead 0.6" wide, plastic dual-in-line package (DIP), a 28-lead small outline IC (SOIC) and in a 28-lead thin shrink small outline package (TSSOP).

PRODUCT HIGHLIGHTS

1.Fast Conversion Time

The AD7822, AD7825, and AD7829 have a conversion time of 420 ns. Faster conversion times maximize the DSP processing time in a real-time system.

2.Analog Input Span Adjustment

The VMID pin allows the user to offset the input span. This feature can reduce the requirements of single-supply op amps and take into account any system offsets.

3.FPBW (Full Power Bandwidth) of Track-and-Hold

The track-and-hold amplifier has an excellent high-frequency performance. The AD7822, AD7825, and AD7829 are capable of converting full-scale input signals up to a frequency of 10 MHz. This makes the parts ideally suited to subsampling applications.

4.Channel Selection

Channel selection is made without the necessity of writing to the part.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.

Tel: 781/329-4700

www.analog.com

Fax: 781/326-8703

© Analog Devices, Inc., 2001

AD7822/AD7825/AD7829–SPECIFICATIONS(VDD = 3 V 10%, VDD = 5 V 10%, GND = 0 V,

VREF IN/OUT = 2.5 V. All specifications –40 C to +85 C unless otherwise noted.)

Parameter

Version B

Unit

Test Condition/Comment

 

 

 

 

DYNAMIC PERFORMANCE

 

 

fIN = 30 kHz. fSAMPLE = 2 MHz

Signal to (Noise + Distortion) Ratio1

48

dB min

 

Total Harmonic Distortion1

–55

dB max

 

Peak Harmonic or Spurious Noise1

–55

dB max

 

Intermodulation Distortion1

 

 

fa = 27.3 kHz, fb = 28.3 kHz

2nd Order Terms

–65

dB typ

 

3rd Order Terms

–65

dB typ

 

Channel-to-Channel Isolation1

–70

dB typ

fIN = 20 kHz

DC ACCURACY

 

 

 

Resolution

8

Bits

 

Minimum Resolution for Which

 

 

 

No Missing Codes Are Guaranteed

8

Bits

 

Integral Nonlinearity (INL)1

±0.75

LSB max

 

Differential Nonlinearity (DNL)1

±0.75

LSB max

 

Gain Error1

±2

LSB max

 

Gain Error Match1

±0.1

LSB typ

 

Offset Error1

±1

LSB max

 

Offset Error Match1

±0.1

LSB typ

 

ANALOG INPUTS2

 

 

See Analog Input Section

VDD = 5 V ± 10%

 

 

Input Voltage Span = 2.5 V

VIN1 to VIN8 Input Voltage

VDD

V max

 

 

0

V min

 

VMID Input Voltage

VDD – 1.25

V max

Default VMID = 1.25 V

VDD = 3 V ± 10%

1.25

V min

 

 

 

Input Voltage Span = 2 V

VIN1 to VIN8 Input Voltage

VDD

V max

 

 

0

V min

 

VMID Input Voltage

VDD – 1

V max

Default VMID = 1 V

 

1

V min

 

VIN Input Leakage Current

±1

µA max

 

VIN Input Capacitance

15

pF max

 

VMID Input Impedance

6

kΩ typ

 

REFERENCE INPUT

 

 

 

VREF IN/OUT Input Voltage Range

2.55

V max

2.5 V + 2%

 

2.45

V min

2.5 V – 2%

Input Current

1

µA typ

 

 

100

µA max

 

ON-CHIP REFERENCE

±50

 

Nominal 2.5 V

Reference Error

mV max

 

Temperature Coefficient

50

ppm/°C typ

 

LOGIC INPUTS

 

 

VDD = 5 V ± 10%

Input High Voltage, VINH

2.4

V min

Input Low Voltage, VINL

0.8

V max

VDD = 5 V ± 10%

Input High Voltage, VINH

2

V min

VDD = 3 V ± 10%

Input Low Voltage, VINL

0.4

V max

VDD = 3 V ± 10%

Input Current, IIN

±1

µA max

Typically 10 nA, VIN = 0 V to VDD

Input Capacitance, CIN

10

pF max

 

LOGIC OUTPUTS

 

 

ISOURCE = 200 µA

Output High Voltage, VOH

 

 

 

4

V min

VDD = 5 V ± 10%

 

2.4

V min

VDD = 3 V ± 10%

Output Low Voltage, VOL

 

 

ISINK = 200 µA

 

0.4

V max

VDD = 5 V ± 10%

 

0.2

V max

VDD = 3 V ± 10%

High Impedance Leakage Current

±1

µA max

 

High Impedance Capacitance

10

pF max

 

–2–

REV. B

 

 

 

AD7822/AD7825/AD7829

 

 

 

 

 

Parameter

Version B

Unit

Test Condition/Comment

 

 

 

 

 

CONVERSION RATE

 

 

 

 

Track/Hold Acquisition Time

200

ns max

See Functional Description Section

Conversion Time

420

ns max

 

 

 

 

 

 

 

POWER SUPPLY REJECTION

 

 

 

 

VDD ± 10%

±1

LSB max

 

 

POWER REQUIREMENTS

 

 

5 V ± 10%. For Specified Performance

VDD

4.5

V min

 

5.5

V max

3 V ± 10%. For Specified Performance

VDD

2.7

V min

 

3.3

V max

 

 

IDD

 

 

 

 

Normal Operation

12

mA max

8 mA Typically

Power-Down

5

A max

Logic Inputs = 0 V or VDD

 

0.2

A typ

 

 

Power Dissipation

 

 

VDD = 3 V

Normal Operation

36

mW max

Typically 24 mW

Power-Down

 

 

 

 

200 kSPS

9.58

mW typ

 

 

500 kSPS

23.94

mW typ

 

 

NOTES

1See Terminology section of this data sheet.

2Refer to the Analog Input section for an explanation of the Analog Input(s). Specifications subject to change without notice.

200 A

IOL

TO

2.1V

OUTPUT

PIN

 

CL

 

50pF

 

200 A

IOH

Figure 1. Load Circuit for Access Time and Bus Relinquish Time

ORDERING GUIDE

 

Linearity

Package

Package

Model

Error

Description

Option

 

 

 

 

AD7822BN

±0.75 LSB

Plastic DIP

N-20

AD7822BR

±0.75 LSB

Small Outline IC

R-20

AD7822BRU

±0.75 LSB

Thin Shrink Small

RU-20

 

±0.75 LSB

Outline (TSSOP)

 

AD7825BN

Plastic DIP

N-24

AD7825BR

±0.75 LSB

Small Outline IC

R-24

AD7825BRU

±0.75 LSB

Thin Shrink Small

RU-24

 

±0.75 LSB

Outline (TSSOP)

 

AD7829BN

Plastic DIP

N-28

AD7829BR

±0.75 LSB

Small Outline IC

R-28

AD7829BRU

±0.75 LSB

Thin Shrink Small

RU-28

 

 

Outline (TSSOP)

 

 

 

 

 

REV. B

–3–

AD7822/AD7825/AD7829

TIMING CHARACTERISTICS1, 2 (VREF IN/OUT = 2.5 V. All specifications –40 C to +85 C unless otherwise noted.)

Parameter

5 V 10%

3 V 10%

Unit

Conditions/Comments

 

 

 

 

 

t1

420

420

ns max

Conversion Time.

t2

20

20

ns min

Minimum CONVST Pulsewidth.

t3

30

30

ns min

Minimum time between the rising edge of RD and next falling edge of convert start.

t4

110

110

ns max

EOC Pulsewidth.

 

70

70

ns min

 

t5

10

10

ns max

RD rising edge to EOC pulse high.

t6

0

0

ns min

CS to RD setup time.

t7

0

0

ns min

CS to RD hold time.

t8

30

30

ns min

Minimum RD Pulsewidth.

t93

10

20

ns max

Data access time after RD low.

t104

5

5

ns min

Bus relinquish time after RD high.

 

20

20

ns max

 

t11

10

10

ns min

Address setup time before falling edge of RD.

t12

15

15

ns min

Address hold time after falling edge of RD.

t13

200

200

ns min

Minimum time between new channel selection and convert start.

tPOWER UP

25

25

µs typ

Power-up time from rising edge of CONVST using on-chip reference.

tPOWER UP

1

1

µs max

Power-up time from rising edge of CONVST using external 2.5 V reference.

NOTES

1Sample tested to ensure compliance.

2See Figures 20, 21, and 22.

3Measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V with V DD = 5 V ± 10%, and time required for an output to cross 0.4 V or 2.0 V with VDD = 3 V ± 10%.

4Derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number is then extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t 10, quoted in the timing characteristics is the true bus relinquish time of the part and as such is independent of external bus loading capacitances.

ABSOLUTE MAXIMUM RATINGS*

(TA = 25°C unless otherwise noted)

VDD to AGND . . . . . . . . . . . . . . . . . . . .

. . . . . –0.3 V to +7 V

VDD to DGND . . . . . . . . . . . . . . . . . . . .

. . . . . –0.3 V to +7 V

Analog Input Voltage to AGND

 

VIN1 to VIN8 . . . . . . . . . . . . . . . . . . .

–0.3 V to VDD + 0.3 V

Reference Input Voltage to AGND . . .

–0.3 V to VDD + 0.3 V

VMID Input Voltage to AGND . . . . . . .

–0.3 V to VDD + 0.3 V

Digital Input Voltage to DGND . . . . .

–0.3 V to VDD + 0.3 V

Digital Output Voltage to DGND . . . .

–0.3 V to VDD + 0.3 V

Operating Temperature Range

–40°C to +85°C

Industrial (B Version) . . . . . . . . . . . . .

Storage Temperature Range . . . . . . . . . .

. . –65°C to +150°C

Junction Temperature . . . . . . . . . . . . . . .

. . . . . . . . . . . 150°C

Plastic DIP Package, Power Dissipation .

. . . . . . . . . 450 mW

θJA Thermal Impedance . . . . . . . . . . . .

. . . . . . . . . 105°C/W

Lead Temperature, (Soldering, 10 sec)

. . . . . . . . . . . 260°C

SOIC Package, Power Dissipation . . . . . . . . . . . . . . . 450 mW

θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 75°C/W Lead Temperature, Soldering

Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . 215°C Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . 220°C TSSOP Package, Power Dissipation . . . . . . . . . . . . . 450 mW

θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 128°C/W Lead Temperature, Soldering

Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . 215°C Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . 220°C ESD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 kV

*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7822/AD7825/AD7829 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.

WARNING!

ESD SENSITIVE DEVICE

–4–

REV. B

 

AD7822/AD7825/AD7829

 

 

 

PIN FUNCTION DESCRIPTIONS

 

 

Mnemonic

Description

 

 

VIN1 to VIN8

Analog Input Channels. The AD7822 has a single input channel; the AD7825 and AD7829 have four and eight

 

analog input channels respectively. The inputs have an input span of 2.5 V and 2 V depending on the sup-

 

ply voltage (VDD). This span may be centered anywhere in the range AGND to VDD using the VMID Pin. The

 

default input range (VMID unconnected) is AGND to 2 V (VDD = 3 V ± 10%) or AGND to 2.5 V (VDD = 5 V

 

± 10%). See Analog Input section of the data sheet for more information.

VDD

Positive supply voltage, 3 V ± 10% and 5 V ± 10%.

AGND

Analog Ground. Ground reference for track/hold, comparators, reference circuit and multiplexer.

DGND

Digital Ground. Ground reference for digital circuitry.

CONVST

Logic Input Signal. The convert start signal initiates an 8-bit analog-to-digital conversion on the falling edge of

 

this signal. The falling edge of this signal places the track/hold in hold mode. The track/hold goes into track

 

mode again 120 ns after the start of a conversion. The state of the CONVST signal is checked at the end of

 

a conversion. If it is logic low, the AD7822/AD7825/AD7829 will power down. (See Operating Modes section

 

of the data sheet.)

EOC

Logic Output. The End of Conversion signal indicates when a conversion has finished. The signal can be used

 

to interrupt a microcontroller when a conversion has finished or latch data into a gate array. (See Parallel Inter-

 

face section of this data sheet.)

CS

Logic input signal. The chip select signal is used to enable the parallel port of the AD7822, AD7825, and AD7829.

 

This is necessary if the ADC is sharing a common data bus with another device.

PD

Logic Input. The Power-Down pin is present on the AD7822 and AD7825 only. Bringing the PD pin low

 

places the AD7822 and AD7825 in Power-Down mode. The ADCs will power up when PD is brought logic

 

high again.

RD

Logic Input Signal. The read signal is used to take the output buffers out of their high impedance state and

 

drive data onto the data bus. The signal is internally gated with the CS signal. Both RD and CS must be logic

 

low to enable the data bus.

A0–A2

Channel Address Inputs. The address of the next multiplexer channel must be present on these inputs when the

 

RD signal goes low.

DB0–DB7

Data Output Lines. They are normally held in a high impedance state. Data is driven onto the data bus when

 

both RD and CS go active low.

VREF IN/OUT

Analog Input and Output. An external reference can be connected to the AD7822, AD7825, and AD7829 at this

 

pin. The on-chip reference is also available at this pin. When using the internal reference, this pin can be

 

left unconnected or, in some cases, it can be decoupled to AGND with a 0.1 F capacitor.

 

 

 

PIN CONFIGURATIONS

 

DIP/SOIC/TSSOP

 

 

 

 

 

 

 

DB2

1

 

 

 

20

DB3

 

 

 

 

 

 

 

DB1

2

 

 

 

19

DB4

 

 

 

 

 

 

 

DB0

3

 

 

 

18

DB5

 

 

 

 

 

 

 

CONVST

4

 

 

 

17

DB6

 

 

 

 

 

 

 

CS

5

AD7822

16

DB7

 

 

TOP VIEW

 

 

RD

6

15

AGND

(Not to Scale)

 

 

 

 

DGND

7

 

 

 

14

V

 

 

 

 

 

 

DD

 

 

 

 

 

 

EOC

8

 

 

 

13

VREF IN/OUT

 

 

 

 

 

 

 

PD

9

 

 

 

12

VMID

 

 

 

 

 

 

NC

10

 

 

 

11

VIN1

 

 

 

 

 

 

 

NC = NO CONNECT

 

 

 

 

 

 

 

DB2

1

 

 

 

24

DB3

 

 

 

 

 

 

 

DB1

2

 

 

 

23

DB4

 

 

 

 

 

 

 

DB0

3

 

 

 

22

DB5

 

 

 

 

 

 

 

CONVST

4

 

 

 

21

DB6

 

 

 

 

 

 

 

CS

5

AD7825

20

DB7

 

 

 

 

RD

6

TOP VIEW

19

AGND

 

 

(Not to Scale)

18

 

DGND

7

V

 

 

 

 

 

 

DD

 

 

 

 

 

 

EOC

8

 

 

 

17

VREF IN/OUT

 

 

 

 

 

 

 

A1

9

 

 

 

16

VMID

 

 

 

 

 

 

A0

10

 

 

 

15

VIN1

 

 

 

 

 

 

PD

11

 

 

 

14

VIN2

 

 

 

 

 

13

 

VIN4

12

 

 

 

VIN3

 

 

 

 

 

 

 

 

 

 

 

 

 

 

DB2

1

 

 

 

28 DB3

 

 

 

 

 

 

 

DB1

2

 

 

 

27

DB4

 

 

 

 

 

 

 

DB0

3

 

 

 

26

DB5

 

 

 

 

 

 

 

CONVST

4

 

 

 

25

DB6

 

 

 

 

 

 

 

CS

5

 

 

 

24

DB7

 

 

 

 

 

 

 

RD

6

 

 

 

23

AGND

 

 

AD7829

 

 

DGND

7

22

VDD

TOP VIEW

 

 

 

 

EOC

8

(Not to Scale)

21

VREF IN/OUT

 

 

 

 

 

 

 

A2

9

 

 

 

20

V

 

 

 

 

 

 

MID

 

 

 

 

 

 

A1

10

 

 

 

19

VIN1

 

 

 

 

 

 

 

A0

11

 

 

 

18

VIN2

VIN8

 

 

 

 

 

12

 

 

 

17

VIN3

 

 

 

 

 

VIN7

13

 

 

 

16

VIN4

 

 

 

 

 

VIN6

14

 

 

 

15

VIN5

 

 

 

 

 

REV. B

–5–

AD7822/AD7825/AD7829

TERMINOLOGY

Signal-to-(Noise + Distortion) Ratio

This is the measured ratio of signal-to-(noise + distortion) at the output of the A/D converter. The signal is the rms amplitude of the fundamental. Noise is the rms sum of all nonfundamental signals up to half the sampling frequency (fS/2), excluding dc. The ratio is dependent upon the number of quantization levels in the digitization process; the more levels, the smaller the quantization noise. The theoretical signal-to-(noise + distortion) ratio for an ideal N-bit converter with a sine wave input is given by:

Signal-to-(Noise + Distortion) = (6.02N + 1.76) dB

Thus, for an 8-bit converter, this is 50 dB.

Total Harmonic Distortion

Total harmonic distortion (THD) is the ratio of the rms sum of harmonics to the fundamental. For the AD7822/AD7825/AD7829 it is defined as:

V 2 +V 2 +V 2 +V 2 +V 2

= 2 3 4 5 6

THD (dB) 20 log

V1

where V1 is the rms amplitude of the fundamental and V2, V3, V4, V5, and V6 are the rms amplitudes of the second through the sixth harmonics.

Peak Harmonic or Spurious Noise

Peak harmonic or spurious noise is defined as the ratio of the rms value of the next largest component in the ADC output spectrum (up to fS/2 and excluding dc) to the rms value of the fundamental. Normally, the value of this specification is determined by the largest harmonic in the spectrum, but for parts where the harmonics are buried in the noise floor, it will be a noise peak.

Intermodulation Distortion

With inputs consisting of sine waves at two frequencies, fa and fb, any active device with nonlinearities will create distortion products at sum and difference frequencies of mfa ± nfb where m, n = 0, 1, 2, 3, etc. Intermodulation terms are those for which neither m nor n are equal to zero. For example, the second order terms include (fa + fb) and (fa – fb), while the third order terms include (2fa + fb), (2fa – fb), (fa + 2fb) and (fa – 2fb).

The AD7822/AD7825/AD7829 are tested using the CCIF standard where two input frequencies near the top end of the input bandwidth are used. In this case, the second and third order terms are of different significance. The second order terms are usually distanced in frequency from the original sine waves while the third order terms are usually at a frequency close to the input frequencies. As a result, the second and third order terms are specified separately. The calculation of the intermodulation distortion is as per the THD specification where it is the ratio of the rms sum of the individual distortion products to the rms amplitude of the fundamental expressed in dBs.

Channel-to-Channel Isolation

Channel-to-channel isolation is a measure of the level of crosstalk between channels. It is measured by applying a full-scale 20 kHz sine wave signal to one input channel and determining how much that signal is attenuated in each of the other channels. The figure given is the worst case across all four or eight channels of the AD7825 and AD7829, respectively.

Relative Accuracy

Relative accuracy or endpoint nonlinearity is the maximum deviation from a straight line passing through the endpoints of the ADC transfer function.

Differential Nonlinearity

The difference between the measured and the ideal 1 LSB change between any two adjacent codes in the ADC.

Offset Error

The deviation of the 128th code transition (01111111) to (10000000) from the ideal, i.e., VMID.

Offset Error Match

The difference in offset error between any two channels.

Zero-Scale Error

The deviation of the first code transition (00000000) to (00000001) from the ideal, i.e., VMID – 1.25 V + 1 LSB (VDD = 5 V ± 10%), or VMID – 1.0 V + 1 LSB (VDD = 3 V ± 10%).

Full-Scale Error

The deviation of the last code transition (11111110) to (11111111) from the ideal, i.e., VMID + 1.25 V – 1 LSB (VDD = 5 V ± 10%), or VMID + 1.0 V – 1 LSB (VDD = 3 V ± 10%).

Gain Error

The deviation of the last code transition (1111 . . . 110) to (1111 . . . 111) from the ideal, i.e., VREF – 1 LSB, after the offset error has been adjusted out.

Gain Error Match

The difference in gain error between any two channels.

Track/Hold Acquisition Time

The time required for the output of the track/hold amplifier to reach its final value, within ±1/2 LSB, after the point at which

the track/hold returns to track mode. This happens approximately 120 ns after the falling edge of CONVST.

It also applies to situations where a change in the selected input channel takes place or where there is a step input change on the input voltage applied to the selected VIN input of the AD7822/ AD7825/AD7829. It means that the user must wait for the duration of the track/hold acquisition time after a channel change/step input change to VIN before starting another conversion, to ensure that the part operates to specification.

PSR (Power Supply Rejection)

Variations in power supply will affect the full-scale transition, but not the converter’s linearity. Power supply rejection is the maximum change in the full-scale transition point due to a change in power supply voltage from the nominal value.

CIRCUIT DESCRIPTION

The AD7822, AD7825, and AD7829 consist of a track-and-hold amplifier followed by a half-flash analog-to-digital converter. These devices use a half-flash conversion technique where one 4-bit flash ADC is used to achieve an 8-bit result. The 4-bit flash ADC contains a sampling capacitor followed by fifteen comparators that compare the unknown input to a reference ladder to achieve a 4-bit result. This first flash, i.e., coarse conversion, provides the 4 MSBs. For a full 8-bit reading to be realized, a second flash, i.e., a fine conversion, must be performed to provide the 4 LSBs. The 8-bit word is then placed on the data output bus.

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REV. B

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