Analog Devices AD7547UQ, AD7547UE, AD7547TQ, AD7547TE, AD7547SQ Datasheet

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LC2MOS

Parallel Loading Dual 12-Bit DAC

 

 

 

 

 

AD7547

 

 

 

FEATURES

Two 12-Bit DACs in One Package

DAC Ladder Resistance Matching: 0.5% Space Saving Skinny DIP and Surface

Mount Packages 4-Quadrant Multiplication

Low Gain Error (1 LSB max Over Temperature) Fast Interface Timing

APPLICATIONS

Automatic Test Equipment

Programmable Filters

Audio Applications

Synchro Applications

Process Control

GENERAL DESCRIPTION

The AD7547 contains two 12-bit current output DACs on one monolithic chip. Also on-chip are the level shifters, data registers and control logic for easy microprocessor interfacing. There are 12 data inputs. CSA, CSB, WR control DAC selection and loading. Data is latched into the DAC registers on the rising edge of WR. The device is speed compatible with most microprocessors and accepts TTL, 74HC and 5 V CMOS logic level inputs.

The D/A converters provide 4-quadrant multiplication capabilities with separate reference inputs and feedback resistors. Monolithic construction ensures that thermal and gain error tracking is excellent. 12-bit monotonicity is guaranteed for both DACs over the full temperature range.

The AD7547 is manufactured using the Linear Compatible CMOS (LC2MOS) process. This allows fast digital logic and precision linear circuitry to be fabricated on the same die.

FUNCTIONAL BLOCK DIAGRAM

PRODUCT HIGHLIGHTS

1.DAC to DAC Matching

Since both DACs are fabricated on the same chip, precise matching and tracking is inherent. Many applications which are not practical using two discrete DACs are now possible. Typical matching: 0.5%.

2.Small Package Size

The AD7547 is available in 0.3" wide 24-pin DIPs and SOICs and in 28-terminal surface mount packages.

3.Wide Power Supply Tolerance

The device operates on a +12 V to +15 V VDD, with ±10% tolerance on this nominal figure. All specifications are guaranteed over this range.

REV. A

Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 617/329-4700 Fax: 617/326-8703

AD7547–SPECIFICATIONS1

(VDD = +12 V to +15 V, 610%, VREFA = VREFB = 10 V; IOUTA = IOUTB = AGND =

O V. All specifications TMIN to TMAX unless otherwise noted.)

Parameter

J, A Versions

K, B Versions

L, C Versions

S Version

T Version

U Version

Units

Test Conditions/Comments

ACCURACY

 

 

 

 

 

 

 

 

Resolution

12

12

12

12

12

12

Bits

 

Relative Accuracy

± 1

± 1/2

± 1/2

± 1

± 1/2

± 1/2

LSB max

 

Differential Nonlinearity

± 1

± 1

± 1

± 1

± 1

± 1

LSB max

All grades guaranteed

 

± 6

± 3

± l

± 6

± 3

± 2

 

monotonic over temperature.

Gain Error

LSB max

Both DAC registers loaded

Gain Temperature Coefficient2;

 

 

 

 

 

 

 

with all 1s.

 

 

 

 

 

 

 

 

DGain/DTemperature

± 5

± 5

± 5

± 5

± 5

± 5

ppm/°C max

Typical value is 1 ppm/°C

Output Leakage Current

 

 

 

 

 

 

 

 

IOUTA

 

 

 

 

 

 

 

 

+25°C

10

10

10

10

10

10

nA max

DAC A Register loaded

TMIN to TMAX

150

150

150

250

250

250

nA max

with all 0s.

IOUTB

 

 

 

 

 

 

 

 

+25°C

10

10

10

10

10

10

nA max

DAC B Register loaded

TMIN to TMAX

150

150

150

250

250

250

nA max

with all 0s.

REFERENCE INPUT

 

 

 

 

 

 

kW min

Typical Input Resistance = 14 kW

Input Resistance

9

9

9

9

9

9

 

20

20

20

20

20

20

kW max

 

VREFA, VREFB

± 3

± 3

± 1

± 3

± 3

± 1

 

Typically ±0.5%

Input Resistance Match

% max

DIGITAL INPUTS

 

 

 

 

 

 

 

 

VIH (Input High Voltage)

2.4

2.4

2.4

2.4

2.4

2.4

V min

 

VIL (lnput Low Voltage)

0.8

0.8

0.8

0.8

0.8

0.8

V max

 

IIN (Input Current)

 

 

 

 

 

 

 

 

+25°C

± 1

± 1

± 1

± 1

± 1

± 1

mA max

VIN = VDD

TMIN to TMAX

± 10

± 10

± 10

± 10

± 10

± 10

mA max

 

CIN (Input Capacitance)2

10

10

10

10

10

10

pF max

 

POWER SUPPLY3

 

 

 

 

 

 

 

 

VDD

10.8/16.5

10.8/16.5

10.8/16.5

10.8/16.5

10.8/16.5

10.8/16.5

V min/V max

 

IDD

2

2

2

2

2

2

mA max

 

AC PERFORMANCE CHARACTERISTICS

These characteristics are included for Design Guidance only and are not subject to test.

(VDD = +12 V to +15 V; VREFA = VREFB = +10 V, IOUTA = IOUTB = AGND = 0 V. Output Amplifiers are AD644 except where noted.)

Parameter

TA = +258C

TA = TMIN, TMAX

Units

Test Conditions/Comments

Output Current Settling Time

1.5

 

ms max

To 0.01 % of full-scale range. IOUT load = 100 W, CEXT = 13 pF.

 

 

 

 

 

 

DAC output measured from rising edge of

WR

.

 

 

 

 

 

 

Typical Value of Settling Time is 0.8 ms.

Digital-to-Analog Glitch Impulse

7

 

nV-s typ

Measured with VREFA = VREFB = 0 V. IOUTA, IOUTB

 

 

 

 

 

 

load = 100 W, CEXT = 13 pF. DAC registers alternately

 

 

 

 

 

 

loaded with all 0s and all 1s.

AC Feedthrough4

 

 

 

 

 

 

 

 

VREFA to IOUTA

–70

–65

dB max

VREFA, VREFB = 20 V p-p, 10 kHz sine wave. DAC

VREFB to IOUTB

–70

–65

dB max

registers loaded with all 0s.

Power Supply Rejection

 

 

 

 

 

 

 

 

DGain/DVDD

± 0.01

± 0.02

% per % max

DVDD = VDD max – VDD min

 

 

 

 

 

 

 

 

 

Output Capacitance

 

 

 

 

 

 

 

 

COUTA

70

70

pF max

DAC A, DAC B loaded with all 0s.

COUTB

70

70

pF max

 

 

 

COUTA

140

140

pF max

DAC A, DAC B loaded with all 1s.

COUTB

140

140

pF max

 

 

 

Channel-to-Channel Isolation

 

 

 

 

 

 

 

 

VREFA to IOUTB

–84

 

dB typ

VREFA = 20 V p-p 10 kHz sine wave, VREFB = 0 V.

 

 

 

 

 

 

Both DACs loaded with all 1s.

VREFB to IOUTA

–84

 

dB typ

VREFB = 20 V p-p 10 kHz sine wave, VREFA = 0 V.

 

 

 

 

 

 

Both DACs loaded with all 1s.

Digital Crosstalk

7

 

nV-s typ

Measured for a Code Transition of all 0s to all 1s.

 

 

 

 

 

 

IOUTA, IOUTB Load = 100 W, CEXT = 13 pF

Output Noise Voltage Density

25

 

nV/Ö

 

typ

Measured between RFBA and IOUTA or RFBB and IOUTB.

 

Hz

(10 Hz–100 kHz)

 

 

 

 

 

Frequency of measurement is 10 Hz–100 kHz.

Total Harmonic Distortion

–82

 

dB typ

VIN = 6 V rms, 1 kHz. Both DACs loaded with all 1s.

NOTES

1Temperature range as follows: J, K, L Versions, –40°C to +85°C; A, B, C Versions, –40°C to +85°C; S, T, U Versions, –55°C to +125°C. 2Sample tested at +25°C to ensure compliance.

3Functional at VDD = 5 V with degraded specifications. 4Pin 12 (DGND) on ceramic DIPs is connected to lid.

Specifications subject to change without notice.

–2–

REV. A

Analog Devices AD7547UQ, AD7547UE, AD7547TQ, AD7547TE, AD7547SQ Datasheet

 

 

 

 

 

AD7547

 

 

 

 

 

 

TIMING CHARACTERISTICS (VDD = 10.8 V to 16.5 V, VREFA = VREFB = +10 V, IOUTA = IOUTB = AGND = 0 V)

 

 

 

 

 

 

 

 

Limit at

Limit at

 

 

 

Limit at

TA = –408C

TA = –558C

 

 

Parameter

TA = +258C

to +858C

to +1258C

Units

Test Conditions/Comments

t1

60

80

80

ns min

Data Setup Time

t2

25

25

25

ns min

Data Hold Time

t3

80

80

100

ns min

Chip Select to Write Setup Time

t4

0

0

0

ns min

Chip Select to Write Hold Time

t5

80

80

100

ns min

Write Pulse Width

Specifications subject to change without notice.

ABSOLUTE MAXIMUM RATINGS*

(TA = +25°C unless otherwise noted)

VDD to DGND . . . . . . . . . . . . . . . . . . . .

. . . . . . –0.3 V, +17 V

VREFA, VREFB to AGND . . . . . . . . . . . . .

. . . . . . . . . . . . ±25 V

VRFBA, VRFBB to AGND . . . . . . . . . . . . . .

. . . . . . . . . . . ±25 V

Digital Input Voltage to DGND . . . . . . .

–0.3 V, VDD +0.3 V

IOUTA, IOUTB to DGND . . . . . . . . . . . . . .

–0.3 V, VDD +0.3 V

AGND to DGND . . . . . . . . . . . . . . . . . .

–0.3 V, VDD +0.3 V

Power Dissipation (Any Package)

 

To +75°C . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . . . . 450 mW

Derates above +75°C . . . . . . . . . . . . . .

. . . . . . . . 6 mW/°C

Operating Temperature Range

. . . . –40°C to +85°C

Commercial Plastic (J, K, L Versions)

Industrial Hermetic (A, B, C Versions)

. . . –40°C to +85°C

Extended Hermetic (S, T, U Versions) .

. . –55°C to +125°C

Storage Temperature . . . . . . . . . . . . . .

. . –65°C to +150°C

Lead Temperature (Soldering, 10 secs) . .

. . . . . . . . . +300°C

*Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

 

 

 

 

 

 

 

Table I. AD7547 Truth Table

 

 

 

 

 

 

 

 

 

 

 

 

CSA

 

 

CSB

 

 

WR

 

FUNCTION

 

 

 

 

 

 

 

 

 

 

 

 

 

X

 

X

1

 

No Data Transfer

1

 

1

 

 

X

 

No Data Transfer

g

 

g

0

 

A Rising Edge on

CSA

or

CSB

Loads

 

 

 

 

 

 

 

 

Data to the Respective DAC from the Data Bus

0

 

1

 

 

g

 

DAC A Register Loaded from Data Bus

1

 

0

 

 

g

 

DAC B Register Loaded from Data Bus

0

 

0

 

 

g

 

DAC A and DAC B Registers Loaded

 

 

 

 

 

 

 

 

from Data Bus

 

 

 

 

 

 

 

 

 

 

 

 

 

NOTES

1.X = Don’t care.

2.g means rising edge triggered.

Figure 1. Timing Diagram

ORDERING GUIDE1

 

Temperature

Relative

Gain

Package

Model2

Range

Accuracy

Error

Option3

 

 

 

 

 

AD7547JN

–40°C to +85°C

±1 LSB

±6 LSB

N-24

AD7547KN

–40°C to +85°C

±1/2 LSB

±3 LSB

N-24

AD7547LN

–40°C to +85°C

±1/2 LSB

±1 LSB

N-24

AD7547JP

–40°C to +85°C

±1 LSB

±6 LSB

P-28A

AD7547KP

–40°C to +85°C

±1/2 LSB

±3 LSB

P-28A

AD7547LP

–40°C to +85°C

±1/2 LSB

±1 LSB

P-28A

AD7547JR

–40°C to +85°C

±1 LSB

±6 LSB

R-24

AD7547KR

–40°C to +85°C

±1/2 LSB

±3 LSB

R-24

AD7547LR

–40°C to +85°C

±1/2 LSB

±1 LSB

R-24

AD7547AQ

–40°C to +85°C

±1 LSB

±6 LSB

Q-24

AD7547BQ

–40°C to +85°C

±1/2 LSB

±3 LSB

Q-24

AD7547CQ

–40°C to +85°C

±1/2 LSB

±1 LSB

Q-24

AD7547SQ

–55°C to +125°C

±1 LSB

±6 LSB

Q-24

AD7547TQ

–55°C to +125°C

±1/2 LSB

±3 LSB

Q-24

AD7547UQ

–55°C to +125°C

±1/2 LSB

±2 LSB

Q-24

AD7547SE

–55°C to +125°C

±1 LSB

±6 LSB

E-28A

AD7547TE

–55°C to +125°C

±1/2 LSB

±3 LSB

E-28A

AD7547UE

–55°C to +125°C

±1/2 LSB

±2 LSB

E-28A

NOTES

1Analog Devices reserves the right to ship ceramic packages (D-24A) in lieu of cerdip packages (Q-24).

2To order MIL-STD-883, Class B processed parts, add /883B to part number. Contact your local sales office for military data sheets.

3E = Leadless Ceramic Chip Carrier; N = Plastic DIP; P = Plastic Leaded Chip Carrier; Q = Cerdip; R = SOIC.

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7547 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.

WARNING!

ESD SENSITIVE DEVICE

REV. A

–3–

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