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LC2MOS |
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Parallel Loading Dual 12-Bit DAC |
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AD7547 |
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Two 12-Bit DACs in One Package
DAC Ladder Resistance Matching: 0.5% Space Saving Skinny DIP and Surface
Mount Packages 4-Quadrant Multiplication
Low Gain Error (1 LSB max Over Temperature) Fast Interface Timing
Automatic Test Equipment
Programmable Filters
Audio Applications
Synchro Applications
Process Control
The AD7547 contains two 12-bit current output DACs on one monolithic chip. Also on-chip are the level shifters, data registers and control logic for easy microprocessor interfacing. There are 12 data inputs. CSA, CSB, WR control DAC selection and loading. Data is latched into the DAC registers on the rising edge of WR. The device is speed compatible with most microprocessors and accepts TTL, 74HC and 5 V CMOS logic level inputs.
The D/A converters provide 4-quadrant multiplication capabilities with separate reference inputs and feedback resistors. Monolithic construction ensures that thermal and gain error tracking is excellent. 12-bit monotonicity is guaranteed for both DACs over the full temperature range.
The AD7547 is manufactured using the Linear Compatible CMOS (LC2MOS) process. This allows fast digital logic and precision linear circuitry to be fabricated on the same die.
1.DAC to DAC Matching
Since both DACs are fabricated on the same chip, precise matching and tracking is inherent. Many applications which are not practical using two discrete DACs are now possible. Typical matching: 0.5%.
2.Small Package Size
The AD7547 is available in 0.3" wide 24-pin DIPs and SOICs and in 28-terminal surface mount packages.
3.Wide Power Supply Tolerance
The device operates on a +12 V to +15 V VDD, with ±10% tolerance on this nominal figure. All specifications are guaranteed over this range.
REV. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 617/329-4700 Fax: 617/326-8703
AD7547–SPECIFICATIONS1 |
(VDD = +12 V to +15 V, 610%, VREFA = VREFB = 10 V; IOUTA = IOUTB = AGND = |
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O V. All specifications TMIN to TMAX unless otherwise noted.) |
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Parameter |
J, A Versions |
K, B Versions |
L, C Versions |
S Version |
T Version |
U Version |
Units |
Test Conditions/Comments |
ACCURACY |
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Resolution |
12 |
12 |
12 |
12 |
12 |
12 |
Bits |
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Relative Accuracy |
± 1 |
± 1/2 |
± 1/2 |
± 1 |
± 1/2 |
± 1/2 |
LSB max |
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Differential Nonlinearity |
± 1 |
± 1 |
± 1 |
± 1 |
± 1 |
± 1 |
LSB max |
All grades guaranteed |
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± 6 |
± 3 |
± l |
± 6 |
± 3 |
± 2 |
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monotonic over temperature. |
Gain Error |
LSB max |
Both DAC registers loaded |
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Gain Temperature Coefficient2; |
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with all 1s. |
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DGain/DTemperature |
± 5 |
± 5 |
± 5 |
± 5 |
± 5 |
± 5 |
ppm/°C max |
Typical value is 1 ppm/°C |
Output Leakage Current |
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IOUTA |
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+25°C |
10 |
10 |
10 |
10 |
10 |
10 |
nA max |
DAC A Register loaded |
TMIN to TMAX |
150 |
150 |
150 |
250 |
250 |
250 |
nA max |
with all 0s. |
IOUTB |
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+25°C |
10 |
10 |
10 |
10 |
10 |
10 |
nA max |
DAC B Register loaded |
TMIN to TMAX |
150 |
150 |
150 |
250 |
250 |
250 |
nA max |
with all 0s. |
REFERENCE INPUT |
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kW min |
Typical Input Resistance = 14 kW |
Input Resistance |
9 |
9 |
9 |
9 |
9 |
9 |
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20 |
20 |
20 |
20 |
20 |
20 |
kW max |
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VREFA, VREFB |
± 3 |
± 3 |
± 1 |
± 3 |
± 3 |
± 1 |
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Typically ±0.5% |
Input Resistance Match |
% max |
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DIGITAL INPUTS |
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VIH (Input High Voltage) |
2.4 |
2.4 |
2.4 |
2.4 |
2.4 |
2.4 |
V min |
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VIL (lnput Low Voltage) |
0.8 |
0.8 |
0.8 |
0.8 |
0.8 |
0.8 |
V max |
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IIN (Input Current) |
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+25°C |
± 1 |
± 1 |
± 1 |
± 1 |
± 1 |
± 1 |
mA max |
VIN = VDD |
TMIN to TMAX |
± 10 |
± 10 |
± 10 |
± 10 |
± 10 |
± 10 |
mA max |
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CIN (Input Capacitance)2 |
10 |
10 |
10 |
10 |
10 |
10 |
pF max |
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POWER SUPPLY3 |
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VDD |
10.8/16.5 |
10.8/16.5 |
10.8/16.5 |
10.8/16.5 |
10.8/16.5 |
10.8/16.5 |
V min/V max |
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IDD |
2 |
2 |
2 |
2 |
2 |
2 |
mA max |
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These characteristics are included for Design Guidance only and are not subject to test.
(VDD = +12 V to +15 V; VREFA = VREFB = +10 V, IOUTA = IOUTB = AGND = 0 V. Output Amplifiers are AD644 except where noted.)
Parameter |
TA = +258C |
TA = TMIN, TMAX |
Units |
Test Conditions/Comments |
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Output Current Settling Time |
1.5 |
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ms max |
To 0.01 % of full-scale range. IOUT load = 100 W, CEXT = 13 pF. |
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DAC output measured from rising edge of |
WR |
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Typical Value of Settling Time is 0.8 ms. |
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Digital-to-Analog Glitch Impulse |
7 |
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nV-s typ |
Measured with VREFA = VREFB = 0 V. IOUTA, IOUTB |
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load = 100 W, CEXT = 13 pF. DAC registers alternately |
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loaded with all 0s and all 1s. |
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AC Feedthrough4 |
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VREFA to IOUTA |
–70 |
–65 |
dB max |
VREFA, VREFB = 20 V p-p, 10 kHz sine wave. DAC |
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VREFB to IOUTB |
–70 |
–65 |
dB max |
registers loaded with all 0s. |
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Power Supply Rejection |
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DGain/DVDD |
± 0.01 |
± 0.02 |
% per % max |
DVDD = VDD max – VDD min |
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Output Capacitance |
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COUTA |
70 |
70 |
pF max |
DAC A, DAC B loaded with all 0s. |
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COUTB |
70 |
70 |
pF max |
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COUTA |
140 |
140 |
pF max |
DAC A, DAC B loaded with all 1s. |
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COUTB |
140 |
140 |
pF max |
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Channel-to-Channel Isolation |
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VREFA to IOUTB |
–84 |
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dB typ |
VREFA = 20 V p-p 10 kHz sine wave, VREFB = 0 V. |
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Both DACs loaded with all 1s. |
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VREFB to IOUTA |
–84 |
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dB typ |
VREFB = 20 V p-p 10 kHz sine wave, VREFA = 0 V. |
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Both DACs loaded with all 1s. |
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Digital Crosstalk |
7 |
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nV-s typ |
Measured for a Code Transition of all 0s to all 1s. |
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IOUTA, IOUTB Load = 100 W, CEXT = 13 pF |
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Output Noise Voltage Density |
25 |
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nV/Ö |
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typ |
Measured between RFBA and IOUTA or RFBB and IOUTB. |
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Hz |
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(10 Hz–100 kHz) |
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Frequency of measurement is 10 Hz–100 kHz. |
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Total Harmonic Distortion |
–82 |
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dB typ |
VIN = 6 V rms, 1 kHz. Both DACs loaded with all 1s. |
NOTES
1Temperature range as follows: J, K, L Versions, –40°C to +85°C; A, B, C Versions, –40°C to +85°C; S, T, U Versions, –55°C to +125°C. 2Sample tested at +25°C to ensure compliance.
3Functional at VDD = 5 V with degraded specifications. 4Pin 12 (DGND) on ceramic DIPs is connected to lid.
Specifications subject to change without notice.
–2– |
REV. A |
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AD7547 |
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TIMING CHARACTERISTICS (VDD = 10.8 V to 16.5 V, VREFA = VREFB = +10 V, IOUTA = IOUTB = AGND = 0 V) |
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Limit at |
Limit at |
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Limit at |
TA = –408C |
TA = –558C |
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Parameter |
TA = +258C |
to +858C |
to +1258C |
Units |
Test Conditions/Comments |
t1 |
60 |
80 |
80 |
ns min |
Data Setup Time |
t2 |
25 |
25 |
25 |
ns min |
Data Hold Time |
t3 |
80 |
80 |
100 |
ns min |
Chip Select to Write Setup Time |
t4 |
0 |
0 |
0 |
ns min |
Chip Select to Write Hold Time |
t5 |
80 |
80 |
100 |
ns min |
Write Pulse Width |
Specifications subject to change without notice.
ABSOLUTE MAXIMUM RATINGS*
(TA = +25°C unless otherwise noted)
VDD to DGND . . . . . . . . . . . . . . . . . . . . |
. . . . . . –0.3 V, +17 V |
VREFA, VREFB to AGND . . . . . . . . . . . . . |
. . . . . . . . . . . . ±25 V |
VRFBA, VRFBB to AGND . . . . . . . . . . . . . . |
. . . . . . . . . . . ±25 V |
Digital Input Voltage to DGND . . . . . . . |
–0.3 V, VDD +0.3 V |
IOUTA, IOUTB to DGND . . . . . . . . . . . . . . |
–0.3 V, VDD +0.3 V |
AGND to DGND . . . . . . . . . . . . . . . . . . |
–0.3 V, VDD +0.3 V |
Power Dissipation (Any Package) |
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To +75°C . . . . . . . . . . . . . . . . . . . . . . . |
. . . . . . . . . 450 mW |
Derates above +75°C . . . . . . . . . . . . . . |
. . . . . . . . 6 mW/°C |
Operating Temperature Range |
. . . . –40°C to +85°C |
Commercial Plastic (J, K, L Versions) |
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Industrial Hermetic (A, B, C Versions) |
. . . –40°C to +85°C |
Extended Hermetic (S, T, U Versions) . |
. . –55°C to +125°C |
Storage Temperature . . . . . . . . . . . . . . |
. . –65°C to +150°C |
Lead Temperature (Soldering, 10 secs) . . |
. . . . . . . . . +300°C |
*Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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Table I. AD7547 Truth Table |
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CSA |
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CSB |
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WR |
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FUNCTION |
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X |
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X |
1 |
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No Data Transfer |
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1 |
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1 |
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X |
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No Data Transfer |
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g |
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g |
0 |
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A Rising Edge on |
CSA |
or |
CSB |
Loads |
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Data to the Respective DAC from the Data Bus |
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0 |
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1 |
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g |
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DAC A Register Loaded from Data Bus |
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1 |
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0 |
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g |
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DAC B Register Loaded from Data Bus |
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0 |
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0 |
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g |
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DAC A and DAC B Registers Loaded |
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from Data Bus |
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NOTES
1.X = Don’t care.
2.g means rising edge triggered.
Figure 1. Timing Diagram
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Temperature |
Relative |
Gain |
Package |
Model2 |
Range |
Accuracy |
Error |
Option3 |
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AD7547JN |
–40°C to +85°C |
±1 LSB |
±6 LSB |
N-24 |
AD7547KN |
–40°C to +85°C |
±1/2 LSB |
±3 LSB |
N-24 |
AD7547LN |
–40°C to +85°C |
±1/2 LSB |
±1 LSB |
N-24 |
AD7547JP |
–40°C to +85°C |
±1 LSB |
±6 LSB |
P-28A |
AD7547KP |
–40°C to +85°C |
±1/2 LSB |
±3 LSB |
P-28A |
AD7547LP |
–40°C to +85°C |
±1/2 LSB |
±1 LSB |
P-28A |
AD7547JR |
–40°C to +85°C |
±1 LSB |
±6 LSB |
R-24 |
AD7547KR |
–40°C to +85°C |
±1/2 LSB |
±3 LSB |
R-24 |
AD7547LR |
–40°C to +85°C |
±1/2 LSB |
±1 LSB |
R-24 |
AD7547AQ |
–40°C to +85°C |
±1 LSB |
±6 LSB |
Q-24 |
AD7547BQ |
–40°C to +85°C |
±1/2 LSB |
±3 LSB |
Q-24 |
AD7547CQ |
–40°C to +85°C |
±1/2 LSB |
±1 LSB |
Q-24 |
AD7547SQ |
–55°C to +125°C |
±1 LSB |
±6 LSB |
Q-24 |
AD7547TQ |
–55°C to +125°C |
±1/2 LSB |
±3 LSB |
Q-24 |
AD7547UQ |
–55°C to +125°C |
±1/2 LSB |
±2 LSB |
Q-24 |
AD7547SE |
–55°C to +125°C |
±1 LSB |
±6 LSB |
E-28A |
AD7547TE |
–55°C to +125°C |
±1/2 LSB |
±3 LSB |
E-28A |
AD7547UE |
–55°C to +125°C |
±1/2 LSB |
±2 LSB |
E-28A |
NOTES
1Analog Devices reserves the right to ship ceramic packages (D-24A) in lieu of cerdip packages (Q-24).
2To order MIL-STD-883, Class B processed parts, add /883B to part number. Contact your local sales office for military data sheets.
3E = Leadless Ceramic Chip Carrier; N = Plastic DIP; P = Plastic Leaded Chip Carrier; Q = Cerdip; R = SOIC.
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7547 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. A |
–3– |