Analog Devices AD7226TQ, AD7226TE, AD7226KR, AD7226KP, AD7226KN Datasheet

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Analog Devices AD7226TQ, AD7226TE, AD7226KR, AD7226KP, AD7226KN Datasheet

a

LC2MOS

Quad 8-Bit D/A Converter

 

 

AD7226

 

FEATURES

FUNCTIONAL BLOCK DIAGRAM

 

Four 8-Bit DACs with Output Amplifiers

 

 

Skinny 20-Pin DIP, SOIC and 20-Terminal

 

 

Surface Mount Packages

 

 

Microprocessor Compatible

 

 

TTL/CMOS Compatible

 

 

No User Trims

 

 

Extended Temperature Range Operation

 

 

Single Supply Operation Possible

 

 

APPLICATIONS

 

 

Process Control

 

 

Automatic Test Equipment

 

 

Automatic Calibration of Large System Parameters,

 

 

e.g., Gain/Offset

 

GENERAL DESCRIPTION

The AD7226 contains four 8-bit voltage-output digital-to- analog converters, with output buffer amplifiers and interface logic on a single monolithic chip. No external trims are required to achieve full specified performance for the part.

Separate on-chip latches are provided for each of the four D/A converters. Data is transferred into one of these data latches through a common 8-bit TTL/CMOS (5 V) compatible input port. Control inputs A0 and A1 determine which DAC is loaded when WR goes low. The control logic is speed-compatible with most 8-bit microprocessors.

Each D/A converter includes an output buffer amplifier capable of driving up to 5 mA of output current. The amplifiers’ offsets are laser-trimmed during manufacture, thereby eliminating any requirement for offset nulling.

Specified performance is guaranteed for input reference voltages from +2 V to +12.5 V with dual supplies. The part is also specified for single supply operation at a reference of +10 V.

The AD7226 is fabricated in an all ion-implanted high speed Linear Compatible CMOS (LC2MOS) process which has been specifically developed to allow high speed digital logic circuits and precision analog circuits to be integrated on the same chip.

REV. A

Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.

PRODUCT HIGHLIGHTS

1. DAC-to-DAC Matching

Since all four DACs are fabricated on the same chip at the same time, precise matching and tracking between the DACs is inherent.

2. Single Supply Operation

The voltage mode configuration of the DACs allows the AD7226 to be operated from a single power supply rail.

3. Microprocessor Compatibility

The AD7226 has a common 8-bit data bus with individual DAC latches, providing a versatile control architecture for simple interface to microprocessors. All latch enable signals are level triggered.

4. Small Size

Combining four DACs and four op amps plus interface logic into a 20-pin DIP or SOIC or a 20-terminal surface mount package allows a dramatic reduction in board space requirements and offers increased reliability in systems using multiple converters. Its pinout is aimed at optimizing board layout with all the analog inputs and outputs at one end of the package and all the digital inputs at the other.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 617/329-4700 Fax: 617/326-8703

AD7226–SPECIFICATIONS

DUAL SUPPLY

(VDD = 11.4 V to 16.5 V, VSS = –5 V 6 10%; AGND = DGND = O V; VREF = +2 V to (VDD – 4 V)1 unless otherwise noted.

All specifications TMIN to TMAX unless otherwise noted.)

 

Parameter

 

K, B, T Versions2

Units

Conditions/Comments

 

 

 

 

STATIC PERFORMANCE

 

 

 

Resolution

 

8

Bits

 

Total Unadjusted Error

±2

LSB max

VDD = +15 V ± 5%, VREF = +10 V

Relative Accuracy

 

±1

LSB max

 

Differential Nonlinearity

±1

LSB max

Guaranteed Monotonic

Full Scale Error

 

±1 1/2

LSB max

 

Full Scale Temperature Coefficient

±20

ppm/°C typ

VDD = 14 V to 16.5 V, VREF = +10 V

Zero Code Error

 

±30

mV max

 

Zero Code Error Temperature Coefficient

±50

μV/°C typ

 

 

 

 

 

 

REFERENCE INPUT

 

 

 

 

Voltage Range

 

2 to (VDD – 4)

V min to V max

 

Input Resistance

 

2

kΩ min

 

Input Capacitance3

 

65

pF min

Occurs when each DAC is loaded with all 0s.

 

 

300

pF max

Occurs when each DAC is loaded with all 1s.

 

 

 

 

 

DIGITAL INPUTS

 

 

 

 

Input High Voltage, VINH

2.4

V min

 

Input Low Voltage, VINL

0.8

V max

 

Input Leakage Current

±1

μA max

VIN = 0 V or VDD

Input Capacitance

 

8

pF max

 

Input Coding

 

Binary

 

 

 

 

 

 

DYNAMIC PERFORMANCE

 

V/μs min

 

Voltage Output Slew Rate4

2.5

 

Voltage Output Settling Time4

 

μs max

VREF = +10 V; Settling Time to ±1/2 LSB

Positive Full Scale Change

5

Negative Full Scale Change

7

μs max

VREF = +10 V; Settling Time to ±1/2 LSB

Digital Crosstalk

 

50

nV secs typ

 

Minimum Load Resistance

2

kΩ min

VOUT = +10 V

 

 

 

 

 

POWER SUPPLIES

 

 

 

 

VDD Range

 

11.4/16.5

V min/V max

For Specified Performance

IDD

 

13

mA max

Outputs Unloaded; VIN = VINL or VINH

ISS

 

11

mA max

Outputs Unloaded; VIN = VINL or VINH

SWITCHING CHARACTERISTICS4, 5

 

 

 

Address to Write Setup Time, tAS

 

 

 

@ 25°C

 

0

ns min

 

TMIN to TMAX

 

0

ns min

 

Address to Write Hold Time, tAH

 

 

 

@ 25°C

 

10

ns min

 

TMIN to TMAX

 

10

ns min

 

Data Valid to Write Setup Time, tDS

 

 

 

@ 25°C

 

90

ns min

 

TMIN to TMAX

 

100

ns min

 

Data Valid to Write Hold Time, tDH

 

 

 

@ 25°C

 

10

ns min

 

TMIN to TMAX

 

10

ns min

 

Write Pulse Width, tWR

 

 

 

@ 25°C

 

150

ns min

 

TMIN to TMAX

 

200

ns min

 

NOTES

1Maximum possible reference voltage.

2Temperature ranges are as follows: K Version: –40°C to +85°C

B Version: –40°C to +85°C T Version: –55°C to +125°C

3Guanteed by design. Not production tested. 4Sample Tested at 25°C to ensure compliance.

5Switching Characteristics apply for single and dual supply operation.

Specifications subject to change without notice.

–2–

REV. A

AD7226

(VDD = +15 V 6 5%; VSS = AGND = DGND = O V; VREF = +10 V1 unless otherwise noted.

SINGLE SUPPLY All specifications TMIN to TMAX unless otherwise noted.)

 

Parameter

K, B, T Versions2

Units

Conditions/Comments

 

 

 

 

STATIC PERFORMANCE

 

 

 

Resolution

8

Bits

 

Total Unadjusted Error

±2

LSB max

 

Differential Nonlinearity

± 1

LSB max

Guaranteed Monotonic

 

 

 

 

REFERENCE INPUT

 

kΩ min

 

Input Resistance

2

 

Input Capacitance3

65

pF min

Occurs when each DAC is loaded with all 0s.

 

300

pF max

Occurs when each DAC is loaded with all 1s.

 

 

 

 

DIGITAL INPUTS

 

 

 

Input High Voltage, VINH

2.4

V min

 

Input Low Voltage, VINL

0.8

V max

 

Input Leakage Current

± 1

μA max

VIN = 0 V or VDD

Input Capacitance

8

pF max

 

Input Coding

Binary

 

 

 

 

 

 

DYNAMIC PERFORMANCE

 

V/μs min

 

Voltage Output Slew Rate4

2

 

Voltage Output Settling Time4

 

μs max

Settling Time to ±1/2 LSB

Positive Full Scale Change

5

Negative Full Scale Change

20

μs max

Settling Time to ±1/2 LSB

Digital Crosstalk

50

nV secs typ

 

Minimum Load Resistance

2

kΩ min

VOUT = +10 V

 

 

 

 

POWER SUPPLIES

 

 

 

VDD Range

14.25/15.75

V min/V max

For Specified Performance

IDD

13

mA max

Outputs Unloaded; VIN = VINL or VINH

NOTES

1Maximum possible reference voltage.

2Temperature ranges are as follows: K Version: –40°C to +85°C

B Version: –40°C to +85°C T Version: –55°C to +125°C

3Guanteed by design. Not production tested. 4Sample Tested at 25°C to ensure compliance.

5Switching Characteristics apply for single and dual supply operation.

Specifications subject to change without notice.

ORDERING GUIDE

 

 

Total

 

 

Temperature

Unadjusted

Package

Model1

Range

Error

Option2

 

 

 

 

AD7226KN

–40°C to +85°C

±2 LSB

N-20

AD7226KP

–40°C to +85°C

±2 LSB

P-20A

AD7226KR

–40°C to +85°C

±2 LSB

R-20

AD7226BQ

–40°C to +85°C

±2 LSB

Q-20

AD7226TQ

–55°C to +125°C

±2 LSB

Q-20

AD7226TE

–55°C to +125°C

±2 LSB

E-20A

NOTES

1To order MIL-STD-883, Class B processed parts, add /883B to part number. Contact your local sales office for Military data sheet, for U.S. Standard Military Drawing (SMD), see DESC drawing #5962–87802.

2E = Leadless Ceramic Chip Carrier; N = Plastic DIP;

P = Plastic Leaded Chip Carrier; Q = Cerdip; R = SOIC.

REV. A

–3–

AD7226

ABSOLUTE MAXIMUM RATINGS*

 

 

 

VDD to AGND . . . . . . . . . . . . . . . . . . . . .

. . . . .

–0.3 V, +17 V

VDD to DGND . . . . . . . . . . . . . . . . . . . . . .

. . . .

–0.3 V, +17 V

VSS to AGND . . . . . . . . . . . . . . . . . . . . . .

. . . .

. . . –7 V, VDD

VSS to DGND . . . . . . . . . . . . . . . . . . . . . .

. . . .

. . . –7 V, VDD

VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . .

. . . .

–0.3 V, +24 V

AGND to DGND . . . . . . . . . . . . . . . . . . .

. . . .

. –0.3 V, VDD

Digital Input Voltage to DGND . . . . . . .

–0.3 V, VDD + 0.3 V

VREF to AGND . . . . . . . . . . . . . . . . . . . . .

. . . .

. –0.3 V, VDD

V

OUT

to AGND1 . . . . . . . . . . . . . . . . . . . .

. . . .

. . . . V

, V

 

 

 

SS

DD

Power Dissipation (Any Package) to +75°C . . . .

. . . . 500 mW

Derates above 75°C by . . . . . . . . . . . . . . .

. . . .

. . 2.0 mW/°C

Operating Temperature

–40°C to +85°C

Commercial (K Version) . . . . . . . . . . . . .

Industrial (B Version) . . . . . . . . . . . . . . . .

–40°C to +85°C

Extended (T Version) . . . . . . . . . . . . . . .

–55°C to +125°C

Storage Temperature . . . . . . . . . . . . . . . . . .

–65°C to +150°C

Lead Temperature (Soldering, 10 secs) . . . . .

. . . . . . +300°C

NOTES

*Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

1Outputs may be shorted to AGND provided that the power dissipation of the package is not exceeded. Typically short circuit current to AGND is 60 mA.

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7226 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.

 

PIN CONFIGURATIONS

DIP and SOIC

LCCC

WARNING!

ESD SENSITIVE DEVICE

PLCC

TERMINOLOGY

TOTAL UNADJUSTED ERROR

This is a comprehensive specification which includes full-scale error, relative accuracy and zero code error. Maximum output

voltage is VREF – 1 LSB (ideal), where 1 LSB (ideal) is VREF/ 256. The LSB size will vary over the VREF range. Hence the zero

code error will, relative to the LSB size, increase as VREF decreases. Accordingly, the total unadjusted error, which includes the zero code error, will also vary in terms of LSB’s over the VREF range. As a result, total unadjusted error is specified for a fixed reference voltage of +10 V.

RELATIVE ACCURACY

Relative Accuracy or endpoint nonlinearity, is a measure of the maximum deviation from a straight line passing through the endpoints of the DAC transfer function. It is measured after allowing for zero and full-scale error and is normally expressed in LSB’s or as a percentage of full-scale reading.

DIFFERENTIAL NONLINEARITY

Differential Nonlinearity is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ±1 LSB max over the operating temperature range ensures monotonicity.

DIGITAL CROSSTALK

The glitch impulse transferred to the output of one converter due to a change in the digital input code to another of the converters. It is specified in nV secs and is measured at VREF = 0 V.

FULL SCALE ERROR

Full-Scale Error is defined as:

Measured Value – Zero Code Error – Ideal Value

–4–

REV. A

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