Analog Devices AD678TD, AD678SD, AD678KN, AD678KD, AD678JN Datasheet

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a

12-Bit 200 kSPS

Complete Sampling ADC

 

 

 

 

 

AD678*

 

 

 

FEATURES

AC and DC Characterized and Specified (K, B and T Grades)

200k Conversions per Second

1 MHz Full Power Bandwidth

500 kHz Full Linear Bandwidth

72 dB S/N+D (K, B, T Grades)

Twos Complement Data Format (Bipolar Mode) Straight Binary Data Format (Unipolar Mode) 10 M Input Impedance

8-Bit or 16-Bit Bus Interface On-Board Reference and Clock

10 V Unipolar or Bipolar Input Range Commercial, Industrial and Military Temperature

Range Grades

MIL-STD-883 Compliant Versions Available

FUNCTIONAL BLOCK DIAGRAM

CS SC OE EOCEN SYNC 12/8 EOC

 

 

 

AD678

 

 

CONTROL LOGIC

 

 

REFOUT

VOLTAGE

 

 

 

REF.

 

12

DB11

REFIN

 

 

DB2

 

 

OUTPUT

 

 

12

DB1

 

 

REGISTER

 

 

(R/L)

 

12-BIT D/A

CONVERSION

 

DB0

 

CONVERTER

LOGIC

 

 

 

 

 

(HBE)

BIPOFF

 

 

4

VCC

 

SAMPLE/

GAIN

4-BIT FLASH

VEE

AIN

A/D

VDD

HOLD

STAGE

 

 

 

CONVERTER

DGND

AGND

 

 

 

 

 

 

 

PRODUCT DESCRIPTION

The AD678 is a complete, multipurpose 12-bit monolithic analog-to-digital converter, consisting of a sample-hold amplifier (SHA), a microprocessor compatible bus interface, a voltage reference and clock generation circuitry.

The AD678 is specified for ac (or “dynamic”) parameters such as S/N+D ratio, THD and IMD which are important in signal processing applications. In addition, the AD678K, B and T grades are fully specified for dc parameters which are important in measurement applications.

The AD678 offers a choice of digital interface formats; the 12 data bits can be accessed by a 16-bit bus in a single read operation or by an 8-bit bus in two read operations (8+4), with right or left justification. Data format is straight binary for unipolar mode and twos complement binary for bipolar mode. The input has a full-scale range of 10 V with a full power bandwidth of

1 MHz and a full linear bandwidth of 500 kHz. High input impedance (10 M) allows direct connection to unbuffered sources without signal degradation.

This product is fabricated on Analog Devices’ BiMOS process, combining low power CMOS logic with high precision, low noise bipolar circuits; laser-trimmed thin-film resistors provide high accuracy. The converter utilizes a recursive subranging algorithm which includes error correction and flash converter circuitry to achieve high speed and resolution.

The AD678 operates from +5 V and ±12 V supplies and dissipates 560 mW (typ). The AD678 is available in 28-lead plastic DIP, ceramic DIP, and 44-lead J-leaded ceramic surface mount packages.

Screening to MIL-STD-883C Class B is also available.

*Protected by U.S. Patent Nos. 4,804,960; 4,814,767; 4,833,345; 4,250,445; 4,808,908; RE30,586.

REV. C

Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.

PRODUCT HIGHLIGHTS

1.COMPLETE INTEGRATION: The AD678 minimizes external component requirements by combining a high speed sample-hold amplifier (SHA), ADC, 5 V reference, clock and digital interface on a single chip. This provides a fully specified sampling A/D function unattainable with discrete designs.

2.SPECIFICATIONS: The AD678K, B and T grades provide fully specified and tested ac and dc parameters. The AD678J, A and S grades are specified and tested for ac parameters; dc accuracy specifications are shown as typicals. DC specifications (such as INL, gain and offset) are important in control and measurement applications. AC specifications (such as S/N+D ratio, THD and IMD) are of value in signal processing applications.

3.EASE OF USE: The pinout is designed for easy board layout, and the choice of single or two read cycle output provides compatibility with 16or 8-bit buses. Factory trimming eliminates the need for calibration modes or external trimming to achieve rated performance.

4.RELIABILITY: The AD678 utilizes Analog Devices’ monolithic BiMOS technology. This ensures long-term reliability compared to multichip and hybrid designs.

5.UPGRADE PATH: The AD678 provides the same pinout as the 14-bit, 128 kSPS AD679 ADC.

6.The AD678 is available in versions compliant with MIL- STD-883. Refer to the Analog Devices Military Products Databook or current AD678/883B data sheet for detailed specifications.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.

Tel: 781/329-4700

World Wide Web Site: http://www.analog.com

Fax: 781/326-8703

© Analog Devices, Inc., 2000

AD678–SPECIFICATIONS

(TMIN to TMAX, VCC = +12 V 5%, VEE = –12 V 5%, VDD = +5 V 10%, fSAMPLE = 200 kSPS,

AC SPECIFICATIONS flN = 10.06 kHz unless otherwise noted)1

 

 

AD678J/A/S

 

AD678K/B/T

 

Parameter

Min

Typ

Max

Min

Typ

Max

Units

 

 

 

 

 

 

 

 

SIGNAL-TO-NOISE AND DISTORTION (S/N+D) RATIO2

 

 

 

 

 

 

 

–0.5 dB Input (Referred to –0 dB Input)

70

71

 

71

73

 

dB

–20 dB Input (Referred to –20 dB Input)

 

51

 

 

53

 

dB

–60 dB Input (Referred to –60 dB Input)

 

11

 

 

13

 

dB

 

 

 

 

 

 

 

 

TOTAL HARMONIC DISTORTION (THD)3

 

–88

–80

 

–88

–80

dB

 

 

0.004

0.010

 

0.004

0.010

%

 

 

 

 

 

 

 

 

PEAK SPURIOUS OR PEAK HARMONIC COMPONENT

 

–87

–80

 

–87

–80

dB

 

 

 

 

 

 

 

 

FULL POWER BANDWIDTH

 

1

 

 

1

 

MHz

 

 

 

 

 

 

 

 

FULL LINEAR BANDWIDTH

500

 

 

500

 

 

kHz

 

 

 

 

 

 

 

 

INTERMODULATION DISTORTION (IMD)4

 

 

 

 

 

 

 

2nd Order Products

 

–85

–80

 

–85

–80

dB

3rd Order Products

 

–90

–80

 

–90

–80

dB

 

 

 

 

 

 

 

 

NOTES

1fIN amplitude = –0.5 dB (9.44 V p-p) bipolar mode full scale unless otherwise indicated. All measurements referred to a –0 dB (9.997 V p-p) input signal unless otherwise indicated.

2See Figures 13 and 14 for higher frequencies and other input amplitudes. 3See Figure 12.

4fA = 9.08 kHz, fB = 9.58 kHz, with fSAMPLE = 200 kSPS. See Definition of Specifications section and Figure 16. Specifications subject to change without notice.

DIGITAL SPECIFICATIONS (All device types TMIN to TMAX, VCC = +12 V 5%, VEE = –12 V 5%, VDD = +5 V 10%)

Parameter

Test Conditions

Min

Max

Units

 

 

 

 

 

LOGIC INPUTS

 

 

 

 

VIH

High Level Input Voltage

 

2.0

VDD

V

VIL

Low Level Input Voltage

 

0

0.8

V

IIH

High Level Input Current

VIN = VDD

–10

+10

A

IIL

Low Level Input Current

VIN = 0 V

–10

+10

A

CIN

Input Capacitance

 

 

10

pF

LOGIC OUTPUTS

 

 

 

 

VOH

High Level Output Voltage

IOH = 0.1 mA

4.0

 

V

VOL

 

IOH = 0.5 mA

2.4

 

V

Low Level Output Voltage

IOL = 1.6 mA

 

0.4

V

IOZ

High Z Leakage Current

VIN = 0 or VDD

–10

+10

A

COZ

High Z Output Capacitance

 

 

10

pF

Specifications subject to change without notice.

–2–

REV. C

 

 

 

 

 

 

 

AD678

DC SPECIFICATIONS (TMIN to TMAX, VCC = +12 V 5%, VEE = –12 V 5%, VDD = +5 V 10% unless otherwise noted)

 

 

 

 

 

 

 

 

 

 

 

 

 

AD678J/A/S

 

 

AD678K/B/T

 

 

 

Parameter

Min

Typ

Max

Min

Typ

Max

Units

 

 

 

 

 

 

 

 

 

TEMPERATURE RANGE

 

 

 

 

 

 

°C

J, K Grades

0

 

+70

0

 

+70

A, B Grades

–40

 

+85

–40

 

+85

°C

S, T Grades

–55

 

+125

–55

 

+125

°C

ACCURACY

 

 

 

 

 

 

 

 

Resolution

12

±1

 

12

±0.7

±1

Bits

Integral Nonlinearity (INL)

 

 

 

LSB

Differential Nonlinearity (DNL)

12

±4

 

12

±2

±3

Bits

Unipolar Zero Error (@ +25°C)1

 

 

 

LSB

Bipolar Zero Error (@ +25°C)1

 

±4

 

 

±3

±5

LSB

Gain Error (@ +25°C)1, 2

 

±4

 

 

±3

±6

LSB

Temperature Drift

 

 

 

 

 

 

 

 

Unipolar/Bipolar Zero

 

±2

 

 

±2

±4

 

 

J, K Grades

 

 

 

LSB

A, B Grades

 

±4

 

 

±3

±4

LSB

S, T Grades

 

±5

 

 

±4

±5

LSB

Gain3

 

±4

 

 

±4

±6

 

 

J, K Grades

 

 

 

LSB

A, B Grades

 

±7

 

 

±5

±9

LSB

S, T Grades

 

±10

 

 

±8

±10

LSB

Gain4

 

±2

 

 

±2

±4

 

 

J, K Grades

 

 

 

LSB

A, B Grades

 

±4

 

 

±3

±4

LSB

S, T Grades

 

±6

 

 

±5

±6

LSB

ANALOG INPUT

 

 

 

 

 

 

 

 

Input Ranges

 

 

 

 

 

 

 

 

Unipolar Range

0

 

+10

0

 

+10

V

Bipolar Range

–5

 

+5

–5

 

+5

V

Input Resistance

 

10

 

 

10

 

M

Input Capacitance

 

10

 

 

10

 

pF

Input Settling Time

 

 

1

 

 

1

µs

Aperture Delay

 

10

 

 

10

 

ns

Aperture Jitter

 

150

 

 

150

 

ps

 

 

 

 

 

 

 

 

 

INTERNAL VOLTAGE REFERENCE

 

 

 

 

 

 

 

 

Output Voltage5

4.98

 

5.02

4.98

 

5.02

V

External Load

 

 

 

 

 

 

 

 

Unipolar Mode

 

 

+1.5

 

 

+1.5

mA

Bipolar Mode

 

 

+0.5

 

 

+0.5

mA

 

 

 

 

 

 

 

 

 

POWER SUPPLIES

 

 

 

 

 

 

 

 

Power Supply Rejection

 

 

 

 

 

 

 

 

VCC = +12 V ± 5%

 

±2

 

 

 

±2

LSB

VEE = –12 V ± 5%

 

±2

 

 

 

±2

LSB

VDD = +5 V ± 10%

 

±2

 

 

 

±2

LSB

Operating Current

 

 

 

 

 

 

 

 

ICC

 

18

20

 

18

20

mA

IEE

 

25

34

 

25

34

mA

IDD

 

8

12

 

8

12

mA

Power Consumption

 

560

745

 

560

745

mW

 

 

 

 

 

 

 

 

 

NOTES 1Adjustable to zero.

2Includes internal voltage reference error.

3Includes internal voltage reference drift.

4Excludes internal voltage reference drift.

5With maximum external load applied.

Specifications subject to change without notice.

REV. C

–3–

AD678

TIMING SPECIFICATIONS

(All grades, TMIN to TMAX, VCC = +12 V 5%, VEE = –12 V 5%, VDD = +5 V 10% unless otherwise noted)

Parameter

Symbol

Min

Max

Units

 

 

 

 

 

SC Delay

tSC

50

 

ns

Conversion Time

tC

3.0

4.4

s

Conversion Ratel

tCR

 

5

s

Convert Pulsewidth

tCP

97

 

ns

Aperture Delay

tAD

5

20

ns

Status Delay

tSD

0

400

ns

Access Time2, 3

tBA

10

100

ns

Float Delay5

 

10

574

ns

tFD

10

80

ns

Output Delay

tOD

 

0

ns

Format Setup

tFS

47

 

ns

OE Delay

tOE

0

 

ns

Read Pulsewidth

tRP

97

 

ns

Conversion Delay

tCD

150

 

ns

EOCEN Delay

tEO

0

 

ns

NOTES

1Includes acquisition time.

2Measured from the falling edge of OE/EOCEN (0.8 V) to the time at which the data lines/EOC cross 2.0 V or 0.8 V. See Figure 3. 3COUT = 100 pF.

4COUT = 50 pF.

5Measured from the rising edge of OE/EOCEN (2.0 V) to the time at which the output voltage changes by 0.5 V. See Figure 3; COUT = 10 pF. Specifications subject to change without notice.

Figure 2. EOC Timing

Figure 1. Conversion Timing

Figure 3. Load Circuit for Bus Timing Specifications

–4–

REV. C

Analog Devices AD678TD, AD678SD, AD678KN, AD678KD, AD678JN Datasheet

AD678

ABSOLUTE MAXIMUM RATINGS*

 

With

 

 

 

 

Respect

 

 

 

Specification

To

Min

Max

Units

 

 

 

 

 

VCC

AGND

–0.3

+18

V

VEE

AGND

–18

+0.3

V

VCC

VEE

–0.3

+26.4

V

VDD

DGND

0

+7

V

AGND

DGND

–1

+1

V

AIN, REFIN

AGND

VEE

VCC

V

Digital Inputs

DGND

–0.5

+7

V

Digital Outputs

DGND

–0.5

VDD + 0.3

V

Max Junction

 

 

 

°C

Temperature

 

 

175

Operating Temperature

 

 

 

°C

J and K Grades

 

0

+70

A and B Grades

 

–40

+85

°C

S and T Grades

 

–55

+125

°C

Storage Temperature

 

–65

+150

°C

Lead Temperature

 

 

 

°C

(10 sec max)

 

 

+300

 

 

 

 

 

CS SC OE EOCEN SYNC 12/8 EOC

 

 

 

AD678

 

 

CONTROL LOGIC

 

 

REFOUT

VOLTAGE

 

 

 

REF.

 

12

DB11

REFIN

 

 

DB2

 

 

OUTPUT

 

 

12

DB1

 

 

REGISTER

 

 

(R/L)

 

12-BIT D/A

CONVERSION

 

DB0

 

CONVERTER

LOGIC

 

 

 

 

 

(HBE)

BIPOFF

 

 

4

VCC

 

SAMPLE/

GAIN

4-BIT FLASH

VEE

AIN

A/D

VDD

HOLD

STAGE

 

 

 

CONVERTER

DGND

AGND

 

 

 

 

 

 

 

Functional Block Diagram

*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

ESD SENSITIVITY

The AD678 features input protection circuitry consisting of large “distributed” diodes and polysilicon series resistors to dissipate both high energy discharges (Human Body Model) and fast, low energy pulses (Charged Device Model). Per Method 3015.2 of MIL-STD-883C, the AD678 has been classified as a Category 1 device.

Proper ESD precautions are strongly recommended to avoid functional damage or performance degradation. Charges as high as 4000 volts readily accumulate on the human body and test equipment and discharge without detection. Unused devices must be stored in conductive foam or shunts, and the foam should be discharged to the destination socket before devices are removed. For further information on ESD precautions, refer to Analog Devices’ ESD Prevention Manual.

WARNING!

ESD SENSITIVE DEVICE

ORDERING GUIDE

Model1

Package

Temperature Range

Tested and Specified

Package Option2

AD678JN

28-Lead Plastic DIP

0°C to +70°C

AC

N-28

AD678KN

28-Lead Plastic DIP

0°C to +70°C

AC + DC

N-28

AD678JD

28-Lead Ceramic DIP

0°C to +70°C

AC

D-28

AD678KD

28-Lead Ceramic DIP

0°C to +70°C

AC + DC

D-28

AD678AD

28-Lead Ceramic DIP

–40°C to +85°C

AC

D-28

AD678BD

28-Lead Ceramic DIP

–40°C to +85°C

AC + DC

D-28

AD678AJ

44-Lead Ceramic JLCC

–40°C to +85°C

AC

J-44

AD678BJ

44-Lead Ceramic JLCC

–40°C to +85°C

AC + DC

J-44

AD678SD

28-Lead Ceramic DIP

–55°C to +125°C

AC

D-28

AD678TD

28-Lead Ceramic DIP

–55°C to +125°C

AC + DC

D-28

NOTES

1For details on grade and package offerings screened in accordance with MIL-STD-883, refer to Analog Devices Military Products Databook or /883 data sheet. 2N = Plastic DIP; D = Ceramic DIP; J = J-Leaded Ceramic Chip Carrier.

REV. C

–5–

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