MC74HC157A
Quad 2-Input Data
Selectors / Multiplexers
High±Performance Silicon±Gate CMOS
The MC74HC157A is identical in pinout to the LS157. The device inputs are compatible with standard CMOS outputs; with pullup resistors, they are compatible with LSTTL outputs.
This device routes 2 nibbles (A or B) to a single port (Y) as determined by the Select input. The data is presented at the outputs in noninverted form. A high level on the Output Enable input sets all four Y outputs to a low level.
•Output Drive Capability: 10 LSTTL Loads
•Outputs Directly Interface to CMOS, NMOS, and TTL
•Operating Voltage Range: 2.0 to 6.0 V
•Low Input Current: 1.0 μA
•High Noise Immunity Characteristic of CMOS Devices
•In Compliance with the Requirements Defined by JEDEC Standard No. 7A
•Chip Complexity: 82 FETs or 20.5 Equivalent Gates
LOGIC DIAGRAM
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A0 |
2 |
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5 |
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NIBBLE |
A1 |
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11 |
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A INPUTS |
A2 |
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4 |
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Y0 |
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14 |
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A3 |
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7 |
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Y1 |
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9 |
DATA |
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3 |
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Y2 OUTPUTS |
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B0 |
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12 |
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Y3 |
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6 |
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NIBBLE |
B1 |
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10 |
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B INPUTS |
B2 |
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13 |
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B3 |
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PIN 16 = VCC |
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PIN 8 = GND |
SELECT |
1 |
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OUTPUT |
15 |
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ENABLE |
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FUNCTION TABLE |
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Inputs |
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Output |
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Outputs |
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Enable |
Select |
Y0 ± Y3 |
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H |
X |
L |
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L |
L |
A0 ± A3 |
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L |
H |
B0 ± B3 |
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X = don't care
A0 ± A3, B0 ± B3 = the levels of the respective Data±Word Inputs.
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MARKING |
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DIAGRAMS |
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16 |
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PDIP±16 |
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MC74HC157AN |
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N SUFFIX |
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16 |
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AWLYYWW |
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CASE 648 |
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1 |
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1 |
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16 |
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SO±16 |
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HC157A |
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D SUFFIX |
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16 |
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AWLYWW |
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CASE 751B |
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1 |
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1 |
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16 |
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TSSOP±16 |
HC |
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16 |
DT SUFFIX |
157A |
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1 |
CASE 948F |
ALYW |
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1 |
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A |
= Assembly Location |
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WL |
= Wafer Lot |
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YY |
= Year |
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WW = Work Week |
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PIN ASSIGNMENT |
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SELECT |
1 |
16 |
VCC |
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A0 |
2 |
15 |
OUTPUT |
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ENABLE |
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B0 |
3 |
14 |
A3 |
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Y0 |
4 |
13 |
B3 |
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A1 |
5 |
12 |
Y3 |
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B1 |
6 |
11 |
A2 |
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Y1 |
7 |
10 |
B2 |
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GND |
8 |
9 |
Y2 |
ORDERING INFORMATION
Device |
Package |
Shipping |
MC74HC157AN |
PDIP±16 |
2000 / Box |
MC74HC157AD |
SOIC±16 |
48 / Rail |
MC74HC157ADR2 |
SOIC±16 |
2500 / Reel |
MC74HC157ADT |
TSSOP±16 |
96 / Rail |
MC74HC157ADTR2 |
TSSOP±16 |
2500 / Reel |
Semiconductor Components Industries, LLC, 2000 |
1 |
Publication Order Number: |
March, 2000 ± Rev. 8 |
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MC74HC157A/D |
MC74HC157A
MAXIMUM RATINGS*
Symbol |
Parameter |
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Value |
Unit |
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VCC |
DC Supply Voltage (Referenced to GND) |
± 0.5 to + 7.0 |
V |
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Vin |
DC Input Voltage (Referenced to GND) |
± 0.5 to VCC + 0.5 |
V |
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Vout |
DC Output Voltage (Referenced to GND) |
± 0.5 to VCC + 0.5 |
V |
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Iin |
DC Input Current, per Pin |
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± 20 |
mA |
Iout |
DC Output Current, per Pin |
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± 25 |
mA |
ICC |
DC Supply Current, VCC and GND Pins |
± 50 |
mA |
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PD |
Power Dissipation in Still Air, |
Plastic DIP² |
750 |
mW |
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SOIC Package² |
500 |
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TSSOP Package² |
450 |
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Tstg |
Storage Temperature |
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± 65 to + 150 |
_C |
TL |
Lead Temperature, 1 mm from Case for 10 Seconds |
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_C |
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(Plastic DIP, SOIC or TSSOP Package) |
260 |
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This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high±impedance circuit. For proper operation, Vin and Vout should be constrained to the
range GND v (Vin or Vout) v VCC. Unused inputs must always be
tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.
*Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the Recommended Operating Conditions.
²Derating Ð Plastic DIP: ± 10 mW/ _C from 65_ to 125_C SOIC Package: ± 7 mW/_C from 65_ to 125_C
TSSOP Package: ± 6.1 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).
RECOMMENDED OPERATING CONDITIONS
Symbol |
Parameter |
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Min |
Max |
Unit |
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VCC |
DC Supply Voltage (Referenced to GND) |
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2.0 |
6.0 |
V |
Vin, Vout |
DC Input Voltage, Output Voltage |
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0 |
VCC |
V |
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(Referenced to GND) |
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TA |
Operating Temperature, All Package Types |
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± 55 |
+ 125 |
_C |
tr, tf |
Input Rise and Fall Time |
VCC = 2.0 V |
0 |
1000 |
ns |
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(Figure 1) |
VCC = 4.5 V |
0 |
500 |
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VCC = 6.0 V |
0 |
400 |
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DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
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Guaranteed Limit |
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VCC |
± 55 to |
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Symbol |
Parameter |
Test Conditions |
V |
25_C |
v 85_C |
v 125_C |
Unit |
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VIH |
Minimum High±Level Input |
Vout = VCC ± 0.1 V |
2.0 |
1.5 |
1.5 |
1.5 |
V |
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Voltage |
|Iout| v 20 |
μA |
3.0 |
2.1 |
2.1 |
2.1 |
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4.5 |
3.15 |
3.15 |
3.15 |
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6.0 |
4.2 |
4.2 |
4.2 |
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VIL |
Maximum Low±Level Input |
Vout = 0.1 V |
2.0 |
0.5 |
0.5 |
0.5 |
V |
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Voltage |
|Iout| v 20 μA |
3.0 |
0.9 |
0.9 |
0.9 |
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4.5 |
1.35 |
1.35 |
1.35 |
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6.0 |
1.8 |
1.8 |
1.8 |
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VOH |
Minimum High±Level Output |
Vin = VIH |
μA |
2.0 |
1.9 |
1.9 |
1.9 |
V |
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Voltage |
|Iout| v 20 |
4.5 |
4.4 |
4.4 |
4.4 |
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6.0 |
5.9 |
5.9 |
5.9 |
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Vin = VIH |
|Iout| v 2.4 mA |
3.0 |
2.48 |
2.34 |
2.2 |
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|Iout| v 6.0 mA |
4.5 |
3.98 |
3.84 |
3.7 |
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|Iout| v 7.8 mA |
6.0 |
5.48 |
5.34 |
5.2 |
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VOL |
Maximum Low±Level Output |
Vin = VIL |
μA |
2.0 |
0.1 |
0.1 |
0.1 |
V |
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Voltage |
|Iout| v 20 |
4.5 |
0.1 |
0.1 |
0.1 |
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6.0 |
0.1 |
0.1 |
0.1 |
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Vin = VIL |
|Iout| v 2.4 mA |
3.0 |
0.26 |
0.33 |
0.4 |
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|Iout| v 6.0 mA |
4.5 |
0.26 |
0.33 |
0.4 |
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|Iout| v 7.8 mA |
6.0 |
0.26 |
0.33 |
0.4 |
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MC74HC157A
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
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Guaranteed Limit |
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VCC |
± 55 to |
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Symbol |
Parameter |
Test Conditions |
V |
25_C |
v 85_C |
v 125_C |
Unit |
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Iin |
Maximum Input Leakage |
Vin = VCC or GND |
6.0 |
± 0.1 |
± 1.0 |
± 1.0 |
μA |
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Current |
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IOZ |
Maximum Three±State |
Output in High±Impedance State |
6.0 |
± 0.5 |
± 5.0 |
± 10 |
μA |
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Leakage Current |
Vin = VIL or VIH |
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Vout = VCC or GND |
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ICC |
Maximum Quiescent Supply |
Vin = VCC or GND |
6.0 |
4.0 |
40 |
160 |
μA |
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Current (per Package) |
Iout = 0 μA |
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NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6.0 ns)
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Guaranteed Limit |
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VCC |
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± 55 to |
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Symbol |
Parameter |
V |
25_C |
v 85_C |
v 125_C |
Unit |
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tPLH, |
Maximum Propagation Delay, Input A or B to Output Y |
2.0 |
105 |
130 |
160 |
ns |
tPHL |
(Figures 1 and 4) |
3.0 |
65 |
85 |
115 |
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4.5 |
21 |
26 |
32 |
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6.0 |
18 |
22 |
27 |
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tPLH, |
Maximum Propagation Delay, Select to Output Y |
2.0 |
110 |
140 |
165 |
ns |
tPHL |
(Figures 2 and 4) |
3.0 |
70 |
90 |
115 |
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4.5 |
22 |
28 |
33 |
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6.0 |
19 |
24 |
28 |
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tPLH, |
Maximum Propagation Delay, Output Enable to Output Y |
2.0 |
100 |
125 |
150 |
ns |
tPHL |
(Figures 3 and 4) |
3.0 |
60 |
80 |
110 |
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4.5 |
20 |
25 |
30 |
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6.0 |
17 |
21 |
26 |
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tTLH, |
Maximum Output Transition Time, Any Output |
2.0 |
75 |
95 |
110 |
ns |
tTHL |
(Figures 1 and 4) |
3.0 |
27 |
32 |
36 |
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4.5 |
15 |
19 |
22 |
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6.0 |
13 |
16 |
19 |
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Cin |
Maximum Input Capacitance |
Ð |
10 |
10 |
10 |
pF |
NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).
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Typical @ 25°C, VCC = 5.0 V |
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CPD |
Power Dissipation Capacitance (Per Package)* |
33 |
pF |
*Used to determine the no±load dynamic power consumption: PD = CPD VCC2f + ICC VCC. For load considerations, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).
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