MOTOROLA MC74HC157ADT, MC74HC157ADTR2, MC74HC157AF, MC74HC157AFEL, MC74HC157AFL1 Datasheet

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MOTOROLA MC74HC157ADT, MC74HC157ADTR2, MC74HC157AF, MC74HC157AFEL, MC74HC157AFL1 Datasheet

MC74HC157A

Quad 2-Input Data

Selectors / Multiplexers

High±Performance Silicon±Gate CMOS

The MC74HC157A is identical in pinout to the LS157. The device inputs are compatible with standard CMOS outputs; with pullup resistors, they are compatible with LSTTL outputs.

This device routes 2 nibbles (A or B) to a single port (Y) as determined by the Select input. The data is presented at the outputs in noninverted form. A high level on the Output Enable input sets all four Y outputs to a low level.

Output Drive Capability: 10 LSTTL Loads

Outputs Directly Interface to CMOS, NMOS, and TTL

Operating Voltage Range: 2.0 to 6.0 V

Low Input Current: 1.0 μA

High Noise Immunity Characteristic of CMOS Devices

In Compliance with the Requirements Defined by JEDEC Standard No. 7A

Chip Complexity: 82 FETs or 20.5 Equivalent Gates

LOGIC DIAGRAM

 

A0

2

 

 

 

 

 

5

 

 

 

 

NIBBLE

A1

 

 

 

 

11

 

 

 

 

 

 

 

 

 

A INPUTS

A2

 

4

 

 

 

 

Y0

 

 

 

14

 

 

 

 

A3

 

7

 

 

 

 

 

Y1

 

 

 

 

 

9

DATA

 

 

 

 

 

 

 

3

 

Y2 OUTPUTS

 

B0

 

12

 

 

 

Y3

 

 

 

6

 

 

NIBBLE

B1

 

 

 

10

 

 

 

 

 

 

 

 

 

B INPUTS

B2

 

 

 

 

13

 

 

 

 

 

B3

 

 

 

PIN 16 = VCC

 

 

 

 

 

 

 

 

 

 

 

PIN 8 = GND

SELECT

1

 

 

 

 

 

 

 

 

 

OUTPUT

15

 

 

 

 

 

ENABLE

 

 

 

 

 

 

 

FUNCTION TABLE

 

 

 

 

Inputs

 

 

 

 

 

Output

 

Outputs

 

 

 

 

Enable

Select

Y0 ± Y3

 

 

 

 

H

X

L

 

 

 

 

L

L

A0 ± A3

 

 

 

 

L

H

B0 ± B3

 

 

X = don't care

A0 ± A3, B0 ± B3 = the levels of the respective Data±Word Inputs.

http://onsemi.com

 

 

 

MARKING

 

 

 

DIAGRAMS

 

 

 

16

 

PDIP±16

 

MC74HC157AN

 

N SUFFIX

 

16

 

AWLYYWW

CASE 648

 

 

 

 

1

 

 

1

 

 

 

 

 

 

16

 

SO±16

 

HC157A

 

D SUFFIX

 

16

 

AWLYWW

CASE 751B

 

1

 

 

 

 

1

 

 

 

 

 

 

16

 

TSSOP±16

HC

16

DT SUFFIX

157A

1

CASE 948F

ALYW

 

 

 

 

 

 

1

A

= Assembly Location

WL

= Wafer Lot

 

 

YY

= Year

 

 

WW = Work Week

 

PIN ASSIGNMENT

SELECT

1

16

VCC

A0

2

15

OUTPUT

ENABLE

 

 

 

B0

3

14

A3

Y0

4

13

B3

A1

5

12

Y3

B1

6

11

A2

Y1

7

10

B2

GND

8

9

Y2

ORDERING INFORMATION

Device

Package

Shipping

MC74HC157AN

PDIP±16

2000 / Box

MC74HC157AD

SOIC±16

48 / Rail

MC74HC157ADR2

SOIC±16

2500 / Reel

MC74HC157ADT

TSSOP±16

96 / Rail

MC74HC157ADTR2

TSSOP±16

2500 / Reel

Semiconductor Components Industries, LLC, 2000

1

Publication Order Number:

March, 2000 ± Rev. 8

 

MC74HC157A/D

MC74HC157A

MAXIMUM RATINGS*

Symbol

Parameter

 

Value

Unit

 

 

 

 

VCC

DC Supply Voltage (Referenced to GND)

± 0.5 to + 7.0

V

Vin

DC Input Voltage (Referenced to GND)

± 0.5 to VCC + 0.5

V

Vout

DC Output Voltage (Referenced to GND)

± 0.5 to VCC + 0.5

V

Iin

DC Input Current, per Pin

 

± 20

mA

Iout

DC Output Current, per Pin

 

± 25

mA

ICC

DC Supply Current, VCC and GND Pins

± 50

mA

PD

Power Dissipation in Still Air,

Plastic DIP²

750

mW

 

 

SOIC Package²

500

 

 

 

TSSOP Package²

450

 

 

 

 

 

 

Tstg

Storage Temperature

 

± 65 to + 150

_C

TL

Lead Temperature, 1 mm from Case for 10 Seconds

 

_C

 

(Plastic DIP, SOIC or TSSOP Package)

260

 

 

 

 

 

 

This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high±impedance circuit. For proper operation, Vin and Vout should be constrained to the

range GND v (Vin or Vout) v VCC. Unused inputs must always be

tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.

*Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the Recommended Operating Conditions.

²Derating Ð Plastic DIP: ± 10 mW/ _C from 65_ to 125_C SOIC Package: ± 7 mW/_C from 65_ to 125_C

TSSOP Package: ± 6.1 mW/_C from 65_ to 125_C

For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).

RECOMMENDED OPERATING CONDITIONS

Symbol

Parameter

 

Min

Max

Unit

 

 

 

 

 

 

VCC

DC Supply Voltage (Referenced to GND)

 

2.0

6.0

V

Vin, Vout

DC Input Voltage, Output Voltage

 

0

VCC

V

 

(Referenced to GND)

 

 

 

 

 

 

 

 

 

 

TA

Operating Temperature, All Package Types

 

± 55

+ 125

_C

tr, tf

Input Rise and Fall Time

VCC = 2.0 V

0

1000

ns

 

(Figure 1)

VCC = 4.5 V

0

500

 

 

 

VCC = 6.0 V

0

400

 

DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)

 

 

 

 

 

Guaranteed Limit

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VCC

± 55 to

 

 

 

Symbol

Parameter

Test Conditions

V

25_C

v 85_C

v 125_C

Unit

 

 

 

 

 

 

 

 

VIH

Minimum High±Level Input

Vout = VCC ± 0.1 V

2.0

1.5

1.5

1.5

V

 

Voltage

|Iout| v 20

μA

3.0

2.1

2.1

2.1

 

 

 

 

 

4.5

3.15

3.15

3.15

 

 

 

 

 

6.0

4.2

4.2

4.2

 

 

 

 

 

 

 

 

 

VIL

Maximum Low±Level Input

Vout = 0.1 V

2.0

0.5

0.5

0.5

V

 

Voltage

|Iout| v 20 μA

3.0

0.9

0.9

0.9

 

 

 

 

 

4.5

1.35

1.35

1.35

 

 

 

 

 

6.0

1.8

1.8

1.8

 

 

 

 

 

 

 

 

 

 

VOH

Minimum High±Level Output

Vin = VIH

μA

2.0

1.9

1.9

1.9

V

 

Voltage

|Iout| v 20

4.5

4.4

4.4

4.4

 

 

 

 

 

6.0

5.9

5.9

5.9

 

 

 

 

 

 

 

 

 

 

 

 

Vin = VIH

|Iout| v 2.4 mA

3.0

2.48

2.34

2.2

 

 

 

 

|Iout| v 6.0 mA

4.5

3.98

3.84

3.7

 

 

 

 

|Iout| v 7.8 mA

6.0

5.48

5.34

5.2

 

VOL

Maximum Low±Level Output

Vin = VIL

μA

2.0

0.1

0.1

0.1

V

 

Voltage

|Iout| v 20

4.5

0.1

0.1

0.1

 

 

 

 

 

6.0

0.1

0.1

0.1

 

 

 

 

 

 

 

 

 

 

 

 

Vin = VIL

|Iout| v 2.4 mA

3.0

0.26

0.33

0.4

 

 

 

 

|Iout| v 6.0 mA

4.5

0.26

0.33

0.4

 

 

 

 

|Iout| v 7.8 mA

6.0

0.26

0.33

0.4

 

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MC74HC157A

DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)

 

 

 

 

Guaranteed Limit

 

 

 

 

 

 

 

 

 

 

 

 

VCC

± 55 to

 

 

 

Symbol

Parameter

Test Conditions

V

25_C

v 85_C

v 125_C

Unit

 

 

 

 

 

 

 

 

Iin

Maximum Input Leakage

Vin = VCC or GND

6.0

± 0.1

± 1.0

± 1.0

μA

 

Current

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IOZ

Maximum Three±State

Output in High±Impedance State

6.0

± 0.5

± 5.0

± 10

μA

 

Leakage Current

Vin = VIL or VIH

 

 

 

 

 

 

 

Vout = VCC or GND

 

 

 

 

 

ICC

Maximum Quiescent Supply

Vin = VCC or GND

6.0

4.0

40

160

μA

 

Current (per Package)

Iout = 0 μA

 

 

 

 

 

NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).

AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6.0 ns)

 

 

 

Guaranteed Limit

 

 

 

VCC

 

 

 

 

 

 

± 55 to

 

 

 

Symbol

Parameter

V

25_C

v 85_C

v 125_C

Unit

 

 

 

 

 

 

 

tPLH,

Maximum Propagation Delay, Input A or B to Output Y

2.0

105

130

160

ns

tPHL

(Figures 1 and 4)

3.0

65

85

115

 

 

 

4.5

21

26

32

 

 

 

6.0

18

22

27

 

 

 

 

 

 

 

 

tPLH,

Maximum Propagation Delay, Select to Output Y

2.0

110

140

165

ns

tPHL

(Figures 2 and 4)

3.0

70

90

115

 

 

 

4.5

22

28

33

 

 

 

6.0

19

24

28

 

 

 

 

 

 

 

 

tPLH,

Maximum Propagation Delay, Output Enable to Output Y

2.0

100

125

150

ns

tPHL

(Figures 3 and 4)

3.0

60

80

110

 

 

 

4.5

20

25

30

 

 

 

6.0

17

21

26

 

 

 

 

 

 

 

 

tTLH,

Maximum Output Transition Time, Any Output

2.0

75

95

110

ns

tTHL

(Figures 1 and 4)

3.0

27

32

36

 

 

 

4.5

15

19

22

 

 

 

6.0

13

16

19

 

 

 

 

 

 

 

 

Cin

Maximum Input Capacitance

Ð

10

10

10

pF

NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).

 

 

Typical @ 25°C, VCC = 5.0 V

 

CPD

Power Dissipation Capacitance (Per Package)*

33

pF

*Used to determine the no±load dynamic power consumption: PD = CPD VCC2f + ICC VCC. For load considerations, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).

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