MC74HCT245A
Octal 3-State Noninverting Bus Transceiver with LSTTL Compatible Inputs
High±Performance Silicon±Gate CMOS
The MC74HCT245A is identical in pinout to the LS245. This device may be used as a level converter for interfacing TTL or NMOS outputs to High Speed CMOS inputs.
The MC74HCT245A is a 3±state noninverting transceiver that is used for 2±way asynchronous communication between data buses. The device has an active±low Output Enable pin, which is used to place the I/O ports into high±impedance states. The Direction control determines whether data flows from A to B or from B to A.
•Output Drive Capability: 15 LSTTL Loads
•TTL/NMOS Compatible Input Levels
•Outputs Directly Interface to CMOS, NMOS and TTL
•Operating Voltage Range: 4.5 to 5.5 V
•Low Input Current: 1.0 μA
•In Compliance with the Requirements Defined by JEDEC Standard No. 7A
•Chip Complexity: 304 FETs or 76 Equivalent Gates
LOGIC DIAGRAM
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A1 |
2 |
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18 |
B1 |
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A2 |
3 |
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17 |
B2 |
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A3 |
4 |
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16 |
B3 |
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A |
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A4 |
5 |
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15 |
B4 |
B |
DATA |
A5 |
6 |
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14 |
B5 |
DATA |
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PORT |
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PORT |
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7 |
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13 |
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A6 |
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B6 |
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A7 |
8 |
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12 |
B7 |
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A8 |
9 |
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11 |
B8 |
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DIRECTION |
1 |
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PIN 20 = V |
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19 |
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CC |
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OUTPUT ENABLE |
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PIN 10 = GND |
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Design Criteria |
Value |
Units |
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Internal Gate Count* |
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76 |
ea |
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Internal Gate Propagation Delay |
1.0 |
ns |
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Internal Gate Power Dissipation |
5.0 |
μW |
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Speed Power Product |
0.005 |
pJ |
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*Equivalent to a two±input NAND gate. |
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FUNCTION TABLE |
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Control Inputs |
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Output |
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Enable |
Direction |
Operation |
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L |
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L |
Data Transmitted from Bus B to Bus A |
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L |
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H |
Data Transmitted from Bus A to Bus B |
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H |
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X |
Buses Isolated (High±Impedance State) |
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X = Don't Care
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MARKING |
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DIAGRAMS |
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20 |
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PDIP±20 |
MC74HCT245AN |
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N SUFFIX |
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AWLYYWW |
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20 |
CASE 738 |
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1 |
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1 |
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20 |
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SOIC WIDE±20 |
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HCT245A |
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20 |
DW SUFFIX |
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AWLYYWW |
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1 |
CASE 751D |
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1 |
20 |
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TSSOP±20 |
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HCT |
20 |
DT SUFFIX |
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245A |
1 |
CASE 948G |
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ALYW |
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1 |
A |
= Assembly Location |
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WL |
= Wafer Lot |
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YY |
= Year |
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WW = Work Week
PIN ASSIGNMENT
DIRECTION |
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1 |
20 |
VCC |
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A1 |
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2 |
19 |
OUTPUT ENABLE |
A2 |
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3 |
18 |
B1 |
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A3 |
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4 |
17 |
B2 |
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A4 |
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5 |
16 |
B3 |
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A5 |
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6 |
15 |
B4 |
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A6 |
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7 |
14 |
B5 |
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A7 |
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8 |
13 |
B6 |
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A8 |
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9 |
12 |
B7 |
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GND |
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10 |
11 |
B8 |
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ORDERING INFORMATION
Device |
Package |
Shipping |
MC74HCT245AN |
PDIP±20 |
1440 / Box |
MC74HCT245ADW |
SOIC±WIDE |
38 / Rail |
MC74HCT245ADWR2 |
SOIC±WIDE |
1000 / Reel |
MC74HCT245ADT |
TSSOP±20 |
75 / Rail |
MC74HCT245ADTR2 |
TSSOP±20 |
2500 / Reel |
Semiconductor Components Industries, LLC, 2000 |
1 |
Publication Order Number: |
March, 2000 ± Rev. 8 |
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MC74HCT245A/D |
MC74HCT245A
MAXIMUM RATINGS*
Symbol |
Parameter |
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Value |
Unit |
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VCC |
DC Supply Voltage (Referenced to GND) |
± 0.5 to + 7.0 |
V |
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Vin |
DC Input Voltage (Referenced to GND) |
± 0.5 to VCC + 0.5 |
V |
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Vout |
DC Output Voltage (Referenced to GND) |
± 0.5 to VCC + 0.5 |
V |
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Iin |
DC Input Current, per Pin |
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± 20 |
mA |
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Iout |
DC Output Current, per Pin |
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± 35 |
mA |
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ICC |
DC Supply Current, VCC and GND Pins |
± 75 |
mA |
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PD |
Power Dissipation in Still Air, |
Plastic DIP² |
750 |
mW |
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SOIC Package² |
500 |
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TSSOP Package² |
450 |
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Tstg |
Storage Temperature |
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± 65 to + 150 |
_C |
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TL |
Lead Temperature, 1 mm from Case for 10 Seconds |
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_C |
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(Plastic DIP, SOIC, SSOP or TSSOP Package) |
260 |
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This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high±impedance circuit. For proper operation, Vin and Vout should be constrained to the
range GND v (Vin or Vout) v VCC. Unused inputs must always be
tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.
*Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the Recommended Operating Conditions.
²Derating Ð Plastic DIP: ± 10 mW/ _C from 65_ to 125_C SOIC Package: ± 7 mW/_C from 65_ to 125_C
TSSOP Package: ± 6.1 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).
RECOMMENDED OPERATING CONDITIONS
Symbol |
Parameter |
Min |
Max |
Unit |
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VCC |
DC Supply Voltage (Referenced to GND) |
4.5 |
5.5 |
V |
Vin, Vout |
DC Input Voltage, Output Voltage (Referenced to GND) |
0 |
VCC |
V |
TA |
Operating Temperature, All Package Types |
± 55 |
+ 125 |
_C |
tr, tf |
Input Rise and Fall Time (Figure 1) |
0 |
500 |
ns |
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
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Guaranteed Limit |
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VCC |
± 55 to |
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Symbol |
Parameter |
Test Conditions |
V |
25_C |
v 85_C |
v 125_C |
Unit |
VIH |
Minimum High±Level Input |
Vout = 0.1 V or VCC ± 0.1 V |
4.5 |
2.0 |
2.0 |
2.0 |
V |
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Voltage |
|Iout| v 20 μA |
5.5 |
2.0 |
2.0 |
2.0 |
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VIL |
Maximum Low±Level Input |
Vout = 0.1 V or VCC ± 0.1 V |
4.5 |
0.8 |
0.8 |
0.8 |
V |
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Voltage |
|Iout| v 20 μA |
5.5 |
0.8 |
0.8 |
0.8 |
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VOH |
Minimum High±Level Output |
Vin = VIH or VIL |
4.5 |
4.4 |
4.4 |
4.4 |
V |
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Voltage |
|Iout| v 20 μA |
5.5 |
5.4 |
5.4 |
5.4 |
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Vin = VIH or VIL |
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|Iout| v 6.0 mA |
4.5 |
3.98 |
3.84 |
3.7 |
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VOL |
Maximum Low±Level Output |
Vin = VIH or VIL |
4.5 |
0.1 |
0.1 |
0.1 |
V |
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Voltage |
|Iout| v 20 μA |
5.5 |
0.1 |
0.1 |
0.1 |
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Vin = VIH or VIL |
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|Iout| v 6.0 mA |
4.5 |
0.26 |
0.33 |
0.4 |
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Iin |
Maximum Input Leakage Current |
Vin = VCC or GND, Pins 1 or 19 |
5.5 |
± 0.1 |
± 1.0 |
± 1.0 |
μA |
ICC |
Maximum Quiescent Supply |
Vin = VCC or GND |
5.5 |
4.0 |
40 |
160 |
μA |
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Current (per Package) |
Iout = 0 μA |
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IOZ |
Maximum Three±State |
Output in High±Impedance State |
5.5 |
± 0.5 |
± 5.0 |
± 10 |
μA |
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Leakage Current |
Vin = VIL or VIH |
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Vout = VCC or GND, I/O Pins |
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ICC |
Additional Quiescent Supply |
Vin = 2.4 V, Any One Input |
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≥ |
±55_C |
25_C to 125_C |
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Current |
Vin = VCC or GND, Other Inputs |
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lout = 0 μA |
5.5 |
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2.9 |
2.4 |
mA |
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NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).
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MC74HCT245A
AC ELECTRICAL CHARACTERISTICS (VCC = 5.0 V ± 10%, CL = 50 pF, Input tr = tf = 6.0 ns)
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Guaranteed Limit |
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± 55 to |
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Symbol |
Parameter |
25_C |
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v 85_C |
v 125_C |
Unit |
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tPLH, |
Maximum Propagation Delay, A to B or B to A |
22 |
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28 |
33 |
ns |
tPHL |
(Figures 1 and 3) |
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tPLZ, |
Maximum Propagation Delay, Direction or Output Enable to A or B |
30 |
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36 |
42 |
ns |
tPHZ |
(Figures 2 and 4) |
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tPZL, |
Maximum Propagation Delay, Output Enable to A or 8 |
30 |
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36 |
42 |
ns |
tPZH |
(Figures 2 and 4) |
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tTLH, |
Maximum Output Transition Time. any Output |
12 |
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15 |
18 |
ns |
tTHL |
(Figures 1 and 3) |
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Cin |
Maximum Input Capacitance (Pin 1 or 19) |
10 |
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10 |
10 |
pF |
Cout |
Maximum Three±State I/O Capacitance, (I/O in High±Impedance |
15 |
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15 |
15 |
pF |
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State) |
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NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).
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Typical @ 25°C, VCC = 5.0 V |
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CPD |
Power Dissipation Capacitance (Per Enabled Output)* |
97 |
pF |
*Used to determine the no±load dynamic power consumption: PD = CPD VCC2f + ICC VCC. For load considerations, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).
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