MOTOROLA MC74HC245AFER, MC74HC245ADW, MC74HC245ADWR2, MC74HC245AF, MC74HC245ADT Datasheet

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MOTOROLA MC74HC245AFER, MC74HC245ADW, MC74HC245ADWR2, MC74HC245AF, MC74HC245ADT Datasheet

MC74HC245A

Octal 3-State Noninverting

Bus Transceiver

High±Performance Silicon±Gate CMOS

The MC74HC245A is identical in pinout to the LS245. The device inputs are compatible with standard CMOS outputs; with pullup resistors, they are compatible with LSTTL outputs.

The HC245A is a 3±state noninverting transceiver that is used for 2±way asynchronous communication between data buses. The device has an active±low Output Enable pin, which is used to place the I/O ports into high±impedance states. The Direction control determines whether data flows from A to B or from B to A.

Output Drive Capability: 15 LSTTL Loads

Outputs Directly Interface to CMOS, NMOS, and TTL

Operating Voltage Range: 2 to 6 V

Low Input Current: 1 μA

High Noise Immunity Characteristic of CMOS Devices

In Compliance with the Requirements Defined by JEDEC Standard No. 7A

Chip Complexity: 308 FETs or 77 Equivalent Gates

LOGIC DIAGRAM

 

A1

2

18

B1

 

 

A2

3

17

B2

 

 

A3

4

16

B3

 

A

A4

5

15

B4

B

DATA

A5

6

14

B5

DATA

PORT

PORT

 

7

13

 

 

A6

B6

 

 

A7

8

12

B7

 

 

A8

9

11

B8

 

DIRECTION

1

 

 

 

OUTPUT ENABLE

19

 

 

 

 

 

 

PIN 10 = GND

 

 

 

 

 

PIN 20 = VCC

 

 

 

 

 

FUNCTION TABLE

 

 

Control Inputs

 

 

 

 

Output

 

 

 

 

 

Enable

Direction

Operation

 

 

L

L

 

Data Transmitted from Bus B to Bus A

 

L

H

 

Data Transmitted from Bus A to Bus B

 

H

X

 

Buses Isolated (High±Impedance State)

 

X = don't care

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MARKING

 

 

DIAGRAMS

 

 

20

 

PDIP±20

MC74HC245AN

 

N SUFFIX

 

AWLYYWW

20

CASE 738

 

 

 

1

 

1

 

20

 

 

SOIC WIDE±20

HC245A

20

DW SUFFIX

AWLYYWW

1

CASE 751D

 

 

 

 

1

A

= Assembly Location

WL

= Wafer Lot

 

YY

= Year

 

WW = Work Week

PIN ASSIGNMENT

DIRECTION

 

1

20

VCC

 

 

A1

 

2

19

OUTPUT ENABLE

A2

 

3

18

B1

 

A3

 

4

17

B2

 

A4

 

5

16

B3

 

A5

 

6

15

B4

 

A6

 

7

14

B5

 

A7

 

8

13

B6

 

A8

 

9

12

B7

 

GND

 

10

11

B8

 

 

 

 

 

 

 

 

 

 

 

ORDERING INFORMATION

Device

Package

Shipping

MC74HC245AN

PDIP±20

1440 / Box

MC74HC245ADW

SOIC±WIDE

38 / Rail

MC74HC245ADWR2

SOIC±WIDE

1000 / Reel

Semiconductor Components Industries, LLC, 2000

1

Publication Order Number:

March, 2000 ± Rev. 8

 

MC74HC245A/D

MC74HC245A

MAXIMUM RATINGS*

Symbol

Parameter

 

Value

Unit

 

 

 

 

VCC

DC Supply Voltage (Referenced to GND)

± 0.5 to + 7.0

V

Vin

DC Input Voltage (Referenced to GND)

 

± 0.5 to VCC + 0.5

V

VI/O

DC Output Voltage (Referenced to GND)

± 0.5 to VCC + 0.5

V

Iin

DC Input Current, per Pin

 

± 20

mA

II/O

DC Output Current, per Pin

 

± 35

mA

ICC

DC Supply Current, VCC and GND Pins

 

± 75

mA

PD

Power Dissipation in Still Air,

Plastic DIP²

750

mW

 

SOIC Package²

500

 

 

 

 

 

 

Tstg

Storage Temperature

 

± 65 to + 150

_C

TL

Lead Temperature, 1 mm from Case for 10 Seconds

 

_C

 

 

(Plastic DIP or SOIC Package)

260

 

 

 

 

 

 

This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high±impedance circuit. For proper operation, Vin and Vout should be constrained to the

range GND v (Vin or Vout) v VCC. Unused inputs must always be

tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.

*Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the Recommended Operating Conditions.

²Derating Ð Plastic DIP: ± 10 mW/ _C from 65_ to 125_C SOIC Package: ± 7 mW/_C from 65_ to 125_C

For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).

RECOMMENDED OPERATING CONDITIONS

Symbol

Parameter

 

Min

Max

Unit

 

 

 

 

 

 

VCC

DC Supply Voltage (Referenced to GND)

 

2.0

6.0

V

Vin, Vout

DC Input Voltage, Output Voltage (Referenced to GND)

0

VCC

V

TA

Operating Temperature, All Package Types

 

± 55

+ 125

_C

tr, tf

Input Rise and Fall Time

VCC = 2.0 V

0

1000

ns

 

(Figure 1)

VCC = 4.5 V

0

500

 

 

 

VCC = 6.0 V

0

400

 

DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)

 

 

 

 

 

Guaranteed Limit

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VCC

± 55 to

 

 

 

Symbol

Parameter

Test Conditions

V

25_C

v 85_C

v 125_C

Unit

 

 

 

 

 

 

 

 

VIH

Minimum High±Level Input

Vout = VCC ± 0.1 V

2.0

1.5

1.5

1.5

V

 

Voltage

|Iout| v 20

μA

3.0

2.1

2.1

2.1

 

 

 

 

 

4.5

3.15

3.15

3.15

 

 

 

 

 

6.0

4.2

4.2

4.2

 

 

 

 

 

 

 

 

 

VIL

Maximum Low±Level Input

Vout = 0.1 V

2.0

0.5

0.5

0.5

V

 

Voltage

|Iout| v 20 μA

3.0

0.9

0.9

0.9

 

 

 

 

 

4.5

1.35

1.35

1.35

 

 

 

 

 

6.0

1.8

1.8

1.8

 

 

 

 

 

 

 

 

 

 

VOH

Minimum High±Level Output

Vin = VIH

μA

2.0

1.9

1.9

1.9

V

 

Voltage

|Iout| v 20

4.5

4.4

4.4

4.4

 

 

 

 

 

6.0

5.9

5.9

5.9

 

 

 

 

 

 

 

 

 

 

 

 

Vin = VIH

|Iout| v 2.4 mA

3.0

2.48

2.34

2.2

 

 

 

 

|Iout| v 6.0 mA

4.5

3.98

3.84

3.7

 

 

 

 

|Iout| v 7.8 mA

6.0

5.48

5.34

5.2

 

VOL

Maximum Low±Level Output

Vin = VIL

μA

2.0

0.1

0.1

0.1

V

 

Voltage

|Iout| v 20

4.5

0.1

0.1

0.1

 

 

 

 

 

6.0

0.1

0.1

0.1

 

 

 

 

 

 

 

 

 

 

 

 

Vin = VIL

|Iout| v 2.4 mA

3.0

0.26

0.33

0.4

 

 

 

 

|Iout| v 6.0 mA

4.5

0.26

0.33

0.4

 

 

 

 

|Iout| v 7.8 mA

6.0

0.26

0.33

0.4

 

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MC74HC245A

DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)

 

 

 

 

Guaranteed Limit

 

 

 

 

 

 

 

 

 

 

 

 

VCC

± 55 to

 

 

 

Symbol

Parameter

Test Conditions

V

25_C

v 85_C

v 125_C

Unit

 

 

 

 

 

 

 

 

Iin

Maximum Input Leakage

Vin = VCC or GND

6.0

± 0.1

± 1.0

± 1.0

μA

 

Current

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IOZ

Maximum Three±State

Output in High±Impedance State

6.0

± 0.5

± 5.0

± 10

μA

 

Leakage Current

Vin = VIL or VIH

 

 

 

 

 

 

 

Vout = VCC or GND

 

 

 

 

 

ICC

Maximum Quiescent Supply

Vin = VCC or GND

6.0

4.0

40

160

μA

 

Current (per Package)

Iout = 0 μA

 

 

 

 

 

NOTE: Information on typical parametric values and high frequency or heavy load considerations can be found in Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).

AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6 ns)

 

 

 

Guaranteed Limit

 

 

 

VCC

 

 

 

 

 

 

± 55 to

 

 

 

Symbol

Parameter

V

25_C

v 85_C

v 125_C

Unit

 

 

 

 

 

 

 

tPLH,

Maximum Propagation Delay, A to B, B to A

2.0

75

95

110

ns

tPHL

(Figures 1 and 3)

3.0

55

70

80

 

 

 

4.5

15

19

22

 

 

 

6.0

13

16

19

 

 

 

 

 

 

 

 

tPLZ,

Maximum Propagation Delay, Direction or Output Enable to A or B

2.0

110

140

165

ns

tPHZ

(Figures 2 and 4)

3.0

90

110

130

 

 

 

4.5

22

28

33

 

 

 

6.0

19

24

28

 

 

 

 

 

 

 

 

tPZL,

Maximum Propagation Delay, Output Enable to A or B

2.0

110

140

165

ns

tPZH

(Figures 2 and 4)

3.0

90

110

130

 

 

 

4.5

22

28

33

 

 

 

6.0

19

24

28

 

 

 

 

 

 

 

 

tTLH,

Maximum Output Transition Time, Any Output

2.0

60

75

90

ns

tTHL

(Figures 1 and 3)

3.0

23

27

32

 

 

 

4.5

12

15

18

 

 

 

6.0

10

13

15

 

 

 

 

 

 

 

 

Cin

Maximum Input Capacitance (Pin 1 or Pin 19)

Ð

10

10

10

pF

Cout

Maximum Three±State I/O Capacitance

Ð

15

15

15

pF

 

(I/O in High±Impedance State)

 

 

 

 

 

 

 

 

 

 

 

 

NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).

 

 

Typical @ 25°C, VCC = 5.0 V

 

CPD

Power Dissipation Capacitance (Per Transceiver Channel)*

40

pF

*Used to determine the no±load dynamic power consumption: PD = CPD VCC2f + ICC VCC. For load considerations, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).

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