MOTOROLA MC74HC573ADW, MC74HC573AF, MC74HC573AFEL, MC74HC573ADTEL, MC74HC573ADT Datasheet

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MOTOROLA MC74HC573ADW, MC74HC573AF, MC74HC573AFEL, MC74HC573ADTEL, MC74HC573ADT Datasheet

MC74HC573A

Octal 3-State Noninverting

Transparent Latch

High±Performance Silicon±Gate CMOS

The MC74HC573A is identical in pinout to the LS573. The devices are compatible with standard CMOS outputs; with pullup resistors, they are compatible with LSTTL outputs.

These latches appear transparent to data (i.e., the outputs change asynchronously) when Latch Enable is high. When Latch Enable goes low, data meeting the setup and hold time becomes latched.

The HC573A is identical in function to the HC373A but has the data inputs on the opposite side of the package from the outputs to facilitate PC board layout.

Output Drive Capability: 15 LSTTL Loads

Outputs Directly Interface to CMOS, NMOS and TTL

Operating Voltage Range: 2.0 to 6.0 V

Low Input Current: 1.0 μA

In Compliance with the Requirements Defined by JEDEC Standard No. 7A

Chip Complexity: 218 FETs or 54.5 Equivalent Gates

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MARKING

 

 

DIAGRAMS

 

 

20

 

 

PDIP±20

MC74HC573AN

 

N SUFFIX

 

 

AWLYYWW

20

CASE 738

 

 

 

 

 

 

1

 

1

 

 

20

 

 

SOIC WIDE±20

 

HC573A

20

DW SUFFIX

 

 

AWLYYWW

1

CASE 751D

 

 

 

 

 

 

1

20

 

TSSOP±20

 

HC

20

DT SUFFIX

 

573A

1

CASE 948E

 

ALYW

 

 

 

1

A

= Assembly Location

WL

= Wafer Lot

 

 

YY

= Year

 

 

WW = Work Week

ORDERING INFORMATION

Device

Package

Shipping

MC74HC573AN

PDIP±20

1440 / Box

MC74HC573ADW

SOIC±WIDE

38 / Rail

MC74HC573ADWR2

SOIC±WIDE

1000 / Reel

MC74HC573ADT

TSSOP±20

75 / Rail

MC74HC573ADTR2

TSSOP±20

2500 / Reel

Semiconductor Components Industries, LLC, 2000

1

Publication Order Number:

May, 2000 ± Rev. 9

 

MC74HC573A/D

MC74HC573A

LOGIC DIAGRAM

 

 

D0

2

 

 

 

19

Q0

 

 

 

 

 

 

 

 

 

 

3

 

 

 

18

 

 

 

 

D1

 

 

 

Q1

 

 

 

4

 

 

 

17

 

 

 

 

D2

 

 

 

Q2

 

 

DATA

5

 

 

 

16

 

NONINVERTING

 

 

 

 

 

 

 

 

D3

 

 

 

Q3

 

6

 

 

 

15

INPUTS

 

D4

 

 

 

Q4

 

OUTPUTS

 

 

7

 

 

 

14

 

 

 

 

D5

 

 

 

Q5

 

 

 

8

 

 

 

13

 

 

 

 

D6

 

 

 

Q6

 

 

 

9

 

 

 

12

 

 

 

 

D7

 

 

 

Q7

 

 

 

 

 

 

 

 

 

 

11

 

 

 

 

 

 

LATCH ENABLE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

1

 

 

 

PIN 20 = VCC

OUTPUT ENABLE

 

 

 

 

 

 

PIN 10 = GND

 

 

 

 

FUNCTION TABLE

 

Inputs

 

Output

Output

Latch

 

 

Enable

Enable

D

Q

L

H

H

H

L

H

L

L

L

L

X

No Change

H

X

X

Z

X = Don't Care

Z = High Impedance

Design Criteria

Value

Units

 

 

 

Internal Gate Count*

54.5

ea.

 

 

 

Internal Gate Propagation Delay

1.5

ns

 

 

 

Internal Gate Power Dissipation

5.0

μW

 

 

 

Speed Power Product

0.0075

pJ

 

 

 

*Equivalent to a two±input NAND gate.

 

 

PIN ASSIGNMENT

OUTPUT

 

1

20

VCC

 

 

 

ENABLE

 

 

 

D0

 

2

19

Q0

D1

 

3

18

Q1

 

D2

 

4

17

Q2

 

D3

 

5

16

Q3

 

D4

 

6

15

Q4

 

D5

 

7

14

Q5

 

D6

 

8

13

Q6

 

D7

 

9

12

Q7

 

GND

 

10

11

LATCH

 

 

ENABLE

 

 

 

 

 

 

 

 

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2

MC74HC573A

MAXIMUM RATINGS*

Symbol

Parameter

 

Value

Unit

 

 

 

 

VCC

DC Supply Voltage (Referenced to GND)

± 0.5 to + 7.0

V

Vin

DC Input Voltage (Referenced to GND)

± 0.5 to VCC + 0.5

V

Vout

DC Output Voltage (Referenced to GND)

± 0.5 to VCC + 0.5

V

Iin

DC Input Current, per Pin

 

± 20

mA

Iout

DC Output Current, per Pin

 

± 35

mA

ICC

DC Supply Current, VCC and GND Pins

± 75

mA

PD

Power Dissipation in Still Air,

Plastic DIP²

750

mW

 

 

SOIC Package²

500

 

 

 

TSSOP Package²

450

 

 

 

 

 

 

Tstg

Storage Temperature

 

± 65 to + 150

_C

TL

Lead Temperature, 1 mm from Case for 10 Seconds

 

_C

 

(Plastic DIP, TSSOP or SOIC Package)

260

 

 

 

 

 

 

This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high±impedance circuit. For proper operation, Vin and Vout should be constrained to the

range GND v (Vin or Vout) v VCC. Unused inputs must always be

tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.

*Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the Recommended Operating Conditions.

²Derating Ð Plastic DIP: ± 10 mW/ _C from 65_ to 125_C SOIC Package: ± 7 mW/_C from 65_ to 125_C TSSOP Package: ±6.1 mW/°C from 65_ to 125_C

For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).

RECOMMENDED OPERATING CONDITIONS

Symbol

Parameter

 

Min

Max

Unit

 

 

 

 

 

 

VCC

DC Supply Voltage (Referenced to GND)

 

2.0

6.0

V

Vin, Vout

DC Input Voltage, Output Voltage (Referenced to GND)

0

VCC

V

TA

Operating Temperature, All Package Types

 

± 55

+ 125

_C

tr, tf

Input Rise and Fall Time

VCC = 2.0 V

0

1000

ns

 

(Figure 1)

VCC = 4.5 V

0

500

 

 

 

VCC = 6.0 V

0

400

 

DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)

 

 

 

 

Guaranteed Limit

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VCC

± 55 to

v _

v

_

 

Symbol

Parameter

Test Conditions

V

_

Unit

 

25 C

85 C

 

125 C

VIH

Minimum High±Level Input

Vout = 0.1 V or VCC ± 0.1 V

2.0

1.5

1.5

 

1.5

V

 

Voltage

|Iout| v 20 μA

3.0

2.1

2.1

 

2.1

 

 

 

 

4.5

3.15

3.15

 

3.15

 

 

 

 

6.0

4.2

4.2

 

4.2

 

 

 

 

 

 

 

 

 

 

VIL

Maximum Low±Level Input

Vout = 0.1 V or VCC ± 0.1 V

2.0

0.5

0.5

 

0.5

V

 

Voltage

|Iout| v 20 μA

3.0

0.9

0.9

 

0.9

 

 

 

 

4.5

1.35

1.35

 

1.35

 

 

 

 

6.0

1.8

1 8

 

1.8

 

 

 

 

 

 

 

 

 

 

VOH

Minimum High±Level Output

Vin = VIH or VIL

2.0

1.9

1.9

 

1.9

V

 

Voltage

|Iout| v 20 μA

4.5

4.4

4.4

 

4.4

 

 

 

 

6.0

5.9

5.9

 

5.9

 

 

 

 

 

 

 

 

 

 

 

 

Vin = VIH or VIL |Iout| 2.4mA

3.0

2.48

2.34

 

2.2

 

 

 

|Iout| v 6.0 mA

4.5

3.98

3.84

 

3.7

 

 

 

|Iout| v 7.8 mA

6.0

5.48

5.34

 

5.2

 

NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High±Speed CMOS Data Book (DL129/D).

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