Changes to Features Section............................................................ 1
Changes to Positive Supply Current, Table 2 ................................ 4
Changes to Ordering Guide .......................................................... 16
10/11—Revision 0: Initial Version
Data SheetAD5116
Rev. | Page 3 of 16
SPECIFICATIONS
ELECTRICAL CHARACTERISTICS
5 kΩ, 10 kΩ, and 80 kΩ versions: V
DD
= 2.3 V to 5.5 V, V
A
= V
DD
, V
B
= 0 V, −40°C < T
A
< +125°C, unless otherwise noted.
Table 2.
Parameter SymbolTest Conditions/CommentsMinTyp
1
MaxUnit
DC CHARACTERISTICS—RHEOSTAT MODE
ResolutionN 6 Bits
Resistor Integral Nonlinearity
2
R-INLR
AB
= 5 kΩ, V
DD
= 2.3 V to 2.7 V−2.5±0.5+2.5LSB
R
AB
= 5 kΩ, V
DD
= 2.7 V to 5.5 V−1 ±0.25+1LSB
R
AB
= 10 kΩ−1 ±0.25+1LSB
R
AB
= 80 kΩ−0.25±0.1+0.25LSB
Resistor Differential Nonlinearity
2
R-DNL−1 ±0.25+1LSB
Nominal Resistor ToleranceΔR
AB
/R
AB
−8 +8%
Resistance Temperature Coefficient
3
(ΔR
AB
/R
AB
)/ΔT × 10
6
Code = full scale35ppm/°C
Wiper Resistance
R
W
Code = zero scale
70
140
Ω
R
BS
Code = bottom scale4580Ω
R
TS
Code = top scale70140Ω
DC CHARACTERISTICS—POTENTIOMETER
DIVIDER MODE
Integral Nonlinearity
4
INL−0.5±0.15+0.5LSB
Differential Nonlinearity
4
DNL−0.5±0.15+0.5LSB
Full-Scale ErrorV
WFSE
R
AB
= 5 kΩ−2.5LSB
R
AB
=10 kΩ
−1.5
LSB
R
AB
= 80 kΩ−1 LSB
Zero-Scale ErrorV
WZSE
R
AB
= 5 kΩ+1.5LSB
R
AB
=10 kΩ+1LSB
R
AB
= 80 kΩ+0.25LSB
Voltage Divider Temperature Coefficient
3
(ΔV
W
/V
W
)/ΔT × 10
6
Code = half scale±10ppm/°C
RESISTOR TERMINALS
Maximum Continuous I
A
, I
B
, and I
W
Current
3
R
AB
= 5 kΩ, 10 kΩ−6 +6mA
R
AB
= 80 kΩ
−1.5
+1.5
mA
Terminal Voltage Range
5
GNDV
DD
V
Capacitance A, Capacitance B
3, 6
C
A
, C
B
f = 1 MHz, measured to GND,
code = halfscale, V
W
= V
A
= 2.5 V
or V
W
= V
B
= 2.5 V
20pF
Capacitance W
3, 6
C
W
f = 1MHz, measured to GND,
code = halfscale, V
A
= V
B
= 2.5 V
35pF
Common-Mode Leakage Current
3
V
A
= V
W
= V
B
50nA
DIGITAL INPUTS (PU AND PD)
Input Logic
3
HighV
INH
2 V
Low V
INL
0.8V
Input Current
3
I
N
±1µA
Input Capacitance
3
C
IN
5 pF
DIGITAL OUTPUT (ASE)
Output High Voltage
3
V
OH
I
SINK
= 2 mA, V
DD
= 5 V
4.8
V
Output Current
3
I
O
V
DD
= 5 V16mA
Three-State Leakage Current
3
I
OZ
±1µA
Input Capacitance
3
C
IN
5 pF
A
AD5116 Data Sheet
Rev. A | Page 4 of 16
Parameter Symbol Test Conditions/Comments Min Typ
1
Max Unit
POWER SUPPLIES
Single-Supply Power Range 2.3 5.5 V
Positive Supply Current I
DD
V
DD
= 5 V 0.75 3.5 mA
V
DD
= 2.7 V 2.5 mA
V
DD
= 2.3 V 2.4 mA
EEMEM Store Current
3, 7
I
DD_NVM_STORE
2 mA
EEMEM Read Current
3, 8
I
DD_NVM_READ
320 μA
Power Dissipation
9
P
DISS
V
IH
= V
LOGIC
or V
IL
= GND 5 μW
Power Supply Rejection
3
PSR ∆V
DD
/∆V
SS
= 5 V ± 10%
R
AB
= 5 kΩ −43 dB
R
AB
=10 kΩ −50 dB
R
AB
= 80 kΩ −64 dB
DYNAMIC CHARACTERISTICS
3, 10
Bandwidth BW Code = half scale − 3 dB
R
AB
= 5 kΩ 4 MHz
R
AB
= 10 kΩ 2 MHz
R
AB
= 80 kΩ 200 kHz
Total Harmonic Distortion THD V
A
= V
DD
/2 + 1 V rms, V
B
= V
DD
/2,
f = 1 kHz, code = half scale
R
AB
= 5 kΩ −75 dB
R
AB
= 10 kΩ −80 dB
R
AB
= 80 kΩ −85 dB
V
W
Settling Time t
s
V
A
= 5 V, V
B
= 0 V, ±0.5 LSB error
band
R
AB
= 5 kΩ 2.5 μs
R
AB
= 10 kΩ 3 μs
R
AB
= 80 kΩ 10 μs
Resistor Noise Density e
N_WB
Code = half scale, T
A
= 25°C,
f = 100 kHz
R
AB
= 5 kΩ 7 nV/√Hz
R
AB
= 10 kΩ 9 nV/√Hz
R
AB
= 80 kΩ 20 nV/√Hz
FLASH/EE MEMORY RELIABILITY
3
Endurance
11
T
A
= 25°C 1 MCycles
100 kCycles
Data Retention
12
50 Years
1
Typical values represent average readings at 25°C, VDD = 5 V, V
SS
= 0 V, and V
LOGIC
= 5 V.
2
Resistor position nonlinearity error (R-INL) is the deviation from an ideal value measured between the maximum resistance and the minimum resistance wiper
positions. R-DNL measures the relative step change from ideal between successive tap positions. The maximum wiper current is limited to 0.8 × V
DD
/R
AB
.
3
Guaranteed by design and characterization, not subject to production test.
4
INL and DNL are measured at V
WB
with the RDAC configured as a potentiometer divider similar to a voltage output DAC. V
A
= V
DD
and V
B
= 0 V. DNL specification limits
of ±1 LSB maximum are guaranteed monotonic operating conditions.
5
Resistor Terminal A, Resistor Terminal B, and Resistor Terminal W have no limitations on polarity with respect to each other.
6
C
A
is measured with V
W
= V
A
= 2.5 V, C
B
is measured with V
W
= V
B
= 2.5 V, and C
W
is measured with V
A
= V
B
= 2.5 V.
7
Different from operating current; supply current for NVM program lasts approximately 30 ms.
8
Different from operating current; supply current for NVM read lasts approximately 20 μs.
9
P
DISS
is calculated from (I
DD
× V
DD
).
10
All dynamic characteristics use V
DD
= 5.5 V, and V
LOGIC
= 5 V.
11
Endurance is qualified at 100,000 cycles per JEDEC Standard 22, Method A117 and measured at 150°C.
12
Retention lifetime equivalent at junction temperature (T
J
) = 125°C per JEDEC Standard 22, Method A117. Retention lifetime based on an activation energy of 1 eV
derates with junction temperature in the Flash/EE memory.
Data Sheet AD5116
Rev. | Page 5 of 16
INTERFACE TIMING SPECIFICATIONS
V
DD
= 2.3 V to 5.5 V; all specifications T
MIN
to T
MAX
, unless otherwise noted.
Table 3.
Parameter Test Conditions/Comments Min Typ Max Unit Description
t
1
8 ms Debounce time
t
2
1 sec Manual to auto scan time
t
3
140 ms Auto scan step
t
4
ASE
= 0 V, PD = GND, PU = GND
1 sec Auto save execute time
t
5
ASE
= V
DD
8 ms Low pulse time to manual storage
t
EEPROM_PROGRAM
1
15 50 ms Memory program time
t
POWER_UP
2
50 μs Power-on EEPROM restore time
1
EEPROM program time depends on the temperature and EEPROM write cycles. Higher timing is expected at a lower temperature and higher write cycles.
2
Maximum time after V
DD
is equal to 2.3 V.
TIMING DIAGRAMS
09657-002
PU
R
W
t
1
PD (LOW)
Figure 2. Manual Increment Mode Timing
09657-003
PU
t
1
t
2
t
3
PD (LOW)
R
W
Figure 3. Auto Increment Mode Timing
9657-004
PD
t
1
t
4
EEPROMDATANEW DATA
t
EEPROM
PROGRAM
R
W
ASE (LOW)
Figure 4. Auto Save Mode Timing
09657-005
PD/PU (LOW)
t
5
EEPROM
DATANEW DATA
t
EEPROM
PROGRAM
ASE
Figure 5. Manual Save Mode Timing
09657-006
PD
t
1
R
W
R
W
= 45Ω
ASE
Figure 6. End Scale Indication Timing
A
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