Texas Instruments UCC3776N, UCC3776DPTR, UCC3776DP, UCC2776DPTR, UCC2776DP Datasheet

0 (0)
Quad FET Driver
UCC1776 UCC2776 UCC3776
PRELIMINARY
FEATURES
High Peak Output Current Each Output – 1.5A Source,
2.0A Sink
Thermal Shutdown
CMOS Compatible Inputs
Outputs Are Active Low for Undervoltage Lockout Condition
DESCRIPTION
The UCC3776 is a four output BCDMOS buffer/driver designed to drive highly capacitive loads such as power MOSFET gates at high speeds. The device can be configured as either an inverting or non-inverting driver via the POL pin.The outputs are enabled by ENBL.When disabled, all outputs are active low. The device incorporates thermal shutdown with hysteresis for stability. The device also includes an undervoltage lockout circuit (UVLO) with hystere­sis which disables the outputs when VDD is below a preset threshold. The outputs are held low during undervoltage lockout, even in the absence of VDD power to the device.This helps prevent MOSFET turn-on due to capaci­tive current through the gate-drain capacitance of the power MOSFET in the presence of high dV/dts. The logic input thresholds are compatible with standard 5V HCMOS logic.
3/97
BLOCK DIAGRAM
UDG-95129-2
Note:Pin connections shown refer to 16-pin packages.
1
2
UCC1776 UCC2776 UCC3776
ABSOLUTE MAXIMUM RATINGS
Input Supply Voltage, VDD1, VDD2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20V Maximum DC Voltage Difference, VDD1 vs.VDD2 . . . . . . . . . . . . . . . . . . . . . . .100mV Logic Input, IN1, IN4, ENBL
Maximum forced voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .−0.3 to VDD1 + 0.3V
Logic Inputs, IN2, IN3, POL
Maximum forced voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.3 to VDD2 + 0.3V
Latch-up Protection withstand Reverse Current
IREV, OUT1, OUT2, OUT3, OUT4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .500mA
Power Outputs, OUT1, OUT2, OUT3, OUT4
Maximum pulsed current (10% duty max, 10µsec max pulse width) . . . . . . . . . .3A Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .65°C to +150°C Operating Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55°C to +150°C Lead Temperature (Soldering, 10 Seconds) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .300°C
All currents are positive into, negative out of the specified terminal.Consult Packaging Section of Databook for thermal limitations and considerations of packages.
CONNECTION DIAGRAMS
DIL-16 (Top View) N or J,DP Packages
PLCC-28 (Top View) Q Package
ELECTRICAL CHARACTERISTICS Unless otherwise stated these specifications apply for TA = −55°C to +125°C for
UCC1776;40°C to +85°C for UCC2776;0°C to +70°C for UCC3776;VPOL = 5V, VENBL = 5V, 4.5V <VDD < 18V, TJ = TA.
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
Input Section
VIH, Logic 1 Input Voltage 3 V VIL, Logic 0 Input Voltage 2 V IINn, Input Current VINn = 5V 30 µA
VINn = 0V –1 +1 µA
ENBL Input Current VENBL = 5V 30 µA
VENBL = 0V –1 +1 µA
POL Input Current VPOL = 5V 1 +1 µA
V
POL = 0V 30 µA
3
UCC1776 UCC2776 UCC3776
Note 1:Guaranteed by design.Not 100% tested in production.
ELECTRICAL CHARACTERISTICS (cont.) Unless otherwise stated these specifications apply for TA = −55°C to +125°C
for UCC1776;40°C to +85°C for UCC2776;0°C to +70°C for UCC3776;VPOL = 5V, VENBL = 5V, 4.5V <VDD < 18V, TJ = TA.
PARAMETERTEST CONDITIONS MIN TYP MAX UNITS Output Section
VOH, High Output Voltage IOUTn = -10mA, VDD1 = VDD2= 12V, VINn = 5V VDD1.0 V VOL, Low Output Voltage IOUTn = 10mA, VDD1 = VDD2 = 12V, VINn = 0V 0.15 V Output Resistance IOUTn = 10mA, VDD1 = VDD2 = 12V, VINn = 0V 6 Output High Peak Current VDD1 = VDD2 = 12V, OUTn = 5V, V
INn = 5V, 1.5 A
TJ = 25°C (Note 1)
Output Low Peak Current VDD1 = VDD2 = 12V, OUTn = 5V, V
INn = 0V, 2.0 A
TJ = 25°C (Note 1)
UVLO Output Pull-down Voltage VDD1 = VDD2 = 3V, IOUTn = −10mA 0.8 1.5 V
Switching Time Section
Output Rise Time C
OUTn = 1nF, VOUTn = 1V to 9V,
VDD1 = VDD2 = 12V 25 50 nsec
Output Fall Time C
OUTn = 1nF, VOUTn = 9V to 1V,
VDD1 = VDD2 = 12V 10 50 nsec
IN−>OUT Delay Time (Rising Output) V
INn = 2.5V, VOUTn = 0.1 • VDD, 40 100 nsec
VDD1 = VDD2 = 12, COUTn = 0nF
IN−>OUT Delay Time (Falling Output) V
INn = 2.5V, VOUTn = 0.9 • VDD, 50 100 nsec
VDD1 = VDD2 = 12V, COUTn = 0nF
Power Supply Section
Power Supply Current V(IN1IN4) = 0V, V
ENBL = 0V, 2 mA
VDD1 = VDD2 = 12V UVLO Threshold 4.5 V UVLO Hysteresis 0.5 V
ENBL: Logic level input to enable the drivers.When ENBL is low, the drivers outputs will be at GND potential, regard­less of the status of POL.The input threshold is designed to be 5 volt CMOS compatible, independent of the VDD voltage used on the device.There is a slight hysteresis in the input circuit to help reduce sensitivity to noise on the input signal or input ground.
GND: Ground for the device, the supply return for the VDDs. There are four GND pads on the device.
IN1 - IN4: Inputs to each driver (1-4).The input threshold is designed to be 5 volt CMOS compatible, independent of the VDD voltage used on the device.There is a slight hysteresis in the input circuit to help reduce sensitivity to noise.
OUT1 - OUT4: Outputs to each driver (1-4). The outputs are totem pole DMOS circuits. In the absence of VDD on the device, the outputs will stay off, even with a capacitive displacement current into the output node.
POL: Polarity selection for the drivers. A logic 0 selects inverting operation. A logic 1 selects non-inverting opera­tion. The input threshold is designed to be 5 volt CMOS compatible, independent of the VDD voltage used on the device.There is a slight hysteresis in the input circuit to help reduce sensitivity to noise.
VDD1: Supply Voltage for drivers 1 and 4. Tied inter nally to VDD2.
VDD2: Supply Voltage for drivers 2 and 3.Tied internally to VDD1.
PIN DESCRIPTIONS
APPLICATION INFORMATION
Figure 1 depicts a block diagram of the UCC3776 Quad FET Driver. Four high current, high speed gate drivers with CMOS compatible input stages are provided. Polar ity select and enable inputs provide circuit integra-
tion flexibility, while power packaging and high speed drive circuitry allow for driving high power MOSFET gates in high speed applications.
Loading...
+ 4 hidden pages