November 1994
54F/74F20
Dual 4-Input NAND Gate
General Description
This device contains two independent gates, each of which performs the logic NAND function.
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Commercial |
Military |
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Package |
Package Description |
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Number |
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74F20PC |
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N14A |
14-Lead (0.300× Wide) Molded Dual-In-Line |
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54F20DM (Note 2) |
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J14A |
14-Lead Ceramic Dual-In-Line |
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74F20SC (Note 1) |
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M14A |
14-Lead (0.150× Wide) Molded Small Outline, JEDEC |
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74F20SJ (Note 1) |
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M14D |
14-Lead (0.300× Wide) Molded Small Outline, EIAJ |
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54F20FM (Note 2) |
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W14B |
14-Lead Cerpack |
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54F20LM (Note 2) |
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E20A |
20-Lead Ceramic Leadless Chip Carrier, Type C |
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Note 1: Devices also available in 13× reel. Use suffix e SCX and SJX. |
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Note 2: Military grade device with environmental and burn-in processing. Use suffix e DMQB, FMQB and LMQB. |
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Logic Symbol |
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Connection Diagrams |
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IEEE/IEC |
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Pin Assignment |
Pin Assignment |
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for DIP, SOIC and Flatpak |
for LCC |
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TL/F/9462 ± 2
TL/F/9462 ± 1
TL/F/9462 ± 3
Unit Loading/Fan Out
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54F/74F |
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Pin Names |
Description |
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U.L. |
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Input IIH/IIL |
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HIGH/LOW |
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Output IOH/IOL |
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An, Bn, Cn, Dn |
Inputs |
1.0/1.0 |
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20 mA/b0.6 mA |
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b1 mA/20 mA |
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On |
Outputs |
50/33.3 |
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TRI-STATEÉ is a registered trademark of National Semiconductor Corporation.
Gate NAND Input-4 Dual 54F/74F20
C1995 National Semiconductor Corporation |
TL/F/9462 |
RRD-B30M75/Printed in U. S. A. |
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications.
Storage Temperature |
b65§C to a150§C |
Ambient Temperature under Bias |
b55§C to a125§C |
Junction Temperature under Bias |
b55§C to a175§C |
Plastic |
b55§C to a150§C |
VCC Pin Potential to |
b0.5V to a7.0V |
Ground Pin |
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Input Voltage (Note 2) |
b0.5V to a7.0V |
Input Current (Note 2) |
b30 mA to a5.0 mA |
Voltage Applied to Output |
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in HIGH State (with VCC e 0V) |
b0.5V to VCC |
Standard Output |
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TRI-STATEÉ Output |
b0.5V to a5.5V |
Current Applied to Output |
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in LOW State (Max) |
twice the rated IOL (mA) |
Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
Recommended Operating
Conditions
Free Air Ambient Temperature |
b55§C to a125§C |
Military |
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Commercial |
0§C to a70§C |
Supply Voltage |
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Military |
a4.5V to a5.5V |
Commercial |
a4.5V to a5.5V |
DC Electrical Characteristics
Symbol |
Parameter |
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54F/74F |
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Units |
VCC |
Conditions |
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Min |
Typ |
Max |
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VIH |
Input HIGH Voltage |
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2.0 |
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V |
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Recognized as a HIGH Signal |
VIL |
Input LOW Voltage |
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0.8 |
V |
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Recognized as a LOW Signal |
VCD |
Input Clamp Diode Voltage |
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b1.2 |
V |
Min |
IIN e b18 mA |
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VOH |
Output HIGH |
54F |
10% VCC |
2.5 |
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IOH e b1 mA |
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Voltage |
74F |
10% VCC |
2.5 |
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V |
Min |
IOH e b1 mA |
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74F |
5% VCC |
2.7 |
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IOH e b1 mA |
VOL |
Output LOW |
54F |
10% VCC |
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0.5 |
V |
Min |
IOL e 20 mA |
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Voltage |
74F |
10% VCC |
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0.5 |
IOL e 20 mA |
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IIH |
Input HIGH |
54F |
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20.0 |
mA |
Max |
VIN e 2.7V |
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Current |
74F |
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5.0 |
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IBVI |
Input HIGH Current |
54F |
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100 |
mA |
Max |
VIN e 7.0V |
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Breakdown Test |
74F |
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7.0 |
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ICEX |
Output HIGH |
54F |
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250 |
mA |
Max |
VOUT e VCC |
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Leakage Current |
74F |
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50 |
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VID |
Input Leakage |
74F |
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4.75 |
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V |
0.0 |
IID e 1.9 mA |
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Test |
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All other pins grounded |
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IOD |
Output Leakage |
74F |
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3.75 |
mA |
0.0 |
VIOD e 150 mV |
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Circuit Current |
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All other pins grounded |
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IIL |
Input LOW Current |
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b0.6 |
mA |
Max |
VIN e 0.5V |
IOS |
Output Short-Circuit Current |
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b60 |
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b150 |
mA |
Max |
VOUT e 0V |
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ICCH |
Power Supply Current |
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0.9 |
1.4 |
mA |
Max |
VO e HIGH |
ICCL |
Power Supply Current |
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3.4 |
5.1 |
mA |
Max |
VO e LOW |
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