NSC 5962-9218001MSA, 5962-9218001MRA, 5962-9218001M2A Datasheet

0 (0)

August 1998

54ACQ573 · 54ACTQ573

Quiet Series Octal Latch with TRI-STATE® Outputs

General Description

The 'ACQ/'ACTQ573 is a high-speed octal latch with buffered common Latch Enable (LE) and buffered common Output Enable (OE) inputs. The 'ACQ/'ACTQ573 is functionally identical to the 'ACQ/'ACTQ373 but with inputs and outputs on opposite sides of the package. The 'ACQ/'ACTQ utilizes NSC Quiet Series technology to guarantee quiet output switching and improved dynamic threshold performance. FACT Quiet Seriesfeatures GTOoutput control and undershoot corrector in addition to a split ground bus for superior performance.

nGuaranteed simultaneous switching noise level and dynamic threshold performance

nImproved latch-up immunity

nInputs and outputs on opposite sides of package allow easy interface with microprocessors

nOutputs source/sink 24 mA

nFaster prop delays than standard 'ACT573

n4 kV minimum ESD immunity

nStandard Microcircuit Drawing (SMD)

Ð'ACTQ573: 5962-92194

Ð'ACQ573: 5962-92180

Features

n ICC and IOZ reduced by 50%

Logic Symbols

IEEE/IEC

DS100242-1

DS100242-2

 

Pin Names

Description

 

 

 

 

 

D0±D7

Data Inputs

 

LE

Latch Enable Input

 

 

TRI-STATE Output Enable Input

 

OE

 

 

O0±O7

TRI-STATE Latch Outputs

GTOis a trademark of National Semiconductor Corporation.

TRI-STATE® is a registered trademark of National Semiconductor Corporation.

FACT® is a registered trademark of Fairchild Semiconductor Corporation.

FACT Quiet Seriesis a trademark of Fairchild Semiconductor Corporation.

Outputs STATE-TRI with Latch Octal Series Quiet 54ACTQ573 · 54ACQ573

© 1998 National Semiconductor Corporation

DS100242

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NSC 5962-9218001MSA, 5962-9218001MRA, 5962-9218001M2A Datasheet

Connection Diagrams

Pin Assignment for DIP and Flatpak

DS100242-3

Pin Assignment for LCC

DS100242-4

Logic Diagram

Functional Description

The 'ACQ/'ACTQ573 contains eight D-type latches with TRI-STATE output buffers. When the Latch Enable (LE) input is HIGH, data on the Dn inputs enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its D input changes. When LE is LOW the latches store the information that was present on the D inputs a setup time preceding the HIGH-to-LOW transition of LE. The TRI-STATE buffers are controlled by the Output Enable (OE) input. When OE is LOW, the buffers are enabled. When OE is HIGH the buffers are in the high impedance mode but this does not interfere with entering new data into the latches.

Truth Table

 

 

 

Inputs

 

Outputs

 

 

 

 

 

 

 

OE

 

LE

D

On

 

L

H

H

H

 

L

H

L

L

 

L

L

X

O0

 

H

X

X

Z

 

 

 

 

 

 

H = HIGH Voltage

L = LOW Voltage

Z = High Impedance X = Immaterial

O0 = Previous O0 before HIGH-to-LOW transition of Latch Enable

DS100242-5

Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.

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Absolute Maximum Ratings (Note 2)

If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications.

Supply Voltage (VCC)

−0.5V to +7.0V

DC Input Diode Current (IIK)

 

VI = −0.5V

−20 mA

VI = VCC + 0.5V

+20 mA

DC Input Voltage (VI)

−0.5V to V CC + 0.5V

DC Output Diode Current (IOK)

 

VO = −0.5V

−20 mA

VO = VCC + 0.5V

+20 mA

DC Output Voltage (VO)

−0.5V to V CC + 0.5V

DC Output Source

 

or Sink Current (IO)

±50 mA

DC VCC or Ground Current

 

per Output Pin (ICC or IGND)

±50 mA

Storage Temperature (TSTG)

−65ÊC to +150ÊC

DC Latchup Source

 

or Sink Current

±300 mA

Junction Temperature (TJ)

 

CDIP

175ÊC

Recommended Operating

Conditions

Supply Voltage (VCC)

 

 

'ACQ

 

2.0V to 6.0V

'ACTQ

 

4.5V to 5.5V

Input Voltage (VI)

 

0V to VCC

Output Voltage (VO)

 

0V to VCC

Operating Temperature (TA)

 

 

54ACQ/ACTQ

 

−55ÊC to +125ÊC

Minimum Input Edge Rate

V/

t

'ACQ Devices

 

 

VIN from 30% to 70% of VCC

 

VCC @ 3.0V, 4.5V, 5.5V

 

125 mV/ns

Minimum Input Edge Rate

V/

t

'ACTQ Devices

 

 

VIN from 0.8V to 2.0V

 

 

VCC @ 4.5V, 5.5V

 

125 mV/ns

Note 1: All commercial packaging is not recommended for applications requiring greater than 2000 temperature cycles from −40ÊC to +125ÊC.

Note 2: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recommend operation of FACT® circuits outside databook specifications.

DC Characteristics for 'ACQ Family Devices

 

 

 

54ACQ

 

 

 

 

 

 

 

 

Symbol

Parameter

VCC

TA = −55ÊC to +125ÊC

Units

Conditions

 

 

(V)

Guaranteed Limits

 

 

 

 

 

 

 

 

VIH

Minimum High Level

3.0

2.1

 

VOUT = 0.1V

 

Input Voltage

4.5

3.15

V

or VCC − 0.1V

 

 

5.5

3.85

 

 

 

 

 

 

 

 

VIL

Maximum Low Level

3.0

0.9

 

VOUT = 0.1V

 

Input Voltage

4.5

1.35

V

or VCC − 0.1V

 

 

5.5

1.65

 

 

VOH

Minimum High Level

3.0

2.9

 

IOUT = −50 µA

 

Output Voltage

4.5

4.4

V

 

 

 

5.5

5.4

 

 

 

 

 

 

 

 

 

 

 

 

 

(Note 3)

 

 

 

 

 

VIN = VIL or VIH

 

 

3.0

2.4

 

IOH = −12 mA

 

 

4.5

3.7

V

IOH = −24 mA

 

 

5.5

4.7

 

IOH = −24 mA

VOL

Maximum Low Level

3.0

0.1

 

IOUT = 50 µA

 

Output Voltage

4.5

0.1

V

 

 

 

5.5

0.1

 

 

 

 

 

 

 

 

 

 

 

 

 

(Note 3)

 

 

 

 

 

VIN = VIL or VIH

 

 

3.0

0.50

 

IOL = 12 mA

 

 

4.5

0.50

V

IOL = 24 mA

 

 

5.5

0.50

 

IOL = 24 mA

IIN

Maximum Input

5.5

±1.0

µA

VI = VCC, GND

 

Leakage Current

 

 

 

(Note 5)

 

 

 

 

 

 

3

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