February 1990
Revised November 1999
100311
Low Skew 1:9 Differential Clock Driver
General Description
The 100311 contains nine low skew differential drivers, designed for generation of multiple, minimum skew differ- ential clocks from a single differential input (CLKIN, CLKIN). If a single-ended input is desired, the VBB output pin may be used to drive the remaining input line. A HIGH on the enable pin (EN) will force a LOW on all of the CLKn
outputs and a HIGH on all of the CLKn output pins. The
Features
■Low output-to-output skew
■2000V ESD protection
■1:9 low skew clock driver
■Differential inputs and outputs
■Available to industrial grade temperature range (PLCC package only)
100311 is ideal for distributing a signal throughout a system without worrying about the original signal becoming too corrupted by undesirable delays and skew.
Ordering Code:
Order Number |
Package Number |
Package Description |
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100311QC |
V28A |
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square |
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100311QI |
V28A |
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square |
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Industrial Temperature Range (− 40° C to + 85° C) |
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Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbol |
Connection Diagram |
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28-Pin PLCC |
Pin Descriptions |
Truth Table |
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Pin Names |
Description |
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CLKIN, |
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Differential Clock Inputs |
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CLKIN |
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Enable |
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EN |
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CLK0–8, |
CLK |
0–8 |
Differential Clock Outputs |
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VBB |
VBB Output |
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NC |
No Connect |
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CLKIN |
CLKIN |
EN |
CLKn |
CLKn |
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L |
H |
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L |
L |
H |
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H |
L |
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L |
H |
L |
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X |
X |
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H |
L |
H |
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Driver Clock Differential 1:9 Skew Low 100311
© 1999 Fairchild Semiconductor Corporation |
DS010648 |
www.fairchildsemi.com |
100311
Absolute Maximum Ratings(Note 1)
Storage Temperature (TSTG) |
− 65° C to + 150° C |
Maximum Junction Temperature (TJ) |
+ 150° C |
Pin Potential to Ground Pin (VEE) |
− 7.0V to + 0.5V |
Input Voltage (DC) |
VEE to + 0.5V |
Output Current (DC Output HIGH) |
− 50 mA |
ESD (Note 2) |
≥ 2000V |
Recommended Operating
Conditions
Case Temperature (TC) |
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Commercial |
0° C to + 85° C |
Industrial |
− 40° C to + 85° C |
Supply Voltage (VEE) |
− 5.7V to − 4.2V |
Note 1: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The “Recommended Operating Conditions” table will define the conditions for actual device operation.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Commercial Version
DC Electrical Characteristics (Note 3)
VEE = − |
4.2V to − 5.7V, VCC = VCCA = |
GND, TC = 0° C to + 85° C |
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Symbol |
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Parameter |
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Min |
Typ |
Max |
Units |
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Conditions |
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VOH |
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Output HIGH Voltage |
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− 1025 |
− 955 |
− 870 |
mV |
VIN = |
VIH (Max) |
Loading with |
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VOL |
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Output LOW Voltage |
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− 1830 |
− 1705 |
− 1620 |
mV |
or VIL (Min) |
50Ω to − 2.0V |
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VOHC |
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Output HIGH Voltage |
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− 1035 |
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mV |
VIN = |
VIH |
Loading with |
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VOLC |
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Output LOW Voltage |
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− 1610 |
mV |
or VIL (Max) |
50Ω to − 2.0V |
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VBB |
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Output Reference Voltage |
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− 1380 |
− 1320 |
− 1260 |
mV |
IVBB = |
− 300 µ A |
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VDIFF |
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Input Voltage Differential |
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150 |
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mV |
Required for Full Output Swing |
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VCM |
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Common Mode Voltage |
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VCC − 2.0 |
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VCC − 0.5 |
V |
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VIH |
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Input HIGH Voltage |
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− 1165 |
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− 870 |
mV |
Guaranteed HIGH Signal for |
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All Inputs |
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VIL |
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Input LOW Voltage |
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− 1830 |
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− 1475 |
mV |
Guaranteed LOW Signal for |
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All Inputs |
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IIL |
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Input LOW Current |
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0.50 |
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µ A |
VIN = |
VIL (Min) |
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IIH |
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Input HIGH Current |
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VIN = |
VIH (Max) |
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µ A |
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CLKIN, CLKIN |
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100 |
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EN |
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250 |
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ICBO |
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Input Leakage Current |
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− 10 |
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µ A |
VIN = |
VEE |
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IEE |
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Power Supply Current |
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− 115 |
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− 57 |
mA |
Inputs Open |
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Note 3: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under “worst case” conditions.
www.fairchildsemi.com |
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