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Low Noise, Matched |
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Dual PNP Transistor |
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MAT03 |
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FEATURES |
PIN CONNECTION |
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Dual Matched PNP Transistor |
TO-78 |
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Low Offset Voltage: 100 V Max |
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(H Suffix) |
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Low Noise: 1 nV/√Hz @ 1 kHz Max |
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High Gain: 100 Min |
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High Gain Bandwidth: 190 MHz Typ |
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Tight Gain Matching: 3% Max |
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Excellent Logarithmic Conformance: rBE 0.3 typ |
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GENERAL DESCRIPTION
The MAT03 dual monolithic PNP transistor offers excellent parametric matching and high frequency performance. Low noise characteristics (1 nV/√Hz max @ 1 kHz), high bandwidth (190 MHz typical), and low offset voltage (100 µV max), makes the MAT03 an excellent choice for demanding preamplifier applications. Tight current gain matching (3% max mismatch) and high current gain (100 min), over a wide range of collector current, makes the MAT03 an excellent choice for current mirrors. A low value of bulk resistance (typically 0.3 Ω) also makes the MAT03 an ideal component for applications requiring accurate logarithmic conformance.
Each transistor is individually tested to data sheet specifications. Device performance is guaranteed at 25°C and over the extended industrial and military temperature ranges. To ensure the longterm stability of the matching parameters, internal protection diodes across the base-emitter junction clamp any reverse baseemitter junction potential. This prevents a base-emitter breakdown condition that can result in degradation of gain and matching performance due to excessive breakdown current.
REV. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700 |
www.analog.com |
Fax: 781/326-8703 |
© Analog Devices, Inc., 2002 |
MAT03–SPECIFICATIONS
ELECTRICAL CHARACTERISTICS (@ TA = 25 C, unless otherwise noted.)
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MAT03E |
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MAT03F |
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Parameter |
Symbol |
Conditions |
Min |
Typ |
Max |
Min |
Typ |
Max |
Unit |
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Current Gain1 |
hFE |
VCB = |
0 V, –36 V |
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IC = 1 mA |
100 |
165 |
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80 |
165 |
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IC = 100 µA |
90 |
150 |
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70 |
150 |
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IC = 10 µA |
80 |
120 |
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60 |
120 |
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Current Gain Matching2 |
DhFE |
IC = 100 µA,VCB = 0 V |
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0.5 |
3 |
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0.5 |
6 |
% |
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Offset Voltage3 |
VOS |
VCB = |
0 V, IC = 100 µA |
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40 |
100 |
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40 |
200 |
µV |
Offset Voltage Change |
∆VOS/∆VCB |
IC = 100 µA |
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µV |
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vs. Collector Voltage |
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VCB1 = 0 V |
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11 |
150 |
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11 |
200 |
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VCB2 = –36 V |
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11 |
150 |
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11 |
200 |
µV |
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Offset Voltage Change |
∆VOS/∆IC |
VCB = |
0 V |
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12 |
50 |
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12 |
75 |
µV |
vs. Collector Current |
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IC1 = 10 µA, IC2 = 1 mA |
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12 |
50 |
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12 |
75 |
µV |
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Bulk Resistance |
rBE |
VCB = |
0 V |
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0.3 |
0.75 |
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0.3 |
0.75 |
Ω |
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10 µA ≤ IC ≤ 1 mA |
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0.3 |
0.75 |
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0.3 |
0.75 |
Ω |
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Offset Current |
IOS |
IC = 100 µA, VCB = 0 V |
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6 |
35 |
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6 |
45 |
nA |
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Collector-Base |
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VCB = –36 V = VMAX |
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50 |
200 |
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50 |
400 |
pA |
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Leakage Current |
ICB0 |
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Noise Voltage Density4 |
eN |
IC = 1 mA, VCB = 0 |
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nV/÷ Hz |
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fO = 10 Hz |
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0.8 |
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0.8 |
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fO = 100 Hz |
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0.7 |
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0.7 |
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nV/÷ Hz |
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fO = 1 kHz |
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0.7 |
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0.7 |
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nV/÷ Hz |
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Collector Saturation |
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fO = 10 kHz |
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0.7 |
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0.7 |
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nV/÷ Hz |
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IC = 1 mA, IB = 100 µA |
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Voltage |
VCE(SAT) |
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0.025 |
0.1 |
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0.025 |
0.1 |
V |
ELECTRICAL CHARACTERISTICS (@ –40 C ≤ TA ≤ 85 C, unless otherwise noted.)
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MAT03E |
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MAT03F |
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Parameter |
Symbol |
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Conditions |
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Min |
Typ |
Max |
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Min |
Typ |
Max |
Unit |
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Current Gain |
hFE |
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VCB = 0 V, –36 V |
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IC = 1 mA |
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70 |
120 |
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60 |
120 |
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IC = 100 A |
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60 |
105 |
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50 |
105 |
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IC = 10 A |
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50 |
90 |
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40 |
90 |
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V |
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Offset Voltage |
VOS |
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IC = 100 A, VCB = 0 V |
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30 |
135 |
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30 |
265 |
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Offset Voltage Drift5 |
TCVOS |
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IC = 100 A, VCB = 0 V |
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0.3 |
0.5 |
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0.3 |
1.0 |
V/°C |
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Offset Current |
IOS |
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IC = 100 A, VCB = 0 V |
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10 |
85 |
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10 |
200 |
nA |
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Breakdown Voltage |
BVCEO |
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36 |
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36 |
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V |
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NOTES |
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1Current gain is measured at collector-base voltages (VCB) swept from 0 to VMAX at indicated collector current. Typicals are measured at VCB = 0 V. |
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100 ( ∆IB ) hFE (min ) |
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2Current gain matching (∆hFE) is defined as: ∆hFE = |
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IC1 |
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IC |
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KT |
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3Offset voltage is defined as: VOS = VBE1 – VBE2, where |
VOS is the differential voltage for IC1 |
= IC2: VOS = VBE1 – VBE2 = |
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In |
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q |
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IC2 |
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4Sample tested. Noise tested and specified as equivalent input voltage for each transistor. 5Guaranteed by VOS test (TCVOS = VOS/T for VOS VBE) where T = 298°K for TA = 25°C. Specifications subject to change without notice.
–2– |
REV. C |
MAT03
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VOS max |
Temperature |
Package |
Model |
(TA = +25 C) |
Range |
Option |
MAT03EH |
100 V |
–40°C to +85°C |
TO-78 |
MAT03FH |
200 V |
–40°C to +85°C |
TO-78 |
ABSOLUTE MAXIMUM RATINGS1 |
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Collector-Base Voltage (BVCBO) . . . . . . . . . . |
. . . . . . . . . 36 V |
Collector-Emitter Voltage (BVCEO) . . . . . . . . |
. . . . . . . . . 36 V |
Collector-Collector Voltage (BVCC) . . . . . . . . |
. . . . . . . . . 36 V |
Emitter-Emitter Voltage (BVEE) . . . . . . . . . . |
. . . . . . . . . 36 V |
Collector Current (IC) . . . . . . . . . . . . . . . . . . |
. . . . . . . . 20 mA |
Emitter Current (IE) . . . . . . . . . . . . . . . . . . . |
. . . . . . . . 20 mA |
Total Power Dissipation |
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Ambient Temperature ≤ 70°C2 . . . . . . . . . |
. . . . . . 500 mW |
Operating Temperature Range |
–40°C to +85°C |
MAT03E/F . . . . . . . . . . . . . . . . . . . . . . . . |
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Operating Junction Temperature . . . . . . . . . |
–55°C to +150°C |
Storage Temperature . . . . . . . . . . . . . . . . . . |
–65°C to +150°C |
Lead Temperature (Soldering, 60 sec) . . . . . |
. . . . . . . . 300°C |
Junction Temperature . . . . . . . . . . . . . . . . . |
–65°C to +150°C |
NOTES
1Absolute maximum ratings apply to both DICE and packaged devices.
2Rating applies to TO-78 not using a heat sink and LCC; devices in free air only. For TO-78, derate linearly at 6.3 mW/°C above 70°C ambient temperature; for LCC, derate at 7.8 mW/°C.
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the MAT03 features propriety ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. C |
–3– |
MAT03–Typical Performance Characteristics
TPC 1. Current Gain vs. |
TPC 2. Current Gain |
TPC 3. Gain Bandwidth vs. |
Collector Current |
vs. Temperature |
Collector Current |
TPC 4. Base-Emitter Voltage |
TPC 5. Small-Signal Input Resistance |
vs. Collector Current |
(hie) vs. Collector Current |
TPC 6. Small Signal Output Conductance (hoe) vs. Collector Current
–4– |
REV. C |