MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order this document by MCM6926A/D
Advance Information
128K x 8 Bit Fast Static Random
Access Memory
The MCM6926A is a 1,048,576 bit static random access memory organized as 131,072 words of 8 bits. Static design eliminates the need for external clocks or timing strobes.
Output enable (G) is a special control feature that provides increased system flexibility and eliminates bus contention problems.
This device meets JEDEC standards for functionality and revolutionary pinout, and is available in a 400 mil plastic small±outline J±leaded package.
•Single 3.3 V Power Supply
•Fully Static Ð No Clock or Timing Strobes Necessary
•All Inputs and Outputs Are TTL Compatible
•Three State Outputs
•Fast Access Times: 8, 10, 12, 15 ns
•Center Power and I/O Pins for Reduced Noise
•Fully 3.3 V BiCMOS
BLOCK DIAGRAM
A |
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A |
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VDD |
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VSS |
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A |
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MEMORY |
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ROW |
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MATRIX |
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DECODER |
512 ROWS x 256 x 8 |
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COLUMNS |
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A |
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A |
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A |
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DQ |
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COLUMN I/O |
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INPUT |
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COLUMN DECODER |
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DATA |
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CONTROL |
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DQ |
A |
A |
A |
A |
A |
A |
A |
A |
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E |
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W |
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G |
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MCM6926A
WJ PACKAGE 400 MIL SOJ CASE 857A±02
PIN ASSIGNMENT
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A |
1 |
32 |
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A |
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A |
2 |
31 |
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A |
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A |
3 |
30 |
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A |
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A |
4 |
29 |
A |
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G |
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E |
5 |
28 |
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DQ |
6 |
27 |
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DQ |
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DQ |
7 |
26 |
DQ |
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VDD |
8 |
25 |
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VSS |
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VSS |
9 |
24 |
VDD |
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DQ |
10 |
23 |
DQ |
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DQ |
11 |
22 |
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DQ |
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W |
12 |
21 |
A |
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A |
13 |
20 |
A |
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A |
14 |
19 |
A |
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A |
15 |
18 |
A |
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16 |
17 |
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PIN NAMES
A . . . . . . . . . . . . . . . . . . . . . . . Address Input
E . . . . . . . . . . . . . . . . . . . . . . . . Chip Enable
W . . . . . . . . . . . . . . . . . . . . . . . Write Enable
G . . . . . . . . . . . . . . . . . . . . . Output Enable
DQ . . . . . . . . . . . . . . . . . Data Input/Output
VDD . . . . . . . . . . . . . + 3.3 V Power Supply
VSS . . . . . . . . . . . . . . . . . . . . . . . . . Ground
This document contains information on a new product. Motorola reserves the right to change or discontinue this product without notice.
REV 1 2/25/97
MOTOROLA FAST SRAM |
MCM6926A |
Motorola, Inc. 1997 |
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1 |
TRUTH TABLE (X = Don't Care)
E |
G |
W |
Mode |
VDD Current |
Output |
Cycle |
H |
X |
X |
Not Selected |
ISB1, ISB2 |
High±Z |
Ð |
L |
H |
H |
Output Disabled |
IDDA |
High±Z |
Ð |
L |
L |
H |
Read |
IDDA |
Dout |
Read Cycle |
L |
X |
L |
Write |
IDDA |
High±Z |
Write Cycle |
ABSOLUTE MAXIMUM RATINGS (See Note)
Rating |
Symbol |
Value |
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Unit |
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Power Supply Voltage |
VDD |
± 0.5 to + |
4.6 |
V |
Voltage Relative to VSS for Any Pin |
Vin, Vout |
± 0.5 to VDD + 0.5 |
V |
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Except VDD |
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Output Current |
Iout |
± 30 |
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mA |
Power Dissipation |
PD |
0.6 |
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W |
Temperature Under Bias |
Tbias |
± 10 to + |
85 |
°C |
Operating Temperature |
TA |
0 to + 70 |
°C |
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Storage Temperature Ð Plastic |
Tstg |
± 55 to + 125 |
°C |
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to RECOMMENDED OPERATING CONDITIONS. Exposure to higher than recommended voltages for extended periods of time could affect device reliability.
This device contains circuitry to protect the inputs against damage due to high static voltages or electric fields; however, it is advised that normal precautions be taken to avoid application of any voltage higher than maximum rated voltages to these high±impedance circuits.
This BiCMOS memory circuit has been designed to meet the dc and ac specifications shown in the tables, after thermal equilibrium has been established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow of at least 500 linear feet per minute is maintained.
DC OPERATING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V + 10%, ± 5%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
Parameter |
Symbol |
Min |
Typ |
Max |
Unit |
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Supply Voltage (Operating Voltage Range) |
VDD |
3.135 |
3.3 |
3.6 |
V |
Input High Voltage |
VIH |
2.2 |
Ð |
VDD + 0.3** |
V |
Input Low Voltage |
VIL |
± 0.5* |
Ð |
0.8 |
V |
*VIL (min) = ± 0.5 V dc; VIL (min) = ± 2.0 V ac (pulse width ≤ 2.0 ns) for I ≤ 20.0 mA.
**VIH (max) = VDD + 0.3 V dc; VIH (max) = VDD + 2 V ac (pulse width ≤ 2.0 ns) for I ≤ 20.0 mA.
DC CHARACTERISTICS
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Parameter |
Symbol |
Min |
Max |
Unit |
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Input Leakage Current (All Inputs, Vin = 0 to VDD) |
Ilkg(I) |
Ð |
± 1.0 |
μA |
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Output Leakage Current (E = VIH, Vout = 0 to VDD) |
Ilkg(O) |
Ð |
± 1.0 |
μA |
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Output Low Voltage (IOL = + 8.0 mA) |
VOL |
Ð |
0.4 |
V |
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Output High Voltage (IOH = ± 4.0 mA) |
VOH |
2.4 |
Ð |
V |
MCM6926A |
MOTOROLA FAST SRAM |
2 |
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POWER SUPPLY CURRENTS (See Note 1)
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6926A±8 |
6926A±10 |
6926A±12 |
6926A±15 |
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Parameter |
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Symbol |
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Unit |
Notes |
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Typ |
Max |
Typ |
Max |
Typ |
Max |
Typ |
Max |
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AC Active Supply Current |
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IDDA |
Ð |
150 |
Ð |
130 |
Ð |
120 |
Ð |
110 |
mA |
2, 3, 4 |
(Iout = 0 mA) (VDD = max, f = fmax) |
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Active Quiescent Current |
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IDD2 |
Ð |
80 |
Ð |
80 |
Ð |
80 |
Ð |
80 |
mA |
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(E = VIL, VDD = max, f = 0 MHz) |
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AC Standby Current |
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ISB1 |
Ð |
50 |
Ð |
45 |
Ð |
40 |
Ð |
35 |
mA |
2, 3, 4 |
(E = VIH, VDD = max, f = fmax) |
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CMOS Standby Current |
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ISB2 |
Ð |
20 |
Ð |
20 |
Ð |
20 |
Ð |
20 |
mA |
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(VDD = max, f = 0 MHz, |
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E ≥ VDD ± 0.2 V, |
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Vin ≤ VSS + 0.2 V, or ≥ |
VDD ± 0.2 V) |
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NOTES:
1.Typical current = 25°C @ 3.3 V.
2.Reference AC Operating Conditions and Characteristics for input and timing (VIH/VIL, tr/tf, pulse level 0 to 3.0 V, VIH = 3.0 V).
3.All address transition simultaneously low (LSB) and then high (MSB).
4.Data states are all zero.
CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, TA = 25°C, Periodically Sampled Rather Than 100% Tested)
Parameter |
Symbol |
Typ |
Max |
Unit |
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Address Input Capacitance |
Cin |
Ð |
6 |
pF |
Control Pin Input Capacitance |
Cin |
Ð |
6 |
pF |
Input/Output Capacitance |
CI/O |
Ð |
8 |
pF |
MOTOROLA FAST SRAM |
MCM6926A |
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3 |