Microchip Technology Inc 93LCS66T-I-SN, 93LCS66T-I-SM, 93LCS66T-I-SL, 93LCS66T-I-P, 93LCS66T-SN Datasheet

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Microchip Technology Inc 93LCS66T-I-SN, 93LCS66T-I-SM, 93LCS66T-I-SL, 93LCS66T-I-P, 93LCS66T-SN Datasheet

93LCS56/66

2K/4K 2.5V Microwire Serial EEPROM with Software Write Protect

FEATURES

Single supply with programming operation down to 2.5V

Low power CMOS technology

-1 mA active current typical

-5 A standby current (typical) at 3.0V

x16 memory organization

-128x16 (93LCS56)

-256x16 (93LCS66)

Software write protection of user defined memory space

Self timed erase and write cycles

Automatic ERAL before WRAL

Power on/off data protection

Industry standard 3-wire serial I/O

Device status signal during E/W

Sequential READ function

1,000,000 E/W cycles guaranteed

Data retention > 200 years

8-pin PDIP/SOIC and 14-pin SOIC packages

Temperature ranges supported

-

Commercial (C):

0˚C

to

+70˚C

-

Industrial (I):

-40˚C

to

+85˚C

BLOCK DIAGRAM

 

VCC

VSS

 

 

 

MEMORY

ADDRESS

 

 

ARRAY

DECODER

 

 

 

 

ADDRESS

 

 

 

 

COUNTER

 

 

DATA REGISTER

OUTPUT

DO

 

BUFFER

 

 

 

 

DI

 

 

 

 

PRE

MODE

 

 

DECODE

 

 

PE

 

 

LOGIC

 

 

CS

 

 

 

 

 

 

CLOCK

CLK

GENERATOR

DESCRIPTION

The Microchip Technology Inc. 93LCS56/66 are low voltage Serial Electrically Erasable PROMs with memory capacities of 2K bits/4K bits respectively. A write protect register is included in order to provide a user defined region of write protected memory. All memory locations greater than or equal to the address placed in the write protect register will be protected from any attempted write or erase operation. It is also possible to protect the address in the write protect register permanently by using a one time only instruction (PRDS). Any attempt to alter data in a register whose address is equal to or greater than the address stored in the protect register will be aborted. Advanced CMOS technology makes this device ideal for low power non-volatile memory applications.

PACKAGE TYPES

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

SOIC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

NC

 

 

1

14

 

 

NC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

2

13

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CS

 

 

 

 

VCC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3

12

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

DIP

 

 

 

 

 

 

 

 

SOIC

 

 

 

 

CLK

 

 

 

 

PRE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CS

 

 

1

8

 

 

VCC

CS

 

1

8

 

VCC

NC

 

 

4

11

 

 

NC

 

 

2

7

 

 

CLK

 

2

7

 

PRE

 

5

10

 

 

CLK

 

 

 

 

PRE

 

 

DI

 

 

 

 

PE

 

 

3

6

 

 

DI

 

3

6

 

PE

 

 

 

 

DI

 

 

 

 

PE

 

 

DO

 

6

9

 

 

VSS

 

 

4

5

 

 

DO

 

4

5

 

VSS

 

 

 

DO

 

 

 

 

VSS

 

 

NC

 

7

8

 

 

NC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

93LCS56

 

 

 

 

 

 

 

93LCS56

 

 

 

 

 

 

 

 

93LCS56

 

 

 

 

 

 

93LCS66

 

 

 

 

 

 

 

93LCS66

 

 

 

 

 

 

 

 

93LCS66

 

 

 

Microwire is a registered trademark of National Semiconductor Incorporated.

1996 Microchip Technology Inc.

Preliminary

DS11181D-page 1

93LCS56/66

1.0ELECTRICAL CHARACTERISTICS

1.1Maximum Ratings*

VCC...................................................................................

 

7.0V

All inputs and outputs w.r.t. VSS ...............

-0.6V to VCC +1.0V

Storage temperature .....................................

 

-65˚C to +150˚C

Ambient temp. with power applied ................

 

-65˚C to +125˚C

Soldering temperature of leads (10 seconds)

............. +300˚C

ESD protection on all pins................................................

 

4 kV

*Notice: Stresses above those listed under “Maximum ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.

TABLE 1-1: PIN FUNCTION TABLE

Name

Function

 

 

 

 

CS

Chip Select

CLK

Serial Data Clock

DI

Serial Data Input

DO

Serial Data Output

VSS

Ground

PE

Program Enable

PRE

Protect Register Enable

VCC

Power Supply

TABLE 1-2:

DC AND AC ELECTRICAL CHARACTERISTICS

 

 

 

VCC = +2.5V to +6.0V

 

 

 

 

 

 

Commercial(C): Tamb = 0˚C to +70˚C

 

 

 

 

Industrial (I):

Tamb = -40˚C to +85˚C

 

 

 

 

 

 

 

 

 

Parameter

Symbol

 

Min

Max

 

Units

Conditions

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

High level input voltage

VIH

 

2.0

VCC +1

 

V

VCC 2.5V

Low level input voltage

VIL

 

-0.3

0.8

 

V

VCC 2.5V

Low level output voltage

VOL1

 

0.4

 

V

I OL = 2.1 mA; VCC = 4.5V

 

 

 

 

 

 

 

 

 

 

 

VOL2

 

0.2

 

V

I OL = 100 A; VCC = 2.5V

High level output voltage

VOH1

 

2.4

 

V

I OH = -400 A; VCC = 4.5V

 

 

VOH2

 

VCC-0.2

 

V

I OH = -100 A; VCC = 2.5V

Input leakage current

ILI

 

-10

10

 

A

VIN = 0.1V to VCC

Output leakage current

ILO

 

-10

10

 

A

VOUT = 0.1V to Vcc

Pin capacitance

 

CIN, COUT

 

7

 

pF

V IN/VOUT = 0V (Note 1 & 2)

(all inputs/outputs)

 

 

 

 

 

 

Tamb = +25˚C; FCLK = 1 MHz

 

 

 

 

 

 

 

 

Operating current

ICC Write

 

3

 

mA

F CLK = 2 MHz; VCC = 3.0V (Note 2)

 

 

 

 

 

 

 

 

 

 

 

ICC Read

 

1

 

mA

FCLK = 2 MHz; VCC = 6.0V

 

 

 

 

 

500

 

A

FCLK = 1 MHz; VCC = 3.0V

Standby current

 

ICCS

 

100

 

A

CLK = CS = 0V; VCC = 6.0V

 

 

 

 

 

30

 

A

CLK = CS = 0V; VCC = 3.0V

Clock frequency

 

FCLK

 

2

 

MHz

VCC 4.5V

 

 

 

 

 

1

 

MHz

VCC < 4.5V

Clock high time

 

TCKH

 

250

 

ns

 

 

 

 

 

 

 

 

 

 

Clock low time

 

TCKL

 

250

 

ns

 

 

 

 

 

 

 

 

 

Chip select setup time

TCSS

 

50

 

ns

Relative to CLK

 

 

 

 

 

 

 

 

Chip select hold time

TCSH

 

0

 

ns

Relative to CLK

 

 

 

 

 

 

 

 

Chip select low time

TCSL

 

250

 

ns

 

 

 

 

 

 

 

 

 

 

PRE setup time

 

TPRES

 

100

 

ns

Relative to CLK

 

 

 

 

 

 

 

 

 

PE setup time

 

TPES

 

100

 

ns

Relative to CLK

 

 

 

 

 

 

 

 

 

PRE hold time

 

TPREH

 

0

 

ns

Relative to CLK

 

 

 

 

 

 

 

 

 

PE hold time

 

TPEH

 

500

 

ns

Relative to CLK

 

 

 

 

 

 

 

 

Data input setup time

TDIS

 

100

 

ns

Relative to CLK

 

 

 

 

 

 

 

 

Data input hold time

TDIH

 

100

 

ns

Relative to CLK

 

 

 

 

 

 

 

 

Data output delay time

TPD

 

400

 

ns

CL=100 pF

 

 

 

 

 

 

 

 

Data output disable time

TCZ

 

100

 

ns

CL=100 pF (Note 2)

 

 

 

 

 

 

 

 

 

Note 1: This parameter is tested at Tamb = 25˚C and FCLK = 1 MHz. 2: This parameter is periodically sampled and not 100% tested.

DS11181D-page 2

Preliminary

1996 Microchip Technology Inc.

 

 

 

 

 

 

 

93LCS56/66

 

 

 

 

 

 

 

 

 

TABLE 1-2: DC AND AC ELECTRICAL CHARACTERISTICS

(Continued)

 

 

 

 

 

 

 

 

 

VCC = +2.5V to +6.0V

 

 

 

 

 

 

Commercial(C): Tamb = 0˚C to +70˚C

 

 

 

 

Industrial (I):

Tamb = -40˚C to +85˚C

 

 

 

 

 

 

 

 

 

 

Parameter

Symbol

 

Min

Max

 

Units

Conditions

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Status valid time

TSV

 

 

500

 

ns

CL=100 pF

Program cycle time

TWC

 

 

10

 

ms

ERASE/WRITE mode (Note 3)

 

 

 

 

 

 

 

 

 

TEC

 

 

15

 

ms

ERAL mode

 

 

 

 

 

 

 

 

 

TWL

 

 

30

 

ms

WRAL mode

 

 

 

 

 

 

 

 

Endurance

 

1M

 

cycles

25 °C, Vcc = 5.0V, Block Mode

 

 

 

 

 

 

 

(Note 4)

 

 

 

 

 

 

 

 

 

3:Typical program cycle time is 4 ms per word.

4:This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific application, please consult the Total Endurance Model which can be obtained on our BBS or website.

TABLE 1-3:

 

INSTRUCTION SET FOR 93LCS56*/66

 

 

 

 

 

 

 

93LCS56/66 (x 16 organization)

 

 

 

 

 

 

 

 

 

 

 

 

Instruction

SB

 

Opcode

Address

Data In

 

Data Out

PRE

PE

Comments

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

READ

1

 

10

A7 - A0

 

D15-D0

0

X

Reads data stored in memory, start-

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ing at specified address (.Note).

 

 

 

 

 

 

 

 

 

 

 

EWEN

1

 

00

11XXXXXX

 

High-Z

0

1

Erase/Write Enable must precede all

 

 

 

 

 

 

 

 

 

 

 

 

 

 

programming modes.

 

 

 

 

 

 

 

 

 

 

 

ERASE

1

 

11

A7 - A0

 

(RDY/

 

1

Erase data at specified address

 

 

 

 

 

 

 

 

BSY)

 

 

 

location if address is unprotected

 

 

 

 

 

 

 

 

 

 

 

 

 

 

(Note).

 

 

 

 

 

 

 

 

 

 

 

ERAL

1

 

00

10XXXXXX

 

(RDY/

0

1

Erase all registers to “FF”. Valid only

 

 

 

 

 

 

 

 

 

 

 

 

 

when Protect Register is cleared.

 

 

 

 

 

 

 

 

BSY)

 

 

WRITE

1

 

01

A7 - A0*

D15 - D0

 

(RDY/

0

1

Writes register if address is unpro-

 

 

 

 

 

 

 

 

BSY)

 

 

 

tected.

WRAL

1

 

00

01XXXXXX

D15 - D0

 

(RDY/

0

1

Writes all registers. Valid only when

 

 

 

 

 

 

 

 

 

 

 

 

Protect Register is cleared.

 

 

 

 

 

 

 

 

BSY)

 

 

EWDS

1

 

00

00XXXXXX

 

High-Z

0

X

Erase/Write Disable deactivates all

 

 

 

 

 

 

 

 

 

 

 

 

 

 

programming instructions.

 

 

 

 

 

 

 

 

 

 

 

PRREAD

1

 

10

XXXXXXXX

 

A7-A0

1

X

Reads address stored in Protect

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Register.

 

 

 

 

 

 

 

 

 

 

 

PREN

1

 

00

11XXXXXX

 

High-Z

1

1

Must immediately precede

 

 

 

 

 

 

 

 

 

 

 

 

 

 

PRCLEAR, PRWRITE and PRDS

 

 

 

 

 

 

 

 

 

 

 

 

 

 

instructions.

 

 

 

 

 

 

 

 

 

 

 

PRCLEAR

1

 

11

11111111

 

(RDY/

1

1

Clears the Protect Register such that

 

 

 

 

 

 

 

 

 

 

 

 

all data are NOT write-protected.

 

 

 

 

 

 

 

 

BSY)

 

 

PRWRITE

1

 

01

A7 - A0*

 

(RDY/

1

1

Programs address into Protect Reg-

 

 

 

 

 

 

 

 

BSY)

 

 

 

ister. Thereafter, memory addresses

 

 

 

 

 

 

 

 

 

 

 

 

 

 

greater than or equal to the address

 

 

 

 

 

 

 

 

 

 

 

 

 

 

in Protect Register are write-pro-

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tected.

 

 

 

 

 

 

 

 

 

 

 

PRDS

1

 

00

00000000

 

(RDY/

1

1

ONE TIME ONLY instruction after

 

 

 

 

 

 

 

 

BSY)

 

 

 

which the address in the Protect

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Register cannot be altered.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Note: Address A7 bit is a “don’t care” on 93LCS56.

 

 

 

 

 

 

 

 

1996 Microchip Technology Inc.

Preliminary

DS11181D-page 3

93LCS56/66

2.0FUNCTIONAL DESCRIPTION

The 93LCS56/66 is organized as 128/256 registers by 16 bits. Instructions, addresses and write data are clocked into the DI pin on the rising edge of the clock (CLK). The DO pin is normally held in a high-Z state except when reading data from the device, or when checking the ready/busy status during a programming operation. The ready/busy status can be verified during an Erase/Write operation by polling the DO pin; DO low indicates that programming is still in progress, while DO high indicates the device is ready. The DO will enter the high-Z state on the falling edge of the CS.

2.1START Condition

The START bit is detected by the device if CS and DI are both HIGH with respect to the positive edge of CLK for the first time.

Before a START condition is detected, CS, CLK, and DI may change in any combination (except to that of a START condition), without resulting in any device operation (READ, WRITE, ERASE, EWEN, EWDS, ERAL, WRAL, PRREAD, PREN, PRCLEAR, PRWRITE, and PRDS). As soon as CS is HIGH, the device is no longer in the standby mode.

An instruction following a START condition will only be executed if the required amount of opcode, address and data bits for any particular instruction is clocked in.

After execution of an instruction (i.e., clock in or out of the last required address or data bit) CLK and DI become don't care bits until a new start condition is detected.

2.2DI/DO

It is possible to connect the Data In and Data Out pins together. However, with this configuration it is possible for a “bus conflict” to occur during the “dummy zero” that precedes the READ operation, if A0 is a logic HIGH level. Under such a condition the voltage level seen at Data Out is undefined and will depend upon the relative impedances of Data Out and the signal source driving A0. The higher the current sourcing capability of A0, the higher the voltage at the Data Out pin.

2.3Data Protection

During power-up, all programming modes of operation are inhibited until VCC has reached a level greater than 1.4V. During power-down, the source data protection circuitry acts to inhibit all programming modes when VCC has fallen below 1.4V.

The EWEN and EWDS commands give additional protection against accidentally programming during normal operation.

After power-up, the device is automatically in the EWDS mode. Therefore, an EWEN instruction must be performed before any ERASE or WRITE instruction can be executed.

2.4READ

The READ instruction outputs the serial data of the addressed memory location on the DO pin. A dummy zero bit precedes the 16 bit output string. The output data bits will toggle on the rising edge of the CLK and are stable after the specified time delay (TPD). Sequential read is possible when CS is held high. The memory data will automatically cycle to the next register and output sequentially.

2.5Erase/Write Enable and Disable (EWEN, EWDS)

The 93LCS56/66 powers up in the Erase/Write Disable (EWDS) state. All programming modes must be preceded by an Erase/Write Enable (EWEN) instruction.

The PE pin MUST be held “high” while loading the EWEN instruction. Once the EWEN instruction is executed, programming remains enabled until an EWDS instruction is executed or VCC is removed from the device. To protect against accidental data disturb, the EWDS instruction can be used to disable all Erase/ Write functions and should follow all programming operations. Execution of a READ instruction is independent of both the EWEN and EWDS instructions.

2.6ERASE

The ERASE instruction forces all data bits of the specified address to the logical “1” state. CS is brought low following the loading of the last address bit. This falling edge of the CS pin initiates the self-timed programming cycle. The PE pin MUST be latched “high” during loading the ERASE instruction but becomes a “don't care” after loading the instruction.

The DO pin indicates the READY/BUSY status of the device if CS is brought high after a minimum of 250 ns low (TCLS). DO at logical “0” indicates that programming is still in progress. DO at logical “1” indicates that the register at the specified address has been erased and the device is ready for another instruction. ERASE instruction is valid if specified address is unprotected.

The ERASE cycle takes 4 ms per word typical.

2.7WRITE

The WRITE instruction is followed by 16 bits of data which are written into the specified address. After the last data bit is put on the DI pin, CS must be brought low before the next rising edge of the CLK clock. Both CS and CLK must be low to initiate the self-timed autoerase and programming cycle. The PE pin MUST be latched “high” while loading the WRITE instruction but becomes a “don't care” thereafter.

DS11181D-page 4

Preliminary

1996 Microchip Technology Inc.

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