25C080/160
8K/16K 5.0V SPI Bus Serial EEPROM
FEATURES
•SPI modes 0,0 and 1,1
•3 MHz Clock Rate
•Single 5V supply
•Low Power CMOS Technology
-Max Write Current: 5 mA
-Read Current: 1.0 mA
-Standby Current: 1 A typical
•Organization
-1024 x 8 for 25C080
-2048 x 8 for 25C160
•16 Byte Page
•Self-timed ERASE and WRITE Cycles
•Sequential Read
•Block Write Protection
-Protect none, 1/4, 1/2, or all of Array
•Built-in Write Protection
-Power On/Off Data Protection Circuitry
-Write Latch
-Write Protect Pin
•High Reliability
-Endurance: 10M cycles (guaranteed)
-Data Retention: >200 years
-ESD protection: >4000 V
•8-pin PDIP/SOIC Packages
•Temperature ranges supported
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Commercial (C): |
0°C |
to |
+70°C |
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Industrial (I): |
-40°C to |
+85°C |
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- |
Automotive (E): |
-40˚C |
to |
+125˚C |
DESCRIPTION
The Microchip Technology Inc. 25C080/160 are 8K and 16K bit Serial Electrically Erasable PROMs. The memory is accessed via a simple Serial Peripheral Interface (SPI) compatible serial bus. The bus signals required are a clock input (SCK) plus separate data in (SI) and data out (SO) lines. Access to the device is controlled through a chip select (CS) input, allowing any number of devices to share the same bus.
There are two other inputs that provide the end user with additional flexibility. Communication to the device
can be paused via the hold pin (HOLD). While the device is paused, transitions on its inputs will be ignored, with the exception of chip select, allowing the host to service higher priority interrupts. Also write operations to the Status Register can be disabled via the write protect pin (WP).
SPI is a trademark of Motorola.
PACKAGE TYPES
PDIP
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CS |
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1 |
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8 |
VCC |
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2 |
25C080/160 |
7 |
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SO |
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HOLD |
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3 |
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6 |
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SCK |
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WP |
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VSS |
4 |
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5 |
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SI |
SOIC
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1 |
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8 |
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VCC |
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CS |
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25C080/160 |
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SO |
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2 |
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7 |
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HOLD |
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6 |
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3 |
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WP |
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SCK |
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5 |
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VSS |
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4 |
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SI |
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BLOCK DIAGRAM
Status |
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HV Generator |
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Register |
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EEPROM |
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I/O Control |
Memory |
X |
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Control |
Array |
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Logic |
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Logic |
Dec |
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Page Latches |
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WP |
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SI |
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SO |
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Y Decoder |
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CS |
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SCK |
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HOLD |
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Sense Amp. |
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R/W Control |
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Vcc |
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Vss |
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1996 Microchip Technology Inc. |
Preliminary |
DS21147F-page 1
25C080/160
1.0ELECTRICAL CHARACTERISTICS
1.1Maximum Ratings*
VCC........................................................................ |
7.0V |
All inputs and outputs w.r.t. VSS...... |
-0.6V to VCC +1.0V |
Storage temperature ............................. |
-65˚C to 150˚C |
Ambient temperature under bias........... |
-65˚C to 125˚C |
Soldering temperature of leads (10 seconds) ... |
+300˚C |
ESD protection on all pins...................................... |
4kV |
*Stresses above those listed under ‘Maximum ratings’ may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended period of time may affect device reliability
TABLE 1-1: PIN FUNCTION TABLE
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Name |
Function |
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Chip Select Input |
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CS |
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SO |
Serial Data Output |
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SI |
Serial Data Input |
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SCK |
Serial Clock Input |
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Write Protect Pin |
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WP |
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VSS |
Ground |
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VCC |
Supply Voltage |
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Hold Input |
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HOLD |
TABLE 1-2: DC CHARACTERISTICS
FIGURE 1-1: AC TEST CIRCUIT
Vcc
2.25 K
SO
1.8 K |
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100 pF |
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1.2AC Test Conditions
AC Waveform: |
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VLO = 0.2V |
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VHI = Vcc - 0.2V |
(Note 1) |
VHI = 4.0V |
(Note 2) |
Timing Measurement Reference Level
Input |
0.5 VCC |
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Output |
0.5 VCC |
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Note 1: |
For VCC ≤ 4.0V |
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2: |
For VCC > 4.0V |
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Applicable over recommended operating ranges shown below unless otherwise noted.
VCC = 4.5V to 5.5V |
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Commercial (C): Tamb = 0°C to +70°C |
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Industrial (I): |
Tamb = -40°C to +85°C |
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Automotive (E): |
Tamb = -40˚C to +125˚C |
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Parameter |
Symbol |
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Min |
Max |
Units |
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Test Conditions |
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High level input voltage |
VIH1 |
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2.0 |
VCC+1 |
V |
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Low level input voltage |
VIL1 |
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-0.3 |
0.8 |
V |
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Low level output voltage |
VOL |
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— |
0.4 |
V |
I OL=2.1 mA |
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High level output voltage |
VOH |
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VCC-0.5 |
— |
V |
I OH=-400 A |
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Input leakage current |
ILI |
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-10 |
10 |
A |
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CS=VIH, VIN=Vss to VCC |
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Output leakage current |
ILO |
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-10 |
10 |
A |
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CS=VIH, VOUT=Vss to VCC |
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Internal Capacitance |
CINT |
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— |
7 |
pF |
Tamb=25˚C, F CLK=3.0 MHz, |
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(all inputs and outputs) |
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VCC=5.5V (Note) |
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Operating Current |
ICC write |
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— |
5 |
mA |
V CC=5.5V |
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ICC READ |
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— |
1 |
mA |
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VCC=5.5V; 3 MHz |
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ICC READ |
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— |
500 |
A |
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VCC=5.5V; 2 MHz |
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Standby Current |
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ICCS |
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— |
5 |
A |
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CS=VCC=5.5V; Vin=0V or VCC |
Note: This parameter is periodically sampled and not 100% tested.
DS21147F-page 2 |
Preliminary |
1996 Microchip Technology Inc. |
25C080/160
FIGURE 1-2: SERIAL INPUT TIMING
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tCSD |
CS |
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tCSS |
t |
tCLD |
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R |
tCSH |
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tF |
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SCK |
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tSU |
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tHD |
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SI |
MSB in |
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LSB in |
SO |
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high impedance |
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FIGURE 1-3: SERIAL OUTPUT TIMING
CS |
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tHI |
tLO |
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tCSH |
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SCK |
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tV |
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tHO |
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tDIS |
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SO |
MSB out |
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LSB out |
SI |
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don’t care |
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FIGURE 1-4: |
HOLD TIMING |
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CS |
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tHS |
tHH |
tHS |
tHH |
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SCK |
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tHZ |
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tHV |
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SO |
n+2 |
n+1 |
n |
high impedance |
n |
n-1 |
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tSU |
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don’t care |
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SI |
n+2 |
n+1 |
n |
n |
n-1 |
HOLD |
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1996 Microchip Technology Inc. |
Preliminary |
DS21147F-page 3 |
25C080/160
TABLE 1-3: |
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AC CHARACTERISTICS |
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Applicable over recommended operating ranges shown below unless otherwise noted. |
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VCC = 4.5V to 5.5V |
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Commercial (C): Tamb = 0° to +70°C |
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Industrial (I): |
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Tamb |
= -40° to +85°C |
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Automotive (E): Tamb |
= -40˚C to +125˚C |
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Symbol |
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Parameter |
Min |
Max |
Units |
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Test Conditions |
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fSCK |
Clock Frequency |
— |
3 |
MHz |
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tCSS |
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Setup Time |
100 |
— |
ns |
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CS |
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tCSH |
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Hold Time |
100 |
— |
ns |
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CS |
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tCSD |
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Disable Time |
250 |
— |
ns |
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CS |
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tSU |
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Data Setup Time |
30 |
— |
ns |
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tHD |
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Data Hold Time |
50 |
— |
ns |
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tR |
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CLK Rise Time |
— |
2 |
s |
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(Note 1) |
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tF |
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CLK Fall Time |
— |
2 |
s |
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(Note 1) |
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tHI |
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Clock High Time |
150 |
— |
ns |
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tLO |
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Clock Low Time |
150 |
— |
ns |
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tCLD |
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Clock Delay Time |
50 |
— |
ns |
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tV |
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Output Valid from |
— |
150 |
ns |
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Clock Low |
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tHO |
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Output Hold Time |
0 |
— |
ns |
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tDIS |
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Output Disable Time |
— |
200 |
ns |
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(Note 1) |
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tHS |
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Setup Time |
100 |
— |
ns |
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HOLD |
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tHH |
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Hold Time |
100 |
— |
ns |
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HOLD |
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tHZ |
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Low to Output High-Z |
100 |
— |
ns |
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(Note 1) |
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HOLD |
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tHV |
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High to Output Valid |
100 |
— |
ns |
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(Note 1) |
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HOLD |
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tWC |
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Internal Write Cycle Time |
— |
5 |
ms |
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(Note 2) |
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— |
Endurance |
10M |
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E/W Cycles |
25 °C, Vcc = 5.0V, Block Mode |
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(Note 3) |
Note 1: This parameter is periodically sampled and not 100% tested.
2:tWC begins on the rising edge of CS after a valid write sequence and ends when the internal self-timed write cycle is complete.
3:This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific application, please consult the Total Endurance Model which can be obtained on our BBS or website.
DS21147F-page 4 |
Preliminary |
1996 Microchip Technology Inc. |