Microchip Technology Inc 27C512A-15E-P, 27C512A-15E-L, 27C512A-15-VS, 27C512A-15-TS, 27C512A-15-SO Datasheet

...

0 (0)

27C512A

512K (64K x 8) CMOS EPROM

FEATURES

•High speed performance

•CMOS Technology for low power consumption

-25 mA Active current

-30 A Standby current

•Factory programming available

•Auto-insertion-compatible plastic packages

•Auto ID aids automated programming

•High speed express programming algorithm

•Organized 64K x 8: JEDEC standard pinouts

-28-pin Dual-in-line package

-32-pin PLCC Package

-28-pin SOIC package

-28-pin TSOP package

-28-pin VSOP package

-Tape and reel

•Data Retention > 200 years

•Available for the following temperature ranges

-	Commercial:	0˚C to +70˚C
-	Industrial:	-40˚C to +85˚C
-	Automotive:	-40˚C to +125˚C

DESCRIPTION

The Microchip Technology Inc. 27C512A is a CMOS 512K bit electrically Programmable Read Only Memory (EPROM). The device is organized into 64K words by 8 bits (64K bytes). Accessing individual bytes from an address transition or from power-up (chip enable pin going low) is accomplished in less than 90 ns. This very high speed device allows the most sophisticated microprocessors to run at full speed without the need for WAIT states. CMOS design and processing enables this part to be used in systems where reduced power consumption and high reliability are requirements.

A complete family of packages is offered to provide the most ﬂexibility in applications. For surface mount applications, PLCC, VSOP, TSOP or SOIC packaging is available. Tape or reel packaging is also available for PLCC or SOIC packages.

PACKAGE TYPES

TSOP

OE/VPP	1		28	A10
A11	2		27	CE
A9	3		26	D7
A8	4		25	D6
A13	5		24	D5
A14	6		23	D4
VCC	7	27C512A	22	D3
		27C512A
A15	8		21	VSS
A12	9		20	D2
A7	10		19	D1
A6	11		18	D0
A5	12		17	A0
A4	13		16	A1
A3	14		15	A2

PLCC	A7	A12	A15	NU	Vcc	A14	A13
	A7	A12	A15	NU	Vcc	A14	A13
	4	3	2	1	32	31	30
A6	5						29	A8
A5	6						28	A9
A4	7		27C512A				27	A11
NC	12		27C512A				22	O7
A3	8						26	NC
A2	9						25	OE/VPP
A1	10						24	A10
A0	11						23	CE
O0	13						21	O6
	14	15	16	17	18	19	20
	O1	O2	VSS	NU	O3	O4	O5

DIP/SOIC

A15	1		28	VCC
A12	2		27	A14
A12	2		27	A14
A7	3		26	A13
A7	3		26	A13
A6	4		25	A8
A6	4		25	A8
A5	5		24	A9
A5	5		24	A9
A4	6	27C512A	23	A11
A4	6		23	A11
A3	7		22
A3	7		22	OE/VPP
A2	8		21	A10
A2	8		21	A10
A1	9		20
A1	9		20	CE
A0	10		19	O7
A0	10		19	O7
O0	11		18	O6
O0	11		18	O6
O1	12		17	O5
O2	13		16	O4
O2	13		16	O4
VSS	14		15	O3
VSS	14		15	O3

VSOP


OE/VPP		22		21			A10
	A11	23		20			CE
	A9	24		19		O7
	A8	25			18	O6
	A8	25			18	O6
	A13	26			17	O5



	A14	27			16	O4


	VCC	28			15	O3
			27C512A

	A15	1			14		VSS
	A15	1			14		VSS
	A12	2			13		O2



	A7	3			12	O1


	A6	4			11	O0



	A5	5			10	A0
	A5	5			10	A0
	A4	6		9		A1
	A3	7		8		A2

1996 Microchip Technology Inc.

DS11173E-page 1

27C512A

1.0ELECTRICAL CHARACTERISTICS

1.1Maximum Ratings*

VCC and input voltages w.r.t. VSS ........	-0.6V to +7.25V
VPP voltage w.r.t. VSS during
programming .........................................	-0.6V to +14V
Voltage on A9 w.r.t. VSS ......................	-0.6V to +13.5V
Output voltage w.r.t. VSS ...............	-0.6V to VCC +1.0V
Storage temperature ..........................	-65˚C to +150˚C
Ambient temp. with power applied .....	-65˚C to +125˚C

*Notice: Stresses above those listed under “Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operation listings of this speciﬁcation is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.

TABLE 1-1:			PIN FUNCTION TABLE

	Name		Function


	A0-A15		Address Inputs
			Chip Enable
		CE
			Output Enable/Programming Voltage
	OE/VPP
O0 - O7			Data Output
	VCC		+5V Power Supply
	VSS		Ground
	NC		No Connection; No Internal Connec-
			tion
	NU		Not Used; No External Connection is
			Allowed

TABLE 1-2:

READ OPERATION DC CHARACTERISTICS

VCC = +5V ±10%

Commercial:

Tamb = 0˚C to +70˚C

Industrial:

Tamb = -40˚C to +85˚C

Extended (Automotive):

Tamb = -40˚C to +125˚C

Parameter

Part*

Status

Symbol

Min

Max

Units

Conditions

Input Voltages

all

Logic "1"

VIH

2.0

VCC+1

Logic "0"

VIL

-0.5

0.8

Input Leakage

all

ILI

-10

VIN = 0 to VCC

Output Voltages

all

Logic "1"

VOH

2.4

IOH = - 400 A

Logic "0"

VOL

0.45

IOL = 2.1 mA

Output Leakage

all

—

I LO

-10

VOUT = 0V to VCC

Input Capacitance

all

—

C IN

—

V IN = 0V; Tamb = 25°C;

f = 1 MHz

Output Capacitance

all

—

C OUT

—

V OUT = 0V; Tamb = 25°C;

f = 1 MHz

Power Supply Current,

TTL input

ICC

—

VCC = 5.5V

Active

I, E

TTL input

ICC

—

f = 1 MHz;

OE/VPP = CE = VIL;

IOUT = 0 mA;

VIL = -0.1 to 0.8V;

VIH = 2.0 to VCC;

Note 1

Power Supply Current,

TTL input

ICC(S)TLL

—

Standby

I, E

TTL input

ICC(S)TLL

—

all

CMOS input

ICC(S)CMOS

—

= Vcc±0.2V

* Parts: C=Commercial Temperature Range; I, E=Industrial and Extended Temperature Ranges

Note 1: Typical active current increases .75 mA per MHz up to operating frequency for all temperature ranges.

DS11173E-page 2

1996 Microchip Technology Inc.

27C512A

TABLE 1-3:

READ OPERATION AC CHARACTERISTICS

AC Testing Waveform:

VIH = 2.4V and VIL = .45V; VOH = 2.0V and VOL = 0.8V

Output Load:

1 TTL Load + 100 pF

Input Rise and Fall Times:

10 ns

Ambient Temperature:

Commercial:

Tamb = 0˚C to +70˚C

Industrial:

Tamb = -40˚C to +85˚C

Extended (Automotive):

Tamb = -40˚C to +125˚C

Parameter

Sym

27C512-90*

27C512-10*

27C512-12

27C512-15

Units

Conditions

Min

Max

Min

Max

Min

Max

Min

Max

Address to Output

tACC

—

100

—

120

—

150

OE/

Delay

VPP = VIL

to Output Delay

tCE

—

100

—

120

—

150

/VPP =

VIL

to Output Delay

tOE

—

= VIL

to Output High

tOFF

Impedance

Output Hold from

tOH

—

Address,

OE/

VPP, whichever

occurred ﬁrst

*90/10 AC Testing Waveforms: VIH = 3.0V and VIL = 0V; VOH = 1.5V and VOL = 1.5V

Output Load: 1 TTL Load + 30 pF

FIGURE 1-1:

READ WAVEFORMS

VIH

Address Valid

Address

VIL

VIH

VIL

tCE(2)

VIH

VIL

tOE(2)

tOFF(1,3)

tOH

Outputs

VOH

High Z

Valid Output

O0 - O7

VOL

tACC

Notes: (1) tOFF is specified for OE or CE, whichever occurs first

(2)OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE

(3)This parameter is sampled and is not 100% tested.

1996 Microchip Technology Inc.

DS11173E-page 3

27C512A

TABLE 1-4: PROGRAMMING DC CHARACTERISTICS

Ambient Temperature: Tamb = 25°C ± 5°C

VCC = 6.5V ± 0.25V,

OE/VPP = VH = 13.0V ± 0.25V

Parameter

Status

Symbol

Min.

Max.

Units

Conditions (See Note 1)

Input Voltages

Logic “1”

VIH

2.0

VCC+1

Logic “0”

VIL

-0.1

0.8

Input Leakage

—

I LI

-10

VIN = 0V to VCC

Output Voltages

Logic “1”

VOH

2.4

IOH = -400 A

Logic “0”

VOL

—

0.45

IOL = 2.1 mA

VCC Current, program & verify

—

I CC2

—

= VIL

—

I PP2

—

OE/VPP Current, program

A9 Product Identiﬁcation

—

VID

11.5

12.5

Note 1: VCC must be applied simultaneously or before VPP voltage on OE/VPP and removed simultaneously or after

the VPP voltage on OE/VPP.

TABLE 1-5:

PROGRAMMING AC CHARACTERISTICS

for Program, Program Verify

AC Testing Waveform:

VIH=2.4V and VIL=0.45V; VOH=2.0V; VOL=0.8V

and Program Inhibit Modes

Ambient Temperature:

25°C ±5°C

VCC = 6.5V ± 0.25V,

OE/VPP = VH = 13.0V ± 0.25 V

Parameter

Symbol

Min.

Max.

Units

Remarks

Address Set-Up Time

tAS

—

Data Set-Up Time

tDS

—

Data Hold Time

tDH

—

Address Hold Time

tAH

—

Float Delay (2)

tDF

130

VCC Set-Up Time

tVCS

—

Program Pulse Width (1)

tPW

105

100 s typical

Set-Up Time

tCES

—

Set-Up Time

tOES

—

Hold Time

tOEH

—

Recovery Time

tOR

—

/VPP Rise Time During Programming

tPRT

—

Note 1: For express algorithm, initial programming width tolerance is 100 s ±5%.

2:This parameter is only sampled and not 100% teted. Output ﬂoat is deﬁned as the point where data is no longer driven (see timing diagram).

DS11173E-page 4

1996 Microchip Technology Inc.

+ 8 hidden pages