Integrated Device Technology Inc IDT54FCT139TP, IDT54FCT139TPB, IDT54FCT139TQ, IDT54FCT139TQB, IDT54FCT139TSO Datasheet
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FAST CMOS DUAL |
IDT54/74FCT139T/AT/CT |
1-OF-4 DECODER |
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WITH ENABLE |
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Integrated Device Technology, Inc.
FEATURES:
•Std., A and C speed grades
•Low input and output leakage ≤1μA (max.)
•CMOS power levels
•True TTL input and output compatibility
–VOH = 3.3V (typ.)
–VOL = 0.3V (typ.)
•High drive outputs (-15mA IOH, 48mA IOL)
•Meets or exceeds JEDEC standard 18 specifications
•Product available in Radiation Tolerant and Radiation Enhanced versions
•Military product compliant to MIL-STD-883, Class B and DESC listed (dual marked)
•Available in DIP, SOIC, QSOP, CERPACK and LCC packages
DESCRIPTION:
The IDT54/74FCT139T/AT/CT are dual 1-of-4 decoders built using an advanced dual metal CMOS technology. These devices have two independent decoders, each of which accept two binary weighted inputs (A0-A1) and provide four mutually exclusive active LOW outputs (O0-O3). Each decoder has an active LOW enable (E). When E is HIGH, all outputs are forced HIGH.
FUNCTIONAL BLOCK DIAGRAM |
PIN CONFIGURATIONS |
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Ea |
A0a A1a |
Eb |
Ea |
1 |
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16 |
VCC |
A0b A1b |
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15 |
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A0a |
2 |
P16-1 |
Eb |
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A1a |
3 |
14 |
A0b |
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D16-1 |
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O0a |
4 |
SO16-1 |
13 |
A1b |
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O1a |
5 |
SO16-7 12 |
O0b |
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O2a |
6 |
& |
11 |
O1b |
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E16-1 |
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O3a |
7 |
10 |
O2b |
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GND |
8 |
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9 |
O3b |
DIP/SOIC/QSOP/CERPACK
TOP VIEW
2566 drw 02
O0a O1a O2a |
O3a O0b O1b O2b |
O3b |
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2566 drw 01 |
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
©1995 Integrated Device Technology, Inc. |
6.4 |
INDEX |
A0a |
Ea |
NC |
V CC |
Eb |
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A1a |
3 |
2 |
1 |
20 19 |
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4 |
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18 |
A0b |
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O0a |
5 |
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17 |
A1b |
NC |
6 |
L20-2 |
16 |
NC |
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O1a |
7 |
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15 |
O0b |
O2a |
8 |
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14 |
O1b |
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9 |
10 11 12 13 |
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O3a |
GND |
NC |
O 3b |
O2b |
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2566 drw 03
LCC
TOP VIEW
APRIL 1995
DSC-4218/3
1
IDT54/74FCT139T/AT/CT |
MILITARY AND COMMERCIAL TEMPERATURE RANGES |
FAST CMOS DUAL 1-OF-4 DECODER WITH ENABLE |
ABSOLUTE MAXIMUM RATINGS(1)
Symbol |
Rating |
Commercial |
Military |
Unit |
VTERM(2) |
Terminal Voltage |
–0.5 to +7.0 |
–0.5 to +7.0 |
V |
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with Respect to |
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GND |
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VTERM(3) |
Terminal Voltage |
–0.5 to |
–0.5 to |
V |
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with Respect to |
VCC +0.5 |
VCC +0.5 |
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GND |
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TA |
Operating |
0 to +70 |
–55 to +125 |
°C |
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Temperature |
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TBIAS |
Temperature |
–55 to +125 |
–65 to +135 |
°C |
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Under Bias |
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TSTG |
Storage |
–55 to +125 |
–65 to +150 |
°C |
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Temperature |
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PT |
Power Dissipation |
0.5 |
0.5 |
W |
IOUT |
DC Output |
–60 to +120 |
–60 to +120 |
mA |
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Current |
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NOTES: |
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2566 lnk 03 |
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1.Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +0.5V unless otherwise noted.
2.Input and VCC terminals only.
3.Outputs and I/O terminals only.
PIN DESCRIPTION
Pin Names |
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Description |
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A0, A1 |
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Address Inputs |
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E |
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Enable Input (Active LOW) |
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O0 - O3 |
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Outputs (Active LOW) |
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2566 tbl 01 |
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FUNCTION TABLE(1) |
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Inputs |
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Outputs |
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E |
A0 |
A1 |
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O0 |
O1 |
O2 |
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O3 |
H |
X |
X |
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H |
H |
H |
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H |
L |
L |
L |
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L |
H |
H |
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H |
L |
H |
L |
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H |
L |
H |
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H |
L |
L |
H |
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H |
H |
L |
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H |
L |
H |
H |
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H |
H |
H |
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L |
NOTE: |
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2566 tbl 02 |
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1. H = HIGH Voltage Level; L = LOW Voltage Level; X = Don’t Care |
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CAPACITANCE (TA = +25°C, f = 1.0MHz) |
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Symbol |
Parameter(1) |
Conditions |
Typ. |
Max. |
Unit |
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CIN |
Input |
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VIN |
= 0V |
6 |
10 |
pF |
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Capacitance |
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COUT |
Output |
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VOUT = 0V |
8 |
12 |
pF |
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Capacitance |
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NOTE: |
2566 lnk 04 |
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1. This parameter is measured at characterization but not tested.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol |
Parameter |
Test Conditions(1) |
Min. |
Typ.(2) |
Max. |
Unit |
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VIH |
Input HIGH Level |
Guaranteed Logic HIGH Level |
2.0 |
— |
— |
V |
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VIL |
Input LOW Level |
Guaranteed Logic LOW Level |
— |
— |
0.8 |
V |
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II H |
Input HIGH Current(4) |
VCC = Max. |
VI = 2.7V |
— |
— |
±1 |
μA |
II L |
Input LOW Current(4) |
VCC = Max. |
VI = 0.5V |
— |
— |
±1 |
μA |
II |
Input HIGH Current(4) |
VCC = Max., VI = VCC (Max.) |
— |
— |
±1 |
μA |
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VIK |
Clamp Diode Voltage |
VCC = Min., IN = –18mA |
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— |
–0.7 |
–1.2 |
V |
IOS |
Short Circuit Current |
VCC = Max.(3), VO = GND |
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–60 |
–120 |
–225 |
mA |
VOH |
Output HIGH Voltage |
VCC = Min. |
IOH = –6mA MIL. |
2.4 |
3.3 |
— |
V |
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VIN = VIH or VIL |
IOH = –8mA COM'L. |
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IOH = –12mA MIL. |
2.0 |
3.0 |
— |
V |
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IOH = –15mA COM'L. |
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VOL |
Output LOW Voltage |
VCC = Min. |
IOL = 32mA MIL. |
— |
0.3 |
0.5 |
V |
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VIN = VIH or VIL |
IOL = 48mA COM'L. |
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VH |
Input Hysteresis |
— |
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— |
200 |
— |
mV |
ICC |
Quiescent Power Supply Current |
VCC = Max. |
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— |
0.01 |
1 |
mA |
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VIN = GND or VCC |
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NOTES: |
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2566 tbl 05 |
1.For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2.Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.
3.Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4.The test limit for this parameter is ±5μA at TA = –55°C.
6.4 |
2 |
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