Integrated Device Technology Inc. IDT29FCT52A, IDT29FCT52B, IDT29FCT52C, IDT29FCT53A, IDT29FCT53B User Manual

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Integrated Device Technology Inc. IDT29FCT52A, IDT29FCT52B, IDT29FCT52C, IDT29FCT53A, IDT29FCT53B User Manual

IDT29FCT52A

 

 

 

 

 

 

 

 

 

 

 

®

 

FAST CMOS

IDT29FCT52A/B/C

 

 

 

 

 

 

 

 

 

 

 

 

 

OCTAL REGISTERED

IDT29FCT53A/B/C

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

TRANSCEIVERS

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Integrated Device Technology, Inc.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

FEATURES:

Equivalent to AMD’s Am2952/53 and National’s 29F52/53 in pinout/function

IDT29FCT52A/53A equivalent to FASTspeed

IDT29FCT52B/53B 25% faster than FAST

IDT29FCT52C/53C 37% faster than FAST

IOL = 64mA (commercial) and 48mA (military)

IIH and IIL only 5μA max.

CMOS power levels (2.5mW typ. static)

TTL input and output level compatible

CMOS output level compatible

Available in 24-pin DIP, SOIC, 28-pin LCC with JEDEC standard pinout

Product available in Radiation Tolerant and Radiation Enhanced versions

Military product compliant to MIL-STD-883, Class B

DESCRIPTION:

The IDT29FCT52A/B/C and IDT29FCT53A/B/C are 8-bit registered transceivers manufactured using an advanced dual metal CMOS technology. Two 8-bit back-to-back registers store data flowing in both directions between two bidirectional buses. Separate clock, clock enable and 3-state output enable signals are provided for each register. Both A outputs and B outputs are guaranteed to sink 64mA.

The IDT29FCT52A/B/C is a non-inverting option of the IDT29FCT53A/B/C.

FUNCTIONAL BLOCK DIAGRAM(1)

CPA

 

 

 

 

CEA

 

 

 

OEB

A0

D0

CE CP Q0

B0

A1

D1

 

Q1

B1

A2

D2

 

Q2

B2

A3

D3

A

Q3

B3

A4

D4

Reg. Q4

B4

A5

D5

 

Q5

B5

A6

D6

 

Q6

B6

A7

D7

 

Q7

B7

 

Q0

 

D0

 

 

Q1

 

D1

 

 

Q2

 

D2

 

 

Q3

B

D3

 

 

Q4 Reg. D4

 

 

Q5

 

D5

 

 

Q6

 

D6

 

 

Q7

CE CP D7

 

OEA

 

 

 

CPB

 

 

 

 

 

 

 

 

CEB

NOTE:

 

 

 

2533 drw 01

1. IDT29FCT52 function is shown.

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

FAST is a trademark of National Semiconductor Co.

MILITARY AND COMMERCIAL TEMPERATURE RANGES

MAY 1992

©1992 Integrated Device Technology, Inc.

7.1

DSC-4605/3

1

IDT29FCT52A/B/C, IDT29FCT53A/B/C

 

FAST CMOS OCTAL REGISTERED TRANSCEIVERS

MILITARY AND COMMERCIAL TEMPERATURE RANGES

PIN CONFIGURATIONS

B7

1

 

24

Vcc

B6

2

 

23

A7

B5

3

P24-1,

22

A6

B4

4

21

A5

B3

5

D24-1,

20

A4

E24-1

B2

6

19

A3

&

B1

7

18

A2

SO24-2

B0

8

 

17

A1

OEB

9

 

16

A0

CPA

10

 

15

OEA

CEA

11

 

14

CPB

GND

12

 

13

CEB

DIP/CERPACK/SOIC

TOP VIEW

INDEX

B4

B3

B2

NC

B1

B0

OEB

B5

B6

B7 NC Vcc

A7

A6

 

4

3

2

 

28 27 26

 

 

 

5

 

 

 

 

 

25

A5

 

 

1

 

 

 

 

 

 

 

 

A4

6

 

 

 

 

 

24

7

 

 

 

 

 

23

A3

8

 

L28-1

 

22

NC

9

 

 

 

 

 

21

A2

10

 

 

 

 

 

20

A1

11

 

 

 

 

 

19

A0

12 13 14 15 16 17 18

 

CPA

CEA

GND

NC CEB

CPB

OEA

 

LCC

TOP VIEW

2533 drw 02

PIN DESCRIPTION

Name

I/O

Description

A0-7

I/O

Eight bidirectional lines carrying the A Register inputs or B Register outputs.

 

 

 

B0-7

I/O

Eight bidirectional lines carrying the B Register inputs or A Register outputs.

 

 

 

CPA

I

Clock for the A Register. When CEA is LOW, data is entered into the A Register on the LOW-to-HIGH transition

 

 

of the CPA signal.

 

 

 

CEA

I

Clock Enable for the A Register. When CEA is LOW, data is entered into the A Register on the LOW-to-HIGH

 

 

transition of the CPA signal. When CEA is HIGH, the A Register holds its contents, regardless of CPA signal

 

 

transitions.

 

 

 

OEB

I

Output Enable for the A Register. When OEB is LOW, the A Register outputs are enabled onto the B0-7 lines. When

 

 

OEB is HIGH, the B0-7 outputs are in the high-impedance state.

 

 

 

CPB

I

Clock for the B Register. When CEB is LOW, data is entered into the B Register on the LOW-to-HIGH transition

 

 

of the CPB signal.

 

 

 

CEB

I

Clock Enable for the B Register. When CEB is LOW, data is entered into the B Register on the LOW-to-HIGH

 

 

transition of the CPB signal. When CEB is HIGH, the B Register holds its contents, regardless of CPB signal

 

 

transitions.

OEA

I

Output Enable for the B Register. When OEA is LOW, the B Register outputs are enabled onto the A0-7 lines. When

 

 

OEA is HIGH, the A0-7 outputs are in the high-impedance state.

 

 

 

 

 

2533 tbl 01

REGISTER FUNCTION TABLE(1)

(Applies to A or B Register)

 

Inputs

 

Internal

 

 

 

 

 

 

D

CP

CE

Q

Function

 

 

 

 

 

X

X

H

NC

Hold Data

 

 

 

 

 

L

L

L

Load Data

H

L

H

 

 

 

 

 

 

 

 

 

 

2533 tbl 02

OUTPUT CONTROL(1)

 

Internal

 

Y-Outputs

 

 

 

 

 

 

 

OE

Q

52

 

53

Function

 

 

 

 

 

 

H

X

Z

 

Z

Disable Outputs

 

 

 

 

 

 

L

L

L

 

H

Enable Outputs

L

H

H

 

L

 

 

 

 

 

 

 

NOTE:

 

 

 

 

2533 tbl 03

1.H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care

NC = No Change

= LOW-to-HIGH Transition

7.1

2

IDT29FCT52A/B/C, IDT29FCT53A/B/C

 

FAST CMOS OCTAL REGISTERED TRANSCEIVERS

MILITARY AND COMMERCIAL TEMPERATURE RANGES

ABSOLUTE MAXIMUM RATINGS(1)

Symbol

Rating

Commercial

Military

Unit

 

 

 

 

 

VTERM(2)

Terminal Voltage

–0.5 to +7.0

–0.5 to +7.0

V

 

with Respect

 

 

 

 

to GND

 

 

 

 

 

 

 

 

VTERM(3)

Terminal Voltage

–0.5 to VCC

–0.5 to VCC

V

 

with Respect

 

 

 

 

to GND

 

 

 

 

 

 

 

 

TA

Operating

0 to +70

–55 to +125

°C

 

Temperature

 

 

 

 

 

 

 

 

TBIAS

Temperature

–55 to +125

–65 to +135

°C

 

Under Bias

 

 

 

TSTG

Storage

–55 to +125

–65 to +150

°C

 

Temperature

 

 

 

PT

Power Dissipation

0.5

0.5

W

 

 

 

 

 

IOUT

DC Output Current

120

120

mA

 

 

 

 

 

NOTES:

 

 

2533 tbl 04

1.Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed +0.5V unless otherwise noted.

2.Inputs and VCC terminals only.

3.Outputs and I/O terminals only.

CAPACITANCE (TA = +25°C, f = 1.0MHz)

Symbol

Parameter(1)

Conditions

Typ.

Max.

Unit

CIN

Input

VIN = 0V

6

10

pF

 

Capacitance

 

 

 

 

 

 

 

 

 

 

CI/O

I/O

VOUT = 0V

8

12

pF

 

Capacitance

 

 

 

 

 

 

 

 

 

 

NOTE:

 

 

 

 

2533 tbl 05

1. This parameter is guaranteed by characterization data and not tested.

DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE

Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V

Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%

 

Symbol

Parameter

Test Conditions(1)

Min.

Typ.(2)

Max.

Unit

 

VIH

Input HIGH Level

Guaranteed Logic HIGH Level

 

2.0

V

 

VIL

Input LOW Level

Guaranteed Logic LOW Level

 

0.8

 

 

V

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IIH

Input HIGH Current

VCC = Max.

VI =VCC

5

 

 

μA

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

(Except I/O Pins)

 

 

 

VI

= 2.7V

5(4)

 

 

 

 

IIL

Input LOW Current

 

 

 

VI

= 0.5V

–5(4)

 

 

 

 

(Except I/O Pins)

 

 

 

VI

= GND

–5

 

 

 

 

 

 

 

 

 

 

 

 

 

IIH

Input HIGH Current

VCC = Max.

VI = VCC

15

 

 

μA

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

(I/O Pins Only)

 

 

 

VI

= 2.7V

15(4)

 

 

 

 

IIL

Input LOW Current

 

 

 

VI

= 0.5V

–15(4)

 

 

 

(I/O Pins Only)

 

 

 

VI

= GND

–15

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VIK

Clamp Diode Voltage

Vcc = Min., IN = –18mA

 

 

–0.7

–1.2

V

 

 

 

 

 

 

 

 

 

 

 

 

 

IOS

Short Circuit Current

Vcc = Max.(3), VO = GND

 

 

–60

–120

mA

 

VOH

Output HIGH Voltage

Vcc = 3V, VIN = VLC or VHC, IOH = –32μA

VHC

VCC

V

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Vcc = Min.

 

IOH = –300μA

VHC

VCC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VIN = VIH or VIL

 

IOH = –15mA MIL.

2.4

4.0

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IOH = –24mA COM’L.

2.4

4.0

 

 

 

 

 

 

 

 

 

 

 

 

 

VOL

Output LOW Voltage

Vcc = 3V, VIN = VLC or VHC, IOL = 300μA

GND

VLC

V

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Vcc = Min.

 

 

IOL = 300μA

GND

VLC(4)

 

 

 

 

 

VIN = VIH or VIL

 

IOL = 48mA MIL.(5)

0.3

0.55

 

 

 

 

 

 

 

 

 

IOL = 64mA COM’L.(5)

0.3

0.55

 

 

 

 

NOTES:

 

 

 

 

 

 

 

 

 

 

 

2533 tbl 06

1.For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.

2.Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.

3.Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.

4.This parameter is guaranteed but not tested.

5.These are maximum IOL values per output, for 8 outputs turned on simultaneously. Total maximum IOL (all outputs) is 512mA for commercial and 384mA for military. Derate IOL for number of outputs exceeding 8 turned on simultaneously.

7.1

3

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