IDT29FCT52A
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FAST CMOS |
IDT29FCT52A/B/C |
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OCTAL REGISTERED |
IDT29FCT53A/B/C |
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TRANSCEIVERS |
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Integrated Device Technology, Inc. |
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FEATURES:
•Equivalent to AMD’s Am2952/53 and National’s 29F52/53 in pinout/function
•IDT29FCT52A/53A equivalent to FAST™ speed
•IDT29FCT52B/53B 25% faster than FAST
•IDT29FCT52C/53C 37% faster than FAST
•IOL = 64mA (commercial) and 48mA (military)
•IIH and IIL only 5μA max.
•CMOS power levels (2.5mW typ. static)
•TTL input and output level compatible
•CMOS output level compatible
•Available in 24-pin DIP, SOIC, 28-pin LCC with JEDEC standard pinout
•Product available in Radiation Tolerant and Radiation Enhanced versions
•Military product compliant to MIL-STD-883, Class B
DESCRIPTION:
The IDT29FCT52A/B/C and IDT29FCT53A/B/C are 8-bit registered transceivers manufactured using an advanced dual metal CMOS technology. Two 8-bit back-to-back registers store data flowing in both directions between two bidirectional buses. Separate clock, clock enable and 3-state output enable signals are provided for each register. Both A outputs and B outputs are guaranteed to sink 64mA.
The IDT29FCT52A/B/C is a non-inverting option of the IDT29FCT53A/B/C.
FUNCTIONAL BLOCK DIAGRAM(1)
CPA |
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CEA |
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OEB |
A0 |
D0 |
CE CP Q0 |
B0 |
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A1 |
D1 |
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Q1 |
B1 |
A2 |
D2 |
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Q2 |
B2 |
A3 |
D3 |
A |
Q3 |
B3 |
A4 |
D4 |
Reg. Q4 |
B4 |
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A5 |
D5 |
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Q5 |
B5 |
A6 |
D6 |
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Q6 |
B6 |
A7 |
D7 |
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Q7 |
B7 |
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Q0 |
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D0 |
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Q1 |
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D1 |
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Q2 |
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D2 |
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Q3 |
B |
D3 |
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Q4 Reg. D4 |
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Q5 |
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D5 |
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Q6 |
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D6 |
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Q7 |
CE CP D7 |
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OEA |
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CPB |
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CEB |
NOTE: |
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2533 drw 01 |
1. IDT29FCT52 function is shown.
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FAST is a trademark of National Semiconductor Co.
MILITARY AND COMMERCIAL TEMPERATURE RANGES |
MAY 1992 |
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©1992 Integrated Device Technology, Inc. |
7.1 |
DSC-4605/3 |
1
IDT29FCT52A/B/C, IDT29FCT53A/B/C |
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FAST CMOS OCTAL REGISTERED TRANSCEIVERS |
MILITARY AND COMMERCIAL TEMPERATURE RANGES |
PIN CONFIGURATIONS
B7 |
1 |
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24 |
Vcc |
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B6 |
2 |
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23 |
A7 |
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B5 |
3 |
P24-1, |
22 |
A6 |
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B4 |
4 |
21 |
A5 |
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B3 |
5 |
D24-1, |
20 |
A4 |
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E24-1 |
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B2 |
6 |
19 |
A3 |
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B1 |
7 |
18 |
A2 |
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SO24-2 |
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B0 |
8 |
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17 |
A1 |
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OEB |
9 |
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16 |
A0 |
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CPA |
10 |
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15 |
OEA |
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CEA |
11 |
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14 |
CPB |
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GND |
12 |
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13 |
CEB |
DIP/CERPACK/SOIC
TOP VIEW
INDEX
B4
B3
B2
NC
B1
B0
OEB
B5 |
B6 |
B7 NC Vcc |
A7 |
A6 |
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4 |
3 |
2 |
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28 27 26 |
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5 |
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25 |
A5 |
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1 |
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A4 |
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6 |
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24 |
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7 |
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23 |
A3 |
8 |
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L28-1 |
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22 |
NC |
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9 |
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21 |
A2 |
10 |
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20 |
A1 |
11 |
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19 |
A0 |
12 13 14 15 16 17 18 |
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CPA |
CEA |
GND |
NC CEB |
CPB |
OEA |
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LCC
TOP VIEW
2533 drw 02
PIN DESCRIPTION
Name |
I/O |
Description |
A0-7 |
I/O |
Eight bidirectional lines carrying the A Register inputs or B Register outputs. |
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B0-7 |
I/O |
Eight bidirectional lines carrying the B Register inputs or A Register outputs. |
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CPA |
I |
Clock for the A Register. When CEA is LOW, data is entered into the A Register on the LOW-to-HIGH transition |
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of the CPA signal. |
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CEA |
I |
Clock Enable for the A Register. When CEA is LOW, data is entered into the A Register on the LOW-to-HIGH |
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transition of the CPA signal. When CEA is HIGH, the A Register holds its contents, regardless of CPA signal |
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transitions. |
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OEB |
I |
Output Enable for the A Register. When OEB is LOW, the A Register outputs are enabled onto the B0-7 lines. When |
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OEB is HIGH, the B0-7 outputs are in the high-impedance state. |
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CPB |
I |
Clock for the B Register. When CEB is LOW, data is entered into the B Register on the LOW-to-HIGH transition |
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of the CPB signal. |
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CEB |
I |
Clock Enable for the B Register. When CEB is LOW, data is entered into the B Register on the LOW-to-HIGH |
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transition of the CPB signal. When CEB is HIGH, the B Register holds its contents, regardless of CPB signal |
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transitions. |
OEA |
I |
Output Enable for the B Register. When OEA is LOW, the B Register outputs are enabled onto the A0-7 lines. When |
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OEA is HIGH, the A0-7 outputs are in the high-impedance state. |
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2533 tbl 01 |
REGISTER FUNCTION TABLE(1)
(Applies to A or B Register)
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Inputs |
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Internal |
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D |
CP |
CE |
Q |
Function |
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X |
X |
H |
NC |
Hold Data |
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L |
− |
L |
L |
Load Data |
H |
− |
L |
H |
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2533 tbl 02 |
OUTPUT CONTROL(1)
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Internal |
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Y-Outputs |
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OE |
Q |
52 |
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53 |
Function |
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H |
X |
Z |
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Z |
Disable Outputs |
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L |
L |
L |
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H |
Enable Outputs |
L |
H |
H |
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L |
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NOTE: |
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2533 tbl 03 |
1.H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care
NC = No Change
− = LOW-to-HIGH Transition
7.1 |
2 |
IDT29FCT52A/B/C, IDT29FCT53A/B/C |
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FAST CMOS OCTAL REGISTERED TRANSCEIVERS |
MILITARY AND COMMERCIAL TEMPERATURE RANGES |
ABSOLUTE MAXIMUM RATINGS(1)
Symbol |
Rating |
Commercial |
Military |
Unit |
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VTERM(2) |
Terminal Voltage |
–0.5 to +7.0 |
–0.5 to +7.0 |
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with Respect |
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to GND |
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VTERM(3) |
Terminal Voltage |
–0.5 to VCC |
–0.5 to VCC |
V |
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with Respect |
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to GND |
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TA |
Operating |
0 to +70 |
–55 to +125 |
°C |
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Temperature |
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TBIAS |
Temperature |
–55 to +125 |
–65 to +135 |
°C |
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Under Bias |
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TSTG |
Storage |
–55 to +125 |
–65 to +150 |
°C |
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Temperature |
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PT |
Power Dissipation |
0.5 |
0.5 |
W |
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IOUT |
DC Output Current |
120 |
120 |
mA |
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NOTES: |
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2533 tbl 04 |
1.Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed +0.5V unless otherwise noted.
2.Inputs and VCC terminals only.
3.Outputs and I/O terminals only.
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol |
Parameter(1) |
Conditions |
Typ. |
Max. |
Unit |
CIN |
Input |
VIN = 0V |
6 |
10 |
pF |
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Capacitance |
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CI/O |
I/O |
VOUT = 0V |
8 |
12 |
pF |
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Capacitance |
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NOTE: |
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2533 tbl 05 |
1. This parameter is guaranteed by characterization data and not tested.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
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Symbol |
Parameter |
Test Conditions(1) |
Min. |
Typ.(2) |
Max. |
Unit |
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VIH |
Input HIGH Level |
Guaranteed Logic HIGH Level |
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2.0 |
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V |
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VIL |
Input LOW Level |
Guaranteed Logic LOW Level |
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0.8 |
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V |
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IIH |
Input HIGH Current |
VCC = Max. |
VI =VCC |
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5 |
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μA |
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(Except I/O Pins) |
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VI |
= 2.7V |
— |
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5(4) |
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IIL |
Input LOW Current |
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VI |
= 0.5V |
— |
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–5(4) |
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(Except I/O Pins) |
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VI |
= GND |
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–5 |
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IIH |
Input HIGH Current |
VCC = Max. |
VI = VCC |
— |
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15 |
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μA |
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(I/O Pins Only) |
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VI |
= 2.7V |
— |
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15(4) |
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IIL |
Input LOW Current |
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VI |
= 0.5V |
— |
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–15(4) |
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(I/O Pins Only) |
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VI |
= GND |
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–15 |
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VIK |
Clamp Diode Voltage |
Vcc = Min., IN = –18mA |
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— |
–0.7 |
–1.2 |
V |
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IOS |
Short Circuit Current |
Vcc = Max.(3), VO = GND |
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–60 |
–120 |
— |
mA |
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VOH |
Output HIGH Voltage |
Vcc = 3V, VIN = VLC or VHC, IOH = –32μA |
VHC |
VCC |
— |
V |
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Vcc = Min. |
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IOH = –300μA |
VHC |
VCC |
— |
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VIN = VIH or VIL |
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IOH = –15mA MIL. |
2.4 |
4.0 |
— |
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IOH = –24mA COM’L. |
2.4 |
4.0 |
— |
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VOL |
Output LOW Voltage |
Vcc = 3V, VIN = VLC or VHC, IOL = 300μA |
— |
GND |
VLC |
V |
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Vcc = Min. |
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IOL = 300μA |
— |
GND |
VLC(4) |
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VIN = VIH or VIL |
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IOL = 48mA MIL.(5) |
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0.3 |
0.55 |
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IOL = 64mA COM’L.(5) |
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0.3 |
0.55 |
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NOTES: |
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2533 tbl 06 |
1.For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2.Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.
3.Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4.This parameter is guaranteed but not tested.
5.These are maximum IOL values per output, for 8 outputs turned on simultaneously. Total maximum IOL (all outputs) is 512mA for commercial and 384mA for military. Derate IOL for number of outputs exceeding 8 turned on simultaneously.
7.1 |
3 |