4M x 16-Bit Dynamic RAM
(8k, 4k & 2k Refresh, EDO-Version)
Advanced Information
HYB 3164165AT(L) -40/-50/-60 HYB 3165165AT(L) -40/-50/-60 HYB 3166165AT(L) -40/-50/-60
•4 194 304 words by 16-bit organization
•0 to 70 °C operating temperature
•Hyper Page Mode - EDO - operation
•Performance:
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-40 |
-50 |
-60 |
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tRAC |
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access time |
40 |
50 |
60 |
ns |
RAS |
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tCAC |
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access time |
10 |
13 |
15 |
ns |
CAS |
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tAA |
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Access time from address |
20 |
25 |
30 |
ns |
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tRC |
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Read/write cycle time |
69 |
84 |
104 |
ns |
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tHPC |
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Hyper page mode (EDO) |
16 |
20 |
25 |
ns |
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cycle time |
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•Single + 3.3 V (± 0.3V) power supply
•Low power dissipation:
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-40 |
-50 |
-60 |
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HYB3166165AT(L) |
1008 |
612 |
450 |
mW |
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HYB3165165AT(L) |
756 |
504 |
360 |
mW |
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HYB3164165AT(L) |
612 |
324 |
324 |
mW |
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7.2 mW standby (TTL)
3.24 mW standby (MOS)
720 μA standby for L-version
•Read, write, read-modify-write, CAS-before-RAS refresh (CBR), RAS-only refresh, hidden refresh and Self Refresh (L-version only
•2 CAS / 1 WE byte control
• 8192 refresh cycles/128 ms , 13 |
R/ |
9C addresses (HYB 3164165AT) |
4096 refresh cycles/ 64 ms , 12 |
R/ 10C addresses (HYB 3165165AT) |
2048 refresh cycles/ 32 ms , 11 R/ 11C addresses (HYB 3166165AT)
•256ms refresh period for L-versions
•Plastic Package: P-TSOPII-50 400 mil
Semiconductor Group |
1 |
6.97 |
HYB3164(5/6)165AT(L)-40/-50/-60 4M x 16 EDO-DRAM
This device is a 64 MBit dynamic RAM organized 4 194 304 x 16 bits. The device is fabricated on an advanced first generation 64Mbit 0,35 μm CMOS silicon gate process technology. The circuit and process design allow this device to achieve high performance and low power dissipation. The HYB3164(5)165AT operates with a single 3.3 +/-0.3V power supply and interfaces with either LVTTL or LVCMOS levels. Multiplexed address inputs permit the HYB3164(5/6)165AT to be packaged in 400mil wide TSOPII-50 package. These packages provide high system bit densities and are compatible with commonly used automatic testing and insertion equipment. The HYB3164(5/6)165ATL parts have a very low power „sleep mode“ supported by Self Refresh.
Ordering Information
Type |
Ordering |
Package |
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Descriptions |
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Code |
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8k-refresh versions: |
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HYB 3164165AT-40 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 40 ns) |
HYB 3164165AT-50 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 50 ns) |
HYB 3164165AT-60 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 60 ns) |
HYB 3164165ATL-50 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 50 ns) |
HYB 3164165ATL-60 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 60 ns) |
4k-refresh versions: |
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HYB 3165165AT-40 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 40 ns) |
HYB 3165165AT-50 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 50 ns) |
HYB 3165165AT-60 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 60 ns) |
HYB 3165165ATL-50 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 50 ns) |
HYB 3165165ATL-60 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 60 ns) |
2k-refresh versions: |
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HYB 3166165AT-40 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 40 ns) |
HYB 3166165AT-50 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 50 ns) |
HYB 3166165AT-60 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 60 ns) |
HYB 3166165ATL-50 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 50 ns) |
HYB 3166165ATL-60 |
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P-TSOPII-50 |
400 mil |
EDO-DRAM (access time 60 ns) |
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Semiconductor Group |
2 |
HYB3164(5/6)165AT(L)-40/-50/-60 4M x 16 EDO-DRAM
Pin Configuration
VCC
I/O1
I/O2
I/O3
I/O4
VCC
I/O5
I/O6
I/O7
I/O8
N.C.
VCC
WE
RAS
N.C.
N.C.
N.C.
N.C.
A0
A1
A2
A3
A4
A5
VCC
P-TSOPII-50 (400 mil)
O |
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1 |
50 |
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VSS |
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2 |
49 |
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I/O16 |
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3 |
48 |
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I/O15 |
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4 |
47 |
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I/O14 |
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5 |
46 |
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I/O13 |
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6 |
45 |
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VSS |
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7 |
44 |
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I/O12 |
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8 |
43 |
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I/O11 |
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9 |
42 |
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I/O10 |
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10 |
41 |
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I/O9 |
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11 |
40 |
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N.C. |
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12 |
39 |
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VSS |
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13 |
38 |
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LCAS. |
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. |
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14 |
37 |
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UCAS |
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15 |
36 |
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OE |
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16 |
35 |
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N.C. |
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17 |
34 |
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N.C. |
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18 |
33 |
A12/N.C. * |
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19 |
32 |
A11/N.C.** |
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20 |
31 |
A10 |
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21 |
30 |
A9 |
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22 |
29 |
A8 |
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23 |
28 |
A7 |
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24 |
27 |
A6 |
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25 |
26 |
VSS |
*Pin 33 is A12 for HYB 3164165AT(L) and N.C. for HYB 3165(6)165AT(L)
**Pin 32 is A11 for HYB 3164(5)165AT(L) and N.C. for HYB 3166165AT(L)
Pin Names
A0-A12 |
Address Inputs for 8k-refresh version HYB 3164165T(L) |
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A0-A11 |
Address Inputs for 4k-refresh version HYB 3165165T(L) |
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A0-A10 |
Address Inputs for 2k-refresh version HYB 3166165T(L) |
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Row Address Strobe |
RAS |
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Output Enable |
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OE |
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I/O1-I/O16 |
Data Input/Output |
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Column Address Strobe |
UCAS, |
LCAS |
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Read/Write Input |
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WE |
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Vcc |
Power Supply ( + 3.3V) |
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Vss |
Ground |
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Semiconductor Group |
3 |
HYB3164(5/6)165AT(L)-40/-50/-60 4M x 16 EDO-DRAM
TRUTH TABLE
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FUNCTION |
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RAS |
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LCAS |
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UCAS |
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WE |
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OE |
ROW |
COL |
I/O1- |
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ADD |
ADD |
I/O16 |
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Standby |
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H |
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H - X |
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H - X |
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X |
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X |
X |
X |
High Impedance |
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Read:Word |
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L |
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L |
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H |
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H |
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L |
ROW |
COL |
Data Out |
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Read:Lower Byte |
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L |
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L |
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H |
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H |
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L |
ROW |
COL |
Lower Byte:Data Out |
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Upper-Byte:High-Z |
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Read:Upper Byte |
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L |
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H |
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L |
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H |
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L |
ROW |
COL |
Lower Byte:High-Z |
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Upper Byte:Data Out |
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Write:Word |
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L |
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L |
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L |
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L |
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X |
ROW |
COL |
Data In |
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(Early-Write) |
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Write:Lower Byte |
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L |
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L |
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H |
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L |
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X |
ROW |
COL |
Lower Byte:Data Out |
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(Early-Write) |
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Upper-Byte:High-Z |
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Write:Upper Byte |
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L |
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H |
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L |
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L |
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X |
ROW |
COL |
Lower Byte:High-Z |
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(Early Write) |
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Upper Byte:Data Out |
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Read-Modify- |
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L |
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L |
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L |
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H - L |
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L - H |
ROW |
COL |
Data Out, Data In |
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Write |
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Hyper Page Mode |
1st |
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L |
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H - L |
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H - L |
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H |
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L |
ROW |
COL |
Data Out |
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Read (Word) |
Cycle |
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Hyper Page Mode |
2nd |
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L |
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H - L |
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H - L |
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H |
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L |
n/a |
COL |
Data Out |
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Read (Word) |
Cycle |
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Hyper Page Mode |
1st |
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L |
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H - L |
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H - L |
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L |
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X |
ROW |
COL |
Data In |
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Early Write(Word) |
Cycle |
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Hyper Page Mode |
2nd |
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L |
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H - L |
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H - L |
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L |
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X |
n/a |
COL |
Data In |
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Early Write(Word) |
Cycle |
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Hyper Page Mode |
1st |
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L |
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H - L |
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H - L |
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H - L |
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L - H |
ROW |
COL |
Data Out, Data In |
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RMW |
Cycle |
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Hyper Page Mode |
2st |
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L |
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H - L |
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H - L |
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H - L |
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L - H |
n/a |
COL |
Data Out, Data In |
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RMW |
Cycle |
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RAS only refresh |
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L |
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H |
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H |
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X |
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X |
ROW |
n/a |
High Impedance |
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CAS-before-RAS |
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H - L |
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L |
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L |
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H |
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X |
X |
n/a |
High Impedance |
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refresh |
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Test Mode Entry |
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H - L |
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L |
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L |
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L |
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X |
X |
n/a |
High Impedance |
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Hidden Refresh |
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L-H- |
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L |
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L |
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H |
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L |
ROW |
COL |
Data Out |
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(Read) |
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L |
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Hidden Refresh |
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L-H- |
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L |
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L |
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L |
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X |
ROW |
COL |
Data In |
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(Write) |
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L |
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Self Refresh |
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H-L |
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L |
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H |
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X |
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X |
X |
X |
High Impedance |
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(L-version only) |
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Semiconductor Group |
4 |
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HYB3164(5/6)165AT(L)-40/-50/-60 |
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4M x 16 EDO-DRAM |
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I/O1 I/O2 |
I/O16 |
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WE |
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LCASUCAS .. |
& |
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Data in |
Data out |
OE |
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Buffer |
Buffer |
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No. 2 Clock |
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16 |
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Generator |
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16 |
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9 |
Column |
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Address |
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9 |
Column |
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A0 |
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Buffer(9) |
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Decoder |
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A1 |
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A2 |
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A3 |
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Refresh |
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Sense Amplifier |
16 |
A4 |
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Controller |
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I/O Gating |
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A5 |
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A6 |
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A7 |
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Refresh |
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512 |
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A8 |
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Counter (13) |
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x16 |
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A9 |
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13 |
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A10 |
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A11 |
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Row |
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Row |
Memory Array |
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A12 |
13 |
Address |
13 |
Decoder 8192 |
8192x512x16 |
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Buffers(13) |
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RAS |
No. 1 Clock |
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Generator |
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Block Diagram for HYB 3164165AT(L)
Semiconductor Group |
5 |
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HYB3164(5/6)165AT(L)-40/-50/-60 |
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4M x 16 EDO-DRAM |
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I/O1 I/O2 |
I/O16 |
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WE |
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LCASUCAS .. |
& |
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Data in |
Data out |
OE |
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Buffer |
Buffer |
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No. 2 Clock |
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16 |
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Generator |
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16 |
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10 |
Column |
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Address |
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10 |
Column |
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A0 |
Buffer(10) |
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Decoder |
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A1 |
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A2 |
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A3 |
Refresh |
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Sense Amplifier |
16 |
A4 |
Controller |
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I/O Gating |
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A5 |
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A6 |
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A7 |
Refresh |
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1024 |
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A8 |
Counter (12) |
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x16 |
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A9 |
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12 |
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A10 |
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A11 |
Row |
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Row |
Memory Array |
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12 |
Address |
12 |
Decoder 4096 |
4096x1024x16 |
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Buffers(12) |
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RAS |
No. 1 Clock |
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Generator |
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Block Diagram for HYB 3165165AT(L)
Semiconductor Group |
6 |
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HYB3164(5/6)165AT(L)-40/-50/-60 |
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4M x 16 EDO-DRAM |
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I/O1 I/O2 |
I/O16 |
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WE |
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LCASUCAS .. |
& |
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Data in |
Data out |
OE |
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Buffer |
Buffer |
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No. 2 Clock |
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16 |
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Generator |
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16 |
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11 |
Column |
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Address |
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11 |
Column |
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A0 |
Buffer(11) |
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Decoder |
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A1 |
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A2 |
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A3 |
Refresh |
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Sense Amplifier |
16 |
A4 |
Controller |
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I/O Gating |
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A5 |
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A6 |
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A7 |
Refresh |
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2048 |
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A8 |
Counter (11) |
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x16 |
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A9 |
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11 |
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A10 |
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Row |
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Row |
Memory Array |
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11 |
Address |
11 |
Decoder 2048 |
2048x2048x16 |
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Buffers(11) |
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RAS |
No. 1 Clock |
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Generator |
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Block Diagram for HYB3166165AT(L)
Semiconductor Group |
7 |
HYB3164(5/6)165AT(L)-40/-50/-60 4M x 16 EDO-DRAM
Absolute Maximum Ratings |
|
Operating temperature range.............................................................................................. |
0 to 70 °C |
Storage temperature range......................................................................................... |
– 55 to 150 ° C |
Input/output voltage.................................................................................. |
-0.5 to min (Vcc+0.5,4.6) V |
Power supply voltage.................................................................................................... |
-0.5V to 4.6 V |
Power dissipation...................................................................................................................... |
1.3 W |
Data out current (short circuit).................................................................................................. |
50 mA |
Note
Stresses above those listed under „Absolute Maximum Ratings“ may cause permanent damage of the device. Exposure to absolute maximum rating conditions for extended periods may effect device reliability.
DC Characteristics
TA = 0 to 70 °C, VSS = 0 V, VCC = 3.3 V ± 0.3 V
Parameter |
Symbol |
Limit Values |
Unit |
Note |
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min. |
max. |
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Input high voltage |
VIH |
2.0 |
Vcc+0.3 |
V |
1) |
Input low voltage |
VIL |
– 0.3 |
0.8 |
V |
1) |
Output high voltage (LVTTL) |
VOH |
2.4 |
– |
V |
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Output „H“ level voltage (Iout = -2mA) |
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Output low voltage (LVTTL) |
VOL |
– |
0.4 |
V |
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Output „L“level voltage (Iout = +2mA) |
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Output high voltage (LVCMOS) |
VOH |
Vcc-0.2 |
- |
V |
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Output „H“ level voltage (Iout = -100uA) |
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Ouput low voltage (LVCMOS) |
VOL |
- |
0.2 |
V |
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Output „L“ level voltage (Iout = +100uA) |
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Input leakage current,any input |
II(L) |
– 2 |
2 |
μA |
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(0 V < Vin < Vcc , all other pins = 0 V |
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Output leakage current |
IO(L) |
– 2 |
2 |
μA |
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(DO is disabled, 0 V < Vout < Vcc ) |
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Semiconductor Group |
8 |
HYB3164(5/6)165AT(L)-40/-50/-60 4M x 16 EDO-DRAM
DC-Characteristics (cont’d)
TA = 0 to 70 °C, VSS = 0 V, VCC = 3.3 V ± 0.3 V
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Parameter |
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Symbol |
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refresh version |
Unit |
Note |
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2k |
4k |
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8k |
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Operating Current |
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-40 ns version |
ICC1 |
280 |
170 |
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125 |
mA |
2) 3) |
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-50 ns version |
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230 |
140 |
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100 |
mA |
4) |
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- |
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-60 ns version |
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185 |
115 |
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85 |
mA |
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address cycling: tRC = tRC min.) |
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(RAS, |
CAS, |
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Standby Current |
(RAS=CAS= Vih) |
ICC2 |
2 |
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2 |
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2 |
mA |
– |
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RASOnlyRefreshCurrent: |
ICC3 |
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- |
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-40 ns version |
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280 |
170 |
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125 |
mA |
2) 4) |
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-50 ns version |
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230 |
140 |
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100 |
mA |
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-60 ns version |
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185 |
115 |
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84 |
mA |
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(RAS cycling: CAS = VIH: tRC = tRC min.) |
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Hyper Page Mode (EDO) Current: |
ICC4 |
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-40 ns version |
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140 |
140 |
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140 |
mA |
2) 3) |
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-50 ns version |
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105 |
105 |
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105 |
mA |
4) |
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-60 ns version |
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85 |
85 |
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85 |
mA |
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= VIL, |
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address cycling: tHPC=tHPC min.) |
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(RAS |
CAS, |
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Standby Current |
(RAS=CAS= Vcc-0.2V) |
ICC5 |
900 |
900 |
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900 |
μA |
– |
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Standby Current |
(L-Version) |
ICC5 |
200 |
200 |
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200 |
μA |
– |
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(RAS=CAS= Vcc-0.2V) |
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Before |
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Refresh Current |
ICC6 |
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CAS |
RAS |
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-40 ns version |
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280 |
170 |
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170 |
mA |
2) 4) |
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-50 ns version |
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230 |
140 |
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140 |
mA |
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-60 ns version |
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185 |
115 |
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115 |
mA |
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cycling: tRC = tRC min.) |
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(RAS, |
CAS |
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Self Refresh Current (L-version only) |
ICC7 |
400 |
400 |
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400 |
μA |
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(CBR cycle with tRAS>TRASSmin, |
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held low, |
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CAS |
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WE |
= Vcc-0.2V, Address and Din=Vcc-0.2V or 0.2V) |
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Capacitance |
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TA = 0 to 70 °C, VCC = 3.3 V ± 0.3 V, f = 1 MHz |
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Parameter |
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Symbol |
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Limit Values |
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Unit |
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min. |
max. |
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Input capacitance (A0 to A11,A12) |
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CI1 |
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– |
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5 |
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pF |
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Input capacitance |
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CI2 |
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– |
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7 |
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pF |
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(RAS, |
CAS, |
WE, |
OE) |
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I/O capacitance (I/O1-I/O16) |
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CIO |
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– |
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7 |
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pF |
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Semiconductor Group |
9 |