SGS Thomson Microelectronics M27C512-90XN6TR, M27C512-90XN6, M27C512-90XN3TR, M27C512-90XN3, M27C512-90XN1TR Datasheet

1/18April 2001

M27C512

512 Kbit (64Kb x8) UV EPROM and OTP EPROM

■ 5V ± 10% SUPPLY VOLTAGE in READ

OPERATION

■ ACCESS TIME: 45ns

■ LOW POWER “CMOS” CONSUMPTION:

– Active Current 30mA

– Standby Current 100µA

■ PROGRAMMING VOLTAGE: 12.75V ± 0.25V

■ PROGRAMMING TIMES of AROUND 6sec.

■ ELECTRONIC SIGNATURE

– Manufacturer Code: 20h

– Device Code: 3Dh

DESCRIPTION

The M27C512 is a 512 Kbit EPROM offered in the

two ranges UV (ultra violet erase) and OTP (one

time programmable). It is ideally suited for applica-

tions where fast turn-around and pattern experi-

mentation are important requirements and is

organized as 65,536 by 8 bits.

The FDIP28W (window ceramic frit-seal package)

has transparent lid which allows the user to ex-

pose the chipto ultraviolet light to erase thebitpat-

tern. A new pattern can then be written to the

device by following the programming procedure.

For applications wherethe content is programmed

only one time and erasure is not required, the

M27C512 is offered in PDIP28, PLCC32 and

TSOP28 (8 x 13.4 mm) packages.

Figure 1. Logic Diagram

AI00761B

16

Q0-Q7

V

CC

M27C512

GV

PP

V

SS

8

A0-A15

E

1

28

28

1

FDIP28W (F) PDIP28 (B)

PLCC32 (C) TSOP28 (N)

8 x 13.4 mm

M27C512

2/18

Figure 2B. LCC Connections

AI00763

A13

A8

A10

Q4

17

A0

NC

Q0

Q1

Q2

DU

Q3

A6

A3

A2

A1

A5

A4

9

A14

A9

1

A15

A11

Q6

A7

Q7

32

DU

V

CC

M27C512

A12

NC

Q5

GV

PP

E

25

V

SS

Figure 2A. DIP Connections

A1

A0

Q0

A7

A4

A3

A2

A6

A5

A13

A10

A8

A9

Q7

A14

A11

GV

PP

E

Q5Q1

Q2

Q3V

SS

Q4

Q6

A12

A15 V

CC

AI00762

M27C512

8

1

2

3

4

5

6

7

9

10

11

12

13

14

16

15

28

27

26

25

24

23

22

21

20

19

18

17

Figure 2C. TSOP Connections

A1

A0

Q0

A5

A2

A4

A3

A9

A11

Q7

A8

GV

PP

E

Q5

Q1

Q2

Q3

Q4

Q6

A13

A14

A12

A6

A15

V

CC

A7

AI00764B

M27C512

28

1

22

78

14

15

21

V

SS

A10

Table 1. Signal Names

A0-A15 Address Inputs

Q0-Q7 Data Outputs

E Chip Enable

GV

PP

Output Enable / Program Supply

V

CC

Supply Voltage

V

SS

Ground

NC

Not Connected Internally

DU

Don’t Use

3/18

M27C512

Table 2. Absolute Maximum Ratings

(1)

Note: 1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”Absolute Maximum Ratings” may

cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions

above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating condi-

tions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and otherrelevant qual-

ity documents.

2. Minimum DC voltage on Input or Output is –0.5V with possible undershoot to –2.0V for a period less than 20ns. Maximum DC

voltage on Output is V

CC

+0.5V with possible overshoot to V

CC

+2V for a period less than 20ns.

3. Depends on range.

Table 3. Operating Modes

Note: X = V

IH

or V

IL

,V

ID

= 12V ± 0.5V.

Table 4. Electronic Signature

Symbol Parameter Value Unit

T

A

Ambient Operating Temperature

(3)

–40 to 125 °C

T

BIAS

Temperature Under Bias –50 to 125 °C

T

STG

Storage Temperature –65 to 150 °C

V

IO

(2)

Input or Output Voltage (except A9) –2 to 7 V

V

CC

Supply Voltage –2 to 7 V

V

A9

(2)

A9 Voltage –2 to 13.5 V

V

PP

Program Supply Voltage –2 to 14 V

Mode E

GV

PP

A9 Q7-Q0

Read

V

IL

V

IL

X Data Out

Output Disable V

IL

V

IH

X Hi-Z

Program

V

IL

Pulse V

PP

XDataIn

Program Inhibit V

IH

V

PP

X Hi-Z

Standby

V

IH

X X Hi-Z

Electronic Signature

V

IL

V

IL

V

ID

Codes

Identifier A0 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Hex Data

Manufacturer’s Code

V

IL

00100000 20h

Device Code

V

IH

00111101 3Dh

M27C512

4/18

DEVICE OPERATION

The modes of operations of the M27C512 are list-

ed in the Operating Modes table. A single power

supply is required in the read mode. All inputs are

TTL levels except for GV

PP

and 12V on A9 for

Electronic Signature.

Read Mode

The M27C512 has two control functions, both of

which must be logically active in order to obtain

data at the outputs. Chip Enable (E) is the power

control and should be used for device selection.

Output Enable(G) is the output control and should

be used to gate data to the output pins, indepen-

dent of device selection. Assuming that the ad-

dresses are stable, the address access time

(t

AVQV

) is equal to the delay from E to output

(t

ELQV

). Data is availableat the output after a delay

of t

GLQV

from the falling edge of G, assuming that

E has been low and the addresses have been sta-

ble for at least t

AVQV

-t

GLQV

.

Standby Mode

The M27C512 has a standby mode which reduces

the active current from 30mA to 100µA The

M27C512 is placed in the standby mode by apply-

ing aCMOS highsignal to the Einput. When in the

standby mode, the outputs are in a high imped-

ance state, independent of the GV

PP

input.

Table 5. AC Measurement Conditions

High Speed Standard

Input Rise and Fall Times ≤ 10ns ≤ 20ns

Input Pulse Voltages 0 to 3V 0.4V to 2.4V

Input and Output Timing Ref. Voltages 1.5V 0.8V and 2V

Figure 3. Testing Input Output Waveform

AI01822

3V

High Speed

0V

1.5V

2.4V

Standard

0.4V

2.0V

0.8V

Figure 4. AC Testing Load Circuit

AI01823B

1.3V

OUT

C

L

C

L

= 30pF for High Speed

C

L

= 100pF for Standard

C

L

includes JIG capacitance

3.3kΩ

1N914

DEVICE

UNDER

TEST

Table 6. Capacitance

(1)

(T

A

=25°C, f = 1 MHz)

Note: 1. Sampled only, not 100% tested.

Symbol Parameter Test Condition Min Max Unit

C

IN

Input Capacitance

V

IN

=0V

6pF

C

OUT

Output Capacitance

V

OUT

=0V

12 pF

5/18

M27C512

Table 7. Read Mode DC Characteristics

(1)

(T

A

= 0 to 70 °C, –40 to 85 °C or –40 to 125 °C; V

CC

=5V±5% or 5V ± 10%; V

PP

=V

CC

)

Note: 1. V

CC

must be applied simultaneously with or before V

PP

and removed simultaneously or after V

PP

.

2. Maximum DC voltage on Output is V

CC

+0.5V.

Table 8A. Read Mode AC Characteristics

(1)

(T

A

= 0 to 70 °C, –40 to 85 °C or –40 to 125 °C; V

CC

=5V±5% or 5V ± 10%; V

PP

=V

CC

)

Note: 1. V

CC

must be applied simultaneously with or before V

PP

and removed simultaneously or after V

PP

.

2. Sampled only, not 100% tested.

3. Speed obtained with High Speed AC measurement conditions.

Symbol Parameter Test Condition Min Max Unit

I

LI

Input Leakage Current 0V ≤ V

IN

≤ V

CC

±10 µA

I

LO

Output Leakage Current 0V ≤ V

OUT

≤ V

CC

±10 µA

I

CC

Supply Current

E=V

IL

,G=V

IL

,

I

OUT

= 0mA, f = 5MHz

30 mA

I

CC1

Supply Current (Standby) TTL

E=V

IH

1mA

I

CC2

Supply Current (Standby) CMOS

E>V

CC

– 0.2V

100 µA

I

PP

Program Current

V

PP

=V

CC

10 µA

V

IL

Input Low Voltage –0.3 0.8 V

V

IH

(2)

Input High Voltage 2

V

CC

+1

V

V

OL

Output Low Voltage

I

OL

= 2.1mA

0.4 V

V

OH

Output High Voltage TTL

I

OH

= –1mA

3.6 V

Output High Voltage CMOS

I

OH

= –100µAV

CC

– 0.7V

V

Symbol Alt Parameter Test Condition

M27C512

Unit

-45

(3)

-60 -70 -80

Min Max Min Max Min Max Min Max

t

AVQV

t

ACC

Address Valid to

Output Valid

E=V

IL

,G=V

IL

45 60 70 80 ns

t

ELQV

t

CE

Chip Enable Low to

Output Valid

G=V

IL

45 60 70 80 ns

t

GLQV

t

OE

Output Enable Low

to Output Valid

E=V

IL

25 30 35 40 ns

t

EHQZ

(2)

t

DF

Chip Enable High to

Output Hi-Z

G=V

IL

0 25 0 25 0 30 0 30 ns

t

GHQZ

(2)

t

DF

Output Enable High

to Output Hi-Z

E=V

IL

0 25 0 25 0 30 0 30 ns

t

AXQX

t

OH

Address Transition to

Output Transition

E=V

IL

,G=V

IL

0000ns

M27C512

6/18

Figure 5. Read Mode AC Waveforms

AI00735B

tAXQX

tEHQZ

A0-A15

E

G

Q0-Q7

tAVQV

tGHQZ

tGLQV

tELQV

VALID

Hi-Z

VALID

Table 8B. Read Mode AC Characteristics

(1)

(T

A

= 0 to 70 °C, –40 to 85 °C or –40 to 125 °C; V

CC

=5V±5% or 5V ± 10%; V

PP

=V

CC

)

Note: 1. V

CC

must be applied simultaneously with or before V

PP

and removed simultaneously or after V

PP

.

2. Sampled only, not 100% tested.

Symbol Alt Parameter Test Condition

M27C512

Unit

-90

-10 -12 -15/-20/-25

Min Max Min Max Min Max Min Max

t

AVQV

t

ACC

Address Valid to

Output Valid

E=V

IL

,G=V

IL

90 100 120 150 ns

t

ELQV

t

CE

Chip Enable Low to

Output Valid

G=V

IL

90 100 120 150 ns

t

GLQV

t

OE

Output Enable Low

to Output Valid

E=V

IL

40 40 50 60 ns

t

EHQZ

(2)

t

DF

Chip Enable High to

Output Hi-Z

G=V

IL

0 30 0 30 0 40 0 50 ns

t

GHQZ

(2)

t

DF

Output Enable High

to Output Hi-Z

E=V

IL

0 30 0 30 0 40 0 50 ns

t

AXQX

t

OH

Address Transition to

Output Transition

E=V

IL

,G=V

IL

0000ns