Integrated Device Technology Inc IDT54841CP, IDT54841AL, IDT54841ALB, IDT54841AP, IDT54841APB Datasheet

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Integrated Device Technology, Inc.

HIGH-PERFORMANCE

IDT54/74FCT841A/B/C

CMOS BUS INTERFACE

 

LATCHES

 

 

 

FEATURES:

Equivalent to AMD’s Am29841-46 bipolar registers in pinout/function, speed and output drive over full temperature and voltage supply extremes

IDT54/74FCT841A equivalent to FASTspeed

IDT54/74FCT841B 25% faster than FAST

IDT54/74FCT841C 40% faster than FAST

Buffered common latch enable, clear and preset inputs

IOL = 48mA (commercial) and 32mA (military)

Clamp diodes on all inputs for ringing suppression

CMOS power levels (1mW typ. static)

TTL input and output level compatible

CMOS output level compatible

Substantially lower input current levels than AMD’s bipolar Am29800 series (5μA max.)

Product available in Radiation Tolerant and Radiation Enhanced versions

Military product compliant to MIL-STD-883, Class B

DESCRIPTION:

The IDT54/74FCT800 series is built using an advanced dual metal CMOS technology.

The IDT54/74FCT840 series bus interface latches are designed to eliminate the extra packages required to buffer existing latches and provide extra data width for wider address/ data paths or buses carrying parity. The IDT54/74FCT841 is a buffered, 10-bit wide version of the popular ‘373 function.

All of the IDT54/74FCT800 high-performance interface family are designed for high-capacitance load drive capability, while providing low-capacitance bus loading at both inputs and outputs. All inputs have clamp diodes and all outputs are designed for low-capacitance bus loading in the high-imped- ance state.

FUNCTIONAL BLOCK DIAGRAM

D0

DN

PRE

 

D P

D P

LE Q

LE Q

CLR

CLR

CLR

 

LE

 

OE

Y0

YN

2607 drw 01

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

FAST is a trademark of National Semiconductor Co.

MILITARY AND COMMERCIAL TEMPERATURE RANGES

APRIL 1994

©1994 Integrated Device Technology, Inc.

7.22

DSC-4603/2

1

IDT54/74FCT841A/B/C

 

HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES

MILITARY AND COMMERCIAL TEMPERATURE RANGES

PIN CONFIGURATIONS

OE

 

1

 

24

 

VCC

D0

 

2

 

23

 

Y0

 

 

 

D1

 

3

 

22

 

Y1

 

 

 

D2

 

4

P24-1

21

 

Y2

 

 

D3

 

5

D24-1

20

 

Y3

 

 

D4

 

6

E24-1

19

 

Y4

 

 

D5

 

7

&

18

 

Y5

 

 

D6

 

8

SO24-2

17

 

Y6

 

 

D7

 

9

 

16

 

Y7

 

 

 

D8

 

10

 

15

 

Y8

 

 

 

D9

 

 

14

 

Y9

 

11

 

 

GND

 

12

 

13

 

LE

 

 

 

DIP/CERPACK/SOIC

TOP VIEW

INDEX

D1

D0 OE NC VCC Y0

Y1

 

 

 

 

 

 

 

 

 

D2

4

3

2

1

28

27

26

Y2

5

 

 

 

 

 

25

D3

6

 

 

 

 

 

24

Y3

D4

7

 

L28-1

 

23

Y4

NC

8

 

 

22

NC

D5

9

 

 

 

 

 

21

Y5

D6

10

 

 

 

 

 

20

Y6

D7

11

 

 

 

 

 

19

Y7

 

12

13

14

15

16

17

18

 

 

D8

D9

GND NC

LE

Y9

Y8

 

 

 

 

LCC

 

 

 

 

 

TOP VIEW

 

 

2607 drw 02

2607 drw 03

PIN DESCRIPTION

Name

I/O

Description

CLR

I

When CLR is LOW, the outputs are

 

 

LOW if OE is LOW. When CLR is HIGH,

 

 

data can be entered into the latch.

DI

I

The latch data inputs.

LE

I

The latch enable input. The latches are

 

 

transparent when LE is HIGH. Input

 

 

data is latched on the HIGH-to-LOW

 

 

transition.

YI

O

The 3-state latch outputs.

OE

I

The output enable control. When OE is

 

 

LOW, the outputs are enabled. When

 

 

OE is HIGH, the outputs (Y I) are in the

 

 

high-impedance (off) state.

PRE

I

Preset line. When PRE is LOW, the

 

 

outputs are HIGH if OE is LOW. Preset

 

 

overrides CLR.

 

 

2607 tbl 01

FUNCTION TABLE(1)

 

 

 

 

 

Inter-

Out-

 

 

 

Inputs

 

 

nal

puts

 

CLR

PRE

OE

LE

DI

QI

YI

Function

H

H

H

X

X

X

Z

High Z

H

H

H

H

L

L

Z

High Z

H

H

H

H

H

H

Z

High Z

H

H

H

L

X

NC

Z

Latched (High Z)

H

H

L

H

L

L

L

Transparent

H

H

L

H

H

H

H

Transparent

H

H

L

L

X

NC

NC

Latched

H

L

L

X

X

H

H

Preset

L

H

L

X

X

L

L

Clear

L

L

L

X

X

H

H

Preset

L

H

H

L

X

L

Z

Latched (High Z)

H

L

H

L

X

H

Z

Latched (High Z)

NOTE:

 

 

 

 

 

 

2607 tbl 02

1.H = HIGH, L = LOW, X = Don’t Care, NC = No Change, Z = High Impedance

7.22

2

Integrated Device Technology Inc IDT54841CP, IDT54841AL, IDT54841ALB, IDT54841AP, IDT54841APB Datasheet

IDT54/74FCT841A/B/C

 

HIGH-PERFORMANCE CMOS BUS INTERFACE LATCHES

MILITARY AND COMMERCIAL TEMPERATURE RANGES

ABSOLUTE MAXIMUM RATINGS(1)

Symbol

Rating

Commercial

Military

Unit

VTERM(2)

Terminal Voltage

–0.5 to +7.0

–0.5 to +7.0

V

 

with Respect to

 

 

 

 

GND

 

 

 

VTERM(3)

Terminal Voltage

–0.5 to VCC

–0.5 to VCC

V

 

with Respect to

 

 

 

 

GND

 

 

 

TA

Operating

0 to +70

–55 to +125

°C

 

Temperature

 

 

 

TBIAS

Temperature

–55 to +125

–65 to +135

°C

 

Under Bias

 

 

 

TSTG

Storage

–55 to +125

–65 to +150

°C

 

Temperature

 

 

 

PT

Power Dissipation

0.5

0.5

W

IOUT

DC Output

120

120

mA

 

Current

 

 

 

NOTE:

 

 

2607 tbl 03

1.Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +0.5V unless otherwise noted.

2.Input and VCC terminals only.

3.Outputs and I/O terminals only.

CAPACITANCE (TA = +25°C, f = 1.0MHz)

Symbol

Parameter (1)

Conditions

Typ.

Max.

Unit

CIN

Input

VIN = 0V

6

10

pF

 

Capacitance

 

 

 

 

COUT

Output

VOUT = 0V

8

12

pF

 

Capacitance

 

 

 

 

NOTE:

 

 

 

 

2607 tbl 04

1. This parameter is measured at characterization but not tested.

DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE

Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V

Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%

Symbol

Parameter

Test Conditions(1)

Min.

Typ.(2)

Max.

Unit

VIH

Input HIGH Level

Guaranteed Logic HIGH Level

2.0

V

VIL

Input LOW Level

Guaranteed Logic LOW Level

0.8

V

II H

Input HIGH Current

VCC = Max.

VI = VCC

5

μA

 

 

 

VI = 2.7V

5(4)

 

II L

Input LOW Current

 

VI = 0.5V

–5(4)

 

 

 

 

VI = GND

–5

 

IOZH

Off State (High Impedance)

VCC = Max.

VO = VCC

10

μA

 

Output Current

 

VO = 2.7V

10(4)

 

IOZL

 

 

VO = 0.5V

–10(4)

 

 

 

 

VO = GND

–10

 

VIK

Clamp Diode Voltage

VCC = Min., IN = –18mA

 

–0.7

–1.2

V

IOS

Short Circuit Current

VCC = Max.(3), VO = GND

 

–75

–120

mA

VOH

Output HIGH Voltage

VCC = 3V, VIN = VLC or VHC, IOH = –32μA

VHC

VCC

V

 

 

VCC = Min.

IOH = –300μA

VHC

VCC

 

 

 

VIN = VIH or VIL

IOH = –15mA MIL.

2.4

4.3

 

 

 

 

IOH = –24mA COM'L.

2.4

4.3

 

VOL

Output LOW Voltage

VCC = 3V, VIN = VLC or VHC, IOL = 300μA

GND

VLC

V

 

 

VCC = Min.

IOL = 300μA

GND

VLC(4)

 

 

 

VIN = VIH or VIL

IOL = 32mA MIL.

0.3

0.5

 

 

 

 

IOL = 48mA COM'L.

0.3

0.5

 

NOTES:

 

 

 

 

 

 

2607 tbl 05

1.For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.

2.Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.

3.Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.

4.This parameter is guaranteed but not tested.

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