ON Semiconductor MC74AC573, MC74ACT573 Technical data

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ON Semiconductor MC74AC573, MC74ACT573 Technical data

MC74AC573, MC74ACT573

Octal Buffer/Line Driver with 3−State Outputs

The MC74AC573/74ACT573 is a high−speed octal latch with buffered common Latch Enable (LE) and buffered common Output

Enable (OE) inputs.

The MC74AC573/74ACT573 is functionally identical to the http://onsemi.com MC74AC373/74ACT373 but has inputs and outputs on opposite sides.

Features

 

 

 

 

 

 

 

 

 

 

 

MARKING

Inputs and Outputs on Opposite Sides of Package Allowing Easy

 

 

DIAGRAM

Interface with Microprocessors

 

 

 

 

 

 

 

Useful as Input or Output Port for Microprocessors

 

 

 

MC74xxx573N

Functionally Identical to MC74AC373/74ACT373

 

 

 

 

20

 

AWLYYWWG

3−State Outputs for Bus Interfacing

 

 

 

 

1

 

 

 

 

 

 

 

Outputs Source/Sink 24 mA

 

 

 

 

 

 

PDIP−20

 

ACT573 Has TTL Compatible Inputs

 

 

 

 

N SUFFIX

 

 

 

 

 

CASE 738

 

Pb−Free Packages are Available*

 

 

 

 

 

 

 

VCC

O0

O1

O2

O3

O4

O5

O6

O7

LE

 

 

xxx573

20

19

18

17

16

15

14

13

12

11

 

 

 

 

AWLYYWWG

 

 

 

 

 

 

 

 

 

 

 

20

 

 

 

 

 

 

 

 

 

 

 

 

1

 

 

 

 

 

 

 

 

 

 

 

 

SO−20

 

 

 

 

 

 

 

 

 

 

 

 

DW SUFFIX

 

 

 

 

 

 

 

 

 

 

 

 

CASE 751D

 

1

2

3

4

5

6

7

8

9

10

 

 

xxx

 

 

573

 

 

 

 

 

 

 

 

 

 

 

20

OE

D0

D1

D2

D3

D4

D5

D6

D7

GND

 

ALYW G

 

1

G

Figure 1. Pinout 20−Lead Packages Conductors

 

 

 

 

 

 

 

(Top View)

PIN ASSIGNMENT

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

PIN

 

 

 

 

 

 

 

FUNCTION

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

D0−D7

 

Data Inputs

 

LE

 

Latch Enable Input

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3−State Output Enable Input

 

OE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

O0−O7

 

3−State Latch Outputs

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

D0 D1 D2 D3 D4 D5 D6 D7

 

 

 

 

 

 

LE

 

 

 

 

 

 

OE

 

 

 

 

 

 

 

 

 

 

 

 

O0 O1 O2 O3 O4 O5 O6 O7

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Figure 2. Logic Symbol

*For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.

TSSOP−20

DT SUFFIX

CASE 948E

 

74xxx573

20

AWLYWWG

 

 

1

EIAJ−20

M SUFFIX

CASE 967

xxx

= AC or ACT

A

= Assembly Location

WL, L

= Wafer Lot

YY, Y

= Year

WW, W

= Work Week

G or G

= Pb−Free Package

(Note: Microdot may be in either location)

ORDERING INFORMATION

See detailed ordering and shipping information in the package dimensions section on page 8 of this data sheet.

Semiconductor Components Industries, LLC, 2005

1

Publication Order Number:

September, 2005 − Rev. 7

 

MC74AC573/D

MC74AC573, MC74ACT573

TRUTH TABLE

 

Inputs

 

Outputs

 

 

 

 

OE

LE

Dn

On

L

H

H

H

L

H

L

L

L

L

X

O0

H

X

X

Z

 

 

 

 

H = HIGH Voltage Level

L = LOW Voltage Level

Z = High Impedance X = Immaterial

O0 = Previous O0 before LOW−to−HIGH Transition of Clock

D0 D1 D2 D3

Functional Description

The MC74AC573/74ACT574 contains eight D−type latches with 3−state output buffers. When the Latch Enable (LE) input is HIGH, data on the Dn inputs enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its D input changes. When LE is LOW the latches store the information that was present on the D inputs a setup time preceding the HIGH−to−LOW transition of LE. The 3−state buffers are controlled by the Output Enable (OE) input. When OE is LOW, the buffers are enabled. When OE is HIGH the buffers are in the high impedance mode but this does not interfere with entering new data into the latches.

D4

D5

D6

D7

D

D

 

D

 

D

D

D

D

D

 

Q

 

Q

Q

Q

Q

Q

Q

Q

 

LE

LE

LE

 

LE

LE

LE

LE

LE

LE

OE

O0

O1

O2

O3

O4

O5

O6

O7

NOTE: That this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.

Figure 3. Logic Diagram

http://onsemi.com

2

MC74AC573, MC74ACT573

MAXIMUM RATINGS

Symbol

Parameter

Value

Unit

 

 

 

 

VCC

DC Supply Voltage (Referenced to GND)

−0.5 to +7.0

V

VIN

DC Input Voltage (Referenced to GND)

−0.5 to VCC +0.5

V

VOUT

DC Output Voltage (Referenced to GND)

−0.5 to VCC +0.5

V

IIN

DC Input Current, per Pin

±20

mA

IOUT

DC Output Sink/Source Current, per Pin

±50

mA

ICC

DC VCC or GND Current per Output Pin

±50

mA

Tstg

Storage Temperature

−65 to +150

°C

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.

RECOMMENDED OPERATING CONDITIONS

Symbol

Parameter

 

Min

Typ

Max

Unit

 

 

 

 

 

 

 

VCC

Supply Voltage

′AC

2.0

5.0

6.0

V

 

 

 

 

′ACT

4.5

5.0

5.5

 

 

 

 

 

 

 

 

 

 

VIN, VOUT

DC Input Voltage, Output Voltage (Ref. to GND)

 

0

VCC

V

 

 

VCC @ 3.0 V

150

 

 

Input Rise and Fall Time (Note 1)

 

 

 

 

 

tr, tf

VCC @ 4.5 V

40

ns/V

′AC Devices except Schmitt Inputs

 

 

VCC @ 5.5 V

25

 

tr, tf

Input Rise and Fall Time (Note 2)

VCC @ 4.5 V

10

ns/V

′ACT Devices except Schmitt Inputs

VCC @ 5.5 V

8.0

 

 

 

 

 

TJ

Junction Temperature (PDIP)

 

140

°C

TA

Operating Ambient Temperature Range

 

−40

25

85

°C

IOH

Output Current − High

 

−24

mA

IOL

Output Current − Low

 

24

mA

1.VIN from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.

2.VIN from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.

http://onsemi.com

3

MC74AC573, MC74ACT573

DC CHARACTERISTICS

 

 

 

74AC

74AC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VCC

 

 

TA =

 

 

 

Symbol

Parameter

TA = +25°C

−40°C to

Unit

 

Conditions

(V)

 

 

 

 

 

+85°C

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Typ

Guaranteed Limits

 

 

 

 

 

 

 

 

 

 

 

VIH

Minimum High Level

3.0

1.5

2.1

2.1

 

VOUT = 0.1 V

 

Input Voltage

4.5

2.25

3.15

3.15

V

or VCC − 0.1 V

 

 

5.5

2.75

3.85

3.85

 

 

 

 

 

 

 

 

 

 

 

VIL

Maximum Low Level

3.0

1.5

0.9

0.9

 

VOUT = 0.1 V

 

Input Voltage

4.5

2.25

1.35

1.35

V

or VCC − 0.1 V

 

 

5.5

2.75

1.65

1.65

 

 

 

 

 

 

 

 

 

 

 

VOH

Minimum High Level

3.0

2.99

2.9

2.9

 

IOUT = −50 mA

 

Output Voltage

4.5

4.49

4.4

4.4

V

 

 

 

 

5.5

5.49

5.4

5.4

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

*VIN = VIL or VIH

 

 

3.0

2.56

2.46

V

 

−12 mA

 

 

4.5

3.86

3.76

IOH

−24 mA

 

 

 

 

 

5.5

4.86

4.76

 

 

−24 mA

 

 

 

 

 

 

 

 

VOL

Maximum Low Level

3.0

0.002

0.1

0.1

 

IOUT = 50 mA

 

Output Voltage

4.5

0.001

0.1

0.1

V

 

 

 

 

5.5

0.001

0.1

0.1

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

*VIN = VIL or VIH

 

 

3.0

0.36

0.44

V

 

12 mA

 

 

4.5

0.36

0.44

IOL

24 mA

 

 

 

 

 

5.5

0.36

0.44

 

 

24 mA

 

 

 

 

 

 

 

 

 

IIN

Maximum Input

5.5

±0.1

±1.0

mA

VI = VCC, GND

 

Leakage Current

 

 

 

 

 

 

 

 

IOZ

Maximum

 

 

±0.5

±5.0

 

VI (OE) = VIL, VIH

 

3−State

5.5

mA

VI = VCC, GND

 

Current

 

 

 

 

 

VO = VCC, GND

IOLD

†Minimum Dynamic

5.5

75

mA

VOLD = 1.65 V Max

 

Output Current

 

 

 

 

 

 

 

IOHD

5.5

−75

mA

VOHD = 3.85 V Min

 

ICC

Maximum Quiescent

5.5

8.0

80

mA

VIN = VCC or GND

 

Supply Current

 

 

 

 

 

 

 

 

 

NOTE: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC. *All outputs loaded; thresholds on input associated with output under test.

†Maximum test duration 2.0 ms, one output loaded at a time.

http://onsemi.com

4

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