Philips NE56632-31D, NE56632-43D, NE56632-45D, NE56632-46D, NE56632-30D Datasheet

INTEGRATED CIRCUITS

NE56632-XX

Active-LOW system reset with adjustable delay time

Product data

2002 Mar 25

P s

on o s

Philips Semiconductors	Product data
Active-LOW system reset with adjustable delay time	NE56632-XX

DESCRIPTION

The NE56632-XX is a family of Active-LOW, power-on reset that offers precision threshold voltage detection within ±1.5% and super low operating supply current of typically 3.0 μA. It includes a reset delay that is user adjustable with an external capacitor.

Several detection threshold voltages are available at 1.9V , 2.0 V,

2.7 V, 2.8 V, 2.9 V, 3.0 V, 3.1 V, 4.2 V, 4.3 V, 4.4 V, 4.5 V, and 4.6 V.

Other thresholds are offered upon request at 100 mV steps from 1.9 V to 4.6 V.

With its ultra low supply current and high precision voltage threshold detection capability, the NE56632-XX is well suited for various battery powered applications such as reset circuits for logic and microprocessors, voltage check, and level detecting. It is available in the SOT23-5 package.

FEATURES

APPLICATIONS

•High precision threshold detection voltage: VS ±1.5%

•Reset for microprocessor and logic circuits

•Super low operating supply current: 3 μA typ.

•Voltage level detection circuit

•Built-in hysteresis voltage:

50 mV typ.

•Battery voltage check circuit

•Detection threshold voltage:

1.9 V, 2.0 V, 2.7 V, 2.8 V, 2.9 V,

•Detection circuit for battery back-up

3.0 V, 3.1 V, 4.2 V, 4.3 V, 4.4 V, 4.5 V, and 4.6 V.

•Reset Output: Active-LOW, open collector

•Other detection threshold voltages available upon request at

100 mV steps from 1.9 V to 4.6 V.

•Large low reset output current: 30 mA typ.

•Power-on reset delay time adjustable with external capacitor:

200 μs to 200 ms

•Reset assertion with VCC down to 0.65 V

SIMPLIFIED SYSTEM DIAGRAM

TO VCC

TO RESET

RPU

TERMINAL

OF CPU

5

4

NE56632-XX

1

2

3

CD

SL01605

Figure 1. Simplified system diagram.

2002 Mar 25

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853±2329 27919

Philips Semiconductors	Product data
Active-LOW system reset with adjustable delay time	NE56632-XX

ORDERING INFORMATION

	TYPE NUMBER	PACKAGE		TEMPERATURE
		NAME	DESCRIPTION	RANGE
	NE56632-XXD	SOT23-5 / SOT25 (SO5)	plastic small outline package; 5 leads (see dimensional drawing)	±20 to +75 °C

NOTE:

The device has 12 voltage output options, indicated by the XX on the `Type number'.

XX	VOLTAGE (Typical)

191.9 V

202.0 V

272.7 V

282.8 V

292.9 V

303.0 V

313.1 V

424.2 V

434.3 V

444.4 V

454.5 V

464.6 V

PIN CONFIGURATION

TC	1		5	VCC
		NE56632-XX
SUB	2
GND				VOUT
	3		4

SL01604

Figure 2. Pin configuration.

MAXIMUM RATINGS

Part number marking

The package is marked with a four letter code. The first three letters designate the product. The fourth letter, represented by `x', is a date tracking code.

Part Number	Marking
NE56632-19D	AKZx
NE56632-20D	ALAx
NE56632-27D	ALBx
NE56632-28D	ALCx
NE56632-29D	ALDx
NE56632-30D	ALEx
NE56632-31D	ALFx
NE56632-42D	ALGx
NE56632-43D	ALHx
NE56632-44D	ALJx
NE56632-45D	ALKx
NE56632-46D	ALLx

PIN DESCRIPTION

PIN	SYMBOL	DESCRIPTION
1	TC	Delay time control; set with external
		capacitor.
2	SUB	Substrate. Connect to ground (GND).
3	GND	Ground. Negative supply.
4	VOUT	Reset output voltage. Active-LOW.
5	VCC	Positive supply voltage; detection threshold
		voltage input.

SYMBOL	PARAMETER	MIN.	MAX.	UNIT
VCC	Supply voltage	±0.3	+10	V
Tamb	Ambient operating temperature	±20	+75	°C
Tstg	Storage temperature	±40	+125	°C
P	Power dissipation	±	150	mW

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Philips Semiconductors	Product data
Active-LOW system reset with adjustable delay time	NE56632-XX

ELECTRICAL CHARACTERISTICS

Tamb = 25 °C, unless otherwise specified.

SYMBOL	PARAMETER	CONDITIONS			-XX	MIN.	TYP.	MAX.	UNIT
VS	Detection threshold	VCC = HIGH-to-LOW; RL = 4.7 kΩ; S1=ON;			46	4.531	4.600	4.669	V
		VOL ≤ 0.4 V;
					45	4.432	4.500	4.568	V
		Test Circuit 1 (Figure 27)
					44	4.334	4.400	4.466	V
					43	4.235	4.300	4.365	V
					42	4.137	4.200	4.263	V
					31	3.053	3.100	3.147	V
					30	2.955	3.000	3.045	V
					29	2.856	2.900	2.944	V
					28	2.758	2.800	2.842	V
					27	2.659	2.700	2.741	V
					20	1.970	2.000	2.030	V
					19	1.871	1.900	1.929	V
Vhys	Hysteresis voltage	RL = 4.7 kΩ; VCC = LOW-to-HIGH-to-LOW; S1 = ON; Test				25	50	100	mV
		Circuit 1 (Figure 27)
VS/ T	Detection threshold voltage	RL = 4.7 kΩ; Tamb = ±20 °C to +75 °C; S1 = ON;				±	±0.01	±	%/°C
	temperature coefficient	Test Circuit 1 (Figure 27)
VOL	LOW-level output voltage	VCC1 = VS(min) ± 0.05 V; RL = 4.7 kΩ; S1 = ON;				±	0.2	0.4	V
		Test Circuit 1 (Figure 27)
ILO	Output leakage current	VCC1 = VCC2 = 10 V; S2 = ON; Test Circuit 1 (Figure 27)				±	±	±0.1	μA
ICCL	Supply current (ON time)	VCC1 = VS(min) ± 0.05 V; RL = ∞ ; Test Circuit 1 (Figure 27)				±	5.0	9.0	μA
ICCH	Supply current (OFF time)	VCC1 = VS(typ)/0.85; RL = ∞ ; Test Circuit 1 (Figure 27)				±	3.0	5.0	μA
tPLH	LOW-to-HIGH delay time	CL = 100 pF; RL = 4.7 kΩ; CD = 10 nF (Note 1)				±	(Note 3)	±	ms
tPHL	HIGH-to-LOW delay time	CL = 100 pF; RL = 4.7 kΩ; CD = 10 nF (Note 2)				±	(Note 3)	±	μs
VOPL	Minimum operating	RL = 4.7 kΩ; VOL ≤ 0.4 V; S1 = ON;				±	0.65	0.80	V
	threshold voltage	Test Circuit 1 (Figure 27)
IOL1	Output current (ON Time 1)	VO = 0.4 V; RL = 0; VCC1 = VS(min) ± 0.05 V;				5	±	±	mA
		VCC2 = 0.4 V; S2 = ON; Test Circuit 1 (Figure 27)
IOL2	Output current (ON Time 2)	VO = 0.4 V; RL = 0; VCC1	= VS(min) ± 0.05 V;			3	±	±	mA
		Tamb = ±20 °C to +75	°C; S2 = ON;
		Test Circuit 1 (Figure 27)

NOTES:

1.tPLH: VCC = (VS(typ) ± 0.4 V) to (VS(typ) + 0.4 V); tPLH is release delay time (Test Circuit 2, Figure 28).

2.tPHL: VCC = (VS(typ) + 0.4 V) to (VS(typ) ± 0.4 V); tPHL is assertion delay time (Test Circuit 2, Figure 28).

3.See Table 1.

Table 1. NE56632-XX series typical delay time

±XX	tPLH	tPHL
46	195 ms	140 μs
45	190 ms	140 μs
44	185 ms	140 μs
43	180 ms	140 μs
42	175 ms	140 μs
31	120 ms	120 μs
30	115 ms	120 μs
29	110 ms	120 μs
28	105 ms	100 μs
27	100 ms	100 μs
20	65 ms	100 μs
19	60 ms	100 μs

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Philips Semiconductors	Product data
Active-LOW system reset with adjustable delay time	NE56632-XX

TYPICAL PERFORMANCE CURVES, NE56632-20

	2.0050
(V)	2.0025
THRESHOLD	2.0000
	1.9975
	1.9950
DETECTION
	1.9925
	1.9900					Test Circuit 1
,						VCC = HIGH-to-LOW
S
V	1.9875					RL = 4.7 kΩ
						VOL ≤ 0.4 V
	1.9850					S1 = ON
	±40	±20	0	20	40	60	80	100

AMBIENT TEMPERATURE, Tamb (°C)

SL01620

Figure 3. Detection threshold versus temperature.

	0.225
(V)	0.220
VOLTAGE	0.215
	0.210
OUTPUT
	0.205
LEVEL	0.200
	0.195
, LOW-						Test Circuit 1
	0.190					VCC1 = VS(min) ± 0.05 V
OL						RL = 4.7 kΩ
V						S1 = ON
	0.185
	±40	±20	0	20	40	60	80	100

AMBIENT TEMPERATURE, Tamb (°C)

SL01622

Figure 5. LOW-level output voltage versus temperature.

μA)	4.5
(
(OFF time),	4.0
CURRENT	3.5
	3.0
, SUPPLY
	2.5
CCH	Test Circuit 1
	RL = ∞
I
	VCC1 = VS(typ)/0.85
	2.0
	±40	±20	0	20	40	60	80	100

AMBIENT TEMPERATURE, Tamb (°C)

SL01624

Figure 7. Supply current (OFF time) versus temperature.

	100
(mV)	90
VOLTAGE	80
	70
HYSTERESIS
	60
	50
,		Test Circuit 1
hys
		VCC = LOW-to-HIGH-to-LOW
V	40
		RL = 4.7 kΩ
		S1 = ON
	30
	±40		±20	0	20	40	60	80	100
				AMBIENT TEMPERATURE, Tamb (°C)
									SL01621

Figure 4. Hysteresis voltage versus temperature.

	9
(μA)	8
(ON time),
	7
CURRENT	6
, SUPPLY	5
	4
CCL		Test Circuit 1
		VCC1	= VS(min) ± 0.05 V
I
	3	RL = ∞
	±40		±20	0	20	40	60	80	100
				AMBIENT TEMPERATURE, Tamb (°C)
									SL01623

Figure 6. Supply current (ON time) versus temperature.

	(V)	0.9
	VOLTAGE	0.8
	THRESHOLD	0.7
		0.6
	OPERATING	0.5
		0.4	Test Circuit 1
			RL = 4.7 kΩ
	, MIN.
			VOL ≤ 0.4 V
			S1 = ON
	OPL	0.3
		±40		±20	0	20	40	60	80	100
	V

AMBIENT TEMPERATURE, Tamb (°C)

SL01625

Figure 8. Min. operating threshold voltage versus temperature.

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