ST STP4NK60Z, STP4NK60ZFP, STB4NK60Z, STB4NK60Z-1, STD4NK60Z User Manual

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P4NK60ZFP

STP4NK60Z-STP4NK60ZFP-STB4NK60Z-1 STB4NK60Z-STD4NK60Z-STD4NK60Z-1

N-CHANNEL600V-1.76Ω-4ATO-220/FP/DPAK/IPAK/D2PAK/I2PAK

Zener-Protected SuperMESH™Power MOSFET

TYPE

VDSS

RDS(on)

ID

Pw

STP4NK60Z

600 V

< 2 Ω

4 A

70 W

STP4NK60ZFP

600 V

< 2 Ω

4 A

25 W

STB4NK60Z

600 V

< 2 Ω

4 A

70 W

STB4NK60Z-1

600 V

< 2 Ω

4 A

70 W

STD4NK60Z

600 V

< 2 Ω

4 A

70 W

STD4NK60Z-1

600 V

< 2 Ω

4 A

70 W

TYPICAL RDS(on) = 1.76 Ω

EXTREMELY HIGH dv/dt CAPABILITY

100% AVALANCHE TESTED

GATE CHARGE MINIMIZED

VERY LOW INTRINSIC CAPACITANCES

VERY GOOD MANUFACTURING REPEATIBILITY

DESCRIPTION

The SuperMESH™ series is obtained through an extreme optimization of ST’s well established stripbased PowerMESH™ layout. In addition to pushing on-resistance significantly down, special care is taken to ensure a very good dv/dt capability for the most demanding applications. Such series complements ST full range of high voltage MOSFETs including revolutionary MDmesh™ products.

APPLICATIONS

HIGH CURRENT, HIGH SPEED SWITCHING

IDEAL FOR OFF-LINE POWER SUPPLIES, ADAPTORS AND PFC

LIGHTING

ORDERING INFORMATION

 

3

 

 

1

3

 

D2PAK

 

2

TO-220

 

1

 

TO-220FP

 

 

 

3

3

1

1 2 3

2

1

DPAK

I2PAK

IPAK

INTERNAL SCHEMATIC DIAGRAM

SALES TYPE

MARKING

PACKAGE

PACKAGING

 

 

 

 

STP4NK60Z

P4NK60Z

TO-220

TUBE

 

 

 

 

STP4NK60ZFP

P4NK60ZFP

TO-220FP

TUBE

 

 

 

 

STB4NK60ZT4

B4NK60Z

D2PAK

TAPE & REEL

STB4NK60Z-1

B4NK60Z

I2PAK

TUBE

STD4NK60ZT4

D4NK60Z

DPAK

TAPE & REEL

 

 

 

 

STD4NK60Z-1

D4NK60Z

IPAK

TUBE

 

 

 

 

March 2003

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STP4NK60Z,STP4NK60ZFP,STB4NK60Z,STB4NK60Z-1,STD4NK60Z,STD4NK60Z-1

ABSOLUTE MAXIMUM RATINGS

Symbol

Parameter

 

Value

 

Unit

 

 

 

 

 

 

 

 

STP4NK60Z

 

STD4NK60Z

 

 

 

STB4NK60Z

STP4NK60ZFP

 

 

 

STD4NK60Z-1

 

 

 

STB4NK60Z-1

 

 

 

 

 

 

 

 

 

 

 

 

 

VDS

Drain-source Voltage (VGS = 0)

 

600

 

V

VDGR

Drain-gate Voltage (RGS = 20 kΩ)

 

600

 

V

VGS

Gatesource Voltage

 

± 30

 

V

 

 

 

 

 

 

ID

Drain Current (continuous) at TC = 25°C

4

4 (*)

4

A

ID

Drain Current (continuous) at TC = 100°C

2.5

2.5 (*)

2.5

A

IDM ( )

Drain Current (pulsed)

16

16 (*)

16

A

PTOT

Total Dissipation at TC = 25°C

70

25

70

W

 

Derating Factor

0.56

0.2

0.56

W/°C

 

 

 

 

 

 

VESD(G-S)

Gate source ESD(HBM-C=100pF, R=1.5KΩ)

 

3000

 

V

dv/dt (1)

Peak Diode Recovery voltage slope

 

4.5

 

V/ns

 

 

 

 

 

 

VISO

Insulation Withstand Voltage (DC)

-

2500

-

V

Tj

Operating Junction Temperature

 

-55 to 150

 

°C

Tstg

Storage Temperature

 

-55 to 150

 

°C

 

 

 

 

 

 

( ) Pulse width limited by safe operating area

(1) ISD 4A, di/dt 200A/µs, VDD V(BR)DSS, Tj TJMAX.

(*) Limited only by maximum temperature allowed

THERMAL DATA

 

 

TO-220

 

 

DPAK

 

 

 

D2PAK

 

TO-220FP

 

 

 

 

IPAK

 

 

 

I2PAK

 

 

 

 

 

 

 

 

 

Rthj-case

Thermal Resistance Junction-case Max

1.78

 

5

1.78

°C/W

 

 

 

 

 

 

 

Rthj-amb

Thermal Resistance Junction-ambient Max

 

62.5

100

°C/W

 

 

 

 

 

 

 

Tl

Maximum Lead Temperature For Soldering Purpose

 

300

 

°C

 

 

 

 

 

 

 

AVALANCHE CHARACTERISTICS

Symbol

Parameter

Max Value

Unit

 

 

 

 

IAR

Avalanche Current, Repetitive or Not-Repetitive

4

A

 

(pulse width limited by Tj max)

 

 

EAS

Single Pulse Avalanche Energy

120

mJ

 

(starting Tj = 25 °C, I D = IAR, VDD = 50 V)

 

 

GATE-SOURCE ZENER DIODE

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

 

 

 

 

 

 

 

BVGSO

Gate-Source Breakdown

Igs=± 1mA (Open Drain)

30

 

 

V

 

Voltage

 

 

 

 

 

 

 

 

 

 

 

 

PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES

The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the usage of external components.

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STP4NK60Z,STP4NK60ZFP,STB4NK60Z,STB4NK60Z-1,STD4NK60Z,STD4NK60Z-1

ELECTRICAL CHARACTERISTICS (TCASE =25°C UNLESS OTHERWISE SPECIFIED) ON/OFF

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

 

 

 

 

 

 

 

V(BR)DSS

Drain-source

ID = 1 mA, VGS = 0

600

 

 

V

 

Breakdown Voltage

 

 

 

 

 

 

 

 

 

 

 

 

IDSS

Zero Gate Voltage

VDS = Max Rating

 

 

1

µA

 

Drain Current (VGS = 0)

VDS = Max Rating, TC = 125 °C

 

 

50

µA

IGSS

Gate-body Leakage

VGS = ± 20V

 

 

±10

µA

 

Current (VDS = 0)

 

 

 

 

 

VGS(th)

Gate Threshold Voltage

VDS = VGS, ID = 50µA

3

3.75

4.5

V

RDS(on)

Static Drain-source On

VGS = 10V, ID = 2 A

 

1.76

2

Ω

 

Resistance

 

 

 

 

 

 

 

 

 

 

 

 

DYNAMIC

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

 

 

 

 

 

 

 

gfs (1)

Forward Transconductance

VDS = 15 V, ID = 2 A

 

3

 

S

Ciss

Input Capacitance

VDS = 25V, f = 1 MHz, VGS = 0

 

510

 

pF

Coss

Output Capacitance

 

 

67

 

pF

Crss

Reverse Transfer

 

 

13

 

pF

 

Capacitance

 

 

 

 

 

 

 

 

 

 

 

 

Coss eq. (3)

Equivalent Output

VGS = 0V, VDS = 0V to 480V

 

38.5

 

pF

 

Capacitance

 

 

 

 

 

 

 

 

 

 

 

 

SWITCHING ON

 

 

 

 

 

 

 

 

 

 

 

 

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

 

 

 

 

 

 

 

td(on)

Turn-on Delay Time

VDD = 300 V, ID = 2 A

 

12

 

ns

tr

Rise Time

RG = 4.7Ω VGS = 10 V

 

9.5

 

ns

 

 

(Resistive Load see, Figure 3)

 

 

 

 

 

 

 

 

 

 

 

Qg

Total Gate Charge

VDD = 480V, ID = 4 A,

 

18.8

26

nC

Qgs

Gate-Source Charge

VGS = 10V

 

3.8

 

nC

Qgd

Gate-Drain Charge

 

 

9.8

 

nC

SWITCHING OFF

 

 

 

 

 

 

 

 

 

 

 

 

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

 

 

 

 

 

 

 

td(off)

Turn-off Delay Time

VDD = 300 V, ID = 2 A

 

29

 

ns

tf

Fall Time

RG = 4.7Ω VGS = 10 V

 

16.5

 

ns

 

 

(Resistive Load see, Figure 3)

 

 

 

 

 

 

 

 

 

 

 

tr(Voff)

Off-voltage Rise Time

VDD = 480V, ID = 4A,

 

12

 

ns

tf

Fall Time

RG = 4.7Ω, VGS = 10V

 

12

 

ns

tc

Cross-over Time

(Inductive Load see, Figure 5)

 

19.5

 

ns

SOURCE DRAIN DIODE

 

 

 

 

 

 

 

 

 

 

 

 

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

 

 

 

 

 

 

 

ISD

Source-drain Current

 

 

 

4

A

ISDM (2)

Source-drain Current (pulsed)

 

 

 

16

A

VSD (1)

Forward On Voltage

ISD = 4 A, VGS = 0

 

 

1.6

V

trr

Reverse Recovery Time

ISD = 4 A, di/dt = 100A/µs

 

400

 

ns

Qrr

Reverse Recovery Charge

VDD = 24V, Tj = 150°C

 

1700

 

nC

IRRM

Reverse Recovery Current

(see test circuit, Figure 5)

 

8.5

 

A

Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.

2.Pulse width limited by safe operating area.

3.Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS.

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ST STP4NK60Z, STP4NK60ZFP, STB4NK60Z, STB4NK60Z-1, STD4NK60Z User Manual

STP4NK60Z,STP4NK60ZFP,STB4NK60Z,STB4NK60Z-1,STD4NK60Z,STD4NK60Z-1

SafeOperatingArea:TO-220/DPAK/IPAK/D2PAK/I2PAKSafe Operating Area For TO-220FP

ThermalImpedance:TO-220/DPAK/IPAK/D2PAK/I2PAKThermal Impedance For TO-220FP

Output Characteristics

Transfer Characteristics

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

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STP4NK60Z,STP4NK60ZFP,STB4NK60Z,STB4NK60Z-1,STD4NK60Z,STD4NK60Z-1

Transconductance

Gate Charge vs Gate-source Voltage

Normalized Gate Threshold Voltage vs Temp.

Static Drain-source On Resistance

Capacitance Variations

Normalized On Resistance vs Temperature

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