AN8000/AN8000M Series
3-pin Positive Output Low Dropout Voltage Regulator (50mA Type)
■ Overview |
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AN8000 Series |
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Unit:mm |
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The AN8000 series is 3-pin low-dropout fixed positive |
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5.0±0.2 |
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4.0±0.2 |
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±0.2 |
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output monolithic voltage regulators. Since thier power |
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5.1 |
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consumption can be minimized, they are suitable for bat- |
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tery stabilizing power supply and reference voltage. Thir- |
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±0.5 |
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teen types of output voltage are available ; 2V, 2.5V, 3V, |
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13.5 |
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3.5V (TO-92 only) , 4V, 4.5V, 5V, 6V, 7V, 8V, 8.5V, 9V, |
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and 10V. |
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+ 0.2 |
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0.45 – 0.1 |
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2.3±0.2 |
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2.54 |
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■ Features |
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1 : Input |
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3 |
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2 : Output |
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• Input/output voltage difference : 0.3V (max.) |
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3 : GND |
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(Bottom View) |
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• Output current of up to 50mA |
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TO-92 Plastic Package (SSIP003-P-0000) |
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• Low bias current ; 0.6mA (typ.) |
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Unit:mm |
• Output voltage ; 2V, 2.5V, 3V, 3.5V (TO-92 only) , 4V, |
AN8000M Series |
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4.6max. |
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4.5V, 5V, 6V, 7V, 8V, 8.5V, 9V, and 10V. |
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1.6max. |
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1.8max. |
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• Over-voltage protective circuit built-in. |
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2.6 |
45˚ |
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2.6max. |
4.25max. |
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0.48max. |
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0.58max. |
0.8min. |
0.44max. |
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1.5 |
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3.0 |
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1 : Output |
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2 : GND |
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3 : Input |
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3-pin Mini Power type Plastic Package (TO-243) (HSIP003-P-0000B) |
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■ Block Diagram |
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Starter |
Voltage |
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R2 |
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Reference |
Error |
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Amp. |
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– |
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Current |
R1 |
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: TO-92 |
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: TO-243 |
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Limiter |
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1 |
3 |
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2 |
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R1=5kΩ |
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CIN=0.33µF |
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3 |
2 |
1 |
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VI |
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VO |
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COUT=10µF |
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COUT |
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■ Absolute Maximum Ratings (Ta=25˚C)
Parameter |
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Supply voltage |
VI |
20 |
V |
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Supply current |
ICC |
100 |
mA |
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Power dissipation |
PD |
650 * |
mW |
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Operating ambient temperature |
Topr |
–30 to+80 |
˚C |
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Storage temperature |
AN8000 Series |
Tstg |
–55 to+150 |
˚C |
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AN8000M Series |
–55 to+125 |
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*Mounting onto the PCB (20 × 20 × 1.7mm glass epoxy copper foil 1 cm2 or more), for AN8000M Series.
■Electrical Characteristics (Ta=25˚C)
· AN8002/AN8002M (2V Type)
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Parameter |
Symbol |
Condition |
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min |
typ |
max |
Unit |
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Output voltage |
VO |
Tj=25˚C |
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1.92 |
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2 |
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2.08 |
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V |
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Line regulation |
REGIN |
VI=2.5 to 8V, Tj=25˚C |
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2 |
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40 |
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mV |
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Load regulation |
REGL |
IO=1 to 40mA, Tj=25˚C |
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7 |
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20 |
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mV |
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IO=1 to 50mA, Tj=25˚C |
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10 |
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25 |
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mV |
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Minimum I/O voltage difference |
VDIF (min.) |
VI=1.9V, IO=20mA, Tj=25˚C |
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0.06 |
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0.2 |
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V |
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VI=1.9V, IO=50mA, Tj=25˚C |
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0.12 |
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0.3 |
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V |
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Bias current |
Ibias |
IO=0mA, Tj=25˚C |
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0.6 |
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1 |
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mA |
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Ripple rejection ratio |
RR |
VI=3 to 5V, f=120Hz |
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62 |
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74 |
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dB |
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Output noise voltage |
Vno |
f=10Hz to 100kHz |
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60 |
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V |
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Output voltage temperature coefficient |
VO/Ta |
Tj=–30 to+125˚C |
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0.1 |
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mV/˚C |
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Note1) |
The specified condition Tj=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that |
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the drift in characteristic value due to a temperature rise at chip junction can be ignored. |
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Note2) |
Unless otherwise specified, VI=3V, IO=20mA, CO=10 F |
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· AN8025/AN8025M (2.5V Type) |
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Parameter |
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Condition |
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min |
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typ |
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max |
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Output voltage |
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VO |
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Tj=25˚C |
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2.4 |
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2.5 |
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2.6 |
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V |
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Line regulation |
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REGIN |
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VI=3 to 8.5V, Tj=25˚C |
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2.5 |
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50 |
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mV |
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Load regulation |
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REGL |
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IO=1 to 40mA, Tj=25˚C |
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8 |
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20 |
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mV |
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IO=1 to 50mA, Tj=25˚C |
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12.5 |
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25 |
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Minimum I/O voltage difference |
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VDIF (min.) |
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VI=2.4V, IO=20mA, Tj=25˚C |
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0.07 |
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0.2 |
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V |
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VI=2.4V, IO=50mA, Tj=25˚C |
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0.12 |
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0.3 |
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V |
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Bias current |
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Ibias |
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IO=0mA, Tj=25˚C |
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0.6 |
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1 |
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mA |
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Ripple rejection ratio |
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RR |
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VI=3.5 to 5.5V, f=120Hz |
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60 |
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dB |
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Output noise voltage |
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Vno |
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f=10Hz to 100kHz |
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65 |
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V |
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Output voltage temperature coefficient |
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VO/Ta |
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Tj=–30 to+125˚C |
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0.13 |
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mV/˚C |
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Note1) |
The specified condition Tj=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that |
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the drift in characteristic value due to a temperature rise at chip junction can be ignored. |
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Note2) |
Unless otherwise specified, VI=3.5V, IO=20mA, CO=10 F |
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■ Electrical Characteristics (Ta=25˚C)
· AN8003/AN8003M (3V Type)
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Parameter |
Symbol |
Condition |
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min |
typ |
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max |
Unit |
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Output voltage |
VO |
Tj=25˚C |
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2.88 |
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3 |
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3.12 |
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V |
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Line regulation |
REGIN |
VI=3.5 to 9V, Tj=25˚C |
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3 |
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50 |
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mV |
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Load regulation |
REGL |
IO=1 to 40mA, Tj=25˚C |
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9 |
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25 |
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mV |
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IO=1 to 50mA, Tj=25˚C |
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15 |
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30 |
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mV |
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Minimum I/O voltage difference |
VDIF (min.) |
VI=2.9V, IO=20mA, Tj=25˚C |
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0.07 |
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0.2 |
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V |
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VI=2.9V, IO=50mA, Tj=25˚C |
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0.12 |
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0.3 |
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V |
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Bias current |
Ibias |
IO=0mA, Tj=25˚C |
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0.6 |
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1 |
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mA |
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Ripple rejection ratio |
RR |
VI=4 to 6V, f=120Hz |
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58 |
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70 |
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dB |
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Output noise voltage |
Vno |
f=10Hz to 100kHz |
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70 |
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V |
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Output voltage temperature coefficient |
VO/Ta |
Tj=–30 to+125˚C |
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0.15 |
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mV/˚C |
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Note1) |
The specified condition Tj=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that |
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the drift in characteristic value due to a temperature rise at chip junction can be ignored. |
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Note2) |
Unless otherwise specified, VI=4V, IO=20mA, CO=10 F |
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· AN8035/AN8035M (3.5V Type) |
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Parameter |
Symbol |
Condition |
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min |
typ |
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max |
Unit |
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Output voltage |
VO |
Tj=25˚C |
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3.36 |
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3.5 |
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3.64 |
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V |
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Line regulation |
REGIN |
VI=4 to 9.5V, Tj=25˚C |
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3.5 |
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50 |
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mV |
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Load regulation |
REGL |
IO=1 to 40mA, Tj=25˚C |
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10 |
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30 |
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mV |
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IO=1 to 50mA, Tj=25˚C |
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20 |
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40 |
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mV |
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Minimum I/O voltage difference |
VDIF (min.) |
VI=3.4V, IO=20mA, Tj=25˚C |
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0.07 |
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0.2 |
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V |
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VI=3.4V, IO=50mA, Tj=25˚C |
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0.12 |
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0.3 |
|
V |
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|||||||||
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Bias current |
Ibias |
IO=0mA, Tj=25˚C |
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0.6 |
|
1 |
|
mA |
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Ripple rejection ratio |
RR |
VI=4.5 to 6.5V, f=120Hz |
|
57 |
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69 |
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dB |
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Output noise voltage |
Vno |
f=10Hz to 100kHz |
|
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75 |
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V |
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|||||
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Output voltage temperature coefficient |
VO/Ta |
Tj=–30 to+125˚C |
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0.2 |
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mV/˚C |
|
|||||
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|||||||||||
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|
||||||||||||||||
|
Note1) |
The specified condition Tj=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that |
|
|||||||||||||||||||||||
|
|
|
|
the drift in characteristic value due to a temperature rise at chip junction can be ignored. |
|
|
|
|
|
|
|
|
|
|
|
|
|
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|
|||||||
|
Note2) |
Unless otherwise specified, VI=4.5V, IO=20mA, CO=10 F |
|
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|||||||||
· AN8004/AN8004M (4V Type) |
|
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|||||
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|
Parameter |
|
Symbol |
|
Condition |
|
min |
|
typ |
|
max |
|
Unit |
|
|||||||||
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|||||||
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|
Output voltage |
|
VO |
|
Tj=25˚C |
|
3.84 |
|
4 |
|
4.16 |
|
V |
|
||||||||||
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|||||
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|
Line regulation |
|
REGIN |
|
VI=4.5 to 10V, Tj=25˚C |
|
|
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|
|
3.5 |
|
50 |
|
mV |
|
|||||||
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|
||||
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|
|
Load regulation |
|
REGL |
|
IO=1 to 40mA, Tj=25˚C |
|
|
|
|
|
|
10 |
|
30 |
|
mV |
|
|||||||
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||||||||||||||||
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|||
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|
IO=1 to 50mA, Tj=25˚C |
|
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|
20 |
|
40 |
|
mV |
|
|||||||||
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|
||||
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|
|
Minimum I/O voltage difference |
|
VDIF (min.) |
|
VI=3.8V, IO=20mA, Tj=25˚C |
|
|
|
|
|
|
0.07 |
|
0.2 |
|
V |
|
|||||||
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||||||||||||||||
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|||
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|
VI=3.8V, IO=50mA, Tj=25˚C |
|
|
|
|
|
|
|
0.12 |
|
0.3 |
|
V |
|
|||||||||
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||||||||||
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|||||||||||||
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|
|||||
|
|
|
Bias current |
|
Ibias |
|
IO=0mA, Tj=25˚C |
|
|
|
|
|
|
0.6 |
|
1 |
|
mA |
|
|||||||
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||||||||||||||||||
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|
|||||
|
|
|
Ripple rejection ratio |
|
RR |
|
VI=5 to 7V, f=120Hz |
|
56 |
|
67 |
|
|
|
|
|
|
|
dB |
|
||||||
|
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|
|||||||||||||||||
|
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|
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|
|||
|
|
|
Output noise voltage |
|
Vno |
|
f=10Hz to 100kHz |
|
|
|
|
|
|
80 |
|
|
|
|
|
|
|
V |
|
|||
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||||||||||||
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|
|||
|
|
|
Output voltage temperature coefficient |
|
VO/Ta |
|
Tj=–30 to+125˚C |
|
|
|
|
|
|
0.2 |
|
|
|
|
|
|
|
mV/˚C |
|
|||
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
||||||||||||
Note1) |
The specified condition Tj=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that |
|
||||||||||||||||||||||||
|
|
|
|
the drift in characteristic value due to a temperature rise at chip junction can be ignored. |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|||||||
Note2) |
Unless otherwise specified, VI=5V, IO=20mA, CO=10 F |
|
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||||||||||
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