high accuracy over long measuring ranges.
These sturdily made gauges are available in
application-oriented versions.
They have a wide range of applications in
production metrology, in multipoint
inspection stations, measuring equipment
monitoring, and as position measuring
devices.
This catalog supersedes all previous
editions, which thereby become invalid.
The basis for ordering from HEIDENHAIN
is always the catalog edition valid when
the contract is made.
2
Standards (ISO, EN, etc.) apply only
where explicitly stated in the catalog.
The Interfaces of HEIDENHAIN
Encoders brochure, ID 1078628-xx,
includes comprehensive descriptions of
all available interfaces as well as general
electrical information.
For HEIDENHAIN-ACANTO, HEIDENHAIN-METRO and
HEIDENHAIN-SPECTO
25 mm
60 mm
25 mm
60 mm
100 mm
30 mm
24
26
28
30
32
34
36
38
40
Interfaces
Cables and connecting elements
Service
Calibration according to DAkkS
* After linear length-error compensation in the evaluation electronics
42
46
50
Areas of application
In quality assurance
Metrology and production
control
Length gauges from HEIDENHAIN play a
role in incoming goods inspection, fast
dimension checking during production,
statistical process control in production or
quality assurance, or in any application
where fast, reliable and accurate length
measurement is required. Their large
measuring lengths are a particular advantage: whether the part measures 5 mm or
95 mm, it is measured immediately with
one and the same length gauge.
Whatever the application, HEIDENHAIN
has the appropriate length gauge for the
required accuracy. The HEIDENHAIN-CERTO length gauges offer a very high
accuracy of ± 0.1 µm/± 0.05 µm*/
± 0.03 µm* for extremely precise measurement. Length gauges from the
HEIDENHAIN-METRO program have
accuracy grades as fine as ± 0.2 µm, while
the HEIDENHAIN-SPECTO length gauges,
with ± 1 µm accuracy, offer particularly
compact dimensions.
Gauge block calibration and
measuring device inspection
The regular inspection of measuring
equipment called for by standards, and the
inspection of gauge blocks in particular,
necessitate a large number of reference
standard blocks if the comparative measurement is performed using inductive
gauges. The problem is the small measuring range of inductive gauges: they can
measure length differences of only up to
10 µm. Length gauges, which offer large
measuring ranges together with high
accuracy, greatly simplify the calibration
of measuring devices required to ensure
traceability.
The length gauges of the HEIDENHAIN-CERTO program with measuring ranges of
25 mm with ± 0.1 µm/± 0.03 µm* accuracy
and 60 mm with ± 0.1 µm/± 0.05 µm*
accuracy are especially well suited for this
task. It permits a significant reduction in
the required number of reference standard
blocks, and recalibrating becomes much
simpler.
* After linear length-error compensation in
the evaluation electronics
Thickness gauging of silicon wafers
Inspection of styli
4
Calibration of
gauge blocks
In production
Multipoint inspection
apparatuses
Multipoint inspection apparatuses require
durable length gauges with small dimensions. They should also have relatively large
measuring ranges of several millimeters
with consistent linear accuracy in order to
simplify the construction of inspection
devices—for example by enabling the construction of one device for several masters.
A large measuring length also provides
benefits in master production, because
simpler masters can be used.
Thanks to their small dimensions, the
HEIDENHAIN-ACANTO absolute length
gauges, like the HEIDENHAIN-SPECTO
incremental length gauges, are specially
designed for multi-point measuring
stations. They feature accuracy grades up
to ± 1 µm over measuring ranges up to
30 mm. Higher accuracy requirements
up to ± 0.2 µm can be met with similarly
compact HEIDENHAIN-METRO length
gauges.
Unlike inductive gauges, HEIDENHAINSPECTO length gauges provide stable
measurement over long periods—
eliminating recalibration.
Position measurement
Length gauges from HEIDENHAIN are also
ideal for position measurement on precision linear slides and X-Y tables. Working
with measuring microscopes, for example,
becomes much easier thanks to the digital
readout and the flexible datum setting.
Here, length gauges from the HEIDENHAIN-METRO and HEIDENHAIN-SPECTO
program come into use with large measuring ranges of 30 mm, 60 mm or 100 mm
at consistently high accuracy grades of
± 0.5 µm or ± 1 µm.
In this application as linear measuring
device, the length gauge’s fast installation
in accordance with the Abbe measuring
principle by its clamping shank or planar
mounting surface is of special benefit.
Testing station for
flatness inspection
Position measurement on an X-Y table for lens mounting
Tolerance gauging of
semifinished products
5
Length gauges from HEIDENHAIN
A number of arguments speak for HEIDENHAIN length gauges. These include not
only their technical features, but also their
high quality standard and the worldwide
presence of HEIDENHAIN.
Large measuring ranges
HEIDENHAIN length gauges are available
with measuring lengths of 12 mm, 25 mm,
30 mm, 60 mm or 100 mm. so that you
can measure very different parts in one
measuring setup and avoid frequently
changing setups with expensive gauge
blocks or masters.
High accuracy
The high accuracy specifi ed for
HEIDENHAIN length gauges applies over
the entire measuring length. Whether the
part measures 10 mm or 100 mm, its
actual dimension is always measured with
the same high quality. The high repeatability of HEIDENHAIN length gauges
comes into play during comparative
measurements, for example in series
production.
In particular HEIDENHAIN-CERTO length
gauges provide high linear accuracy and
offer resolution in the nanometer range.
Robust design
HEIDENHAIN length gauges are built for
an industrial environment. They feature
consistently high accuracy over a long
period of time as well as high thermal
stability. They can therefore be used in
production equipment and machines.
6
Wide range of applications
HEIDENHAIN length gauges are suited for
many applications. Automatic inspection
equipment, manual measuring stations or
positioning equipment—wherever lengths,
spacing, thickness, height or linear motion
are to be measured, HEIDENHAIN length
gauges function quickly, reliably and
accurately.
Absolute position measurement
HEIDENHAIN-ACANTO length gauges operate with absolute measurement over a
range of 12 mm or 30 mm and with high
repeatability. Its particular advantage is that
the measured value is available immediately after switch-on.
Worldwide presence
HEIDENHAIN is represented in all important industrial countries—in most of them
with wholly owned subsidiaries. Sales
engineers and service technicians support
the user on-site with technical information
and servicing in the local language.
Know-how
The high quality of HEIDENHAIN length
gauges is no coincidence. HEIDENHAIN
has been manufacturing high-accuracy
scales for over 70 years, and for many
years it has developed measuring and
testing devices for length and angle
measurement for national standards
laboratories. This know-how makes
HEIDENHAIN an extraordinarily qualifi ed
partner for metrology questions.
7
Length gauge overview
AccuracyMeasuring range
Plunger actuation
Absolute position measurement
± 2 µmHEIDENHAIN-ACANTO
By measured object
Pneumatic
Incremental linear measurement
± 0.1 µm
± 0.05 µm
± 0.03 µm
± 0.2 µmHEIDENHAIN-METRO
± 0.5 µm
± 1 µm
± 1 µmHEIDENHAIN-SPECTO
*)
After linear length-error compensation in the evaluation electronics
*)
*)
HEIDENHAIN-CERTO
By motor
By external coupling
By cable lifter
or measured object
Pneumatic
HEIDENHAIN-METRO
By motor
By external coupling
By measured object
Pneumatic
CT 6000CT 2500MT 101MT 60
8
AT 3000
AT 1200
12 mm25 mm/
30 mm
60 mm100 mmPage
AT 1218 EnDat
AT 1217 EnDat
AT 3018 EnDat
AT 3017 EnDat
CT 2501 » 11 µA
CT 2502 » 11 µA
PP
PP
CT 6001 » 11 µA
CT 6002 » 11 µA
PP
PP
MT 1271 « TTL
MT 1281 » 1 V
MT 1287 » 1 V
PP
PP
MT 2571 « TTL
MT 2581 » 1 V
MT 2587 » 1 V
PP
PP
MT 60 M » 11 µA
MT 60 K » 11 µA
PP
PP
MT 101 M » 11 µA
MT 101 K » 11 µA
PP
PP
22
24
26
28
ST 1278 « TTL
ST 1288 » 1 V
ST 1277 « TTL
ST 1287 » 1 V
PP
PP
ST 3078 « TTL
ST 3088 » 1 V
ST 3077 « TTL
ST 3087 » 1 V
PP
PP
30
ST 3000ST 1200MT 2500MT 1200
AT 3000
AT 1200
9
Measuring principles
Measuring standard
HEIDENHAIN length gauges are characterized by long measuring ranges and consistently high accuracy. The basis for both is
the photoelectrical scanning principle.
HEIDENHAIN length gauges use material
measuring standards consisting of absolute or incremental graduations on substrates of glass or glass ceramic. These
measuring standards permit large measuring ranges, are insensitive to vibration and
shock, and have a defined thermal behavior. Changes in atmospheric pressure or
relative humidity have no influence on the
accuracy of the measuring standard—
which is the prerequisite for the high long-term stability of HEIDENHAIN length
gauges.
HEIDENHAIN manufactures the precision
graduations in specially developed,
photolithographic processes.
• AURODUR: matte-etched lines on goldplated steel tape with typical graduation
period of 40 µm
• METALLUR: contamination-tolerant
graduation of metal lines on gold, with
typical graduation period of 20 µm
• DIADUR: extremely robust chromium
lines on glass (typical graduation period
of 20 µm) or three-dimensional chromium structures (typical graduation period
of 8 µm) on glass
• SUPRADUR phase grating: optically
three dimensional, planar structure;
particularly tolerant to contamination;
typical graduation period of 8 µm and
finer
• OPTODUR phase grating: optically three
dimensional, planar structure with
particularly high reflectance, typical
graduation period of 2 µm and less
Measurement procedure
With the incremental measuring
method, the graduation consists of a
periodic grating structure. The position
information is obtained by counting the
individual increments (measuring steps)
from some point of origin. Since an
absolute reference is required to ascertain
positions, the measuring standard is
provided with an additional track that bears
a reference mark. The absolute position
on the scale, established by the reference
mark, is gated with exactly one signal
period.
The reference mark must therefore be
scanned to establish an absolute reference
or to find the last selected datum.
With the absolute measuring method,
the position value is available from the encoder immediately upon switch-on and can
be called at any time by the subsequent
electronics. There is no need to move the
axes to find the reference position. The absolute position information is read from the graduated disk, which is formed from
a serial absolute code structure. A separate
incremental track is interpolated for the
position value and at the same time—depending on the interface version—is used
to generate an optional incremental signal.
DIADUR phase grating with
approx. 0.25 µm grating height
Photoelectric scanning
Most HEIDENHAIN encoders operate
using the principle of photoelectric
scanning. Photoelectric scanning of a
measuring standard is contact-free, and as
such, free of wear. This method detects
even very fine lines, no more than a few
microns wide, and generates output
signals with very small signal periods.
The finer the grating period of a measuring
standard is, the greater the effect of diffraction on photoelectric scanning. HEIDENHAIN uses two scanning principles with
linear encoders:
• The imaging scanning principle for
grating periods of 20 µm and 40 µm
• The interferential scanning principle
for very fine graduations with grating
periods of, for example, 8 µm
DIADUR graduation
Along with these very fine grating periods,
these processes permit a high definition
and homogeneity of the line edges.
Together with the photoelectric scanning
method, this high edge definition is a
precondition for the high quality of the
output signals.
The master graduations are manufactured
by HEIDENHAIN on custom-built highprecision dividing engines.
10
5 µm
Imaging principle
To put it simply, the imaging scanning principle functions by means of projected-light
signal generation: two scale gratings with
equal or similar grating periods are moved
relative to each other—the scale and the
scanning reticle. The carrier material of the
scanning reticle is transparent, whereas
the graduation on the measuring standard
may be applied to a transparent or reflective surface.
When parallel light passes through a
grating, light and dark surfaces are
projected at a certain distance. An index
grating is located here. When the two
gratings move relative to each other, the
incident light is modulated. If the gaps in
the gratings are aligned, light passes
through. If the lines of one grating coincide
with the gaps of the other, no light passes
through. An array of photovoltaic cells
converts these variations in light intensity
into electrical signals. The specially
structured grating of the scanning reticle
filters the light to generate nearly
sinusoidal output signals.
The smaller the period of the grating
structure is, the closer and more tightly
toleranced the gap must be between the
scanning reticle and scale.
Interferential scanning principle
The interferential scanning principle
exploits the diffraction and interference of
light on a fine graduation to produce
signals used to measure displacement.
A step grating is used as the measuring
standard: reflective lines 0.2 µm high are
applied to a flat, reflective surface. In front
of that is the scanning reticle—a transparent phase grating with the same grating
period as the scale.
When a light wave passes through the
scanning reticle, it is diffracted into three
partial waves of the orders –1, 0, and +1,
with approximately equal luminous
intensity. The waves are diffracted by the
scale such that most of the luminous
intensity is found in the reflected diffraction
orders +1 and –1. These partial waves meet
again at the phase grating of the scanning
reticle where they are diffracted again and
interfere. This produces essentially three
waves that leave the scanning reticle at
different angles. Photovoltaic cells convert
this alternating light intensity into electrical
signals.
A relative motion of the scanning reticle to
the scale causes the diffracted wave fronts
to undergo a phase shift: when the grating
moves by one period, the wave front of the
first order is displaced by one wavelength
in the positive direction, and the wavelength of diffraction order –1 is displaced by
one wavelength in the negative direction.
Since the two waves interfere with each
other when exiting the grating, the waves
are shifted relative to each other by two
wavelengths. This results in two signal periods from the relative motion of just one
grating period.
Interferential encoders function with
grating periods of, for example, 8 µm, 4 µm
and finer. Their scanning signals are largely
free of harmonics and can be highly
interpolated. These encoders are therefore
especially suited for high resolution and
high accuracy.
The HEIDENHAIN-CERTO and the
HEIDENHAIN-METRO length gauges
of the MT 1200 and MT 2500 series
operating according to the interferential
principle.
The HEIDENHAIN-ACANTO, HEIDENHAINSPECTO and the HEIDENHAIN-METRO
length gauges of the MT 60 and MT 100
series operating according to the imaging
principle.
Imaging principle
LED light source
Measuring standard
Condenser lens
Scanning reticle
Photovoltaic
cell array
Interferential scanning principle (optics schematics)
C Grating period
y Phase shift of the light wave when passing through the scanning reticle
Phase shift of the light wave due to motion X of the scale
Photocells
LED light
source
Condenser lens
Scanning reticle
Measuring standard
11
Measuring accuracy
The accuracy of linear measurement is
mainly determined by
• the quality of the graduation,
• the quality of the scanning process,
• the quality of the signal processing
electronics,
• the eccentricity of the graduation to the
bearing,
• the error from the scale guideway
relative to the scanning unit, and
• the orthogonality of the length gauge to
the bearing surface.
These factors of influence are comprised
of encoder-specific error and applicationdependent issues. All individual factors of
influence must be considered in order to
assess the attainable overall accuracy.
Error specific to the measuring
device
The error that is specific to the measuring
device is shown in the Specifications as
the system accuracy.
The extreme values of the total error F
with reference to their mean value lie over
the entire measuring length within the
system accuracy ± a. They are measured
during the final inspection and documented
in the calibration chart.
The system accuracy includes
• the homogeneity and period definition of
the graduation,
• the alignment of the graduation,
• the error of the bearing, and
• the position error within one signal
period.
Position error within one signal period
Position errors within one signal period
already become apparent in very small
motions and in repeated measurements.
They are therefore considered separately.
The position error within one signal period
± u results from the quality of the scanning
and—for encoders with integrated pulseshaping or counter electronics—the quality
of the signal-processing electronics.
For encoders with sinusoidal output
signals, however, the errors of the signal
processing electronics are determined by
the subsequent electronics.
The following individual factors influence
the result:
• The size of the signal period
• The homogeneity and period definition
of the graduation
• The quality of scanning filter structures
• The characteristics of the sensors
• The stability and dynamics of further
processing of the analog signals
These deviations are to be considered
when specifying position error within one
signal period.
Position error within one signal period ± u
is specified in percent of the signal period.
For length gauges, the value is typically
better than ± 1% of the signal period. You
will find the specified values in the
Specifications.
Short-range accuracy
The short-range accuracy describes an
error that occurs within a distance of
± 100 µm from a measuring point. It
includes electronic and mechanical
influences of the gauge on the result of
measurement. The values for short-range
accuracy typically lie below the specified
values.
12
Position error
Position error a over the measuring length ML
Position error within
one signal period
Position
Position error u within one signal period
Position error
Signal level
Signal period
360 °elec.
Application-dependent error
Other factors besides the system accuracy
also influence the attainable total accuracy
of measurement. These include in particular the ambient temperature and temperature fluctuations during measurement as
well as a stable, orthogonal measuring
setup.
All components included in the measuring loop, such as the holder for the measured
object, the gauge stand with holder, and
the length gauge itself, influence the result
of measurement. Expansion or deformation of the measuring setup through mechanical or thermal influences adds directly
to the error.
Mechanical design
A stable measuring assembly must be
ensured. Long lateral elements within the
measuring loop are to be avoided. HEIDENHAIN offers a stable gauge stand as an
accessory. The force resulting from the
measurement must not cause any measurable deformation of the measuring loop.
Length gauges from HEIDENHAIN operate
with small gauging force and have very
little influence on the measuring setup.
Orthogonal mounting
The length gauge is to be mounted so that
its plunger is exactly orthogonal to the
measured object or the surface on which it
rests. Deviations result in measuring error.
The accessory HEIDENHAIN gauge stands
with holders for an 8 mm clamping shank
ensure orthogonal mounting. Length
gauges that provide planar mounting surfaces are to be adjusted in the direction
parallel to the mounting surface (Y) to be
perpendicular to the measuring plate. A
quick and reliable adjustment is possible
with the aid of a gauge block or a parallel
block. The perpendicularity to the measuring table (X) is already ensured by the
gauge stand.
Thermal characteristics
Temperature variations during measurement cause changes in length or deformation of the measuring setup. After a change
in temperature of 5 K, a steel bar of 200 mm
length expands by 10 µm.
Length changes resulting from a uniform
deviation from the reference temperature
can largely be compensated by resetting
the datum on the measuring plate or a
master; only the expansion of the scale
and measured object go into the result of
measurement.
Temperature changes during measurement
cannot be ascertained mathematically. For
critical components, HEIDENHAIN therefore uses special materials with low coefficients of expansion, such as are found in
the HEIDENHAIN-CERTO gauge stand.
This makes it possible to guarantee the
high accuracy of HEIDENHAIN-CERTO
even at ambient temperatures of 19 °C
to 21 °C and variations of ± 0.1 K during
measurement.
In order to measure with complete
accuracy, the length gauge should be
switched on approximately 15 minutes
before the first measurement.
The measuring loop: All components involved
in the measuring assembly, including the length
gauge
Orthogonal mounting
Thermally induced change in length:
Expansion of the measuring loop components
as a result of heat
13
Calibration chart
All HEIDENHAIN length gauges are inspected before shipping for accuracy
and proper function.
They are calibrated for accuracy during
retraction and extension of the plunger. For
HEIDENHAIN-CERTO gauges, the number
of measuring positions is selected to
ascertain very exactly not only the longrange error, but also the position error
within one signal period.
The Quality Inspection Certifi cate
confi rms the specifi ed system accuracy
of each length gauge. The calibration standards ensure the traceability—as
required by EN ISO 9001—to recognized
national or international standards.
For the HEIDENHAIN-METRO and HEIDENHAIN-CERTO series, a calibration chart
documents the position error over the
measuring range. It also shows the measuring step and the measuring uncertainty
of the calibration measurement.
For HEIDENHAIN-METRO gauges the
calibration chart shows the mean value of
one forward and one backward measuring
stroke.
The HEIDENHAIN-CERTO calibration chart
shows the envelope curve of the measured error. The HEIDENHAIN-CERTO
length gauges are supplied with two calibration charts, each for different operating
attitudes.
1
Operating attitude for calibration chart 1
2
4
3
Example
Temperature range
The length gauges are inspected at a
reference temperature of 20 °C. The
system accuracy given in the calibration
chart applies at this temperature.
Operating attitude for calibration chart 2
14
The operating temperature indicates the
ambient temperature limits between which
the length gauges will function properly.
The storage temperature range of -20 °C
to 60 °C applies for the device in its packaging.
Repeatability
Whereas the system accuracy applies over
the entire measuring range, for some
applications the repeatability is the decisive
factor. It plays an important role in repeated
measurements.
Repeatability is defined in the standards
DIN 32876 and DKD-R 4-3, and describes
a length gauge’s capability to supply very
similar measured values for identical measurands and conditions.
HEIDENHAIN ascertains the repeatability
of the length gauges with five measurements near the lower plunger stop. The
plunger is completely extended and retracted at medium speed. Since the length
gauge was already in operation for at least
10 minutes before this, it is already in a stable thermal state.
The repeatability of the length gauges is
usually better than the values listed in the
table. The characteristic statistical distribution is shown in the diagram, using the
ST 1200 as an example.
Repeatability depends on the
• combinations of materials used in the
components,
• installed electronics,
• optomechanics used, and the
• bearing of the plunger.
SeriesRepeatability
< x
± 2s
AT 1200
AT 3000
CT 2500
CT 6000
MT 101
MT 1200
MT 2500
MT 60
ST 1200
ST 3000
0.4 µm
0.8 µm
0.02 µm
0.03 µm
0.04 µm
0.03 µm
0.09 µm
0.06 µm
0.25 µm
0.7 µm
Frequency
ST 1200: Statistical distribution of the repeatability
Repeatability
15
Mounting
Abbe principle
HEIDENHAIN length gauges enable you
to work according to the Abbe measuring
principle: The measured object and scale
must be in alignment to avoid additional
measuring error.
Fastening
The CT 6000, MT 60 and MT 101 length
gauges are fastened by two screws onto a
plane surface. This ensures a mechanically
stable installation of even these large
length gauges. Special holders are available
for fastening the MT 60 and MT 101 to the
MS 100 gauge stand for the HEIDENHAINMETRO (see Accessories).
The CT 2500 is mounted by its standard
clamping shank with 16h8 diameter. A
holder is available for fastening the
HEIDENHAIN-CERTO to the gauge stand
(see Accessories).
The AT, ST, MT 1200 and MT 2500 length
gauges feature a standard clamping shank
with 8h6 diameter. These HEIDENHAIN
length gauges can therefore easily be used
with existing measuring fixtures and
stands.
As an accessory, HEIDENHAIN offers a
special clamping sleeve and screw. It
facilitates fastening the length gauge
securely without overstressing the
clamping shank.
Clamping sleeve ID 386811-01
CT 6000
MT 60
MT 101
CT 2500
–
Secured with clamping sleeve
Operating attitude for HEIDENHAINCERTO
The HEIDENHAIN-CERTO can be operated
at any attitude. However, the mounting
position with horizontal length gauge and
upward facing mounting surface should be
avoided because in such a case no
guarantee can be made for accuracy.
16
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