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UTRON |
UT62V5128 |
Rev. 1.0 |
512K X 8 BIT LOW POWER CMOS SRAM |
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FEATURES |
GENERAL DESCRIPTION |
Access time : 70/100ns(max) CMOS Low operating power Operating : 30/20mA (Icc max) Standby : 20µA (TYP.) L-version
2µA (TYP.) LL-version Single 2.3V~2.7V power supply Operating Temperature:
Commercial : 0 ~70
Extended : -20 ~80
All inputs and outputs TTL compatible Fully static operation
Three state outputs
Data retention voltage : 1.5V (min) Package : 32-pin 8mm×20mm TSOP-I
32-pin 8mm×13.4mm STSOP
FUNCTIONAL BLOCK DIAGRAM
A0
A1
A2
A3 |
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MEMORY ARRAY |
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A4 |
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ROW |
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VCC |
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A8 |
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2048 ROWS × 256 COLUMNS × 8bits |
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DECODER . |
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A13 |
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VSS |
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A14 |
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A15 |
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A16 |
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A17 |
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I/O1 |
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I/O |
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COLUMN I/O |
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CONTROL |
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I/O8 |
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COLUMN DECODER |
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CE |
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LOGIC |
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WE |
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CONTROL |
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A18A12 A11 |
A10 |
A9 |
A7 A6 A5 |
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OE |
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The UT62V5128 is a 4,194,304-bit high speed CMOS static random access memory organized as 524,288 words by 8 bits. It is fabricated using high performance, high reliability CMOS technology.
The UT62V5128 is designed for high speed system applications. It is particularly well suited for battery back-up nonvolatile memory applications.
The UT62V5128 operates from a single 2.3V~2.7V power supply and all inputs and outputs are fully TTL compatible.
PIN CONFIGURATION
A11 |
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1 |
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32 |
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OE |
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A9 |
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2 |
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31 |
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A10 |
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A8 |
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3 |
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30 |
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CE |
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A13 |
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4 |
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29 |
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I/O8 |
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WE |
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5 |
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28 |
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I/O7 |
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A17 |
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6 |
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27 |
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I/O6 |
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A15 |
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7 |
UT62V5128 |
26 |
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I/O5 |
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Vcc |
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8 |
25 |
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I/O4 |
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A18 |
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9 |
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24 |
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Vss |
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A16 |
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10 |
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23 |
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I/O3 |
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A14 |
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11 |
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I/O2 |
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A12 |
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12 |
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21 |
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I/O1 |
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A7 |
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13 |
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20 |
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A0 |
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A6 |
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A1 |
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A5 |
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18 |
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A2 |
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A4 |
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16 |
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17 |
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A3 |
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TSOP-1 / STSOP
PIN DESCRIPTION
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SYMBOL |
DESCRIPTION |
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A0 - A18 |
Address Inputs |
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I/O1 - I/O8 |
Data Inputs/Outputs |
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Chip Enable Input |
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CE |
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Write Enable Input |
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WE |
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Output Enable Input |
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OE |
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Vcc |
Power Supply |
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Vss |
Ground |
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NC |
No Connection |
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UTRON TECHNOLOGY INC. |
P80064 |
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1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. |
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TEL: 886-3-5777882 |
FAX: 886-3-5777919 |
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1
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UTRON |
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UT62V5128 |
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Rev. 1.0 |
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512K X 8 BIT LOW POWER CMOS SRAM |
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TRUTH TABLE |
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MODE |
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I/O OPERATION |
SUPPLY CURRENT |
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WE |
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CE |
OE |
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Standby |
X |
H |
X |
High – Z |
ISB, ISB1 |
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Output Disable |
H |
L |
H |
High – Z |
ICC |
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Read |
H |
L |
L |
DOUT |
ICC |
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Write |
L |
L |
X |
DIN |
ICC |
Note: H = VIH, L=VIL, X = Don't care.
ABSOLUTE MAXIMUM RATINGS*
PARAMETER |
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SYMBOL |
RATING |
UNIT |
Terminal Voltage with Respect to VSS |
VTERM |
-0.5 to 3.6 |
V |
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Operating Temperature |
Commercial |
TA |
0 to 70 |
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Extended |
TA |
-20 to 80 |
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Storage Temperature |
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TSTG |
-65 to 150 |
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Power Dissipation |
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PD |
1 |
W |
DC Output Current |
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IOUT |
50 |
mA |
Soldering Temperature (under 10 secs) |
Tsolder |
260 |
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*Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability.
DC ELECTRICAL CHARACTERISTICS (VCC = 2.3V~2.7V, TA =0 to 70 / -20 to 80 (E))
PARAMETER |
SYMBOL |
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TEST CONDITION |
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MIN. |
TYP. |
MAX. |
UNIT |
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Power Voltage |
Vcc |
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2.3 |
2.5 |
2.7 |
V |
Input High Voltage |
VIH |
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2.0 |
- |
Vcc+0.3 |
V |
Input Low Voltage |
VIL |
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- 0.2 |
- |
0.6 |
V |
Input Leakage Current |
ILI |
VSS VIN VCC |
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- 1 |
- |
1 |
µA |
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Output Leakage Current |
ILO |
VSS VI/O VCC, Output Disabled |
- 1 |
- |
1 |
µA |
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Output High Voltage |
VOH |
IOH= -0.5mA |
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2.0 |
- |
- |
V |
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Output Low Voltage |
VOL |
IOL= 0.5mA |
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- |
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0.4 |
V |
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Operating Power |
ICC |
Cycle time=Min.100% duty, |
70 |
- |
20 |
30 |
mA |
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Supply Current |
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= VIL, II/O =0mA , |
100 |
- |
15 |
20 |
mA |
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CE |
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Icc1 |
Cycle time = 1µs,100% duty, |
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3 |
4 |
mA |
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0.2,II/O=0mA, |
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CE |
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other pins at 0.2V or Vcc-0.2V, |
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Icc2 |
Cycle time =500ns,100% duty, |
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- |
6 |
8 |
mA |
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0.2,II/O=0mA |
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CE |
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other pins at 0.2V or Vcc-0.2V, |
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Standby Current(TTL) |
ISB1 |
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=VIH |
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0.3 |
0.5 |
mA |
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CE |
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Standby Current(CMOS) |
ISB1 |
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CE |
VCC-0.2V |
-L |
- |
20 |
80 |
µA |
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other pins at 0.2V or Vcc-0.2V, |
-LL |
- |
2 |
15 |
µA |
UTRON TECHNOLOGY INC. |
P80064 |
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
2
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UTRON |
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UT62V5128 |
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Rev. 1.0 |
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512K X 8 BIT LOW POWER CMOS SRAM |
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CAPACITANCE |
(TA=25 |
, f=1.0MHz) |
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PARAMETER |
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SYMBOL |
MIN. |
MAX |
UNIT |
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Input Capacitance |
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CIN |
- |
6 |
pF |
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Input/Output Capacitance |
CI/O |
- |
8 |
pF |
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Input Pulse Levels |
0V to 2.2V |
Input Rise and Fall Times |
5ns |
Input and Output Timing Reference Levels |
1.5V |
Output Load |
CL = 30pF, IOH/IOL = -0.5mA/0.5mA |
AC ELECTRICAL CHARACTERISTICS |
(VCC = 2.3V~2.7V , TA =0 to 70 / -20 to 80 (E)) |
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(1) READ CYCLE |
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PARAMETER |
SYMBOL |
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UT62V5128-70 |
UT62V5128-100 |
UNIT |
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MIN. |
MAX. |
MIN. |
MAX. |
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Read Cycle Time |
tRC |
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70 |
- |
100 |
- |
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Address Access Time |
tAA |
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- |
70 |
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100 |
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Chip Enable Access Time |
tACE |
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- |
70 |
- |
100 |
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Output Enable Access Time |
tOE |
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- |
35 |
- |
50 |
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Chip Enable to Output in Low Z |
tCLZ* |
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10 |
- |
10 |
- |
ns |
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Output Enable to Output in Low Z |
tOLZ* |
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5 |
- |
5 |
- |
ns |
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Chip Disable to Output in High Z |
tCHZ* |
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- |
25 |
- |
30 |
ns |
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Output Disable to Output in High Z |
tOHZ* |
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- |
25 |
- |
35 |
ns |
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Output Hold from Address Change |
tOH |
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5 |
- |
5 |
- |
ns |
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(2) WRITE CYCLE |
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PARAMETER |
SYMBOL |
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UT62V5128-70 |
UT62V5128-100 |
UNIT |
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MIN. |
MAX. |
MIN. |
MAX. |
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Write Cycle Time |
tWC |
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70 |
- |
100 |
- |
ns |
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Address Valid to End of Write |
tAW |
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60 |
- |
80 |
- |
ns |
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Chip Enable to End of Write |
tCW |
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60 |
- |
80 |
- |
ns |
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Address Set-up Time |
tAS |
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0 |
- |
0 |
- |
ns |
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Write Pulse Width |
tWP |
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55 |
- |
70 |
- |
ns |
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Write Recovery Time |
tWR |
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0 |
- |
0 |
- |
ns |
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Data to Write Time Overlap |
tDW |
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30 |
- |
40 |
- |
ns |
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Data Hold from End of Write Time |
tDH |
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0 |
- |
0 |
- |
ns |
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Output Active from End of Write |
tOW* |
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5 |
- |
5 |
- |
ns |
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Write to Output in High Z |
tWHZ* |
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- |
30 |
- |
40 |
ns |
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*These parameters are guaranteed by device characterization, but not production tested.
UTRON TECHNOLOGY INC. |
P80064 |
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
3