UTRON
Rev. 1.2
FEATURES
Fast access time : 8/10/12/15 ns (max.) Low operating power consumption :
80 mA (typical)
Single 5V power supply
All inputs and outputs TTL compatible Fully static operation
Three state outputs
Package : 28-pin 300 mil SOJ
28-pin 8mm×13.4mm STSOP
FUNCTIONAL BLOCK DIAGRAM
32K × 8
A0-A14 DECODER MEMORY ARRAY
Vcc
Vss
I/O1-I/O8 |
I/O DATA |
COLUMN I/O |
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CIRCUIT |
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CE |
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CONTROL |
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OE |
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CIRCUIT |
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WE |
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PIN DESCRIPTION
SYMBOL |
DESCRIPTION |
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A0 - A14 |
Address Inputs |
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I/O1 - I/O8 |
Data Inputs/Outputs |
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Chip Enable Input |
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CE |
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Write Enable Input |
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WE |
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Output Enable Input |
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OE |
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VCC |
Power Supply |
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VSS |
Ground |
UT61256C
32K X 8 BIT HIGH SPEED CMOS SRAM
The UT61256C is a 262,144-bit high-speed CMOS static random access memory organized as 32,768 words by 8 bits. It is fabricated using high performance, high reliability CMOS technology.
The UT61256C is designed for high-speed system applications. It is particularly suited for use in high-density high-speed system applications.
The UT61256C operates from a single 5V power supply and all inputs and outputs are fully TTL compatible.
PIN CONFIGURATION
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A14 |
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1 |
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28 |
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Vcc |
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A12 |
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2 |
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27 |
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WE |
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A7 |
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3 |
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26 |
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A13 |
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UT61256C |
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A8 |
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A6 |
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25 |
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I/O8 |
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A0 |
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10 |
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A5 |
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5 |
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24 |
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A9 |
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6 |
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23 |
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A11 |
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A4 |
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A3 |
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7 |
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OE |
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A2 |
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8 |
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A10 |
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A1 |
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20 |
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CE |
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19 |
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18 |
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I/O7 |
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I/O1 |
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11 |
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I/O2 |
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12 |
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17 |
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I/O6 |
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I/O3 |
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13 |
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16 |
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I/O5 |
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Vss |
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14 |
SOJ |
15 |
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I/O4 |
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OE |
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1 |
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28 |
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A10 |
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A11 |
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2 |
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27 |
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CE |
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A9 |
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3 |
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26 |
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I/O8 |
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A8 |
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4 |
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25 |
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I/O7 |
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A13 |
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5 |
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24 |
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I/O6 |
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6 |
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23 |
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WE |
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I/O5 |
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Vcc |
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7 |
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UT61256C |
22 |
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I/O4 |
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A14 |
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8 |
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Vss |
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A12 |
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9 |
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20 |
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I/O3 |
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A7 |
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10 |
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I/O2 |
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A6 |
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18 |
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I/O1 |
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A5 |
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12 |
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17 |
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A0 |
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A4 |
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16 |
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A1 |
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A3 |
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14 |
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15 |
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A2 |
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STSOP
GENERAL DESCRIPTION
UTRON TECHNOLOGY INC. |
P80031 |
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
1
UTRON |
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UT61256C |
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Rev. 1.2 |
32K X 8 BIT HIGH SPEED CMOS SRAM |
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ABSOLUTE MAXIMUM RATINGS* |
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PARAMETER |
SYMBOL |
RATING |
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UNIT |
Terminal Voltage with Respect to Vss |
VTERM |
-0.5 to +6.5 |
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V |
Operating Temperature |
TA |
0 to +70 |
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Storage Temperature |
TSTG |
-65 to +150 |
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Power Dissipation |
PD |
1 |
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W |
DC Output Current |
IOUT |
50 |
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mA |
Soldering Temperature (under 10 sec) |
Tsolder |
260 |
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*Stress greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability.
TRUTH TABLE
MODE |
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I/O OPERATION |
SUPPLY CURRENT |
CE |
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OE |
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WE |
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Standby |
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H |
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X |
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X |
High - Z |
ISB,ISB1 |
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Output Disable |
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L |
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H |
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H |
High - Z |
ICC |
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Read |
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L |
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L |
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H |
DOUT |
ICC |
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Write |
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L |
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X |
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L |
DIN |
ICC |
Note: H = VIH, L=VIL, X = Don't care.
DC ELECTRICAL CHARACTERISTICS (VCC = 5V± 10%, TA = 0 to 70 )
PARAMETER |
SYMBOL |
TEST CONDITION |
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MIN. |
MAX. |
UNIT |
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Input High Voltage |
VIH |
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2.2 |
VCC+0.5 |
V |
Input Low Voltage |
VIL |
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- 0.5 |
0.8 |
V |
Input Leakage Current |
ILI |
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VSS VIN VCC |
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- 1 |
1 |
µA |
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Output Leakage Current |
ILO |
VSS VI/O VCC |
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- 1 |
1 |
µA |
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CE =VIH or OE =VIH or WE =VIL |
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Output High Voltage |
VOH |
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IOH = - 4mA |
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2.4 |
- |
V |
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Output Low Voltage |
VOL |
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IOL = 8mA |
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0.4 |
V |
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Cycle time=Min. |
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- 8 |
- |
190 |
mA |
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Operating Power |
ICC |
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- 10 |
- |
180 |
mA |
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Supply Current |
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CE = VIL , II/O = 0mA |
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- 12 |
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160 |
mA |
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- 15 |
- |
140 |
mA |
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Standby Current (TTL) |
ISB |
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= VIH |
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30 |
mA |
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CE |
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Standby Current (CMOS) |
ISB1 |
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VCC-0.2V |
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5 |
mA |
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CE |
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|
UTRON TECHNOLOGY INC. |
P80031 |
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
2
UTRON |
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UT61256C |
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Rev. 1.2 |
32K X 8 BIT HIGH SPEED CMOS SRAM |
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CAPACITANCE (TA=25 , f=1.0MHz) |
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PARAMETER |
SYMBOL |
MIN. |
MAX. |
UNIT |
Input Capacitance |
CIN |
- |
8 |
pF |
Input/Output Capacitance |
CI/O |
- |
10 |
pF |
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Input Pulse Levels |
0V to 3.0V |
Input Rise and Fall Times |
3ns |
Input and Output Timing Reference Levels |
1.5V |
Output Load |
CL=30pF, IOH/IOL=-4mA/8mA |
AC ELECTRICAL CHARACTERISTICS (VCC = 5V± 10% , TA = 0 to 70 )
(1) READ CYCLE
PARAMETER |
SYMBOL |
UT61256C |
UT61256C |
UT61256C |
UT61256C |
UNIT |
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-8 |
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-10 |
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-12 |
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-15 |
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MIN. |
MAX. |
MIN. |
MAX. |
MIN. |
MAX. |
MIN. |
MAX. |
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Read Cycle Time |
tRC |
8 |
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- |
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10 |
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- |
12 |
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- |
15 |
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- |
ns |
Address Access Time |
tAA |
- |
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8 |
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- |
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10 |
- |
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12 |
- |
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15 |
ns |
Chip Enable Access Time |
tACE |
- |
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8 |
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- |
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10 |
- |
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12 |
- |
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15 |
ns |
Output Enable Access Time |
tOE |
- |
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4 |
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- |
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5 |
- |
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6 |
- |
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7 |
ns |
Chip Enable to Output in Low Z |
tCLZ* |
2 |
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- |
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2 |
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- |
3 |
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- |
4 |
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- |
ns |
Output Enable to Output in Low Z |
tOLZ* |
0 |
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- |
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0 |
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- |
0 |
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- |
0 |
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- |
ns |
Chip Disable to Output in High Z |
tCHZ* |
- |
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4 |
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- |
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5 |
- |
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6 |
- |
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7 |
ns |
Output Disable to Output in High Z |
tOHZ* |
- |
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4 |
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- |
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5 |
- |
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6 |
- |
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7 |
ns |
Output Hold from Address Change |
tOH |
3 |
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- |
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3 |
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- |
3 |
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- |
3 |
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- |
ns |
(2) WRITE CYCLE |
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PARAMETER |
SYMBOL |
UT61256C |
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UT61256C |
UT61256C |
UT61256C |
UNIT |
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-8 |
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-10 |
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-12 |
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-15 |
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MIN. |
MAX. |
MIN. |
MAX. |
MIN. |
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MAX. |
MIN. |
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MAX. |
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Write Cycle Time |
tWC |
8 |
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- |
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10 |
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- |
12 |
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- |
15 |
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- |
ns |
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Address Valid to End of Write |
tAW |
6.5 |
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- |
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8 |
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- |
10 |
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- |
12 |
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- |
ns |
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Chip Enable to End of Write |
tCW |
6.5 |
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- |
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8 |
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- |
10 |
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- |
12 |
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- |
ns |
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Address Set-up Time |
tAS |
0 |
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- |
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0 |
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- |
0 |
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- |
0 |
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- |
ns |
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Write Pulse Width |
tWP |
6.5 |
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- |
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8 |
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- |
9 |
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- |
10 |
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- |
ns |
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Write Recovery Time |
tWR |
0 |
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- |
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0 |
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- |
0 |
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- |
0 |
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- |
ns |
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Data to Write Time Overlap |
tDW |
5 |
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- |
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6 |
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- |
7 |
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- |
8 |
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- |
ns |
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Data Hold from End of Write Time |
tDH |
0 |
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- |
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0 |
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- |
0 |
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- |
0 |
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- |
ns |
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Output Active from End of Write |
tOW* |
1.5 |
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- |
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2 |
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- |
3 |
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- |
4 |
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- |
ns |
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Write to Output in High Z |
tWHZ* |
5 |
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- |
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6 |
- |
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7 |
- |
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8 |
ns |
*These parameters are guaranteed by device characterization, but not production tested.
UTRON TECHNOLOGY INC. |
P80031 |
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C. TEL: 886-3-5777882 FAX: 886-3-5777919
3