Zetex (Now Diodes) FMMT3905, FMMT3906 Schematic [ru]

SOT23 PNP SILICON PLANAR
SWITCHING TRANSISTORS
ISSUE 4 – MARCH 2000
FMMT3905 FMMT3906
PARTMARKING DETAILS - FMMT3905 - 2W
FMMT3906 - 2A
C
COMPLEMENTARY TYPES - FMMT3905 - FMMT3903
FMMT3906 - FMMT3904
ABSOLUTE MAXIMUM RATINGS.
PARAMETER SYMBOL VALUE UNIT
Collector-Base Voltage V
CollectorEmitter Voltage V
Emitter-Base Voltage V
Continuous Collector Current I
Power Dissipation at T
=25°C P
amb
Operating and Storage Temperature Range T
ELECTRICAL CHARACTERISTICS (at T
CBO
CEO
EBO
C
tot
j:Tstg
= 25°C unless otherwise stated).
amb
PARAMETER SYMBOL FMMT3905 FMMT3906. UNIT CONDITIONS.
MIN MAX MIN MAX
BreakdownVoltages V
Cut-Off Currents I
Static Forward Current Transfer Ratio
Saturation Voltages
Transition Frequency
Output Capacitance C
Input Capacitance C
(BR)CBO
V
(BR)CEO
V
(BR)EBO
CEX
I
BEX
h
FE
V
CE(sat)
V
BE(sat)
f
T
obo
ibo
-40 -40 V
-40 -40 V IC=-1mA, IB=0*
-5 -5 V
-50 -50 nA VCE=-30V, V
-50 -50 nA VCE=-30V, V
150
-0.25
-0.4
-0.95
60 80
300
100 60 30
0.25
0.4VV
-0.65 -0.85
-0.95VV
30 40 50 30 15
-0.65 -0.85
200 250 MHz IC=-10mA, VCE=-20V
4.5 4.5 pF VCB=-5V, IE=0, f=100KHz
10 10 pF VBE=0.5V, IC=0, f=100KHz
Noise Figure N 5 4 dB I
*Measured under pulsed conditions. Pulse width=200
µs. Duty cycle =1%
-40 V
-40 V
-5 V
-200 mA
330 mW
-55 to +150 °C
=-10µA, I
I
C
=-10µA, I
I
E
I
=-0.1mA, VCE=-1V*
C
I
=-1mA, VCE=-1V*
C
=-10mA, VCE=-1V*
I
C
I
=-50mA, VCE=-1V*
C
=-100mA, VCE=-1V*
I
C
=0
E
=0
C
BE(off)
EB(off)
=-3V
=-3V
IC=-10mA, IB=-1mA* I
=-50mA, IB=-5mA*
C
IC=-10mA, IB=-1mA* I
=-50mA, IB=-5mA*
C
f=100MHz
=-200mA, VCE=-5V
C
, f=30Hz to 15kHz
Rg=2k at -3dB points
E
B
FMMT3905 FMMT3906
SWITCHING CHARACTERISTICS (at Tamb=25 °C unless otherwise stated)
PARAMETER SYMBOL FMMT3905 FMMT3906 UNIT CONDITIONS
MIN MAX MIN MAX
Delay Time t
Rise Time t
Storage Time t
Fall Time t
Delay and Rise Time
Equivalent Test Circuit
d
r
s
f
35 35 ns VCC=-3V, V
35 35 ns
200 225 ns VCC=-3V, IC=-10mA
60 75 ns
=-10mA, IB1=-1mA
I
C
(See Fig.1)
I
=-IB2=-1mA
B1
(See Fig.2)
BE(off)
=-0.5V
Storage and Fall Time
Equivalent Test Circuit
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