
2SK3163
Silicon N Channel MOS FET
High Speed Power Switching
Features
• Low on-resistance
R
= 6 mΩ typ.
DS(on)
• Low drive current
• 4 V gate drive device can be driven from 5 V source
Outline
ADE-208-736A (Z)
2nd Edition
February 1999
TO–3P
G
D
1. Gate
1
S
2
3
2. Drain
(Flange)
3. Source

2SK3163
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V
Gate to source voltage V
Drain current I
Drain peak current I
Body-drain diode reverse drain current I
Avalanche current I
Avalanche energy E
Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
Note 3
AP
Note 3
AR
Note 2
Note 1
Channel temperature Tch 150 °C
Storage temperature Tstg –55 to +150 °C
Note: 1. PW ≤ 10 µs, duty cycle ≤ 1%
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg ≥ 50 Ω
60 V
±20 V
75 A
300 A
75 A
50 A
214 mJ
110 W
2

2SK3163
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown
V
(BR)DSS
60——V I
voltage
Gate to source leak current I
Zero gate voltege drain
GSS
I
DSS
——±0.1 µAV
——10µAV
current
Gate to source cutoff voltage V
Static drain to source on state R
GS(off)
DS(on)
1.0 — 2.5 V ID = 1 mA, VDS = 10 V
— 6.0 7.5 mΩ ID = 40 A, VGS = 10 V
resistance — 8.0 12 mΩ ID = 40 A, VGS = 4 V
Forward transfer admittance |yfs|5080—SI
Input capacitance Ciss — 7100 — pF VDS = 10 V
Output capacitance Coss — 1000 — pF VGS = 0
Reverse transfer capacitance Crss — 280 — pF f = 1 MHz
Total gate charge Qg — 125 — nc VDD = 25 V
Gate to source charge Qgs — 25 — nc VGS = 10 V
Gate to drain charge Qgd — 25 — nc ID = 75 A
Turn-on delay time t
Rise time t
Turn-off delay time t
Fall time t
Body–drain diode forward
V
d(on)
r
d(off)
f
DF
— 60 — ns VGS = 10 V, ID = 40 A
— 300 — ns RL = 0.75 Ω
— 520 — ns
— 330 — ns
— 1.05 — V IF = 75 A, VGS = 0
voltage
Body–drain diode reverse
t
rr
— 90 — ns IF = 75 A, VGS = 0
recovery time
Note: 1. Pulse test
= 10 mA, VGS = 0
D
= ±20 V, VDS = 0
GS
= 60 V, VGS = 0
DS
1
= 40 A, VDS = 10 V
D
diF/ dt = 50 A/ µs
Note
Note 1
Note 1
Note 1
3

2SK3163
Main Characteristics
200
Power vs. Temperature Derating
150
100
50
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
Typical Output Characteristics
100
V = 10 V
GS
5 V
80
4 V
Pulse Test
3.5 V
1000
Maximum Safe Operation Area
300
100
D
30
(Tc = 25°C)
10
Operation in
3
this area is
Drain Current I (A)
limited by R
1
DS(on)
0.3
Ta = 25°C
0.1
0.1 0.3 1
Drain to Source Voltage V (V)
Typical Transfer Characteristics
100
V = 10 V
DS
Pulse Test
80
PW = 10 ms (1 shot)
DC Operation
3
10
100 µs
1 ms
DS
10 µs
30
100
D
60
40
Drain Current I (A)
20
0
Drain to Source Voltage V (V)
4
3 V
2.5 V
246810
DS
D
60
40
Drain Current I (A)
20
0
75°C
12345
Gate to Source Voltage V (V)
25°C
Tc = –25°C
GS

2SK3163
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
2.0
Pulse Test
1.6
DS(on)
V (V)
1.2
0.8
0.4
Drain to Source Saturation Voltage
10 A
0
48
Gate to Source Voltage V (V)
I = 50 A
D
20 A
12
16 20
GS
Static Drain to Source on State Resistance
vs. Temperature
20
Ω
Pulse Test
16
DS(on)
R (m )
12
4 V
8
4
I = 50 A
D
V = 10 V
GS
20 A
10 A
10, 20, 50 A
0
Static Drain to Source on State Resistance
–50 0 50 100 150 200
Case Temperature Tc (°C)
Static Drain to Source on State Resistance
vs. Drain Current
100
Ω
50
DS(on)
20
R (m )
10
5
2
Drain to Source On State Resistance
1
1
2
V = 4 V
GS
10 V
10
Drain Current I (A)
Pulse Test
20 100
D
Forward Transfer Admittance vs.
Drain Current
500
V = 10 V
200
fs
DS
Pulse Test
100
50
Tc = –25 °C
20
10
5
2
25 °C
75 °C
1
Forward Transfer Admittance |y | (S)
0.5
0.1 0.3 1 3 10 30 100
Drain Current I (A)
D
505
200
5

2SK3163
Body–Drain Diode Reverse
Recovery Time
1000
500
200
100
50
20
Reverse Recovery Time trr (ns)
10
di / dt = 50 A / µs
V = 0, Ta = 25 °C
GS
0.1 0.3 1 3 10 30 100
Reverse Drain Current I (A)
DR
Typical Capacitance vs.
Drain to Source Voltage
30000
10000
3000
1000
Capacitance C (pF)
300
100
01020304050
Drain to Source Voltage V (V)
Ciss
Coss
Crss
V = 0
GS
f = 1 MHz
DS
100
I = 75 A
D
V
CE
80
60
GE
V = 50 V
CC
25 V
10 V
40
Dynamic Input Characteristics
20
V = 50 V
CC
25 V
Collector to Emitter Voltage V (V)
0
80 160 240 320 400
10 V
V
CE
Gate Charge Qg (nc)
20
1000
Switching Characteristics
500
16
GE
200
12
100
8
4
50
Switching Time t (ns)
20
Gate to Emitter Voltage V (V)
0
10
0.1 0.2
0.5
Drain Current I (A)
t
d(off)
t
f
t
r
t
d(on)
V = 10 V, V = 30 V
GS
DD
PW = 5 µs, duty < 1 %
10 100
20
2
1
5
D
50
6

2SK3163
Reverse Drain Current vs.
Source to Drain Voltage
100
10 V
80
F
5 V
60
V = 0, –5 V
GS
40
20
Reverse Drain Current I (A)
0
0.4 0.8 1.2 1.6 2.0
Source to Drain Voltage V (V)
Pulse Test
SDF
Maximum Avalanche Energy vs.
Channel Temperature Derating
250
I = 50 A
AP
V = 25 V
AR
200
DD
duty < 0.1 %
Rg > 50
Ω
150
100
50
0
Repetitive Avalanche Energy E (mJ)
25 50 75 100 125 150
Channel Temperature Tch (°C)
Vin
15 V
Avalanche Test Circuit Avalanche Waveform
V
DSS
V – V
DSS DD
AR
1
2
V
DS
L
E = • L • I •
AP
2
Monitor
I
AP
Monitor
I
Rg
D. U. T
V
DD
AP
V
I
D
50Ω
V
DD
0
V
DS
(BR)DSS
7

2SK3163
3
Normalized Transient Thermal Impedance vs. Pulse Width
s (t)
1
γ
D = 1
0.5
0.3
0.2
0.1
0.1
0.05
0.03
Normalized Transient Thermal Impedance
0.02
0.01
1shot pulse
0.01
10 µ
100 µ 1 m 10 m 100 m 1 10
Pulse Width PW (S)
Tc = 25°C
θ γ θ
ch – c(t) = s (t) • ch – c
θ
ch – c = 1.14 °C/W, Tc = 25 °C
P
DM
PW
T
D =
PW
T
Switching Time Test Circuit Waveform
R
L
V
DD
= 30 V
Vout
Monitor
Vin
Vout
td(on)
10%
10%
90%
tr
90%
td(off)
90%
10%
t
f
Vin Monitor
Vin
10 V
D.U.T.
50Ω
8

2SK3163
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright,
trademark, or other intellectual property rights for information contained in this document. Hitachi bears no
responsibility for problems that may arise with third party’s rights, including intellectual property rights, in
connection with use of the information contained in this document.
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received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact
Hitachi’s sales office before using the product in an application that demands especially high quality and
reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury,
such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment
or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for
maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and
other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed
ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in
semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating
Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the
Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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