WM5620L and WM5620 are quad 8-bit digital to analogue
converters (DAC) controlled via a serial interface. Each
DAC's output voltage range isprogrammable for either x1
or x 2 its reference input voltage, allowing near rail to rail
operation for the x 2 output range. Separate high
impedance buffered voltage reference inputs are provided
for each DAC. WM5620L operates on a single supply
Features
•Four 8-bit voltage output DAC's
•Three wire serial interface
•Programmable x1 or x 2 output range.
•Power-on-reset sets outputs to zero
•Buffered voltage reference inputs
•Simultaneous DAC output update
•14 pin SO or DIP package
voltage of 3 V while WM5620 operates on 5 V .
WM5620/L interfaces to all popular microcontrollers and
microprocessors via a three wire serial interface with CMOS
compatible, schmitt trigger, digital inputs. An 11 bit
command word comprises 2 DAC select bits, an output
range selection bit and 8-bits of data.
Individual or all DAC outputs are changed using WM5620/
L's double buffered DAC registers and the separate LOAD
and LDAC inputs. DAC outputs are updated
simultaneously by writing a complete set of new values
and then pulsing the LDAC input.
The DAC outputs are optimised for single supply
operation and driving ground referenced loads.
An internal power-on-reset function sets the DAC's input
codes to zero at power up.
Ideal in space critical applications WM5620/L is available
in small outline and DIP packages for commercial (0
o
C) and industrial (-40oC to 85oC) temperature ranges.
70
o
C to
Block Diagram
2
ef A
9
3
Ref B
4
ef C
ef D
Production Data data sheets contain
final specifications current on publication
date. Supply of products conforms to
Wolfson Microelectronics standard terms
and conditions
Data
oad
5
7
Clk
6
Serial Interface
8
Lutton Court, Bernard Terrace, Edinburgh EH8 9NX, UK
Supply voltage WM5620VDD4.755.25V
Supply Voltage WM5620LVDD2.73.35.25V
Reference input range x1 gain V
DAC output load resistance to GNDRL10kΩ
High level digital input voltageVIH0.8 VDDV
Low level digital input voltageVIL0.8 V
Clock frequencyFCLK1 MHz
REF [A/B/C/D]V DD - 1.5V
DEVICE TEMP. RANGE PACKAGE
WM5620CN0
WM5620CD0oC to 70oC14 pin plastic SO
WM5620IN-40oC to 85oC14 pin plastic DIP
WM5620ID-40oC to 85oC14 pin plastic SO
WM5620LCN0oC to 70oC14 pin plastic DIP
WM5620LCD0oC to 70oC14 pin plastic SO
WM5620LIN-40oC to 85oC14 pin plastic DIP
WM5620LID-40oC to 85oC14 pin plastic SO
Output slew rate1V/µs
Input bandwidth(note 14)100kHz
Large Signal BandwidthMeasured at -3dB point100kHz
Digital CrosstalkClk = 1MHz sq wave measured at-50dB
1. Absolute Maximum Ratings are stress ratings only.
Permanent damage to the device may be caused by
continuously operating at or beyond these limits.
Device functional operating range limits are given
under Recommended Operating Conditions.
Guaranteed performance specifications are given
under Electrical Characteristics at the test conditions
specified.
2. Total Unadjusted Error is the sum of integral linearity error, zero code error and full scale error over the
input code range.
3. Differential Nonlinearity (DNL) is the difference
between the measured and ideal 1 LSB amplitude
change of any two adjacent codes. A guarantee of
monotonicity means the output voltage changes in
the same direction (or remains constant) as a change
in the digital input code.
4. Integral Nonlinearity (INL) is the maximum deviation
of the output from the line between zero and full scale
(excluding the effects of zero code and full-scale
errors).
5. Zero code error is the deviation from zero voltage
output when the digital input code is zero.
6. Zero code error temperature coefficient is given by:
ZCETC = (ZCE(Tmax) - ZCE(Tmin))/VREF
(Tmax - Tmin)
7. Zero-code Error Rejection Ratio (ZCE-RR) is measured by varying the VDD voltage, from 4.5 to 5.5 V
d.c., and measuring the proportion of this signal imposed on the zero-code output voltage.
8. Full-scale error is the deviation from the ideal fullscale output (VREF - 1 LSB) with an output load of
10kΩ
9. Full-Scale Temperature Coefficient is given by:
FSETC = (FSE(T
min)
T
10. Full Scale Error Rejection Ratio (FSE-RR) is measured by varying the VDD voltage, from 4.5 to 5.5 V
d.c., and measuring the proportion of this signal imposed on the full-scale output voltage.
11 Reference feedthrough is measured at a DAC out-
put with an input code = 00 Hex with a V
REF input = 1
Vdc + 1 VPP at 10kHz
12. Channel to channel isolation is measured at a DAC
output with an input code of one DAC to FF Hex and
the code oa all other DACs to oo Hex with a V
REF
input = 1 Vdc + 1 Vpp at 10kHz
Parameter Measurement Information
DACA
DACB
DACC
DACD
Slewing Settling Time and Linearity Measurements
10KΩCL - 100pF
13 Setting time is the time for the output signal to remain
within ±0.5 LSB of the final measurement value for a
digital input code change of 00 Hex to FF Hex. For WM
DD = 5V, VREF = 2V and range = x 2. For
5620: V
WM5620L: V
DD = 3, VREF = 1.25V and range = x 2.
14 Reference bandwidth is the -3dB bandwidth with an
input at V
REF = 1.25 Vdc =+ 2 Vpp with a digital input
code of full-scale
Typical Performance Characteristics
Typical DNL, INL and TUE * at VDD = 5 V
Differen t i al Nonlinea rity
VDD = 5 V, Vref = 2.5 V, Range x 1, TA = 25OC
0.2
0.1
0
-0.1
Error (lsb
-0.2
032 64 96 128 160 192 224 256
Input Cod
Tota l Unadjuste d Error
VDD = 5 V, Vref = 2.5 V , Range = x 1, TA = 25OC
0.5
0.25
0
-0.25
Error (lsb
-0.5
0 32 64 96 128 160 192 224 256
Input Cod
Error (lsb
Int egral Non linea r ity
DD
V
0.2
0.1
0
-0.1
Error (lsb
-0.2
ref
= 5 V, V
= 2.5 V, Range = x 1, TA = 25OC
032 64 96 128 160 192 224 256
Input Cod
Differential Nonlinearity
VDD = 5 V, V
0.2
0.1
0
-0.1
-0.2
ref
= 2 V, Range = x 2, TA = 25OC
032 64 96 128 160 192 224 256
Input Cod
* see note 2
Wolfson Microelectronics
5
Page 6
WM5620L, WM5620
s
)
)
V
T
V
R
I
e
)
e
)
e
)
e
)
e
)
Supply Curren t v s
)
)
V
V
V
V
R
I
5
Typical Performance Characteristics (Continued)
Typical DNL, INL and TUE * at VDD = 5 V
Integral N o nlinear ity
VDD = 5 V, V
0.2
0.1
0
-0.1
Error (lsb
-0.2
032 64 96 128 160 192 224 256
Typical DNL, INL and TUE at VDD = 3 V
ref
= 2 V, Range = x 2, TA = 25OC
Input Cod
0.5
0.25
-0.25
Error (lsb
-0.5
Total Unadjusted Error
VDD = 5 V, Vref = 2 V, Range = x 2, TA = 25OC
0
032 64 96 128 160 192 224 256
Input Cod
Differential Nonlinearity
VDD = 3 V, V
0.2
0.1
0
-0.1
Error (lsb
-0.2
032 64 96 128 160 192 224 256
ref
= 1.25 V, Range x 2, TA = 25OC
Input Cod
Total Unadjusted Error
0.5
0.25
0
-0.25
Error (lsb
-0.5
VDD = 3 V, V
ref
= 1.25 V, Range x 2, TA = 25OC
032 64 96 128 160 192 224 256
Input Cod
Output Source Cur rent v
Out put Vo ltage
8
7
6
5
DD
4
(mA
out
I
3
2
1
0
= 5 V
A
= 25OC
= 2 V
ref
ange = x 2
nput code = 255
012345
Vout (V
Integral N o nlinear ity
DD
V
0.2
0.1
0
-0.1
Error (lsb
-0.2
ref
= 3 V, V
= 1.25 V, Range x 2, TA = 25OC
032 64 96 128 160 192 224 256
Input Cod
Tempe rature
1.2
1.15
1.1
1.05
ange = x 2
nput code = 25
1
IDD (mA
0.95
0.9
0.85
0.8
-50050100
Temperature (OC
DD
= 3 V
= 1.25 V
ref
DD
ref
= 5 V
= 2 V
6
Wolfson Microelectronics
Page 7
y
)
V
T
V
I
Typical Performance Characteristics (Continued)
y
)
V
T
V
I
WM5620L, WM5620
Large Signal Fre quenc
Response
0
-2
-4
-6
-8
-10
DD
= 5 V
-12
A
= 25OC
ref
= 1.25 Vdc + 2 V
-14
nput Code = 255
Relative Gain (dB)
-16
-18
-20
1101001000
pp
Frequency (kHz
Positive Rise and Settling Time V
500 mV/Vert. div
2 µs/Hor. div
DD = 3 V
VDD = 3 V
O
C
TA = 25
code 00 to FF Hex
Range = x 2
Vref = 1.25 V
Small Sig n al F req ue nc
Response
10
0
-10
-20
= 5 V
DD
-30
= 25OC
A
ref = 2 Vdc + 0.5 V
-40
nput code = 255
Relative Gain (dB)
-50
-60
110100100010000
pp
Frequency (kHz
Negative Fall and Settling Time VDD = 3 V
VDD = 3 V
O
C
TA = 25
500 mV/Vert. div
5 µs/Hor. div
code FF to 00 Hex
Range = x 2
Vref = 1.25 V
Rise time = 2.05 µs, Positive slew rate = 0.96 µ s
Settling time = 4.5 µs
Positive Rise and Settling Time VDD = 5 V
1 V/Vert. div
2 µs/Hor. div
DD = 5 V
V
O
C
TA = 25
code 00 to FF Hex
Range = x 2
Vref = 2 V
Rise time = 2.4 µs, Positive slew rate = 1.0 µs
Settling time = 5.8 µs
Fall time = 4.25 µs, Negative slew rate = 0.46 µs
Settling time = 8.5 µs
Negative Fall and Settling Time V
1 V/Vert. div
5 µs/Hor. div
DD = 5 V
DD = 5 V
V
O
C
TA = 25
code FF to 00 Hex
Range = x 2
Vref = 2 V
Fall time = 5.0 µs, Negative slew rate = 0.63 µs
Settling time = 9.5 µs
Wolfson Microelectronics
7
Page 8
WM5620L, WM5620
1234567891011
L
D
Data Input Timing
Load and LDAC Timing
Equivalent Input and Output Circuits
Timing Waveforms
CLK
ata
50 %
t
SD
t
HD
CLK
Load
50 %
t
HL
t
WL
t
LD
t
SL
t
WD
LDAC
Timing Diagrams
CLK
Data
A1A0
Load
DAC
RNG
D7D6D5D4D3D2D1D0
Figure 1. Load controlled update (LDAC = 0)
8
Wolfson Microelectronics
Page 9
Timing Diagrams
L
123
4
567891011
1234567891011
CLK
WM5620L, WM5620
Data
Load
DAC
LDAC
CLK
Data
Load
CLK
Data
Load
A1A0
RNG
D7D6D5D4D3D2D1D0
Figure 2. LDAC controlled update
A1 A0
RNG
D7 D6D5 D4D3 D2D1 D0
Figure 3. Load controlled update (LDAC = 0) using 8-bit serial word.
123
A1 A0
RNG
567891011
4
D7 D6D5 D4D3 D2D1 D0
LDAC
Figure 4. LDAC controlled update using 8-bit serial word.
Wolfson Microelectronics
9
Page 10
WM5620L, WM5620
Pin Descriptions
Pin Name Type Function
1GNDSupplyGround return and reference terminal
2RefAAnalogue inputReference voltage input to DACA
3RefBAnalogue inputReference voltage input to DACB
4RefCAnalogue inputReference voltage input to DACC
5RefDAnalogue inputReference voltage input to DACD
6DataDigital inputSerial interface data
7ClkDigital inputSerial interface clock, negative edge sensitive
8LoadDigital inputSerial interface load
9DACDAnalogue outputDAC D output
10DACCAnalogue outputDAC C output
1 1DACBAnalogue outputDAC B output
12DACAAnalogue outputDAC A output
13LDACDigital inputDAC update latch control
14VDDSupplypositive supply voltage
Functional Description
DAC operation
Each of WM5620/L 's four digital to analogue converters
(DACs) are implemented using a single resistor string with
256 taps corresponding to each of the input 8-bit codes.
One end of a resistor string is connected to the GND pin
and the other end is driven from the output of a reference
input buffer. The use of a resistor string guarantees
monotonicity of the DAC's output voltage. Linearity depends
upon the matching of the resistor string's individual elements
and the performance of the output buffer. The reference input
buffers present a high impedance to reference sources.
Each DAC has a voltage output amplifier which is
programmable for gains of x1 or x 2 through the serial
interface. The DAC output amplifiers feature rail to rail
output stages, allowing outputs over the full supply voltage
range to be achieved with a x 2 gain setting and a VDD/2
reference voltage input. Used in this way a slight
degradation in linearity will occur as the output voltage
approaches VDD.
A power-on-reset activates at power up resetting the DACs
inputs to code 0. Each output voltage is given by:
out = Vref x CODE/256 x (1 + RNG)
V
Where:RNG controls the output gains of x 1 and x 2
CODE is the range 0 to 255
Data Interface
WM5620/L's four double buffered DAC inputs allow
several ways of controlling the update of each DAC's
output.
Serial data is input, MSB first, into the DAT A input pin using
CLK, LOAD and LDAC control inputs and comprises 2 DAC
address bits, an output range (RNG) bit and 8 DAC input
bits.
With the LOAD pin high data is clocked into the DATA pin
on each falling edge of CLK. Any number of data bits may
be clocked in, only the last 1 1 bits are used. When all data
bits have been clocked in, a falling edge at the LOAD pin
latches the data and RNG bits into the correct 9 bit input
latch using the 2 bit DAC address.
If the LDAC input pin is low, the second latch at the DAC
input is transparent, and the DAC input and RNG bit will be
updated on the falling edge of LOAD simultaneously with
the input latch, as shown in figure 1. If the LDAC input is high
during serial data input, as shown in figure 2, the falling edge
of the LOAD input stores the data in the addressed input
latch. The falling edge of LDAC updates the second latches
from the input latches and hence the DAC outputs.
10
Wolfson Microelectronics
Page 11
Functional Description (Continued)
WM5620L, WM5620
Using these inputs individual DACs can be updated using
one 11 bit serial input word and the LOAD pin. Using both
LOAD and LDAC, all or selected DACs can be updated
after an appropriate number of data words have been
inputted. Figures 3 & 4 illustrate operation with the 8 clock
pulses available from some microprocessors. If the data
input is interrupted in this way the clock input must be
held low during the break in clock pulses.
The RNG bit controls the DAC output range. When RNG
= 0 the output is between Vref(A,B,C,D) and GND and
when RNG = 1 the range is between 2 x Vref (A,B,C,D)
and GND.
Serial Input Decode
A1A0DAC
00DACA
01DACB
10DACC
11DACD
D7 D6 D5 D4 D3 D2 D1 D0 Output V oltage
00000000GND
00000001(1/256) x Ref (1 + RNG)
•••••••• •
•••••••• •
01111111(127/256) x Ref (1 + RNG)
10000000(128/256) x Ref (1 + RNG)
•••••••• •
•••••••• •
11111111(255/256) x Ref (1 + RNG)
Wolfson Microelectronics
11
Page 12
WM5620L, WM5620
Applications Information
Linearity, offset, and gain error using
single end supplies
When an amplifier is operated from a single supply, the
voltage offset can still be either positive or negative. With
a positive offset, the output voltage changes on the first
code change. With a negative offset the output voltage may
not change with the first code depending on the magnitude of the offset voltage.
The output amplifier, with a negative voltage of fset, attempts
to drive the output to a negative voltage. However, because
the most negative supply rail is GND, the output cannot
drive to a negative voltage.
So when the output offset voltage is negative, the output
voltage remains at ZERO volts until the input code value
produces a sufficient output voltage to overcome the
inherent negative offset voltage, resulting in the transfer
function shown below.
This negative offset error, not the linearity error, produces
this breakpoint. The transfer function would have followed
the dotted line if the output buffer could drive to a negative voltage.
For a DAC, linearity is measured between ZERO input code
( all inputs 0 ) and full scale code ( all inputs 1 ) after offset
and full scale are adjusted out or accounted for in some
way. However, single supply operation does not allow for
adjustment when the offset is negative due to the breakpoint in the transfer function. So the linearity in the unipolar mode is measured between full scale code and the
lowest code which produces a positive output voltage. The
code is calculated from the maximum specification for the
negative offset.
Effect of negative offset (single supply)
12
Wolfson Microelectronics
Page 13
Package Descriptions
Plastic Small-Outline Package
D - 8 pins shown
WM5620L, WM5620
4.00
3.80
6.20
5.80
1.75
1.35
0.25
0.10
A
14
Pin spacing
1.27 B.S.C.
Dimension 'A' Variations
NMinMax
84.805.00
148.558.75
169.8010.00
58
0.50
O
0.51
0.33
0.25
x 45 NOM
1.27
0.40
0.25
0.19
OO
0 to 8
Notes:
A. Dimensions in millimeters.
B. Complies with Jedec standard MS-012.
C. This drawing is subject to change without notice.
D. Body dimensions do not include mold flash or protrusion.
E. Dimension A, mould flash or protrusion shall not exceed 0.15mm. Body width, interlead flash or protrusions shall
A. Dimensions are in inches
B. Falls within JEDEC MS-001( 20 pin package is shorter than MS-001)
C. N is the maximum number of terminals
D. All end pins are partial width pins as shown, except the 14 pin package which is full width.
N/2
14
Rev. 1 November 96
Wolfson Microelectronics
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